Wafer Level Reliability
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Product
WAFER MVM-SEM
E3300 Family
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The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Product
Wafer Edge Profile Measurement
WATOM
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WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
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Product
Reliable Evaluation of Damping Materials and Composites
Carrousel
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Carrousel measures the dynamic vibration properties of coated or non-coated materials. The method is based on the classic "Oberst" procedure where Autoneum has improved both the measurement procedure itself and the mathematical model used to evaluate the results. The Carrousel software automatically calculates the damping loss factor at various conditions and temperatures as well as controlling both the Carrousel apparatus and the all-important temperature when measuring in a temperature chamber.
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Product
Level & Pressure Transmitters
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This series of low-pressure transducers is specifically designed for demanding industrial applications where the primary criteria are reliability and economy. These units provide repeatable, precision measurements under the most hostile condition.
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Product
Radar Level Sensor
VRS-20
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Versatile and simple to install, the VRS-20 has been developed by Valeport to work seamlessly with the TideMaster Tide Display/Logger and other third party data loggers using RS232, RS485 and SDI-12 communication. Non-contact technology removes the installation, corrosion & fouling issues of submerged sensors, while simplifying datum control. Accuracy and performance are unaffected by changes in water density and atmospheric conditions.
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Product
Flow, Level & Valves
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We have an extensive range of flow controllers and flow indicators for both liquid and gas applications. We specialize in flow measurement and control of media in flow lines less than 2". Our level control instrumentation is perfect for use with small to medium process and industrial tanks and storage vessels. Choose from level sensors, float switches, optical switches, and ultrasonic transmitters/controllers for single-point control, dual-point control, continuous-level control, and leak detection. Our valve selection offers solutions to meter and control fluids in laboratory, process, and industrial applications. Types of valves available include options from simple and inexpensive plastic ball valves to actuated solenoid and manifold valves. Other types of valves include check, diaphragm, elliptical, metering, needle, pinch, proportioning, and stopcocks. To fit your fluid path, connection types include barbed, compression, luer, sanitary clamp, NPT, and true-union.
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Product
Sound Level Meters
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A sound level meter is a measuring instrument used to assess noise or sound levels by measuring sound pressure. Often referred to as a sound pressure level (SPL) meter, decibel (dB) meter, noise meter or noise dosimeter, asound level meter uses a microphone to capture sound. The sound is then evaluated within the sound level meter and acoustic measurement values are shown on the display of the sound level meter.
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Product
Magnetostrictive Level Gauge
HR9200
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HighReach Measuring & Controlling System Co.,Ltd
The HR9200 magnetostrictive level gauge is a new generation of level gauge developed by the company using magnetostrictive principle combined with advanced digital and analog circuits. The product has high measurement accuracy, stable and reliable operation, and can be displayed on-site by liquid crystal meter It has compact structure, simple installation, strong resistance to power supply interference and environmental interference, and has great flexibility in use and strong environmental applicability.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Product
Ultrasonic Level Measurement
VeriGAP
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Ultrasonic technology is a great choice for high or low-level liquid level measurement requirements in a wide variety of liquids. These ultrasonic sensors require no calibration and are not affected by changes in electrical properties of the material being measured.
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Product
Wafer Prober Networking System
PN-300
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The Wafer Prober Networking System PN-300 utilizes a database to facilitate data access from other systems and provides an environment that enables the user to edit data and handle processing. The system achieves wide-ranging compatibility by adopting standard hardware and operating system. In addition, it is equipped with an N-PAF (Network-based Prober Advanced Function) to provide robust support for wafer prober operation and maintenance.
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Product
Exposure Level Tester
ELT-400
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*Wide frequency range (1 Hz - 400 kHz)*Standard-compliant measurement*Acceptance measurements compliant with CE standard IEC/EN 62233 and Generic Standard IEC 62311*Limit value traces conforming to ICNIRP 1998, 2010 and EMF Directive 2013/35/EU*Real time measurement with RMS and peak detectors*External FFT signal analysis for determining the frequency components via three channel analog output (one channel for each spatial axis) e.g. with the aid of a digital oscilloscope.
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Product
WAFER MVM-SEM® E3300 Series
E3310
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The E3310 is a WAFER MVM-SEM®* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Product
Sound Level Meters
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Dalian Taijia Technology Co.,Ltd
Is used for acoustic measurements. It is commonly a hand-held instrument with a microphone.
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Product
Sound Level Meters
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Castle Group Ltd are a long standing leading manfacturer of noise measuring equipment, particularly Sound Level Meters for industrial noise monitoring. Our equipment is ideal for performing noise at work assessments to The Control of Noise at Work Regulations 2005.
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Product
Level Translators
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ADI’s level translators offer the most flexible level translation solutions in the industry. The ADG3241 series translators allow direct 3.3 V to 1.8 V translation by means of the innovative SEL pin function while allowing bidirectional data transfer. The ADG3231 series allows wide range 1.65 V to 3.6 V translation and the ADG3308 series allows the industry's widest 1.2 V to 5.5 V up or down translation while permitting bidirectional data transfer.
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Product
Wafer Probe Test System
STI3000
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The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Product
IK Level Tester
IK07-10
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IK ratings are defined as IKXX, where “XX” is a number from 00 to 10 indicating the degrees of protection provided by enclosures (including luminaires) against external mechanical impacts. The different IK ratings relate to the ability of an enclosure to resist impact energy levels measured in joules (J). IEC 62262 specifies how the enclosure must be mounted for testing, the atmospheric conditions required, the quantity and distribution of the test impacts and the impact hammer to be used for each level of IK rating. The IK test applicate on lighting luminaires test according to IEC60598 (GB7000) and IEC60068-2-75 (GB2423.55).
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Product
Wafer Chucks
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American Probe & Technologies, Inc.
High Performance Chuck for your needs Introducing the American Probe & Technologies’ HC-6000 series of thermal chucks,
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Product
Wafer Inspection System
AutoWafer Pro™
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AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
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Product
Sound Level Meter
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Maschinenbau Haldenwang GmbH & Co. KG.
Ideal sound level measuring device for almost every acoustical environment.
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Product
Ultrasonic Level Transmitter
2260
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The type 2260 is a rugged, high performance ultrasonic secondary lightning protection level measurement transmitter, having transducer and processing electronics and a display/programming unit incorporated into a single housing.
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Product
Ultrasonic Level Measurement
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Ultrasonic technology is a perfect choice for level applications that require low cost, non-contact measurement of liquids and slurries for level, distance, volume and open channel flow. These products have excellent accuracy and will handle measurements up to 30’.
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Product
Submersion Level Detector
SL-180C
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For waste water and sewage water facilities: Pumping stations, Flow conduits in treatment plants and so on.
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Product
Wafer Chip Inspection System
7940
System
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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Product
Radar Level Transmitter
DR6500
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The Drexelbrook DR6500 is a two-wire open air radar level transmitter for measuring level in applications with powder and dusty atmosphere.
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Product
In-situ Wafer Temperature Monitoring
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CI Semi's family of noncontact temperature monitors (the NTM line), offers high end pyrometry products for the measurement of wafer temperatures during process. CI Semi’s flag ship of the line, the NTM Delta, incorporates real-time, same point emissivity measurement and compensation making it the ideal solution for in situ monitoring for processes such as RTP, CVD and PVD. The NTM family is sold to leading tool manufacturers.
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Product
Signal Level Meter
HT828B
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Hangzhou Softel Optic Co., Ltd.
The signal level meter, SE828C is able to measure EQ, C/N, V/A and trunk volt in the CATV analog system, the number keys is designed to direct input frequency so that work would be easier. It can measure 2 channels at the same time.
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Product
Wafer Thickness Measurement System
MPT1000
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Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Product
Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
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AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
