Highly Accelerated Life Test
Processes a product through extreme temperature, vibration and product tailored stresses to expose design limits.
See Also: HALT
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3D Acceleration Logger Sensor
NUL-227
This is a 3D (three dimensions) acceleration sensor which displays each dimension one at a time. It allows measuring the acceleration of moving bodies such as a body oscillating in a spring or in a moving vehicle.
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Full-Featured Life Cycle Test System
LCV
Configurations for testing to industry standards: IEC, SAE, BCILife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing
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Low Temperature Operating Life (LTOL) Test
LTOL
LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Eagle Test Systems
ETS-200T
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Electric Tool Life Tester
Guangzhou Jumho Electric Co., Ltd.
Electric Tool Life Tester loads various periodic signals, such as constant current, constant torque and revolving speed etc, to a single electric tool until it is completely ruined, comparing historical data for further causal analysis.
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Constant Acceleration Tester-Arm Type
KRD31 series
KRD31 series constant acceleration tester are used to test articles under extreme acceleration conditions based on standard like MIL-STD-810F, MIL-STD-202 and IEC68-2-7. It is most suitable for testing electronic components or devices. Under high g effect on microcircuits, to check adaptability and reliability of wiring and the internal structures. It may expose mechanical and structural defects that are not found with vibration and shock tests.
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Spectrophotometer For Life Science
BioSpec-nano
Capable of performing quantitation and purity checking of nucleic acids, quantitation of proteins, and photometric measurements (OD values displayed and printed for specified wavelengths, up to 8 wavelengths). Simply drop 1 to 2 μL of the sample onto the measurement window and press the instrument's Start button (or click the Start Measurement button in the software window), and all steps in the process, from setting the optical path length, measurement, up until the task of wiping off the sample from the measurement window, are all carried out automatically. Troublesome work of moving arm up and down and wiping the sample from the measurement window now unnecessary. Moreover, when using the specialized software, all it takes to perform a measurement, output a report, export data, or carry out other common tasks is to click buttons on the toolbar.
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Mini In-Circuit Test System
U9403A
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Accelerated Aging Testing
Accelerated aging is a testing method used to estimate the useful lifespan of a product when actual lifespan data is unavailable. This occurs with products that have not existed long enough to have gone through their useful lifespan: for example, a new type of car engine or a new polymer for replacement joints or medical products and packaging.
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Acceleration and Gyro Sensors
Acceleration and gyro sensors specifically for the motorsports industry.
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High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Acceleration Sensor
Vernier Software & Technology, LLC
This 3-axis acceleration sensor has two acceleration ranges plus an altimeter and a 3-axis gyroscope. An additional channel measures the angle of the sensor’s long axis. Go Direct Acceleration Sensor connects wirelessly via Bluetooth® or wired via USB to your device.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Highly integrated, PC-compatible embedded modules
ETX®
Highly integrated, PC-compatible embedded modules based on x86 CPU architecture all that on a footprint of 95 x 114 mm.Full featured Multimedia PC from Intel Atom via AMD or VIA Eden to Intel Core2 Duo on 95 x 114mm - the standard for custom designs.
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Series Dual Temp / Acceleration Sensors
TA102
Dual Temperature / Acceleration Output, Top Exit Connector / Cable, 100 mV/g, 10 mV/?C
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Life Science, Stability Test Chambers
Weiss Technik provides test Chamber solutions for packaging, medical devices, pharmaceutical, biotech and other life science products.
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Acceleration Simulation Mode (ASM) Roller Set
ASM-P-PLUS | VP 230047
Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-P-PLUS roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97. The increased tractive force of its eddy current brake means that the ASM-P-PLUS is also suitable for power measurements at constant speed and constant tractive force.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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PCIe 4.0 Test Platform
PXP-400A
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Acceleration Meter (Top/Side Output)
BC 111
*General-purpose acceleration meters with integrated electronics;*Sensitivity: 10 mV/g;*Frequency band: 1 ~15 000 Hz.
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Other Test Systems
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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CPE Design Verification System
Jupiter 310
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Life Cycle & Fatigue Testers
Switches can use all these operations. Membrane switches, keyboards and keypads will all require a push with a known force. On/Off switches will combine a push and a pull or possibly push on, push off. A rocker switch and toggle switches will require a push in two different places. Rotary switches (and volume controls, potentiometers) need to be rotated clockwise and counter clockwise The standard life cycle and fatigue tester the B886 Simon System has been designed for life cycle and fatigue testing of switches, membrane switches, keyboards and keypads. It contains all the components needed to life and fatigue test a products that need to be pushed. We can also supply different actuators for a push, pull, rocker, toggle, volume control or rotary switch.
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Power Cycling Semiconductor Life Test System
ITC52300
The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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Life Science Microscope
Our product range includes a wide range of smart life science microscope, excel life science microscope, select binocular microscope, crown trinocular life science microscope, classic life science trinocular microscope and premium trinocular microscope.
