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Product
DC SQUID System
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Quantum Design's patented high-symmetry SQUID design and electronics provide the most rugged and sensitive all-thin-film sensors commercially available, and give you everything you need to configure flexible, powerful detection systems for your research. These sensors can easily withstand the rigors of a laboratory environment such as repeated temperature cycling. Their robust performance offers a level of reliability and adaptability that has earned QD a worldwide reputation as the SQUID of choice. OEM services are also available for special commercial applications.
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Thin-Film Thickness Measurement Systems
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The Filmetrics® range of affordable reflectometers deliver high-precision thin-film thickness measurements in seconds. These easy-to-use tools, combined with intelligent software and a broad range of accessories and configurations, provide maximum versatility in film thickness measurements ranging from 1nm to 3mm.
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ALD For Manufacturing And Production
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Uniformity over large substrates, reproducibility, and low temperature deposition make ALD an ideal candidate for the next generation of large-scale manufacturing thin film technology.
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Heat Shrinkage Tester
RSY-01
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Film Shrinkage tester, known as free shrink tester, is used for analyzing the effect of temperature on heatshrinkable films made from polyethylene, ethylene copolymers and their mixtures.
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Product
Spectroradiometer
SpectraScan® PR-735
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The SpectraScan® Spectroradiometer PR-735 is JADAK’s enhanced sensitivity portable solution for spectral based photometric and colorimetric light measurements, designed for applications requiring precise light measurements from a range of light sources, such as display monitors and projectors, reflective surfaces, and industrial applications (visual display testing, LED testing, film and video post-production, auto/aerospace displays, and dental color testing).
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Product
Non-Contact Digital Video Extensometer
TRViewX
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TRViewX is an advanced non-contact extensometer that offers high-measurement accuracy, is capable of measuring width changes, and is applicable to a wide variety of materials testing applications. In particular, due to the non-contact design, TRViewX is perfect for measuring films, foils, and other thin or narrow materials without affecting the specimen during testing. Furthermore, TRViewX can be used to measure displacements during atmosphere-controlled testing in a thermostatic chamber. TRViewX provides high-accuracy measurements in accordance with ISO 9513 Class 0.5 and JIS B 7741 Class 0.5 for elongation measurements and ISO 9513 Class 1 and JIS B 7741 Class 1 for width measurements. It is compliant with plastic tensile testing standards, including ISO 527, JIS K7161, and ASTM D638, even supporting 75 mm gauge length specimens (type A1 specimens) specified in ISO 527 and JIS K 7161.
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Product
6-Axis Robotic Automated Testing System
AT6
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The Instron AT6 is a flexible, robot-assisted testing solution featuring six axes of motion, purpose-built to automate tensile, compression, flexural, and lap shear testing in alignment with widely used ASTM and ISO standards. Its modular design accommodates a broad array of materials—including metals, polymers, elastomers, films, composites, and sutures—at force capacities up to 600 kN. Capable of processing up to 500 specimens without operator intervention, the AT6 enables true unattended or “lights-out” operation, significantly increasing throughput around the clock. Optional modules include stations for specimen measurement, automated strain measurement, environmental temperature chambers, and multiple test frames for simultaneous testing. The system also integrates smoothly with auxiliary devices such as durometers, hardness testers, and surface roughness testers, making it a robust solution for high-volume, high-efficiency testing environments.
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Product
ACCUplace BullsEye /Recognition Grid
AP-B Series
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A unique concept in imaging calibration technology, The ACCUplace Bulls Eye / Recognition Grid allows the end user to calibrate magnification at multiple power levels, as well as test the system’s ability to recognize and locate distinctive shapes within shapes by focusing on the concentric circles.Each Bulls Eye / Recognition Grid target has individual patterns consisting of 5 concentric circles with 0.50mm line width and 0.50mm spacing between circles (10mm Pitch) with a 0.100mm center dot. In addition, each row and column is labeled with X & Y coordinates. The AP-B series is offered on four standard substrates; Chrome on Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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Product
Ceramic Process Carrier Pallets
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Ceramic engineering specializing in Silicon Carbide, Boron Carbide, Alumina, Zirconia and Lead Zirconate Titanate (PZT) based ceramics, composites and thin films for High Strength, high temperature, semiconductive ceramic designed for use in wafer fabrication or hybrid circuits in vapor deposite ovens. Test Electronics will precision drill and customize pallets for your circuit board. Click on the Quote tab on the left then click on the Carrier Pallets tab to get an instant quotation on your process carrier pallets.
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Product
Salt Spray Test Chambers
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Labodam salt spray test chambers are reliable instruments for testing the corrosion resistivity of products with painted, organic, or inorganic film surface.
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Product
Spectroscopic Ellipsometry
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Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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Product
Transmission Hazemeter
Novo-Haze TX
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The Novo-Haze TX Transmission Hazemeter offers fast and accurate measurement of the optical quality of plastic films and other transparent materials. This instrument measures total transmission and haze according to ASTM D1003 (CIE C), the most important standard used in most QA applications.
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Product
Wide Range Film Inspection
790
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For a wide range of coatings the easy-carry and easy to handle SPY Model 790 speeds inspection time with its built in Jeep meter and various other time saving and comfort features
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Product
Film Thickness Probe
FTPadv
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The SE 500adv combines ellipsometry and reflectometry to eliminate the ambiguity of measuring layer thickness of transparent films. It extends the measureable thickness to 25 µm. Therefore the SE 500adv extends the capability of the standard laser ellipsometer SE 400adv especially for analyzing thicker films of dielectrics, organic materials, photoresists, silicon, and polysilicon.
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Product
Scanning Auger Nanoprobe
PHI 710
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The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
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Product
Materials Metrology
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Nova is a market leader for innovative thin film metrology and process control technologies. We develop highly sensitive in-line metrology solutions on high productivity platforms, thereby enabling critical metrology solutions to be closer to a semiconductor fab’s process and integration needs.Our technologies enable customers to accurately detect and quantify small variations in film composition and thickness, thereby influencing better device functionality, and improved manufacturing yield.
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Product
Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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Product
CD Measurement and Advanced Film Analysis
FilmTek CD
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Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
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Product
Automated Testing Systems
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Instron’s automated testing systems bring precision, productivity, and safety to materials testing by automating routine tensile, flexural, and compression operations. Available as full turnkey platforms or modular add-ons for existing test frames, these systems — including the AT3 three-axis, AT6 six-axis robotic, AT2 automated XY stages, CT6 cobot integration, and carousel stations — allow labs to boost throughput, reduce operator variability, and free up staff for higher-value activities. The systems are engineered to support a wide spectrum of materials (plastics, metals, films, composites, medical devices) and comply with international ASTM and ISO test standards while enhancing repeatability and workflow efficiency.
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Product
microRSP
M200
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The window of acceptable sheet resistance is shrinking with each technology node resulting in increasingly more rigorous standards for scale and accuracy of metrology tools. The shortcomings of traditional types of 4 point probes are becoming more and more evident. By developing the microRSP-M200, a unique tool for measuring the sheet resistance of conducting films, hereunder ultra shallow junctions (USJ’s), CAPRES A/S has responded to the growing need for reliable sheet resistance measurements on micro scale.
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Product
Dynamic Ultra Micro Hardness Tester
DUH-210/DUH-210S
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A new evaluation system for measuring the material strength of micro regions, such as semiconductors, LSI, ceramics, hard disks, vapor deposited films, and thin coating layers, not addressed by previous hardness testers. It can also be used to evaluate the hardness of plastics and rubbers. This instrument uniquely measures dynamic indentation depth, not the indentation after the test. This in turn permits measurement of very thin films and surface (treatment) layers that are impossible to measure with conventional methods. Additionally, this same method supplies the data needed to calculate elastic modulus on the test specimens.
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Product
COATING THICKNESS GAGES
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Coating thickness or dry film thickness (DFT) is an important variable that plays a role in product quality, process control, and cost control. Measurement of film thickness can be accomplished by selecting the best mil gage for the particular application.
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Product
Anti Static Bars
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Static bars, also known as, static eliminators or anti static bars, are a very cost effective way to remove static electricity on a web of material in a plastics, paper, glass, textile, and or film converting applications. All of these static bars are bi-polar ionization generators (produce both positive and negative ionization) to remove static electricity. Remember - A clean static bar is more effective.
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Product
100GHz/200GHz DWDM Module in LGX Box
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Flyin Optronics’ 100GHz/200 GHz dense wavelength division multiplexer (DWDM module) utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging to achieve optical add and drop at the ITU wavelengths. It provides ITU channel center wavelength, low insertion loss, high channel isolation, wide pass band, low temperature sensitivity and epoxy free optical path . It can be used for wavelength add/drop in telecommunication network system.
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Product
Spectroradiometer
Spectrascan® PR 788
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The SpectraScan® Spectroradiometer PR-788 Extended Dynamic Range is JADAK’s ultra-sensitivity portable solution for spectral based photometric and colorimetric light measurements, designed for applications requiring precise light measurements from a range of light sources, such as display monitors and projectors, reflective surfaces, and industrial applications (visual display testing, LED testing, film and video post-production, auto/aerospace displays, and dental color testing).
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Product
Spectroscopic Ellipsometers
SENresearch 4.0
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The SENresearch 4.0 is the new SENTECH spectroscopic ellipsometer. Every individual SENresearch 4.0 spectroscopic ellipsometer is a customer-specific configuration of spectral range, options and field upgradable accessories. SENresearch 4.0 uses fast FTIR ellipsometry for the NIR up to 2,500 nm or 3,500 nm, respectively. It provides broadest spectral range with best S/N ratio and highest, selectable spectral resolution. Silicon films up to 200 µm thickness can be measured. The measurement speed of FTIR ellipsometry compares to diode array configurations, which are also selectable up to 1,700 nm. The new motorized Pyramid Goniometer features an angle range from 20 deg to 100 deg. Optical encoders ensure highest precision and long term stability of angle settings. The spectroscopic ellipsometer arms can be moved independently for scatterometry and angle resolved transmission measurements.
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Product
Pure Boron Foils
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MICROMATTER™ boron foils are also produced by laser plasma ablation; however, the deposition process is much more complex and time consuming than that for diamond-like carbon. Accordingly, only thin films, mainly designed for beam stripping of heavy ions in electrostatic accelerators, are available. All films are generally delivered on glass substrates coated with a release agent.
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Product
Coordinate Measuring Machines
FlatScope
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Perfect for the measurement of larger 2D profiles (e.g.),films, circuit boards, laser cut and stamped parts large and smallMachine design with the image processing sensor under the glass plate, eliminates time-consuming focusing as the workpiece is always in the correct distance to the opticsIn raster scanning mode the machine also quickly captures the selected measurement range completelyAll geometric features are then evaluated automatically in the imageQuick dimensional measurements in the scanned image and automatic gaging with ToleranceFit® comparisons
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Product
SMD/Chip Resistors
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Panasonic Industrial Devices Sales Company of America
Panasonic offers a wide range of SMD/Chip Resistors including conventional Thick Film and Precision Thick Chip Resistors as well as specialized Resistors such as Thin Film, Metal Film Chip, Current Sense and more.
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Product
Flashlight Solar Simulator
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Flashlight Solar Simulators have the advantage of negligible temperature change to the solar cell. For this reason, they are primarily used in cell and module production environments. Also, they are a more budgetary alternative if large cell areas are to be illuminated, because it is easier to have excellent light uniformity on areas of 8 in x 8 in or larger. So, this type of solar simulator is also used for analysis of large area thin film solar cells. But care must be taken, as some materials (e.g. CIGS) have long inherent time constants, so that the pulse length (better: flash plateau) must be chosen accordingly.
