Wafer Level Reliability
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Product
Dynatrol® Level Switch for Bulk Solids
CL-10DJ-7
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Dynatrol® CL-10DJ-7 Vibrating Level Switch is designed for high-, intermediate- or low-point level detection of bulk solids. The CL-10DJ-7 is typically used with bulk solids in the density range of 60+ lbs/ft3.
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Product
Sound Level Meters
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Sound level meters measure sound pressure level and are commonly used in noise pollution studies for the quantification of almost any noise, but especially for industrial, environmental and aircraft noise.
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Product
Sanitary Magnostrictive Level Transmitter
DM330S
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The Drexelbrook DM330S is a sanitary magnetostrictive level transmitter providing Triclover fittings as standard mountings. It is authorized by 3A Sanitary Standards Council for level applications in the food and beverage industries.The DM330S takes field proven sensing technology and incorporates intrinsic safety with a field programmable zero and span.The two wire loop powered level transmitter is configurable with a 4-20 mA span and is not affected by changes in electrical characteristics.It uses proven machine tool positioning accuracy combined with a process compatible float to offer a liquid level, and interface measurement system for the process industry.
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Product
Autonomous Capacitive Level Logger
DCX-38 VG
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KELLER AG für Druckmesstechnik
The DCX-38 VG is an autonomous instrument for recording water level with a high resolution and full scale ranges as low as 0,5 mWC / 50 mbar. It features a rugged, gold-plated ceramic diaphragm for outstanding long-term stability and stainless steel housing with user serviceable battery for long service life.
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Product
Signal Level Meter
T1125
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Hangzhou Softel Optic Co., Ltd.
The signal level meter, SE828C is able to measure EQ, C/N, V/A and trunk volt in the CATV analog system, the number keys is designed to direct input frequency so that work would be easier. It can measure 2 channels at the same time.
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Product
Wafer ESD Tester lineup
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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Product
Die-To-Wafer Bonding Systems
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Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
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Product
Low Level DC Current Data Logger
Process101A
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The Process101A is one of MadgeTech's newest data loggers. It is part of a new series of low cost, state-of-the-art data logging devices. MadgeTech has taken the lead in offering the most advanced, low cost, battery powered data loggers in the world today.
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Product
Digital Sound Level Meter
PSPL05R
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This unit confirms to the IEC61672-1 class 2 for sound metersAccuracy: +/- 1.4 dBFrequency range: 31.5 Hz - 8 kHz1/2" Electret Condenser MicrophoneMAX & MIN MeasurementsOver Range DisplayUnder Range DisplayA & C weightingFast & Slow responseDigital LCD Display with a resolution of 0.1 dbBar Graph FunctionRecords up to 50 sets of dataSold as : Unit
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Product
Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Product
Sound Level Test System
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In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
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Product
LED Type Wafer Alignment Sensor Controller
HD-T1
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Panasonic Industrial Devices Sales Company of America
The HD-T1 Series is a new Wafer Alignment Sensor that uses a safe red LED light beam, with a resolution of 30µm, to achieve the same high level performance as Laser Sensors. The HD-T1 Sensor is best suited to detect wafer eccentricity, notches and orientation flats. Using linear image Sensor methodology and high-speed sampling technology, a wide variety of objects can now be stably measured with great precision at ultra-high speeds. This CCD style Sensor is developed for use in almost all fields of industry, e.g. tire manufacturing or Semiconductor production (Wafer Printed Circuit Boards).
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Product
Non-contact Measurement Wafer Sorting System (Robot Hand Tranceportation)
NC-3000R
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*High accuracy measurement system for large diameter wafer*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Compact design of Two-stage by measuring area and transfer area*Number of cassette station can be changed by customers request Option : Add wafer flattness measurement system(FLA-200)
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Product
Batch Wafer Transfer Tools
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Batch Wafer Transfer Tools
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Product
Ultra Low Level DC Voltage Amplifiers
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The EM A10 is a low level amplifier module for sensitive measurements, data collection and systems, where signals below 1 nanovolt may be measured. It is ideal for the input unit for precision voltage measuring systems, requiring voltage sensitivity for measuring low noise and low impedance sources. The noise level of the A10 is equivalent to a perfect resistor of about 20 ohms. When used with a digital voltmeter, steady one nanovolt digits may be displayed, with a response time constant of less than a second. The input voltage stability of the A10 is very high, with the drift around a nanovolt per degree C. The input connectors are made from pure copper. The input impedance is very high, and is time dependent, determined by the loop gain.
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Product
Modular Power Supplies With High Efficiency And High Reliability
UltiMod Series
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The industry-proven Excelsys UltiMod power-supply platform combines technical performance with user flexibility. Built for various demanding industries, the series delivers up to 1200 W of output power in a compact 1U form factor and up to 12 isolated output voltages.
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Product
Wafer Test
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Silicon Turnkey Solution, Inc.
Most foundries provide wafers already probed to a set of DC parameters at room temperature to ensure they meet a basic subset of the package-part specification. Beyond this basic set of tests, more rigorous testing is often needed to meet specifications requiring die to be 100 percent probed, identify and segregate devices with higher performance levels and guarantee that parts will perform to a certain specification level.
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Product
High Level Language Debugger and Emulator Tool
Universal Debug Engine
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Programmierbare Logik & Systeme GmbH
With Universal Debug Engine (UDE®) PLS offers on top solutions for software development of systems-on-silicon including debug support for the 16 Bit and 32 Bit microcontrollers C16x, C166™, ST10F276, ST10F280, XC166, XC2000, XE166, XMC4500, C166S V2, SDA6000, TriCore™ from Infineon and STMicroelectronics, Power Architecture® MPC55xx, MPC560x, MPC563x, MPC57xx from NXP™, PowerPC PPC440SPe from AMCC, Power Architecture® SPC560, SPC563, SP574 from STMicroelectronics, ARM7™, ARM9™, ARM11™, Cortex™-M0, Cortex™-M0+, Cortex™-M3, Cortex™-M4, Cortex™-M7, Cortex™-R4, Cortex™-A8, Cortex™-A9, XScale™, SuperH™ SH-2A derivatives in a new multicore debug environment as well as technical support. The extensive feature list includes functions like: high speed and flexible target access via JTAG, cJTAG with OCDS L1, EmbeddedICE, OnCE, COP, DAP, DAP2, SWD support, OCDS L2 trace, MCDS trace, CoreSight™ trace, ETM trace, ETB trace, Nexus trace, ASC, SSC, 3Pin and CAN, in-system FLASH memory programming of FLASH / OTP with UDE MemTool, support of various RTOS, OSEK® and test automation tools.
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Product
Pro-Stik II Level Sensor
7330
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The Drexelbrook 7330 Pro-Stik II Series are intrinsically safe programmable liniear position sensors ideal for monitoring in a variety of liquids and tanks.These position sensors are based on the proven magnetostrictive technology and are available in different models including our popular explosion proof and flame proof models. The 7330 Pro-Stik II position sensors are loop powered and available with a rigid 316 stainless steel or flexible PVDF materials.The probe features a security feature by utilizing a timing sequence that is used to unlock the probe for programming. This ensures that the span cannot be accidentally programmed by someone in the field.All of the sensor's electronics are SMT components integrated into the 5/8" diameter sensing tube offering greater options for insertion and mounting in tanks and vessels.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Class 2 Sound Level Meter
SP79
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The SP79 is a Class 2 sound level meter for on-site measurements in accordance with Noise at Work legislation in industrial and office environments. Featuring A and C frequency weighting and fast and slow time weighting, the compact design can be handheld, or mounted on a tripod for longer term monitoring of Min / Max values. Detailed recording and analysis can be made using the AC and DC outputs. The SP79 complies with BS EN 61672-1:2003 and is supplied with a detachable windshield and hard carry case. The large high contrast display includes both digital reading and analogue bar graph. An optional Class 2 sound level calibrator is available to verify accuracy before and after readings in accordance with international standards. The SPC70 is simple to use and provides a 1kHz reference at 94dB and 114dB.
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Product
Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
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Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Product
Sound Level Meters
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Advanced technology ensures the accuracy and stability of the sound level meter.
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Product
Liquid Level Sensor
LevelMaster
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The LevelMaster combines the industry’s most innovative hardware and software to address the unique custody-measurement and operational needs of tank-level management. The LevelMaster provides not only an accurate level gauge, but also an accurate measurement of the oil and water interface.Unlike other level-sensing technologies, LevelMaster provides precise levels without having to continuously adjust for changes in the unpredictable properties of storage-tank liquids. LevelMaster floats can measure oil, water, and emulsion levels up to 25 feet (7.6 m) deep, with a standard relative accuracy of 0.1 inch (2.5 mm) or optional high-precision relative accuracy of 0.05 inch (1.25 mm).
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Product
Level Indicators
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4B has a wide range of radio frequency (RF), rotary paddle and capacitance point level indicators for detecting high, intermediate, or low levels of liquids, powders and free flowing granular solids stored in tanks, bins, silos or other containers. Certain units can also be used as plug or choke detectors in chutes, conveyors and elevator legs.
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Product
Shield Level / Pathloss Equipment
PAMS & PAMS-C
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PAMS is a user-friendly, transmitter and receiver system that measures shielding effectiveness in RF shielded enclosures. Lightweight and compact, each PAMS unit measures approximately 12” x 5” x 5” and weighs 5.5 lbs., making PAMS ideally suited to field measurement tasks. Rugged construction insures instrument survivability in a field test environment. PAMS-C is a simple and efficient solution for quickly identifying shielding faults in an RF shielded enclosure. Cousin to the original PAMS used extensively by customers operating RF Shielded Enclosures, PAMS-C gives commercial end-users everything needed to measure shielding effectiveness levels of critical infrastructure - all with minimal or no interruption to normal operations.
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Product
Manual Contactless Wafer Detector
HS-NCS-300
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Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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Product
Liquid Level Sensors
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Are used to detect liquid levels or interfaces between liquids such as oil and water or liquids and solids. They can be defined as sensors or transducers, or as integrated systems with instrumentation and control capabilities.
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Product
MultiPoint II Level Switch
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The Multipoint II level switch product offers three control points located anywhere along a single vertically inserted level sensing element. One control point can be set up for differential measurement for pump control. This product is best suited to sump level control and batch processing.
