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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Laser Diode Characterization Systems
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Artifex Engineering GmbH & Co. KG
The LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!
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Product
Image Sensor Characterization Systems
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Image Sensor QE and Spectral Responsivity Characterization
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Product
Laser Diode Characterization Testing
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The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
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Product
Nucleic Acid Analysis And Protein Characterization
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Utilizing automated microfluidic capillary electrophoresis (micro-CE) technology, our instruments enable the user to simplify the process of traditional gel separations, resulting in even more accurate and reproducible data in a fraction of the time. Separate, identify and analyze genomic and protein samples in seconds and visualize your data as an electropherogram, virtual gel, or tabular report.
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Product
Nonlinear Component Characterization 10 MHz - 50 GHz (Export Control)
S94511B
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The S94511B Nonlinear Component Characterization provides strong insight into the nonlinear behavior of your device under test (DUT).
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Product
Automated Compliance and Device Characterization Tests
N5990A
Test Platform
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Product
Frequency Converter Characterization With Wideband Modulated Signal
N5245BQ
Network Analyzer
The N5245BQ provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for frequency converter measurements with modulated signal such as EVM, NPR and ACPR in addition to gain, gain compression, IMD and other measurements
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Product
CMP Process and Material Characterization System
CP-4
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he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
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Product
Material Characterization Products
MeasureReady®
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Unique real-time sampling architecture for synchronous sourcing and measuring.
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Product
Solar Cell I-V Characterization System
VS6821
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Industrial Vision Technology Pte Ltd.
This system provides cell manufactures and laboratories a new way in testing and measuring photovoltaic cells. Integrated with Steady-State Solar Simulator, it provides complete coverage of testing parameters and measurement requirements by most international standards. Its test methods, procedure & equipment are IEC 60904 compliant. Calibration of reference cell is performed at Fraunhofer ISE in Germany, and is traceable to PTB.
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Product
Portable Cryogen-Free Cryocooler-Based Material Characterization Platform
PPMS® VersaLab™
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Quantum Design’s PPMS VersaLab is a portable, cryogen-free cryocooler-based material characterization platform. With a temperature range of 50 – 400 K, this 3 tesla platform is perfect for accomplishing many types of materials characterization in a limited space.
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Product
EasyEXPERT group+ Device Characterization Software
EasyEXPERT group+
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Keysight EasyEXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities EasyEXPERT group+ is upgradable from the previous generation of EasyEXPERT/Desktop EasyEXPERT software.
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Product
Bench & Characterization Boards
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Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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Product
Optical Measurement Methods and Characterization Services
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The Fraunhofer IOF develops optical measurement methods and systems to customer requirements. Key areas include the characterization of optical and non-optical surfaces, coatings, components and systems in the micro and sub-nano range as well as 3D shape acquisition.
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Product
Active Device Characterization Solution Up To 67 GHz
N5247BM
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The N5247BM provides the N5247B 67 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 67 GHz.
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Product
PCB Material Characterization
N19308B
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PLTS N19308B extends the N19301B base product to perform PCB material Dk/Df and surface roughness characterization.
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Product
Automated Distortion Characterization and Information System
ADCS
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Matrix Test Equipment Incorporated
The Automated Distortion Characterization and Information System (ADCS) is an extension of the Matrix equipment control software that automatically makes RF measurements selected from the following: Cross Modulation (XMOD), Composite Triple Beat (CTB), Composite Second Order (CSO), Carrier to Noise (C/N), Discrete Second Order, Discrete Third Order Distortion. Measurements are made, and the test results and a profile describing the test conditions are saved in a database for later retrieval or reporting.
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Product
Materials Characterization
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The techniques within Material Characterization have some sample challenges. Our highly talented staff of Engineers have overcome these with unique solutions. From moving highly viscous samples to mixing and sampling in a small well plate.
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Product
Dynamic Imaging Particle Analysis Technology
FlowCam® Macro
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Yokogawa Fluid Imaging Technologies, Inc.
Based on proven FlowCam dynamic imaging particle analysis technology, and optimized for larger particles (50μm to 5mm), FlowCam Macro provides rapid particle characterization that goes beyond just particle size. Direct, image-based measurements of particle size and shape enable differentiation of particle types in a heterogeneous mixture.
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Product
RF Training Kit And Lab Sheets
Y1800A
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The RF transceiver kit consists of a transmitter unit and a receiver unit in superheterodyne architecture. The transceiver units are made up of various RF building-block modules such as filter, low noise amplifier, power amplifier, mixer and oscillator. The RF transceiver kit is controlled by a Windows-based Control Panel software via USB. A Measurement Automation Program is provided to demonstrate automated characterization and test of RF circuits. A signal generator and a spectrum analyzer are required to run this program.
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Product
Rebuilt Testers
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Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
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Product
PXIe-4138, 60 V, 3 A System PXI Source Measure Unit
782856-01
Source Measure Unit
±60 V, 3 A System PXI Source Measure Unit—The PXIe‑4138 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4138 features 4-quadrant operation. The PXIe‑4138 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Product
PNA-X Microwave Network Analyzer, 8.5 GHz
N5249B
Network Analyzer
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Automated Optical Inspection
AOI
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No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.
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Product
Connected Meteorology
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"Epi to Etch" - get full control of your frontend processes! The LayTec Connected Metrology® ecosystem enables improved process control characterizing complex layer stacks along the manufacturing chain. In a typical frontend production line, wafers are measured 3 or more times by LayTec products.
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Product
Compact Tunable Laser Source with Continuous Sweep Mode, 1520nm to 1630nm
81940A
Laser Source
Keysight's 81940A high power compact tunable lasers enables optical device characterization at high power levels and measurement of nonlinear effects. It's improves the testing of all types of optical amplifiers and other active components as well as broadband passive optical components. As single slot plug-in modules for Keysight's 8163A/B, 8164A/B and 8166A/B mainframes, they are a flexible and cost effective stimulus for single channel and DWDM test applications. Each module covers a total wavelength range of 110 nm in the C+L-band.
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Product
Test Fixture
OCP NIC 3.0
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These test fixtures are necessary for testing within the OCP NIC subgroup (found under the OCP Server Work Group). These fixtures will arrive meeting the OCP NIC 3.0 Specification with a characterization of the boards. These fixtures mate with the OCP form factor connector, and will allow an electrical break out of each signaling lane.
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Product
Test Handler
M4872
Test Handler
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
PCI Express 4 CEM Receiver Test Automation
N5991PC4A
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The N5991PC4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express 4.0 CEM Add-In Cards and systems
