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PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-02
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR … test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Amplifier Characterization With Wideband Modulated Signal
N5245BV
The N5245BV provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for amplifier measurements with modulated signal such as EVM, NPR and ACPR in addition to gain, gain compression, IMD and other measurements.
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Temp Characterized CalPod, 20 GHz
85531B
CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button and without removing the DUT or re-connecting standards. Very useful in thermal chamber testing, where it is desired to remove the thermal effects of the test cables and connectors from the DUT’s response, and where it is impractical to stop the thermal testing to perform a normal re-calibration.
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ATCA 5U 6 Slot Mesh with Radial IPMB
109ATCA506-3010R
The 5U 6-slot ATCA backplane is a 3X Replicated Mesh, compliant to the PICMG 3.0 Rev 3.0 specification. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Displacement and Encoders
INCREMENTAL digital Transducers are mainly designed for displacement measurement in machine tools and other industrial applications. The sensors are characterized by high precision and are absolutely dust and waterproof. The used materials permit applications in heavy industrial environments.DISPLACEMENT Transducers are suitable for measurements of small distances up to 50mm. They are characterized by high accuracy and repeatability, reliability and fast response. Digital ENCODERS operate on optical or magnetical principal and are offered with incremental or absolute coded outputs. They are suitable for precision industrial applications.
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EV Profiler Kit V2
Harness the power of single-molecule localization microscopy to characterize EVs across scales. Quantify nanometer small, rare, and precious EV samples with super-resolution precision. ONI’s EV Profiler helps you focus on answering the right questions about your EV populations.
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Acoustic Microscope
AMI D9650
Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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DWDM High Power DFB Buttterfly Laser
CA1782-XXX-XX-BT
The CA1782-XXX-XX-BT DWDM High Power DFB Buttterfly Laser component is characterized for use as a CW optical source in CATV and DWDM networks. The CA1782-XXX-XX-BT is dc-coupled with a built-in TEC, thermistor, and monitor photodiode. The device is mounted in a 14-pin, OC-48 pinout compatible butterfly package with the optical isolator mounted on the TEC. The CA1782-XXX-XX-BT incorporates a high efficiency coupling scheme to deliver 40 mW, 50 mW, 63 mW and 100 mW of CW optical power.
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COLOSUS
The COLOSUS line of electro-optical test systems from Santa Barbara Infrared Inc. and Labsphere Inc. include collimated optics, software and uniform sources for the optical characterization of sensors and cameras.
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QE System
PVE300
The PVE300 system is a monolithic,turnkey solution for photovoltaic material and device characterization;a key component in research, or as part of a production-line quality process.
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Test Cell System
qCf FC50/125
qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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Thermal Analysis
The TORC (Thermo-optical Oscillating Refraction Characterization) technique applies decades of know-how in optical instrumentation to thermal analysis in a novel and unique way. The technique requires minimal sample preparation at maximal tolerance for sample properties. You can determine the coefficient of thermal expansion, glass and phase transitions as well as polymerization for various samples: liquids, gels, pastes, and certain solids. For example: cured and uncured resins, adhesives, glues, etc. can easily be characterized. Both thermal and time-dependent processes can be monitored with minimal effort.
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Power Transformer Automatic Test Device
XD71
Hangzhou Xihu Electronic Institute
The device is used for power transformer power outage routine test items to do automated testing.Which is characterized by dielectric loss, insulation resistance, DC resistance, tap-changer switching characteristics, short circuit impedance and variable ratio of six test items are concentrated in an instrument,so that the instrument function, test power and test lead height fusion.Field test, just start wiring once, at the end of unplugging wiring once,the middle process by the test personnel in the computer terminal to send command control,the test system automatically completes all or part of the above test items.
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PNA-X Microwave Network Analyzer, 13.5 GHz
N5241B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Probe Card
T40™ Series
Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD E-Series
The world’s most comprehensive test systems to completely characterize augmented reality, virtual reality, mixed reality, and heads-up displays (AR, VR, MR and HUDs) by truly emulating the human eye and conforming to the latest standards being developed by the IEC and SID.
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PCI Express 4 Base Specification Receiver Test Automation
N5991PB4A
The N5991PB4A is the receiver test automation software for bit error ratio testers, allowing you to test and characterize PCI Express 4.0 ASICs.
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Open Loop Current Sensor
C03 30A
The C03 offers efficient and precise sensor solutions for direct, alternating and pulsed currents in industrial, commercial and communication systems. It consists of three main components: an accurate, linear Hall sensor with low temperature drift, a flux collector and a transformer. It is characterized by a very low resistance and thus lowers power loss and temperature drift - for optimal performance.
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Thick Film Passive Element
GBR-182
GBR-182 series resistors are made in a thick film technology, on ceramic substrates (Al2O3 - 96%). Thick film resistors are characterized by a higher stability, and lower noises than a typical carbon resistors. The whole of resistor is encapsulated with epoxy resin by fluidization process. GBR-182 series elements are used both for general, and professional applications.
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PXIe-5652, 6.6 GHz RF Analog Signal Generator
781217-01
PXIe, 6.6 GHz, PXI RF Analog Signal Generator—The PXIe‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Blackbodies
Blackbodies are devices that work as near perfect emitters of thermal radiation in range from visible to microwaves. There are many blackbodies available on international market. Inframet specializes in high-tech expensive blackbodies optimized for narrow market of high requirements. All blackbodies offered by Inframet are characterized by special features.
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Radiating Comb Generators
TBCG1
The TBCG1 is a radiating comb generator with an internal antenna and a base frequency of 100MHz. It radiates a comb spectrum characterized up to 6GHz. The comb generator is built and characterized to serve as a rough reference for testing radiated noise measurement set ups in anechoic chambers, TEM/GTEM cells, shielded chambers, etc.
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PCI Express 4 U.2 Receiver Test Automation
N5991PU4A
The N5991PU4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express U.2 devices and hosts at 8 GT/s.
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Probe Card
VC20E Lab
*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes
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Active Device Characterization Solution Up To 43.5 GHz For 5G
N5244BM
The N5244BM provides the N5244B 43.5 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 43.5 GHz for 5G applications.
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ThermalAir Series Temperature Forcing System
ThermalAir TA-1000B Rack Mount Test System
The ThermalAir TA-1000B high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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Low Voltage Differential Oscilloscope Probes
Differential signaling used in high speed serial standards requires very accurate characterization. The industry-leading bandwidth and signal fidelity found in a Tektronix low voltage differential oscilloscope probe ensures that you see every possible detail. Tektronix offers TriMode™ architecture which streamlines measurement acquisition by enabling you to make differential, single-ended, and common mode measurements with a single connection!
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LED solar simulators
We offer innovative A + A + A + LED solar simulators for the integration of the production process and for the stand-alone operation in the laboratory or goods receipt. Our LED solar simulators are characterized by maximum repeatability, a long pulse duration and very low maintenance.
