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Memory Module Testers
The module tester tests the modules in which the final tested components are assembled together. This test is also one of the most important factors to guarantee the quality of the products. DDR, DDR2, DDR3, FBDIMM,
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PID Insulation Tester
TOS7210S
The PID insulation tester (TOS7210S) is designed based on the insulation resistance tester (TOS7200) to carry out the evaluation of the PID (Potential Induced Degradation) effect of the PV module precisely and efficiently. Being equipped with the output ability of 2000 V and the ammeter with nA resolution as well as a polarity switching function, the TOS7210S is also applicable not only to the PID evaluation but also the evaluation of the insulators that requires a high sensitivity of measurement. The tester is equipped with the panel memory that is externally accessible and RS232C interface as standard; it can be flexibly compatible with the automated system.
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Gear Teeth Hardness Tester
PHT-1840
This dedicated unit is designed to test gear teeth and other difficult to access applications. The 1840 is loaded with the same features found on the base 1800 version which includes memory, USB output and software for downloading to your PC. The 1840 hardness tester is capable of measuring the surface hardness of a broad variety of metals on flat and round surfaces. This instrument comes complete with a dedicated DL impact device, calibrated test block and rugged carry case.
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0-5KV Digital Hi-pot Tester 0-5KV
7110
Shenzhen Chuangxin Instruments Co., Ltd.
Programmable AC/DC withstand voltage tester Feature: Small volume, light weight Easy to operate, has keyboard lock function Provide 5 groups memory setting, each group has four kinds of work mode
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Test Adapter
RAMCHECK® SIMM
The RAMCHECK SIMM Adapter is another addition to the RAMCHECK memory tester. It provides a needed solution for testing older 72-pin EDO/FPM DRAM SIMM modules. An optional adapter for 30 and 72-pin SIMMs is also available
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Portable Force/Displacement Tester
The FSA-MSL Mini Material Tester is a portable force/displacment tester. The FSA-MSL is ideal for tests requiring very small movement, like switch tests. The tester also features a reversible base plate, allowing the tester to be used on uneven or obstructed surfaces. The highly visible EL display and plain language menus in eight languages make programming fast and easy. Both force and displacement values are displayed plus user-selectable data; high/low setpoints, peak, memory data, etc.
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CT Ratio/Burden Tester
1047
TESCO’s new CT Ratio/Burden Tester (Catalog No. 1047) is a lightweight, portable and highly accurate in-service test set to assist in finding lost revenue by testing the accuracy of your meter circuits. The Tester can help determine if there are installations errors, loose connections, incorrect ratios, resistance buildup, open CT’s, or manufacturers defects. The CT Ratio/Burden Tester measures and displays the primary and secondary current of the CT under test, and the ratio of the currents. All test data is stored in the internal memory and easily uploaded to a PC.
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Optical Power Meter & VFL
TM263
◇ Self Calibration◇ Set the Auto Off◇ Wavelength Memory function after turn off the tester◇ High Accuracy, high ,High sensitivity, high linearity◇ Stable VFL Output◇ USB Charge port◇ FC,SC Connector◇ 18650Li-ion Battery◇ Lower power consumption design, long standby time◇ Rubber Out shell, increased the protective properties for field work
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Network Cable Tester
AudioJoG Pro 8 Power
Audio/Lighting/Network cable tester with SINGLE & DOUBLE ended testing with memory and intermittent fault detection.
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SNAPSHOT
PH-200
The Snapshot cable checker gives professionals and layman the ability to check cables instantly upon plug-in, with no buttons pressed or displays read. With its built-in memory, the Snapshot simply checks each cable plugged in against a correctly-configured cable pre-set by the user, and indicates the cable’s status with a sound. For pin-by-pin cable checking, the 〝standard check〞mode offers a plain LED-displayed check of the cable’s pins, checked automatically or manually. The Snapshot also generates a tone along the length of cables, making finding and following the cable with a tone probe a snap. A remote unit allows testing of already-installed cables, and a built-in line tester verifies phone line polarity and detects voltage before it threatens the safety of the test unit. A shield-test feature automatically tests cable shielding and a battery-low indicator prevents misreading results.
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Hardness Testers
Guangzhou Amittari Instruments Co.Ltd
Memory Foam Hardness Tester AS-120MF, special for memory foam hardness measurement.(memory foam is also known as slow rebound sponge, space zero pressure, space foam, TEMPUR material, low rebound sponge material, viscoelastic, used in high velocity ofaerospace, aviation, equipment, high-end consumer goods.)
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Auditor Torque Cube
ATC Series
The Auditor Torque Cube (ATC) is a compact, versatile desktop tester and provides a multitude of capabilities. The ATC is designed to test hand or power tools with the following: Peak, first peak and track modes. Multiple engineering units. Manual and auto clear function. Multiple frequency response settings. Bi-directional use and accuracy. Accuracy is better than 1% of indicated reading top 90% of range. Serial data output. Memory 999 data samples. Battery and/or mains powered.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Wire Harness Tester
NX Pro
The Dynalab NX Pro Wire Harness Tester is a low-cost, feature-packed, stand-alone continuity tester with a maximum capability of 512 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to "decide" which operation to perform next. The NX Pro Tester has 1.3Mb memory capacity for program storage and is compatible with Printers, Scanners, and all other Dynalab NX System accessories.
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Component Testers
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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Optical Power Meter & VFL & RJ45 Network Test
TM263N
◇ Added Network Cable Test ◇ Accurately test whether a single network cable transmits signals normally ◇ Self Calibration ◇ Set the Auto Off ◇ Wavelength Memory function after turn off the tester ◇ High Accuracy, high ,High sensitivity, high linearity ◇ Stable VFL Output ◇ USB Charge port ◇ FC,SC Connector ◇ 18650Li-ion Battery ◇ Lower power consumption design, long standby time ◇ Rubber Out shell, increased the protective properties for field work
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Test Adapter
Ramcheck 72 Pro
Our latest addition to the RAMCHECK memory tester provides needed support for testing 72-pin SO DIMM modules used in older laptop computers. The RAMCHECK memory tester automatically detects the presence of the RC 72 Pro adapter
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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USB TESTER, 3-9V, 3A, WHITE
72-13540
*USB tester inspects USB charger & portable power source*Lightweight and portable*LCD backlight*High/low output voltage warning*10 sets of data memory
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Network Cable Tester
LightingJoG Rack 8
Sensational 19 inch 2U rack mount Lighting/Network cable tester with SINGLE & DOUBLE ended testing, memory and intermittent fault detection.
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Memory Burn-In Tester
H5620/H5620ES
As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Leeb Hardness Tester
THL500
It is the highest brightness display in China showing all functions and parameters, easy read Largest screen Oled screen and operate,also can save lots of energy .the largest screen of Leeb hardness tester in China. Two hardness scale dual-display in the screen. Measuring direction in 360 and add the auto measure direction to make test easy and precision. Add four new hardness scales, HRA, HB for D impact device of alloy tool steel; HV for cast aluminum alloy. Add New user material function, to meet the need of user can test the special material. Test at any angle, even upside down. Wide measuring range. It can measure the hardness of all metallic materials. Direct display of hardness scales HRB, HRC, HV, HB, HS, HL and three types of strength values immediately. Seven impact devices are available for special application. Automatically identify the type of impact devices. Large capacity memory could store 600 groups (Relative to average times321 ) information including single measured value, mean value, testing data, impact direction, impact times, material and hardness scale etc. Upper and lower limit can be preset. It will alarm automatically when the result value exceeding the limit. Battery information indicates the rest capacity of the battery and the charge status. User calibration function. USB port with the PC humanity multi-functions data proceeding software. Original imported high speed thermal printer support the immediate printing function. It can save data permanently. Li rechargeable battery as the power source. Charge circuit integrated inside the instrument. Continuous working period of no less than 200 hours (EL off and no printing). Auto power off to save energy. Excellent after-sale service system for high quality products---3 years guarantee and all life maintenance. Easy to buy and comfortable to use.
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Memory Tester
RAMCHECK
RAMCHECK is our most advanced memory tester and is the latest in our product line. Highly modular and user friendly, it redefines the capabilities of an affordable and portable ram checker.
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Solderability Tester
LBT210
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Nand Flash Tester
NplusT
NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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Hi-Pot Tester
DU3315/3316
Delta United Instrument Co., Ltd.
3 in 1 tester with AC, DC, IR functions ( IR function is optional for DU3316 only)ARC Detction:DU3315 /DU3316 Standard function40 x 4 LCD text displayFast cut-off time : 0.4ms5 sets of memory, 3 steps for each memory
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Turns Ratio Testers
TRT Advanced Series
TRT Advanced series is the newest DV Power solution for transformer turns ratio measurement. Besides its main application, each turns ratio tester from this series also measures transformer excitation current and phase shift. Furthermore, all models perform automatic vector group detection and magnetic balance on three-phase transformers and three-phase autotransformers. They have a built-in true three-phase power source. For that reason, they can test transformers with special configurations, such as phase-shifting, rectifier, arc-furnace, traction transformers, etc.The instruments can output test voltages from 1 V AC to 500 V AC, depending on the model. With the highest test voltage 500 V AC, TRT500 provides the most accurate turns ratio testing of power transformers used in power generation and transmission. The output test voltage of TRT500 can be boosted to 5 kV AC using the external CVT20 extension transformer. This application is specially designed for testing turns ratio of capacitive voltage transformers. The other three models, TRT400, TRT250, and TRT100 can output up to 400 V, 250 V, and 170 V respectively. The low test voltage of 1 V AC enables turns ratio verification of current transformers.TRT500 is equipped with a large 10.1” graphical touch screen display. Other models, (TRT400, TRT250, TRT100) have 7” graphical touch screen display. Besides making the interface much more user-friendly compared to older turns ratio testers, it also brings certain options that were previously available only with DV-Win software. The most important are test templates and automatic test mode. Users can simply create test templates, store them in the instrument’s memory, and load when in the field with just a few clicks.This turns ratio test set, as well as all other DV Power turns ratio testers, has a built-in tap changer control unit. It enables remote control of an on-load tap changer (OLTC) directly from the instrument. In order to make the most out of this feature, the instrument can be programmed to do everything automatically – running turns ratio tests, changing OLTC tap positions, and saving results. This option, especially in combination with test templates, significantly facilitates and shortens the turns ratio testing time. Automatic test mode minimizes human errors, which makes the measurement more reliable.
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D-SUB (Male)
QSPI
The QSPI represents a multi-function of performance and capabilities for PXI-based digital instrumentation. The QSPI offers high performance pin electronics and 4 I2C masters and 4 32bit counter 4 clock generator in a compact, 3U PXI form factor. Each card can function as a quad sites I2C/SPI device tester, multiple cards can be interconnected, supporting up to 64 sites. The QSPI also supports deep pattern memory by offering 32M of onboard vector memory with dynamic per pin direction control and with test rates up to 10 MHz.
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Application Level Tester
The application tester tests the memory devices such as graphic memory and HDD buffer memory in a specially designed condition made similar to actual PC and Server environments. In fact the graphic memory has releatively higher speed, test expense and quality standard compared to main memory, stressing the importance and the need of the application tester.
