Boundary Scan
Boundary Scan is a topic that contains the various types of testers designed to control and observe the behaviour within boundary scan devices and the circuitry around them.
See Also: Circuit Testers, Boundary Scan Software, IEEE 1149.1, JTAG
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Laser Scanning Microscopes
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The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Scanning Probe Microscopy
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SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Scanning Electron Microscope
JSM-IT510
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Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Scanning Near Field Optical Microscope
SNOM
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SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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3D Scanning System
CyberGage360
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Unprecedented combination of speed, accuracy and one-button simplicity for non-contact automated 3D scanning inspection.CyberGage360 dramatically Speeds Up Quality Assurance of Incoming Parts Inspection & In-Process Inspection of components on the manufacturing floor; Lowers Cost of Quality & Speeds Up Product Time-to-Market. Designed for use in general purpose metrology, the CyberGage360 has a range of potential industrial applications from automotive to aerospace to consumer electronics, where high accuracy and high speed throughput are important.
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Advantage Xi Radar Scan Converter
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Curtiss-Wright Defense Solutions
The Advantage Xi radar scan converter is a half-size PCI card. Radar video arrives into the card through the PCI bus, which allows the card to be used in a client-server configuration with radar distributed over a network, or in conjunction with a radar interface card such as the Virgo PCI and Osiris PCI.
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USB Line Scan Camera
TinyUSB
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*Very small and compact dimensions, only 40 x 30 mm²*High speed, up to 9kHz line rate*Programmable amplifier and offset*Supported operating systems:****Windows**Linux**Linux ARM32 (Raspberry PI)
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Scanning Systems
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Electro-Optical Products Corp.
We combine deep proprietary technology expertise and competencies in photonics, with a proven ability to solve complex technical challenges to manufacture various optical scanning systems and sub-systems tailored to our customers' demanding applications.
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High-Resolution Scanning Probe Microscope
SPM-8100FM
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The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Electrolytic Capacitor Test & Scanning System
DU-9001
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Delta United Instrument Co., Ltd.
The 10 capacitor - LCC/DZ/R in order to automatically scan test improve the test reliability and test efficiencyEach test channel can be opened / short circuit return to zero with high precision.Wide range scan box can be used to test 3mm~35mm 10 capacitorsSuitable for high voltage capacitance test, 450V330uF 10 capacitors can be smooth test
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Area Scan Cameras
Go-X Series
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The Go-X Series offers compact, attractively-priced area scan cameras with a blend of features, image quality and industrial grade reliability that is in high demand for the next generation of machine vision systems.
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Area Scan Camera
Genie Nano-1GigE
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Introducing Genie Nano, a CMOS GigE camera that redefines low cost performance. Genie Nano starts with industry leading CMOS sensors and adds proprietary camera technology for breakthrough speed, a robust build quality for wide operating temperature, a three-year warranty and an unmatched feature set—all at an incredible price.
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Scanning Droplet Cell
VS-SDC
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Scanning Droplet System (SDC) uses a compact peristaltic pump to force electrolyte through a small diameter tube and into a specifically designed head. This PTFE-based SDC head is machined to allow electrolyte to flow past an installed Reference Electrode and then to a port at the base of the head.
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Line Scan Sensors
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The CMOS line scan image sensor family from ams consists of 23 variants, offering a range of resolution and pixel size specifications. Resolution options range from 2kpixels up to 16kpixels and line rates extend up to 80,000 lines/s.
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Line Scan Cameras
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JAI’s extensive product offering includes color line scan cameras featuring prism technology with multiple CCD or CMOS linear sensors delivering high performance color/NIR imaging solutions for high-speed web/continuous applications such as print verification, tile inspection, food/fruit sorting, and more. Also monochrome line scan cameras with ultra fast scan rates.
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3 GHz RF/IF Sentinel Intelligent Signal Scanning Portable Recorder
Talon RTR 2613
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The Talon® RTR 2613 combines Pentek’s Sentinel Intelligent Signal Scanning software with real-time recording in a lightweight, portable and rugged package. The RTR 2613 provides SIGINT engineers the ability to scan the 3 GHz spectrum for signals of interest and monitor or record bandwidths up to 40 MHz wide once a signal band of interest is detected. The RTR 2613 recorder is a grab-and-go recorder suitable for test & measurement, mobile military, security and government intelligence (SIGINT, COMINT and ELINT) applications.
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Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Line Scan Moisture Imager
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Bodkin Design & Engineering, llc
Line scan camera built for measuring product on a moving conveyor. Infrared spectral filtering permits moisture and hydrocarbon imaging for process control.
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Long Range Scanning
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Our contract measurement services include a variety of short-range (< 20 feet) and long-range (20 to 900 feet) high definition technologies, which use both contact and non-contact processes. With over a decade of experience in long range scanner technologies, we have the experience to determine the most affordable approach to your project and the expertise to do the job right. Our tools for long range scanner services include portable CMMs (PCMM) – both touch probes and laser trackers – and 3D laser mapping scanners.
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Scan To CAD
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Scanning or hard probing, large or small, we have a large arsenal of hardware & software to fit our clients’ needs. With all the reference data coming directly from the CAD model this eliminates any human error that would have come through manually entering nominal information.
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Stroke-to-Raster Scan Conversion
SSC/924
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The Model SSC/924 Stroke-to-Video Scan Converter converts stroke video from XYZ vector to a standard video format. Stroke video is generated by a variety of random deflection devices, including certain radar and sonar devices, spectrum analyzers, and Heads Up Display (HUD) generators. High Definition, Standard Definition, and VESA video output standards are provided. After conversion, the video can be recorded using standard video recording devices and viewed using low cost, off-the-shelf monitors.
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Laser Scanning Microscope
OLS4100
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The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
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32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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3-Sensor R-G-B (Prism) Color Line Scan Cameras
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JAI's advanced product offering includes a set of 3-sensor R-G-B color line scan cameras for industrial machine vision applications. Part of the Sweep+ Series, these cameras feature state-of-the-art prism technology providing the best possible performance, precision, and versatility for line scan imaging in continuous production flows.
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Area Scan 3D Camera
3D-A5000 Series
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Cognex’s 3D-A5000 series is an area scan 3D camera designed to capture high-resolution 3D images. It features 3D LightBurst technology which rapidly acquires images to maximize throughput. High-resolution 3D images combined with industry-leading Cognex 3D vision tools enable reliable and accurate solutions to applications such as assembly verification, in-line measurement, and robotic guidance.
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Spectro UV-Vis Auto Scanning Spectrophotometer
UV-2602
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The new 2 way communication system allows the user, to give instructions right from your computer and gives you the ability to print and record results in an easy to use interface.A 2nm bandwidth gives you the accuracy needed in today's laboratories and its auto adjustment feature makes it easy to work with, providing more answers to scientific problems in less time.
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Area Scan Cameras
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JAI provides a wide selection of industrial machine vision cameras with both single-sensor and multi-sensor configurations. Resolutions range from 0.3 MP to 20 MP, with high frame rates ranging up to 250 fps for full 5MP resolution. A selection of cameras can operate beyond the visible – in the ultraviolet, near infrared and in the short wave infrared light spectrums.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
