Standard Transformers
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Product
Radius, Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0D
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Standard 2.00 (57.00) - 6.00 (170.00) Non Replaceable General Purpose Probe
F-S-C
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 66Recommended Travel (mm): 1.68Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
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Product
Standard 2.00 (57.00) - 4.00 (113.00) General Purpose Probe
P2757G-1C1S
General Purpose Probe
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
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Product
CPSI-S.0 Standard Compliant Peripheral Board Controlled by a PCIe Channel Derived from a Backplane Connector P1
MIC-3811
Backplane
It is a dual mini-PCIe carrier board with two onboard SIM card holders and mini-PCIe connectors, routed by PCIe and USB2.0 interface. It allows connection with different types of Mini PCIe form factor add on cards like Wi-Fi/3G/4G LTE/GPS/DIO/CAN/ and MVB modules, either full- or half-size style.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1P-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25I15-4
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.10 (31.18) - 4.80 (136.00) Switch Probe
TSP100-H150-1
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Standard 1.10 (31.00) - 2.50 (71.00) General Purpose Probe
HPA-1T
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
STANAG3910/EFEX Test And Simulation Module for Standard Ethernet
ANET3910
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STANAG3910/EFEX Test and Simulation module for Standard Ethernet. The ANET embedded Linux Operating System gives the unique capability to run the optional PBA.pro Engine right in the box. Another option is the ANET-ADK onboard software development kit where users create run-time applications (e.g. STANAG3910/EFEX to Ethernet Converter, STANAG3910/EFEX to Ethernet Gateway) to execute right in the box. For wireless applications, an ANET compatible USB Wifi dongle is optionally available.The capability to execute Python scripts in the ANET is a standard feature. For applications with multiple ANET devices AIM offers the ADock ANET Docking Station to host up to 4 ANET modules.
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Product
ACCUplace Macro Calibration Standard
AP-M Series
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With both X & Y axis metric scales, these dual axis targets are ideal for calibrating optical magnification in microscopes, linear distance, stage motion and squareness. In addition, with the larger area calibration scale, the calibration of low power optical systems over the longer distances can be easily carried out. The AP-M is offered on two standard materials; Glass (CG) and Opal (OP).
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Product
IEC Standard Burden Sets (Current)
IEC Burden Sets
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Testing and calibrating current transformers often requires standard burdens of reliable accuracy and stability, and burdens that are immune to stray fields and harmonics. These burden sets have been carefully designed to meet these requirements. They also provide the standard burdens required for the testing of current transformers for metering service, and for the testing (within the current rating provided by the sets) of current transformers for relaying applications, all as called for by IEC (International Electrotechnical Commission) Publication 185: 1987.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1I15-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1UN-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3A
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
DC Immune Current Transformer
DCT 108
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SHANGHAI POWOO INDUSTRY CO., LTD
- Accurate DC measurement; comply to IEC 1036 and IEC 62053; - suitable for a wide range of current (from 1.5A to 100A); - linear output current, high precision; - compact, delicate appearance.
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Product
Standard 2.00 (57.00) - 6.00 (170.00) Non Replaceable General Purpose Probe
F-S-R
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 66Recommended Travel (mm): 1.68Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
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Product
NanoLattice Pitch Standard for Mask Handling Tools (NLSM)
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The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) Bead Probe
BTP-1C-4
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 3.06 (86.70) - 4.00 (113.40) RF Probe For SMA Connectors
CSP-30ES-013
High Frequency Probe
Nominal Impedance (Ohms): 50Current Capacity (Amps) @ 20° C: 1.00Bandwidth @ -1dB (GHz): 35.00Return Loss @ -20dB (GHz): 22.00Test Center (mil): 328Test Center (mm): 8.33Recommended Travel (mil): 100Recommended Travel (mm): 2.54Full Travel (mil): 200Full Travel (mm): 5.08Overall Length (mil): 1,033Overall Length (mm): 26.24Rec. Mounting Hole Size (mil): 297Rec. Mounting Hole Size (mm): 7.54
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Product
Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50B-QG-75
High Frequency Probe
Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,575Overall Length (mm): 40.00
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Product
Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2J30
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Standard Tensile Link
SL-3.0
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The SL-3.0 is a cable connected Tensile Link available with capacities ranging from 1t to 500t. These devices can be used in various tension load monitoring applications for industries worldwide and combine high levels of performance with excellent value.
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Product
Standard 1.53 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-72T1-4
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Sample Support Holder – Standard 1 Cm² / Custom Reaction Area
SSH-1
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The Sample Support Holder is designed for mounting flat samples in electrochemical cells and defining a controlled exposed area. Manufactured from PTFE, it accommodates samples 0.1–2 mm thick and 12–14.5 mm in diameter, with a standard exposure area of 1 cm².
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Product
Pyramid, 3-Sided Chisel 30°, Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0T
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Standard Voltage 9 Pin D-Type Cables - Connector to Connector for Pickering Products
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The connector to connector cable assemblies below are suitable to use with Pickering cards and modules that utilize a standard voltage 9-pin D-type connector.
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Product
Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2P
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Transformer Resistance Testing
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Transformer insulation resistance deterioration is one of the most common causes of transformer failure: a failing transformer is a costly replacement in an electrical system with the potential for a long downtime. If you fail to maintain your transformer with regular insulation resistance testing (as can be carried out by the Megger Transformer Ohmmeter (MTO) series of transformer test equipment) then it’s likely to fail before reaching its maximum operating life.
