Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
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The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Electronics Functional Test
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Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
ARINC429 PCI Express Mini Card
AMEE429-x
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The AMEE429-x is AIM’s new PCI Express Mini Card module targeted for embedded ARINC429 applications in an ultra-compact form factor.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
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The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Product
SoC Test Systems
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Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Embedded MXM GPU Module with NVIDIA® Quadro® Embedded RTX3000
EGX-MXM-RTX3000
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The EGX-MXM-RTX3000 module features advanced NVIDIA® Turing™ GPU technology in MXM 3.1 Type B form factor. It’s compact, slim and reliable design makes it suitable for mission critical environment. With Quadro® Turing™ TU106 processing cores, EGX-MXM-RTX3000 supports 4 DP1.4 displays offering a flexible and easy solution for medical and gaming applications.
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Product
Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
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The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
Digital/Pattern/PE Card
PE32H
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The PE32H represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE32, the PE32H offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (8 boards). The PE32H also supports deep pattern memory by offering 32M of on-board vector memory with dynamic per pin direction control and with test rates up to 66 MHz. With new 32M log memory, PE32H can capture 32 channels data or fail log.
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
ARINC 429 Multichannel Interface Card for Mini PCI Systems
DAS-429mPCI/RTx
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The DAS-429mPCI/RTx is an ARINC 429, multichannel interface card for Mini PCI systems. The card’s small size and suitability for Mini PCI notebook computers, make them a complete solution for developing and testing ARINC 429 interfaces and for performing system simulation of the ARINC-429 bus, both in the lab and in the field.The DAS-429mPCI/RTx is supplied with C drivers, including source code and Mystic application program.
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Product
Edge Card Adapter, Universal, for .062 PCB
111107138
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VPC provides two types of Edge Card Adapter Kits for 10, 25 and 50 Module ITA Enclosures. Both kits are designed for various sized cards.The Universal Edge Card Adapter Kit’s card guides are hinged and can be folded for storage by releasing the holding latches on either side of the card.
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Product
Test Instruments
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Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Product
Microwave SPDT Plug-In Switch Card
1260-160B/E
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The Astronics 1260-160B/E is a 1 or 2-slot microwave switch plug-in for use in either the Astronics 1260-100 Adapt-a-Switch™ VXI carrier or the 1256, GPIB/RS-232 Switching Mainframe.
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Product
Parametric Test Fixture
U2941A
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The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Ethernet Network Interface Cards
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Our Ethernet cards, which support copper and fiber, are designed to relieve your bandwidth bottlenecks in compactPCI and VMEbus applications.
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ARINC Interface Cards
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- Wide Selection of COTS ARINC Interface Cards/Boards and Real-Time Appliances- 4-48 Shared and Dedicated, Independent RX/TX Channels- Portable FPGA AltaCore Design – Reduced Parts Obsolescence Risk- Most Advanced Error Detection and Injection Available- Parametrics Variable Voltage on ENET-A429P
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
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Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
Digital Stimulus Response PXI Card
GX5152 Series
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The GX5152 Series are high speed, 6U PXI, digital I/O instruments. The GX5152 master controller has 32 I/O channels that supports test rates up to 50 MHz and vector depths up to 128 Mb per pin. The GX5153 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5152. The GX5152 can control up to 15 GX5153 boards using the same timing and sequencer.
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Product
JTAG Functional Test
JFT
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JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Configurable Functional Test System
ATS-5000
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Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Product
Magnetic Material Test Fixture
16454A
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The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. Complex permeability is calculated from the inductance with and without the toroid. When the E4991A/4291B with option 002 is used as the measurement instrument, direct readouts of complex permeability are possible. In addition, it is furnished with a small and a large fixture to adapt to a wide range of sizes.
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Product
4-Module ICT System, I307x Series 6
E9903G
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Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
Hybrid Single Site Test Handler
3110
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Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
High Density DPDT Plug-In Switch Card
1260-112
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The Astronics 1260-112 is a 96-channel, high-density, double-pole, double-throw (DPDT), switch for the Adapt-a-SwitchTM platform.
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Product
SAS Protocol Test System
M124A
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The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
ARINC PCI Express One Lane Interface Card
PCIE1L-A429
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The ARINC PCIE1L-A429 Interface Card and AltaAPI Support Software Represent the Latest ARINC 32-bit FPGA Protocol Engine Technology. Encode and Decode almost Any ARINC-429 PHY Level Label/Word Signal. The First Card in the Industry to Offer Advanced Test Functions of Signal Generation and A/D Signal Capture. The one lane card PCIe is the industry first low profile
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Product
IDoor Module: 24-Channels Isolated Digital I/O With Counter MPCIe, DB37
PCM-27D24DI
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Meets Advantech Standard iDoor TechnologyPCI Express® Mini Card Specification Revision 1.2 compliantSupports wide-input/output voltage (10-30 VDC/5-30 VDC)High over-voltage-protection (70 VDC) and voltage isolation (2,500 VDC)Easy configuration & efficient programming by Advantech DAQNaviI/O address automatically assigned by PCIe plug & playKeeps the output settings and values after system hot resetSupports Embedded Automation PC UNO-2200/2300/2400 seriesSupports Control DIN-Rail PC UNO-1300/1400 seriesSupports Control Cabinet PC UNO-3200/3300/3400 seriesSupports Control Panel Computers TPC-xx81/xx82 seriesSupports Thin Client Panel Computers TPC-xx51 series
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Product
In-Line Test System
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With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
