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Infared Refractometer
PRISM PRO - IR
The Prism Pro - IR is a state of the art Infrared Refractometer. It is the ideal instrument for characterizing infrared material properties of dispersion and refractive index.
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Four Slot PXI/PXIe Full Hybrid ABex Chassis with up to PXIe x4 Connectivity on Each Slot
ABex PXIe Rack 04
Ultra-Compact 2U ABex chassis with 4 slots. This variant is characterized by outstanding compactness and due to the directly integrated PXIe full hybrid backplane one achieves maximum performance at an attractive price. The first slot is reserved for a single slot PXIe controller. Either Konrad PXIe embedded controllers or MXI interfaces are supported.
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Fibolocator
Fibolocator is an innovative device for measuring and characterizing breaks and other backscattering-causing faults in optical fibers. Time-resolved correlation reflectometry is the principle on which the device is based. It analyzes the backscattered light like a pulse OTDR, but unlike such OTDRs, cw laser diodes are used. The requirements for the test signal and the complexity of the system are low, which leads to very low costs for OEM subsystems.
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PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-02
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
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High-Power Low-Loss Pulsed Bias Tees
MBT series
The MBT-series of bias tees is based on Maury's patented broadband capacitor (US Patent 9,614,267) which simultaneously enables the industry's widest bandwidth, lowest insertion loss and lowest return loss in a coaxial bias tee up to 18 GHz. In addition, its unique design makes it ideal for pulsed applications, including pulsed IV and pulsed load pull characterization, without distorting the voltage and current waveforms.
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In-situ Gas Analyzers
Real-time gas analysis directly within the processInnovative measurement technology that allows the devices to be mounted directly at the measurement site: In-situ gas analyzers take measurements directly within the process under system conditions. These analyzers are primarily characterized by their minimal maintenance requirements and extremely short response times. SICK's in-situ gas analyzers are available in two different versions:The cross-duct version for representative measurement results across the entire duct diameterThe measuring probe version, optimized for single-sided gas duct installation
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Reverberation Chambers
Over the past several decades, RCs have been enjoying growing popularity as a promising facility for the characterization of wireless devices and for EMC testing. The RC (Reverberation Chamber) measurement method exhibits much competitive superiority over the AC (Anechoic Chamber) method and TEM Cell method, such as low cost, enhanced test repeatability, a more realistic test environment, and easily achieved high-field environment. The application of the RC for performing EMC testing was first proposed by H. A. Mendes in 1968. In the recent IEC 61000-4-21 standard, the importance of EMC testing using RCs as an alternative measurement technique has been recognized.
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Analog/Linear Tester
Amoeba 4200
4200 is capable of running multiple test sites independently with a parallel efficiency of up to 85% for quad-site and octal-site testing.It comes with test development and production software suite, which makes the transition from test development and bench characterization to production seamlessly.
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Signal Generator Frequency Extenders
FES
These frequency extension modules easily connect to the output of your signal generator so you have high-performance source for your DUT characterization activities. Characterize your DUT with the confidence that the superior performance in terms of output power, spurious and harmonic will provide product accurate results.
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Component Test and Analysis Laboratories
The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Telurometer
AMRU-10
AMRU-10 is a simple meter that allows to perform measurements by the technical method, as well as the measurement of the resistance of the grounding by the bipolar method. The device is characterized by its ease of operation, high resistance to disturbances and high accuracy.
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PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
783126-02
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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Comprehensive Test and Assessment for IoT Devices
Ixia IoT
Keysight Network Applications and Security
Characterize and optimize IoT devices under real-world deployment conditions
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Solutions for Nondestructive Characterization of Elastic
Sonelastic
Sonelastic® is a line of solutions for nondestructive characterization of elastic modulus and damping of materials by the natural frequencies obtained by impulse excitation technique.
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Semiconductor Thermal Transient Tester
T3Ster®
T3Ster (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
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Rheometers
The MCR rheometer series from the market leader offers you one thing first and foremost: an open range of possibilities. Whatever your rheological requirements are and will be in the future – based on its modular setup, your MCR rheometer is efficiently and comfortably adapted and extended to meet your needs, from routine quality control to high-end R&D applications. An investment in an MCR rheometer is always a safe investment in longstanding technology: The air-bearing-supported EC motor, for example, was developed by Anton Paar and has been used in all MCR models for over 25 years to ensure accuracy across a vast viscosity range. It makes it possible to measure liquids with a viscosity even lower than water and also characterize stiff materials like polymer composites or steel by DMA – and everything in-between.
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LXI Microwave Matrix, 10GHz, Dual 3x3, Terminated With Loop-Thru
60-750-233-C
The 60-750-233-C is a dual 3x3 10GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Thermal Warpage and Strain Measurement Tool
PS200S
The TherMoir PS200S is a metrology solution that utilizes the shadow moir measurement technique combined with automated phase-stepping to characterize out-of-plane displacement forsamples up to 150 mm x 200 mm. With time-temperature profiling capability, the TherMoir PS200S captures a complete history of a sample's behavior during a user-defined thermal excursion.
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PCI Express 5 CEM Receiver Test Automation
N5991PC5A
The N5991PC5A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express 5.0 CEM Add-In Cards and systems.
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X-ray Microscopy
Xradia Family
✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
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Materials Test Systems
An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Gross Alpha/Beta Measurement Systems
Gross alpha/beta measurement is one of the simplest radioanalytical procedures which are applied widely as a screening technique in the field of radioecology, environmental monitoring and industrial applications. This procedure has been developed to determine whether radionuclide specific analysis is required to further characterize the water. Regular measurements of gross alpha and gross beta activity in water may be invaluable for early detection of radioactive contamination and indicate the need for supplemental data on concentrations of more hazardous radionuclides.
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SSA-J Precision Clock Jitter Analysis Software
E5001A
To meet the demanding needs of today's advanced digital communication systems, Keysight offers Precision Clock Jitter Analysis software (E5001A SSA-J) for more precise and accurate characterization and evaluation of clock-signal jitter.
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Particle Size Analyzers
Particle systems can be complex, but measuring them doesn’t have to be! Anton Paar offers two different technologies to characterize particles from the nanometer to the millimeter range. The Litesizer series employs light-scattering technology to determine not only particle size, but also zeta potential, transmittance, molecular mass, and the refractive index of nano- and microparticles in liquid dispersions. The PSA series uses laser diffraction technology to measure the size of particles in both liquid dispersions and dry powders in the micro and millimeter range. Side by side they open up a wide range of possibilities for comprehensive particle characterization.
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Sample Analysis Services
Postnova Analytics offers a variety of unique sample analysis services for the characterization of biopolymers, proteins, liposomes and nanoparticles. Our European Application Laboratory Center EAC and our American Application Laboratory Center AAC represent the worldwide biggest and most advanced labs offering sample analysis services based on Field-Flow Fractionation and Light Scattering.
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IV-curve Software
Tracer
In Tracer you will find your all-in-one solution for the measurement and elaboration of IV-curve measurements. Tracer is the core application developed by ReRa that will help you to characterize your solar cells and compare the results.Tracer natively supports the control of Keithley 24xx and 26xx sourcemeters.These instruments have proven their strength over time for the measurement of solar cells.
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Switches
Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
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2 Channel IV Analyzer / Source Monitor Unit
E5263A
Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.
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SSD
M.2 SSD (MLC)
Innodisk M.2 (S42) 3ME4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
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Thermal Warpage Measurement Tool
PS600S
The TherMoir PS600S is a metrology solution that utilizes the shadow moir measurement technique combined with automated phase-stepping to characterize out-of-plane displacement for samples up to 600 mm x 600 mm. With time-temperature profiling capability, the TherMoir PS600S captures a complete history of a sample's behavior during a user-defined thermal excursion.
