Ion
charged particle.
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Product
Ion Chromatography
IC Software- MagIC Net
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MagIC Net is the software to control your Metrohm ion chromatograph and any modules for liquid handling, sample preparation, and automation connected. Intuitive operation, comprehensive system monitoring, and straightforward data management make MagIC Net, what it is: the preferred software for state-of-the art ion chromatography.
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Product
Ion Chromatograph Systems
HIC-ESP
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The HIC-ESP is a new anion suppressor ion chromatograph with built-in electrodialytic suppressor, boasting the same low carryover and excellent injection precision characteristic of Shimadzu HPLCs to bring you highly-reliable results. The newly developed anion suppressor prevents peak spreading and achieves high sensitivity, providing stable functionality even over long periods of use. The HIC-ESP is suitable for applications in a wide range of fields including environmental science, medicine, chemistry and food science.
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Product
Deep Reactive Ion Etch (DRIE
Syndion Product Family
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Deep silicon etch refers to plasma-based processes that remove silicon, creating features that can be many orders of magnitude larger than those in advanced transistors and memory cells.
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Product
Ion Source Packages
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RBD Instruments provides a wide range of sputter ion sources used for sample cleaning, and depth profiling. No matter what the application, RBD provides the highest performance at the lowest price.
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Product
Ion & Electron Detection
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Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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Product
Ion/pH/mV Meter with Single Junction pH Electrode
Ion 6+
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Direct Ion Concentration for use with most mono- or di-valent Ion Selective Electrodes (ISE) :: mV measurement mode allows you to check performance and calibration of your ISE
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Product
Ion Beam Milling Systems
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When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
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Product
Gridless End-Hall Ion Sources
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Veeco's Gridless End Hall Ion Sources provide high beam current for vacuum coating processes.
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Product
Nitrate Ion and Nitrate-Nitrogen Concentrations Pocket Water Meter
LAQUAtwin NO3-11C/NO3-11S/NO3-11
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The only pocket meter that directly measures nitrate ion and nirate-nitrogen concentrations in 0.3ml sample (or 0.05ml sample with sampling sheet B). Unique sensor allows measurement of viscous liquids, solids, and even powder samples. No need for a beaker to calibrate your meter or measure a sample. Just place few drops of the standard or sample onto the flat sensor. This procedure saves you time and prevents wasting your precious sample.
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Product
Waterproof pH/mV/Ion Meter
CyberScan pH 620
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Measures pH and Ion with up to 0.001 Resolution.Cal-Due Alarm Prevents Out-dated Calibrations, while Set-Point Alarms warns when readings are outside set-point limits.
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Product
ION Meters
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GAOTek offers a wide selection of ion meters for precise calculation of number of ions in various kinds of solutions. These devices determine whether the solutions have positive or negative ion charge. A solution of known concentration is accurately prepared, and its mV value is plotted on a graph of mV vs. concentration to determine the corresponding unknown concentration. These devices are durable and easy to use portable field instruments.
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Product
Benchtop Ion Meters
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Benchtop Ion Meters for Cl (chloride), F (fluoride), Na (sodium), Ca (calcium), Br, (bromide), NH4 (ammonium), NH3 (ammonia), Cn (cyanide), Ag (silver), K (potassium), S (sulphide), Pb (lead), I (iodide), Cu (copper), Cd (cadmium)
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Product
Ar Gas Cluster Ion Source
GCIS
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The Kratos Ar Gas Cluster Ion Source (GCIS) is optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode, dependent on the operating parameters defined by the user and the type of material to be profiled. In Arn+ ion cluster mode the ions can be accelerated up to a maximum of 20 keV. This enables the successful sputter depth profiling of the widest range of polymer materials to be undertaken. However, Arn+ cluster depth profiling has been shown to give very low sputter yields for inorganic materials. In order to retain the capability of generating depth profiles from this class of materials this ion source can also be operated in the more conventional Ar monomer (Ar+) mode.
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Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Product
Ion Sources
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Veeco offers the most comprehensive array of ion beam sources for a broad range of applications, including the industry's only Linear gridded sources.
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Product
Gridded DC Ion Sources
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Ion-assisted processes like sputtering, etching, and surface treatment depend on a beam that’s stable, uniform, and tightly controlled. Gridded DC ion sources make that happen, giving engineers the precision they need to fine-tune ion energy and current density for reliable results.
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Product
Sodium Ion Concentration Pocket Water Meter
LAQUAtwin Na-11
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The only pocket meter that directly measures sodium ion concentration in 0.3ml sample (or 0.05ml sample with sampling sheet B). Unique sensor allows measurement of viscous liquids, solids, and even powder samples. No need for a beaker to calibrate your meter or measure a sample. Just place few drops of the standard or sample onto the flat sensor. This procedure saves you time and prevents wasting your precious sample.
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Product
Ion Chambers
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0.2 to 5000 mR/hr, 5 Ranges• Temperature Compensated• Retractable 1000 mg/cm² Beta Shield• High Background Zero Capability• Proportional Audio Output
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Product
Ion Chromatography
930 Compact IC Flex
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The 930 Compact IC Flex is a versatile ion chromatograph developed with a focus on the requirements of routine users.
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Product
Secondary Ion Mass Spectrometry (SIMS Analysis)
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Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Product
Waterproof pH/mV/Ion/ Conductivity/TDS/ Resistivity/SalinityHandheld Meter
CyberScan PC 650
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Combining two of the most popular electrochemistry parameters, the Eutech’s CyberScan PC650 allows you to measure pH, conductivity and temperature with one handheld, at the same time.
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Product
Mass Spectrometers Gas Analyzers
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Our real-time Extrel quadrupole mass spectrometers are built for the demands of the gas and ion analysis for industrial and high purity process control, environmental monitoring, and cutting-edge laboratory research. Our mass spectrometers offer high sensitivity and a wide dynamic measurement range (ppb to %) for full, speciated composition. Our fast and powerful, quadrupole mass spectrometer performs precision quantitative analysis on every component in a gas or vapor mixture. It can easily be fully automated for sampling of multiple gas channels. For decades we have collaborated with research, academic, and industrial customers to deliver, design, integrate validate, and support these unique turnkey solutions.
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Product
X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Product
Microscopy Software/Hardware
ZEISS Atlas 5
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Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Product
Battery Cell Formation System
17000 series
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Chroma 17000 series is specifically designed for the formation of Lithium Ion and Lithium Polymer secondary batteries. The 17000 series is a complete turn-key system, including carrier trays, robust battery probe contacts, high quality charge/discharge modules and intuitive software all under computer control. Patented Battery Voltage Tracking (BVT) DC-DC conversion power modules minimize power consumption in battery charging, and Energy Recycle Modules (ERM) recycle the discharged energy directly back to the DC power system for increased power efficiency. These power saving designs provide a planet friendly solution along with cost savings by reducing energy consumption. The intuitive software provides a flexible selection in the charge/ discharge channel, current rating, and modules under test. These features allow the Series 17000 to be used for final cell development, pilot line production, high volume production and ongoing reliability monitoring/quality control.
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Product
Potentiometric Titrators
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Potentiometric titrators provide results which are based on analysis methods that are highly important in the field of electrochemistry and are commonly used for the determination of different organic and inorganic ions in various areas such as process control and environmental, industrial, agricultural analysis and also medicinal drug analysis.
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Product
Liquid Chromatography/Mass Spectrometry (LC/MS)
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Agilent liquid chromatography/mass spectrometry (LC/MS) brings powerful analytical capability to a wide range of applications. Complete LC/MS workflows feature sample preparation, InfinityLab chromatography, and Agilent mass spectrometry, as well as software to acquire high-quality data and turn it into definitive answers.The Agilent family of liquid chromatography/mass spectrometry instruments provides the versatility and performance to solve virtually any analytical challenge. A broad selection of ion sources enables the most flexible detection for the variety of compound classes amenable to HPLC separation and beyond. Powerful software along with curated compound databases and libraries allow you to quickly set up an LC/MS or LC/MS/MS method for your specific application.
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Product
Water Testing
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Benchtop conductivity meter, benchtop dissolved oxygen meter, benchtop ion meter, benchtop multi-parameter water quality meter, benchtop water hardness meter, BOD meter, COD analyzer, conductivity tester, dissolved oxygen tester, multi parameter water quality analyzer, online conductivity controller, online dissolved oxygen controller, online pH controller, ORP tester, pH meter (benchtop), pH meters (portable), pH tester, portable conductivity meter, portable dissolve oxygen meter, portable multi parameter water quality meter, portable water hardness meters, salinity tester, TDS tester, TSS meter, trubidity meter, water activity meter
