Memory Test Systems
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Product
Standalone Test System
1000 Series ATE
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The Circuit Check 1000 Series ATE provides a configurable standard platform that can utilize multiple mass interconnect interfaces while providing ease of maintenance and the ability to accept a wide variety of test fixture solutions. With the 1000 Series ATE, test procedures become automatic, with test steps and go/no-go limits easily programmable.
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Product
Automated Test Systems
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Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Product
Timing, Logic & Memory
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Offering an extensive portfolio of products for programmable clocks, clock generation and distribution, standard logic and memory (Flash, EEPROM and SRAM) across various applications.
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Product
Telecom Test Systems
4301 Series
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The 4301 is designed to work with a standard arbitrary wave form generator or signal source that can be triggered. The system can be ordered with an optional Fluke 281 arbitrary waveform generator, which comes pre-programmed and integrated into the 4301 system. When equipped with the Fluke 281 option, the 4301 provides a complete solution for GR-1089 Section 10/ATIS-0600315.2007 testing.
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Product
Mezzanine System
5676
System
The Abaco SystemsP/N 5676 ECM module provides eight channels of 16 bit voltage measurement in the 0 to 2.5V volt range. For each channel the common mode voltage range is -100 volts to +100 volts.
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Product
Mezzanine System
5047
System
The 5047 provides breakout of all ECM signals for debug, design validation and development. Plated through holes on the PCB allow soldering of probe wires to IO, Data, Power and Serial Identification signals. LEDs indicate presence of 3V, 5V, +12V, -12V and Ground. Elevates the ECM module by 2 mm and saves wear on the ECM carrier board connectors. Since this is a debug too there is no serial identification circuit.
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Product
Low Voltage Test System
CKT T1
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The CKT T1 is a compact size solid-state test system featuring 128 test points.
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Product
EFT Module for Teststand
test
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
Tan Delta Test System
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Precision measuring bridge is designed for determining the capacitance and dielectric dissipation factor of liquid and solid insulants, cables, capacitors, line transformers, generators, motors, bushings etc. Furthermore it can also be used for power loss measurement on shunt reactors or similar apparatus. This system is suitable for both low and high voltage measurement at line frequency. Measurement reports can be printed. This measuring equipment has been specially developed to maximise efficiency in production and quality control environments. Its outstanding accuracy also makes it suitable for laboratory and research applications.
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Product
Audio and Acoustic Functional Test Solution
Functional Test
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
EMS Test System
TS9982
Test System
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
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Product
Memory Test Software
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Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Product
Electrodynamic Vibration Test Systems
DC-series
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Depending on the reference PSD or other operating conditions such as the specimen, one part of the controlled response may deviate from the reference PSD
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Product
Handheld Test Systems
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Lightweight and easy to use handheld test systems designed with a plug and play approach, ideal when operating on site or close quarters.
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Product
Battery Test Systems
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The Intepro’s battery test systems are configurable systems designed to test the latest Lithium Ion batteries and other high power density batteries and chargers. Combining high resolution, high powered charge and discharge systems, Intepro IBT line of battery test systems link to the battery management through the bus communication and fail-safe external monitoring of key battery parameters.
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Product
Automated Testing System
PV-LIT
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Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects
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Product
Circuit Breaker Test Systems
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Crest has over a decade of experience of designing and manufacturing test systems for testing all the different kinds of switchgear and controlgear.
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Product
Configurable Data-Logging System
NI CompactDAQ
Data Acquisition System
This NI CompactDAQ configurable data-logging system includes an NI CompactDAQ controller or chassis, C Series I/O modules, and Chameleon software. It is designed for structural test and monitoring applications with the NI CompactDAQ controller, which includes built-in processing and nonvolatile storage for running Chameleon software and logging data locally. Alternatively, you can choose a USB or Ethernet chassis for a lower cost system that requires an external PC. This system accepts a variety of C Series I/O modules, so you can mix and match microphones, accelerometers, and temperature and bridge-based sensors.
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Product
PIM Test Systems
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AWT's Portable PIM testers are powerful yet compact tools for testing and analyzing telecommunications network infrastructure. These testers are ruggedized and can withstand harsh environmental conditions. they are accurate, reliable and easy to operate and they provide a wealth of features ideal for work in the field. Built-in Distance-to-PIM option.
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Product
Memory
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Renesas offers MIL-STD-883-compliant CMOS random access memory (RAM) and CMOS programmable read-only memory (PROM) devices that are that are qualified to QML Class Q military standards.
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Product
Power mixed test system
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Power device or module with which are digitally controlled and memory can be measured per system.
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Phase Noise Test System
PN9000 System
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Noise eXtended Technologies S.A.S.
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a NIST tested instrument.
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Product
SR/QE Testing System
PVE300
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Industrial Vision Technology Pte Ltd.
Solar Cell Multi-function SR/QE Testing System is specially designed for Photovoltaic Industry to characterize the Optical Performance of Raw material, process wafer, finished solar cell, as well as small Module.
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Product
Ferroelectric Test System
RT66B
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Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
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Product
Manufacturing Test Only System
MTO
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The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Product
Test Systems Integration
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Highly flexible test solutions that are cost effective offering basic tests that easily adapts to high product volumes and complicated tests. Mobile computer based test stations provide a wide variety of test solutions at efficient costs.
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Product
Test System
NFC Xplorer
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The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Product
The All-In-One Noise Test System
NXA Series
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Noise eXtended Technologies S.A.S.
The NXA is a fully automated Phase Noise analyzer. Its dual channel architecture allows the system to use a cross-correlation process to cancel its internal noise floor. This reliable technique provides access to the unique noise floor performance of the DCNTS.
