Scattering
a propagating wave or moving particle's linear trajectory, interrupted by non-uniformity in the medium they move through.
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Dynamic Light Scattering (DLS)
NANOTRAC
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Dynamic Light Scattering (DLS) is an established and precise measurement technique for the characterization of particle sizes in suspensions and emulsions. Microtrac is a pioneer of particle analysis technology and has been developing optical systems based on Dynamic Light Scattering for over 30 years.
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Small-Angle X-Ray Scattering (SAXS) Products
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Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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Multi-Angle Light Scattering Detectors
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Since the 1990s Postnova has been a leading innovator and developer of special advanced online Light Scattering solutions for coupling with chromatographic separation systems. The first model was the PD2000 - Static Light Scattering detector for coupling with Asymmetric Flow FFF. Later on the models PN3020 SLS and PN3070 MALS have been launched. Based on these over two decades of practical experience, Postnova has collected a unique competence in the area of Laser Light Scattering and has developed the unique PN3621 MALS - Multi-Angle Light Scattering detector series. The model PN3621 MALS is a completely new type of high performance MALS detector system with a unique range of specifications.
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Multi-angle Polarized Light Scattering Measurements
LISST-VSF
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The LISST-VSF covers the angular range from 0.094 to 150°. Of this, the range 0.094 to 14.9° is covered with Sequoia’s 32-ring detector optics as in the LISST-200X. From 15 to 150° scattering from the length of a laser is viewed by a rotating eyeball. These data produce P12 and a noisy estimate of P22 (no P22 estimate at 45 and 135°).
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Laser Scattering Particle Size Distribution Analyzer
Partica mini LA-350
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HORIBA's new LA-350 Laser Diffraction Particle Size Distribution Analyzer is the ideal combination of performance, price, and packaging. The LA-350 excels in applications as diverse as slurries, minerals, and paper chemistry. Based on the advanced optical design of previous LA-series analyzers, the LA-350 strikes a harmonious balance between high-functionality, easy operation, low maintenance, and cost-effectiveness.Bench space is used efficiently due to the LA-350’s compact size (297 mm x 420 mm). The clever design and precision, high quality manufacturing ensure convenient, reliable operation and accurate results, now with a wider size range (0.1-1,000 µm).
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Benchtop Small Angle X-ray Scattering (SAXS) Instrument
NANOPIX mini
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Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
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Evaporative Light Scattering Detector for HPLC
ELSD-LT III
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The evaporative light scattering detector (ELSD) is a general-purpose universal detector that can even detect components with no UV absorption, such as carbohydrates, lipids, surfactants, and synthetic polymers. With exceptional sensitivity, a wide dynamic range through Analytical Intelligence features, and easy operability using LabSolutions™ software, the ELSD-LT III contributes to more effective analysis in a wide variety of fields.
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Nephelometric Turbidity Sensor
DTF16
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The DTF16 is a high 3 channel turbidity sensor for installation into pipelines, measuring turbidity at two angles of scattered light and a direct reference channel in various liquid flow streams.
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Product
L-Band Separate Raman Fiber Amplifier
RFA6000
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Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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Viscometer
ViscoStar III
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A highly sensitive, on-line differential viscometer used in conjunction with SEC-MALS to determine the size and conformation of all types of biopolymers, synthetic polymers and even proteins and peptides. The ViscoStar III incorporates multiple novel technologies to provide the highest sensitivity, stability and solvent compatibility of any available viscometer for GPC. Its ease-of-use and serviceability make it the perfect companion for Wyatt's DAWN HELEOS II light scattering and Optilab T-rEX refractive index detectors.
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TSS Meter
LD-LTSS-A10
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TSS meterLD-LTSS-A10is a tabletop meter with a dual-beam infrared scattered light photometerdetection system for enhanced stability. Built-in self-diagnosis function to ensure dataaccuracy. Optional cleaning brush for automate cleansing function to reduce the sensormaintenance.
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Profiling Current Meter and Wave
SeaGuardII DCP Wave
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The SeaGuardII DCP Wave is a 600kHz Doppler Current Profiler able to measure directional wave parameters and currents from a bottom mounted installation.The Acoustic Wave software 5759 used by the DCPS implements unique features to improve the wave measurement accuracy by optimizing the signal to noise ratio.Maximum deployment depth is 40m in normal scatter conditions. The Profiling Current Meter and Waveis available as a self-recording instrument. It can be easily integrated into a real-time system offering reliable two-way communication.
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Product
Network OTDR
NFO series
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The NFO OTDR unit injects the laser pulse into the fiber under test and picks up scattered and reflected optical signals by an avalanche photodiode (APD). The unit accepts remote commands from Internet to control all related timing and data acquisition processes. Maximal three wavelengths are available at the NFO with options on 1310, 1490, 1550, and 1625 nm. NFO also has options on dynamic ranges so users can select the most cost effective units for their demands. Radiantech provides an easy use API (Application Program Interface) for NFO so users can design and build their own AP for NFO. Standard NFO API package is for Windows XP or higher. Please contact Radiantech’s sales person to inquire API for another OS.
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Evaporative Light Scattering Detector
ELSD-LTII
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The ELSD-LTII utilizes a high-efficiency LED and enhanced digital signal treatment to minimize noise and deliver optimum sensitivity for trace analysis. An innovative cell design also reduces band broadening and allows sensitivity levels below 200 picograms. The high-performance optical detection system can also be used for combinatorial chemistry and high-throughput screening applications. The new Low Temperature Evaporative Light Scattering Detector (ELSD-LTII) is an easy-to-operate, universal detector that identifies analytes with uniform sensitivity regardless of their spectroscopic properties. It is not a spectroscopic detector. Instead, it removes the mobile phase through evaporation and then makes a light scattering measurement of the dried analyte particles.
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Fusion Splicer
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Shaanxi Aitelong Technology Co., Ltd
Fusion splicing is the act of joining two optical fibers end-to-end. The goal is to fuse the two fibers together in such a way that light passing through the fibers is not scattered or reflected back by the splice, and so that the splice and the region surrounding it are almost as strong as the intact fiber.
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Isolators
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Optical isolators transmit light in only one direction. These devices are especially beneficial in preventing back-reflection and scattered light from reaching sensitive components such as lasers.
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Static Multiple Light Scattering (SMLS)
TURBISCAN
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Static Multiple Light Scattering (SMLS) is an optical method that allows for the direct characterization of native concentrated liquid dispersions. Microtrac’s TURBISCAN range uses this technology to provide accurate and rapid results. TURBISCAN was the first patented technology to provide tools that allow accelerated aging tests on unstressed products, thus becoming a reference for direct stability characterization technology.
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Field-installation Type Turbidity Meter (Four-Wire Transmission, High-sensitivity)
HU-200TB-H
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HU-200TB-H connects flow-through type turbidity sensor (SS-120-H) and measures turbidity. It accurately measures turbidity in the range of low to medium concentration (10 degrees) by the 90-degree transmission scattering method with less stray light.Optimal for control and monitoring of wastewater treatment and production processes.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Present Weather Sensors
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Bristol Industrial & Research Associates Ltd
Biral forward scatter Present Weather Sensors measure visibility and report precipitation type and intensity. These compact sensors can identify a wide range of precipitation types including drizzle, rain, snow, hail, freezing rain and other forms of frozen precipitation. Precipitation type is reported using a combination of WMO Table 4680 and METAR codes. The range of precipitation types identified varies with sensor model.
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Diffractometers & Scattering Systems
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Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
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Application Specific LC System
Reducing Sugar Analysis System
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The Nexera reducing sugar analysis system uses Shimadzu’s unique post-column boric acid-arginine fluorescence derivatization method. Unlike the refractive index detectors and evaporative light scattering detectors (ELSD) commonly used for sugar analysis, this system reduces the effects of impurities and offers both high sensitivity and a wide dynamic range. As a result, sugars contained in samples can be analyzed simultaneously, without dilution even when there are significant concentration differences.
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Turbidity Meter
TF16-N
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The TF16-N is a high precision turbidity meter for installation into pipelines measuring scattered and unscattered light at two independent angles in various liquid process streams. The ratio of scattered to un-scattered light can then be correlated.
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Turbidity Sensors
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Turbidity sensors measure the amount of light that is scattered by the suspended solids in water. As the amount of total suspended solids (TSS) in water increases, the water's turbidity level (and cloudiness or haziness) increases. Turbidity sensors are used in river and stream gaging, wastewater and effluent measurements, control instrumentation for settling ponds, sediment transport research, and laboratory measurements.
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Raman Spectroscopy
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Raman is a spectroscopic technique that uses laser light to interact with molecular excitations and determine what a substance or element is composed of. It relies upon the inelastic scattering of photons which produces a weak signal, making the collection of information challenging particularly when the substance to be measured is at distance or can only be given short exposure times. Our Raman spectrometers are particularly effective at making Raman measurements due to their configuration which delivers a higher throughput/etendue than standard instruments.
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PCI Card with 8 output channels
PCI_LVDS_8T
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The PCI-LVDS-8T PCI card has 8 channels of LVDS output (8T), digital filtering and storage. The PCI-LVDS-8T is compatible with TIA/EIA-644 LVDS standards. The card features "Scatter gather" DMA data transfer into the transmit memories.
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X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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NDT Wedges
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Rexolite or perspex wedges incorporate a pyramidal scattering surface with an impedance matched acoustic absorber to minimise internal reflections within the wedge.
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OEM Solutions
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Headwall-manufactured gratings, spectrographs, and spectrometers maximize the quality of UV-VIS-NIR analysis. Each grating is an original piece, unmarred by replication processes. These master-quality gratings feature superior spectral and spatial resolution and extremely low scatter, meeting the demands of your high-performance instrument. We have more than 40 years of experience producing gratings and spectral engines for ourselves and for our OEM customers.
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Bending Deflectometers For ISO 178, JIS K 7171, And ASTM D790 Compliant Testing
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After tensile testing, flexural tests are the most common strength tests for plastics and other resins. The main standards for plastic flexural (bend) tests are ISO 178, JIS K 7171, and ASTM D790, which require very accurate test systems. These standards include flexural strain measurements using a deflectometer, ranging from micro-strain measurements in the elastic region, the reversible elongation at the beginning of tests, to larger strain measurements in the plastic region. Shimadzu's deflectometers integrate easily into AG-X plus series, AGS-X series, and EZ-X test frames and Trapezium X testing software. Since these deflectometers push up against the specimen from below, the specimen color is not a limiting factor, as can be for laser type non-contact deflectometers. Furthermore, these deflectometers can partially absorb the shock during specimen failure, preventing specimen fragments from scattering.
