Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Spectroscopy Card
microDXP
Instrument Card
The microDXP is a complete, low power compact digital spectroscopy card design for a wide range of handheld, benchtop and other embedded applications, lowering cost and speeding time-to-market.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
Combination Board Functional Test System
QT 4256 ATE
Functional Test
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
NI's Electrical Functional Test Solution
Functional Test
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Test System
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
In-Circuit Test System Repairs
Test System
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
2-CH PCI ExpressR IEEE 1394b Frame Grabber
PCIe-FIW62
Interface Card
The PCIe-FIW62 is an IEEE 1394b (FireWire 800) interface card which provides two high-speed FireWire 800 ports with data transfer rates up to 800 Mb/s on a PCI ExpressR x1 lane. The PCIe-FIW62 provides two direct-connect IEEE 1394b bilingual connectors with a screw-lock mechanism. These screw-lock connectors provide a reliable connection between the PCIe-FIW62 and up to two IEEE 1394b cameras. A 4-pin ATX power connector on the PCIe-FIW62 supports IEEE 1394b cameras that draw power directly from the frame grabber. Each port has a green LED on the front panel that will illuminate when the PCIe-FIW62 is connected to a IEEE 1394b camera for convenient identification of channel connection status.
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Product
Embedded MXM GPU Module with Embedded NVIDIA RTX™ A500
EGX-MXM-A500
Graphics Card
- NVIDIA Ampere Architecture- Standard MXM 3.1 Type A (82 x 70 mm)- PCIe Gen 4 x4 interface- 2048 CUDA® cores, 16 RT Cores, and 64 Tensor Cores- 6.54 TFLOPS Peak FP32 performance
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
PMC-WMUX for F-16 16PP194 Interface
PMC-WMUX
Interface Card
Alta Data Technologies’ PMC-WMUX interface module (PCI Mezzanine Card for Carriers and Single Board Computers) is a single or dual-channel (A-B Redundant = 4 Busses per Channel) WMUX card supported by the latest software technologies. This product is based on the industry’s most advanced 32-bit WMUX FPGA protocol engine, AltaCore™, and by a feature-rich application programming interface, AltaAPI™, which is a multi-layer, highly portable ANSI C architecture. This hardware and software package provides increased system performance and reduces integration time.
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Product
Wireless Device Functional Test Reference Solution
Functional Test
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
SAS Protocol Test System
Sierra M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
PCI Express Graphics Card With NVIDIA RTX 2000 Ada
NVIDIA RTX 2000 Ada
Graphics Card
- NVIDIA Ada Lovelace Architecture- Half height, half length design- PCIe Gen4x8 interface- 16GB GDDR6 Memory, 128-bit Bandwidth- 2816 CUDA Cores, 12 TFLOPS SP Peak- 88 Tensor Cores, 191.9 TFLOPS- 4 x mDP (mini Display Port 1.4), 1 x USB-C
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Test Instrument
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Embedded MXM GPU Module with NVIDIA RTX™ A2000
EGX-MXM-A2000
Graphics Card
- NVIDIA Ampere Architecture- Standard MXM 3.1 Type A (82x70mm)- PCIe Gen 4 x8 interface- 2560 CUDA® cores, 20 RT Cores, and 80 Tensor Cores- 8.25 TFLOPS peak FP32 performance
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Product
PCI Express Graphics Card With NVIDIA RTX 6000 Ada
NVIDIA RTX 6000 Ada
Graphics Card
- NVIDIA Ada Lovelace Architecture- Full height, full length design- PCIe Gen4x16 interface- 48GB GDDR6 Memory, 384-bit Bandwidth- 18176 CUDA Cores, 91.1 TFLOPS SP Peak
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
Embedded MXM GPU Modules with NVIDIA® Quadro® Embedded P2000
EGX-MXM-P2000
Graphics Card
The EGX-MXM-P2000 features advanced NVIDIA Quadro GPU with NVIDIA Pascal™ Architecture technology in MXM 3.1 Type A form factor. The EGX-MXM-P2000 has 768 NVIDIA CUDA cores and a peak single-precision floating-point performance of 2.3 TFLOPS. The EGX-MXM-P2000 has 4GB of GDDR5 memory and supports NVIDIA GPUDirect™ RDMA which helps increase data throughput by up to 80% and consequently system responsiveness by up to 60%*. Additionally, 4 UHD display outputs and an extended operating temperature range of -40°C to 85°C are supported. The embedded graphics product is suitable for mission-critical harshenvironment edge computing applications with size, weight, and power (SWaP) and network connectivity constraints.
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
ARINC-429 Module
M4K429RTx
Test Module
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
