Ion
charged particle.
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Remote Plasma Sources
Semiconductor and Electronic Thin Film applications use plasma sources to generate low-energy ions and radicals to react with material surfaces and chamber walls to remove contaminants and act as a precursor to aid in material deposition. MKS provides multiple options for radical generation including Toroidal and Microwave based Remote Plasma Sources supporting Fluorine, NF3, oxygen, nitrogen and hydrogen process chemistries.
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Software
MOS Doping Profile Analysis
Materials Development Corporation
MDC uses the comprehensive Ziegler algorithm toconvert pulsed MOS C-V data to a doping profile. The doping profile is accurate from the oxide semiconductor interface to the maximum depletion depth and is therefore useful for low dose ion implant monitoring. Peak doping, range, and total active dose are computed. The technique is sensitive enough to resolve changes in the substrate doping profile due to redistribution during oxidation.
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Lithium-Ion Battery Pack, B2983 / B2987
N1418A
Use for the B2983A femto/picoammeter and the B2987A electrometer/high resistance meter.
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Ar Gas Cluster Ion Source
GCIS
The Kratos Ar Gas Cluster Ion Source (GCIS) is optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode, dependent on the operating parameters defined by the user and the type of material to be profiled. In Arn+ ion cluster mode the ions can be accelerated up to a maximum of 20 keV. This enables the successful sputter depth profiling of the widest range of polymer materials to be undertaken. However, Arn+ cluster depth profiling has been shown to give very low sputter yields for inorganic materials. In order to retain the capability of generating depth profiles from this class of materials this ion source can also be operated in the more conventional Ar monomer (Ar+) mode.
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Mass Spectrometers Gas Analyzers
Our real-time Extrel quadrupole mass spectrometers are built for the demands of the gas and ion analysis for industrial and high purity process control, environmental monitoring, and cutting-edge laboratory research. Our mass spectrometers offer high sensitivity and a wide dynamic measurement range (ppb to %) for full, speciated composition. Our fast and powerful, quadrupole mass spectrometer performs precision quantitative analysis on every component in a gas or vapor mixture. It can easily be fully automated for sampling of multiple gas channels. For decades we have collaborated with research, academic, and industrial customers to deliver, design, integrate validate, and support these unique turnkey solutions.
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Field-installation Type Simplified Fluoride Ion Concentration Meter(Four-Wire Transmission)
HC-200F
HC-200F is connected to a fluoride ion electrode (1009) to detect free fluoride ions in the sample water.(Total fluorine is not detected.) It is suitable for fluoride ion monitoring in effluent from factories, e.g., those of semiconductor FPD and glass manufacturers.
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Scanning XPS Microprobe
PHI VersaProbe III
The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
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Bench Ion/pH/mV RS232 Meter
CyberScan pH 2100
High Resolution and Accuracy (Up to ±0.002 pH Accuracy) for precise measurementBacklit Two Line, Dot Matrix LCD Display provides clear instructions for setup, measurement and calibration
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Tabletop Ionizing Transport System
90610-03610
The Model IT-7000 Ion Transport System is a self contained, compact table top ionizer capable of producing copious amounts of both positive and negative ions. The variable speed fan permits a gentle flow of ionized air, reaching a distance of up to 4 feet. A charged object, when passed through the ionization field, becomes neutral instantaneously. Inherently balanced, the Ion Transport System has a fail safe balance indicator to assure proper ionization output for ESD static control applications.
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Ionic Contamination (Cleanliness) Tester
Zero-Ion
Current IPC standards now require ROSE testing for process monitoring. The Zero Ion ionic contamination tester fully complies with current IPC standards.
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Field-installation Type Ammonia Nitrogen Meter(Four-Wire Transmission)
HC-200NH
HC-200NH is an ammonia nitrogen(NH4-N) meter using ion electrode method which is designed for aeration control in wastewater treatment.
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Gridded RF Ion Sources
Veeco's gridded RF ion sources are designed for improved production of long-run ion beam deposition processes.
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TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Process Analyzers
Metrohm Process Analytics
Metrohm Process Analytics combines Applikon’s expertise in online analysis and the know-how of the world’s leader in ion analysis, Metrohm. This combination has yielded analytical instruments that meet any requirements in the process industry. The product range varies from single-parameter analyzers to the most advanced multiparameter Ex Proof Analyzer for the most hazardous environments. With the NIRSystems Process Analyzers, Metrohm Process Analytics is setting the standard for real-time spectroscopic analysis with unmatched stability and performance.
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Analytical Services
IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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Rapid Solution Changer
BioLogic’s Rapid Solution Changer (RCS-200) is a multi-channel perfusion system designed to work with patch-clamp and other biological equipment in a wide variety of electrophysiological domains including neurosciences, biotech and pharmacology. The instrument is used for changing the concentration of solutions (ions, neurotransmitters, ligands etc) or the solutions themselves.
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Inductively Coupled Plasma Spectroscopy (ICP-OES/MS), ICP Analysis Services
ICP-OES measures the light emitted at element-specific characteristic wavelengths from thermally excited analyte ions . This light emitted is separated and measured in a spectrometer, yielding an intensity measurement that can be converted to an elemental concentration by comparison with calibration standards. ICP-MS (ICP-Mass Spec) measures the masses of the element ions generated by the high temperature argon plasma. The ions created in the plasma are separated by their mass to charge ratios, enabling the identifcation and quantitation of unknown materials. ICP-MS offers extremely high sensitivity (i.e. low detection limits) for a wide range of elements
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Waterproof pH/mV/Ion/ Conductivity/TDS/ Resistivity/SalinityHandheld Meter
CyberScan PC 650
Combining two of the most popular electrochemistry parameters, the Eutech’s CyberScan PC650 allows you to measure pH, conductivity and temperature with one handheld, at the same time.
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Long Term Test Kit
When long term electro-chemical tests (>1000 hours) are run to monitor the cell degradation at the cathode for example, it is important to avoid any contaminant in the gas flow rate.Inconel 601 flange equipped with alumina housing and alumina tube to feed the gas to the electrode during long term test (>1000 h)Typical poisoning is coming from the chromium contained in the steel tubing. The volatile chromium species (Cr6+) will flow into the cathode (with the air) and thanks to the intake of electrons at the electrode, the chromium ion will transform to chromium oxide and be deposited at the cathode triple point. In such a case, the long term test kit is used. The Inconel 601 flange is equipped with an alumina housing (>96 % Al2O3) and the air (or other gas) is led through an alumina tube. The long term test kit is fully compatible with other functionalities proposed with the Open Flanges™ test Set-Up as the integrated steamer or the small pellet test kit. The long term test kit can be implemented on the fuel, on the air or on both sides.
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Electron Multipliers
Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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Gridless End-Hall Ion Sources
Veeco's Gridless End Hall Ion Sources provide high beam current for vacuum coating processes.
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Failure Analysis
A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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Pulse AC Method Area Ionizers
ER-X Series
Panasonic Industrial Devices Sales Company of America
The ER-X Series Area Ionizers utilize the pulse AC ionization design to achieve high-speed charge removal of wide surface areas for high-volume production lines. In addition to supporting compressed air ionization, the ER-X also features both airless and low-pressure ionization modes for applications where tiny workpieces can be easily blown away. Additional features include automatic ion balance and discharge frequency control (manual control is also possible), flat discharge surface for easy cleaning, discharge needle air barrier design to reduce contamination of the needles, replaceable discharge needle unit for easy maintenance, and a dual head configuration for enhanced charge area and layout (2 different ionizer heads can be connected to a single controller).
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350 MHz RF Frequency Counter, 10 digits/s
53210A
Single-channel, RF frequency counter One 350 MHz input channel, plus optional second channel (6 GHz or 15 GHz)10 digits/second resolution Built-in math analysis and color, graphical display (trend and histogram)LXI-C/LAN, USB, GPIB Optional: Lithium Ion Battery BenchVue software enabled: Do more with your PC and instrument together, no programming required. Easily control your counters, quickly build automated tests and log data for faster analysis and save precious time.
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Cold Atomic Beam System
Detailed description of item: Complete cold atomic beam sources for alkaline-earth precision experiments and atomic devices. Small chambers with patented permanent-magnet Zeeman slowers and in-vacuum 2D MOT optics allow high flux with low outgassing and no thermal beam flux at the cold atom port, which provides a CF-133 connection to customer vacuum chamber. Advanced thermal design of the effusion oven allows long-lifetime operation at minimal heating power, with no water cooling. An integrated low-outgassing hot window is provided for coupling of on-axis Zeeman cooling light. Ion and getter pumps integrated into the chamber manage outgassing from the oven at temperatures up to 520 °C. Operating baseline pressures below 1×10-11 mbar can be attained in the customer’s downstream cold atom (typically 3D MOT) science chamber, with suitable pumping speed provided at the differentially-pumped cold beam output port.
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Bench Top Ionizer Cleaning Box
EC-B
Panasonic Industrial Devices Sales Company of America
The EC-B Bench Top Ionizer allows direct ion emission to be paired with pulsed air emission to provide quick and effective removal of static charges as well as any dust that is present on the part. Three white LEDs illuminate the work piece to ensure complete dust removal. A powerful dust collecting fan exhausts dust quickly, preventing re-adhesion of dust.
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Potentiostat Galvanostat
EnergyLab XM
EnergyLab XM is an application specific XM instrument designed for research of batteries, fuel cells, and supercapacitors. EnergyLab XM’s extreme sensitivity is used for advanced testing of lithium ion batteries and alkaline batteries. This includes research in half-cell configurations and next generation low impedance cells in the sub 100 μΩ range as well as popular battery types such as 2032 coin cell testing and 18650 cell testing.
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Battery Cell Simulation / Emulation
BMS
Efficiency, reliability and safety of modern lithium ion batteries for electric vehicle drives strongly depend on the battery management system (BMS) as their electronic control unit.
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Auger Electron Spectroscopy (AES)
Rocky Mountain Laboratories, Inc.
Auger Analysis, Auger Electron Spectroscopy (AES or Auger) is a chemical surface analysis method. AES measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
