Scattering
a propagating wave or moving particle's linear trajectory, interrupted by non-uniformity in the medium they move through.
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Dynamic Light Scattering (DLS)
NANOTRAC
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Dynamic Light Scattering (DLS) is an established and precise measurement technique for the characterization of particle sizes in suspensions and emulsions. Microtrac is a pioneer of particle analysis technology and has been developing optical systems based on Dynamic Light Scattering for over 30 years.
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Neutron Scattering and Beamline Systems
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For optical, neutron and particle beam experiments, Cryogenic offers a range of split pair magnets. These allow strong magnetic fields to be produced in a small volume with maximum access to the working space. Split pair coils can be mounted to provide either a vertical field with horizontal access or a horizontal field offering horizontal or vertical access.
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Small-Angle X-Ray Scattering (SAXS) Products
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Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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Evaporative Light Scattering Detector
ELSD-LTII
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The ELSD-LTII utilizes a high-efficiency LED and enhanced digital signal treatment to minimize noise and deliver optimum sensitivity for trace analysis. An innovative cell design also reduces band broadening and allows sensitivity levels below 200 picograms. The high-performance optical detection system can also be used for combinatorial chemistry and high-throughput screening applications. The new Low Temperature Evaporative Light Scattering Detector (ELSD-LTII) is an easy-to-operate, universal detector that identifies analytes with uniform sensitivity regardless of their spectroscopic properties. It is not a spectroscopic detector. Instead, it removes the mobile phase through evaporation and then makes a light scattering measurement of the dried analyte particles.
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Benchtop Small Angle X-ray Scattering (SAXS) Instrument
NANOPIX mini
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Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
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Laser Scattering Particle Size Distribution Analyzer
Partica LA-960V2
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This latest evolution in the LA series advances scientific knowledge for tomorrow's world through intuitive software, unique accessories, and high performance.The LA-960V2 continues HORIBA's proud tradition of leading the industry with innovative design.
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Multi-Angle Light Scattering Detectors
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Since the 1990s Postnova has been a leading innovator and developer of special advanced online Light Scattering solutions for coupling with chromatographic separation systems. The first model was the PD2000 - Static Light Scattering detector for coupling with Asymmetric Flow FFF. Later on the models PN3020 SLS and PN3070 MALS have been launched. Based on these over two decades of practical experience, Postnova has collected a unique competence in the area of Laser Light Scattering and has developed the unique PN3621 MALS - Multi-Angle Light Scattering detector series. The model PN3621 MALS is a completely new type of high performance MALS detector system with a unique range of specifications.
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Diffractometers & Scattering Systems
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Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
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SERS (Surface Enhanced Raman Scattering) Substrate & SERS Reader – Mini Chemistry Analytic Pack
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The porous carbon SERS substrate provides not only high signal enhancement due to its strong broadband charge-transfer resonance for large chemical enhancement (as opposed to electromagnetic enhancement in traditional metal-based SERS substrates), but also extraordinarily high reproducibility or substrate-to-substrate, spot-to-spot, sample-to-sample, and time-to-time consistency in SERS spectrum (which is not possible with traditional metal-based SERS) due to the absence of "electromagnetic hot spots" by making the entire surface of the substrate "chemically hot", high durability due to no oxidization, and high compatibility to biomolecules due to its fluorescence quenching capability.
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Multi-angle Polarized Light Scattering Measurements
LISST-VSF
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The LISST-VSF covers the angular range from 0.094 to 150°. Of this, the range 0.094 to 14.9° is covered with Sequoia’s 32-ring detector optics as in the LISST-200X. From 15 to 150° scattering from the length of a laser is viewed by a rotating eyeball. These data produce P12 and a noisy estimate of P22 (no P22 estimate at 45 and 135°).
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NDT Wedges
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Rexolite or perspex wedges incorporate a pyramidal scattering surface with an impedance matched acoustic absorber to minimise internal reflections within the wedge.
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3D Electromagnetic Simulation Software
XFdtd®
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A full-featured simulation solver, XFdtd outpaces other methods in efficiency as the number of unknowns increases. XF includes full-wave, static, bio-thermal, optimization, and circuit solvers to tackle a wide variety of applications, including antenna design and placement, biomedical and SAR, EMI/EMC, microwave devices, radar and scattering, automotive radar, and more. It also works with Remcom's ray-tracing products to provide thorough simulation capability at the low-, middle-, and high-end of the electromagnetic spectrum.
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Sample Analysis Services
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Postnova Analytics offers a variety of unique sample analysis services for the characterization of biopolymers, proteins, liposomes and nanoparticles. Our European Application Laboratory Center EAC and our American Application Laboratory Center AAC represent the worldwide biggest and most advanced labs offering sample analysis services based on Field-Flow Fractionation and Light Scattering.
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Gloss & Reflectance
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Visual appearance can determine a person’s perception of a product. Colour and Gloss are two key parameters that are used to define a product’s overall quality. Perception is subjective, but Elcometer’s range of gloss meters, DOI meters and colour assessment equipment can quantify appearance measurement. The ability of a surface to reflect light without scattering is known as gloss. Using a gloss meter, gloss is measured by directing a constant intensity light beam at a fixed angle to the test surface and then by monitoring the amount of reflected light at the same angle. Different surfaces require different reflective angles.
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Vector Network Analyzer
SNA5000A
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The SIGLENT SNA5000A series of Vector Network Analyzers have a frequency range of 9 kHz to 8.5 GHz, with 2 and 4 port models available. Designed to give you instant insight into scattering, differential, and time-domain measurements. They are effective instrumentation for determining the Q-factor, bandwidth, and insertion loss filters and feature impedance conversion, movement of measurement plane, limit testing, ripple test, fixture simulation, and adapter removal/insertion adjustments. There are five sweep types: Linear-Frequency, Log-Frequency, Power-Sweep, CW-Time, and Segment-Sweep mode. The SNA5000A series VNAs also support scattering-parameter correction of SOLT, SOLR, TRL, Response, and Enhanced Response for increased flexibility in R&D and manufacturing applications.
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Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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TSS Meter
LD-LTSS-A10
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TSS meterLD-LTSS-A10is a tabletop meter with a dual-beam infrared scattered light photometerdetection system for enhanced stability. Built-in self-diagnosis function to ensure dataaccuracy. Optional cleaning brush for automate cleansing function to reduce the sensormaintenance.
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UltraScan VIS Spectrophotometer
Spectrometer
Hunter Associates Laboratory, Inc.
The UltraScan VIS easily measures both reflected and transmitted color as well as transmission haze and meets CIE, ASTM and USP guidelines for accurate color measurement. UltraScan VIS uses diffuse/8° geometry with automated specular component inclusion/exclusion. For transmission measurement, the use of a robust CIE-conforming sphere instrument (TTRAN Total Transmission mode) effectively negates the effects of minor scattering typically found in transparent samples.
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Deep Submersible Particle Size Analyzer
LISST-Deep
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The LISST-DEEP instrument obtains in-situ measurements of particle size distribution, optical transmission, and the optical volume scattering function (VSF). Using a red 670nm diode laser and a custom silicon detector, small-angle scattering from suspended particles is sensed at 32 specific log-spaced angle ranges. This measurement is post-processed to obtain sediment size distribution, volume concentration, optical transmission, and VSF. The electronics and optical configuration in the LISST-DEEP are very similar to Sequoia’s workhorse, the LISST- 100X. However, because of the extreme difficulty associated with keepingalignment under high pressure, the LISSTDEEP hardware design is radically different from the LISST-100X. This allows the LISST-DEEP to be deployed down to 3000 m and obtain reliable measurements of the in situ particle size distribution and volume concentration in waters with optical transmission up to 98.5%.
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Optical Time Domain Reflectometers
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An optical time domain reflectometer (OTDR) is a precision instrument used to locate events or faults along a fiber link, typically within an optical communications network. The OTDR launches a series of high speed optical pulses into the fiber to be measured. Various events on the fiber generates a Rayleigh back scatter that returns to the OTDR and the strength of the return pulses are measured and integrated as a function of time, and plotted as a function of fiber length. The horizontal axis is the distance and the vertical axis is the loss.
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OEM Solutions
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Headwall-manufactured gratings, spectrographs, and spectrometers maximize the quality of UV-VIS-NIR analysis. Each grating is an original piece, unmarred by replication processes. These master-quality gratings feature superior spectral and spatial resolution and extremely low scatter, meeting the demands of your high-performance instrument. We have more than 40 years of experience producing gratings and spectral engines for ourselves and for our OEM customers.
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Optical VSF Sensors
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The optical Volume Scattering Function(VSF) is an ‘inherent optical property’ of water that is used by optical oceanographers to predict light propagation, image degradation, remote sensed ocean color, biological environment etc. in water.
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C-Band Separate Raman Fiber Amplifier
RFA5000
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Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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Profiling Current Meter and Wave
SeaGuardII DCP Wave
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The SeaGuardII DCP Wave is a 600kHz Doppler Current Profiler able to measure directional wave parameters and currents from a bottom mounted installation.The Acoustic Wave software 5759 used by the DCPS implements unique features to improve the wave measurement accuracy by optimizing the signal to noise ratio.Maximum deployment depth is 40m in normal scatter conditions. The Profiling Current Meter and Waveis available as a self-recording instrument. It can be easily integrated into a real-time system offering reliable two-way communication.
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Laser Turbidity Meter
HU-200TB-EH
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HU-200TB-EH is a laser-type turbidity meter that can measure turbidity of membrane filtered water, etc. with a resolution of 0.0001 degrees. A high-sensitivity turbidty meter with a minimum resolution of 0.0001 degrees at a measurement range of 0.0000 to 2.0000 degrees, which uses a long-lasting semiconductor laser as the light source and employs a transmission 90-degree scattering light method.This is best suited for sensitive measurement of turbidity on surface water.
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Measuring Stations
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In cooperation with important customers in the automotive industry, medical engineering, mechanical engineering, and the semiconductor industry, OptoSurf has developed measuring devices that enable scattered light to be used for production purposes as well as in R&D and universities.
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Particle Size Analyzers
NanoBrook Series
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Brookhaven Instruments Corporation
Rapid and accurate protein & nanoparticle size distributionsMultimodal & unimodal size distribution softwareISO 13321 and ISO 22412 compliant resultsRange: < 0.3 nm to 10 mThree measurement angles: 15, 90, and 173Ideal for fast, routine sizing applications in research or quality controlHigh power 35 mW diode laserDynamic light scattering at 173 and 90Temperature control, -5 C to 110 CCompact bench top unit, USB connectionMolecular weight determination (relative and absolute through Debye plot)
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Laboratory And Analysis Systems
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High performance UV-VIS-IR spectrophotometer with superb optical performance for the determination of spectral absorption coefficient and spectral effective scattering coefficients
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Water Treatment Plant Analyzer
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Aqualog® is the only instrument to simultaneously measure both absorbance spectra and fluorescence Excitation-Emission Matrices. EEMs are acquired up to a 100 times faster than with other instruments. Dedicated software automates traceable Quinine Sulfate Unit calibration and correction of inner-filter effects and Rayleigh and Raman scattering lines, enabling rapid export to modeling algorithms like PARAFAC.
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Physical Contact Connectors
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Amphenol Fiber Systems International
Physical Contact (PC) connections are characterized by the physical mating of two optical fibers. Precision ceramic ferrules are typically utilized for PC connections. A PC connection is accomplished by terminating the optical fiber into a precision ceramic ferrule. Epoxy is used to affix the fiber into the ferrule. The tip of the ceramic ferrule is polished in a precise manner to ensure that light enters and exits at a known trajectory with little scattering or optical loss. Polishing the terminated ceramic ferrule is a critical process in Physical Contact fiber optic connectors.
