-
Product
Microwave Cavity Characterization
-
Material Sensing & Instrumentation
Microwave cavity characterization complements TDR Dielectric Spectroscopy in low-loss materials, providing high-resolution permittivity and loss data at specific single frequencies. Since measurements do not change significantly with frequency in low-loss materials (Kramer-Kronig relation) cavity measurement at select frequencies provides a full characterization across the RF/microwave range.
-
Product
Characterization System
System 7700
-
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
-
Product
EasyEXPERT group+ Device Characterization Software
EasyEXPERT group+
-
Keysight EasyEXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities EasyEXPERT group+ is upgradable from the previous generation of EasyEXPERT/Desktop EasyEXPERT software.
-
Product
Display Test & Characterization Solutions
-
The Gamma Scientific line of display measurement solutions leverages the company’s renowned competencies in developing high-sensitivity spectroradiometer-based equipment. Our range of NIST traceable solutions include handheld and portable instruments, laboratory equipment, and fully automated production inspection systems. With over 50 years of experience in the industry, you won’t find another company with the level of combined knowledge and expertise as the team at Gamma Scientific.
-
Product
Characterization of Solar Cells
Paios
-
Paios performs a large variety of experiments in no time with one click. Get consistent and precise measurement data, directly compare your results in the measurement software and speed up your research.Increase your research speedCompare your devices directly in the softwareGet highly consistent dataThink about physics - Let Paios handle the rest
-
Product
Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
-
Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
-
Product
Nonlinear Component Characterization 10 MHz - 50 GHz (Export Control)
S94511B
-
The S94511B Nonlinear Component Characterization provides strong insight into the nonlinear behavior of your device under test (DUT).
-
Product
Optical Measurement Methods and Characterization Services
-
The Fraunhofer IOF develops optical measurement methods and systems to customer requirements. Key areas include the characterization of optical and non-optical surfaces, coatings, components and systems in the micro and sub-nano range as well as 3D shape acquisition.
-
Product
Antenna Characterization
-
Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
-
Product
Laser Diode Characterization Testing
-
The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
-
Product
Beam Characterization
-
Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
-
Product
Keithley Automated Characterization Suite Software
ACS
-
Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
-
Product
Active Device Characterization Solution Up To 67 GHz
N5247BM
-
The N5247BM provides the N5247B 67 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 67 GHz.
-
Product
Arbitrary Load-Control Device Characterization
S94522B
-
The S94522B Arbitrary Load Control Device Characterization application. Ideal for bare transistor compact modeling. Generate Keysight’s DynaFET compact model or use large signal waveform data to generate models.
-
Product
Probe Card
VC20E Series
-
The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. Probes can be configured in either single or dual layer.
-
Product
PNA-L Microwave Network Analyzer
N5232B
Network Analyzer
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to20 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
-
Product
Semiconductor Package Wind Tunnel
WT-100
-
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
-
Product
Metrology
-
KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
-
Product
Aluminum-Polymer
OS-CON™
-
Panasonic Industrial Devices Sales Company of America
Panasonic's OS-CON™ Aluminum-Polymer Solid Capacitors are available in both surface-mount and through hole types. These Solid Electrolyte Aluminum OS-CON™ Capacitors utilize aluminum and a highly conductive polymer material to offer low ESR, excellent noise reduction and ripple current capabilities. The OS-CON Series parts are characterized by a long-life and minimal ESR changes throughout the entire product line’s rated temperature range.
-
Product
Modulator
SFT3332
-
Hangzhou Softel Optic Co., Ltd.
SFT3332 IP Mux-Scrambling modulator is the latest generational Mux-scrambling-modulating all-in-one device developed by SOFTEL. It has 32 multiplexing channels, 32 scrambling channels and 32 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 32 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is also characterized with high integrated level, high performance and low cost. This is very adaptable to newly generation CATV broadcasting system.
-
Product
Materials And Chemical Analysis
-
Anderson Materials Evaluation, Inc.
Materials characterization, failure analysis, quality control, and materials and process development services are offered. Our analytical techniques allow us to assess elemental and chemical material composition, thermal properties, coating thickness, electrochemical properties, surface chemistry, surface wetting, corrosion rates and pitting potentials, contamination and degradation problems, metallography, fractography, phase transitions, static coefficient of friction, adhesive bonding strength and causes of adhesive bonding failures, surface tension and surface energy, tensile and compressive strength, bend deflection, lapshear strength, elasticity properties, UV and visible light absorption and reflection, density and porosity, and many other material properties integral to improving your products.
-
Product
Static and dynamic analysis
MEMS
-
Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.
-
Product
Power, Energy and Disturbance Analysers
-
Designed for test and maintenance departments working in industrial or administrative buildings, it can be used to obtain a snapshot of the main features characterizing the quality of the electrical network.
-
Product
Microswitches
-
Our microswitches are characterized by a large range of switching ratings from 1 mA to 25 A, magnetic blowout versions for High DC ratings, sealed models, positive break versions, a wide range of operating temperatures, models for explosive atmospheres, long service life and wide variety of actuators, contact materials and fixing means.
-
Product
LXI Microwave Matrix, 10GHz, Single 8x4
60-750-184
Matrix Switch Module
The 60-750-184 is a single 8x4 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
-
Product
Off-Air Testing Products
-
Understanding the challenges of the Electromagnetic Spectrum is paramount for Engineers that are charged with the design, characterization, validation of modern RF systems such as Communications Systems, RADAR Systems, and Electronic Warfare Systems.
-
Product
Modulation Distortion For E5081A Up To 20 GHz
S960704B
-
The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
-
Product
Calibration Light Source
CAL1
-
Image Engineering GmbH & Co. KG
The one light source solution in the field of camera characterization and calibration. CAL1The CAL1 calibration light source is designed to characterize and calibrate cameras in the lab or on the production line. Its compact design consists of one iQ-LED element in a 0.3 m integrating sphere that illuminates a 70 mm opening. Because of the non-reflective special diffusor filter on the sphere opening, a uniformity of more than 98% could be reached
-
Product
Probes
-
D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm diffenrential, single-ended probe.
-
Product
Software
Solar Cells/ Photovoltaic Devices
-
Materials Development Corporation
MDC offers a comprehensive array of current-voltage, capacitance-voltage, and resistivity measurements to characterize solar cells and PV devices. CSM/Win systems and software can help to fine tune your process for maximum efficiency. Critical values such as series and shunt resistances, maximum power point (both actual and theoretical), and fill factor are automatically determined.
