Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
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Product
ASCA Pilot Program Participation
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Compatible Electronics, Inc. is a testing laboratory participant under the United States Food and Drug Administration’s Accreditation Scheme for Conformity Assessment (FDA ASCA) pilot program. We are listed under ASCA ID# TL-80, TL-81 and TL-82.
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Product
3-Axis Non-Robotic Automated Testing System
AT3
Test Instrument
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Automatic Test System
Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
Flash Programming for Functional Test Systems
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Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
Programming Stations
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A dedicated computer setup used to create, test, and upload code or instructions for machines (like CNC tools or industrial robots) or electronic devices (like ECUs) away from the main equipment, reducing downtime and improving efficiency; it mimics the main control interface, allowing for offline development, simulation, and diagnostics, ensuring smoother operations when the actual machine runs.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Programming Interface for CMC Test Sets
CMEngine
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CMEngine is an open programming interface that enables you to integrate the CMC test sets into your own testing environment and control them within any type of application.
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Product
WaferPro Express On-Wafer Measurement Program Software
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WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Other Test Systems
Test System
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Physical Testing Test
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Physical Testing by Aero Nav: mechanical, weathering, environmental, immersion, electrical, luminance, thermal analysis, thermal conductivity, water exposure, saltwater exposure, etc.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Regenerative Battery Pack Test System
17040E
Test System
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
160W DC Programable Power Supply
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*Source effect: CV≤0.01%+3mV(mA)*Load effect: CV≤0.01%+3mV(I≤3A) CC≤0.2%+3mA(I≤3A) CV≤0.02%+5mV(I>3A) CC≤0.2%+5mA(I>3A)*Ripple and noise: CV≤1.0mVrms(I≤3A) CC≤3mArms(I≤3A) CV≤2.0mVrms(I>3A) CC≤6mArms(I>3A) *Protection Type: Overcurrent Protection (OCP) Overvoltage Protection (OVP)* Display accuracy: Voltage indication accuracy: ± (0.5% + 2 words)
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Product
Regenerative Battery Pack Test System
17020E
Test System
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Product
Motor Vehicle Inspect Lines Engineer Program
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Foshan Analytical Instrument Co, Ltd.
It is suitable for measurement of motor vehicles equipped ignition engine with max total mass more than 3500kg.Including the dual idle speed method test.Meet the requirement of GB18285-2005"Limits and Measurement Methods for Exhaust Pollutomts from Vehicles Equipped Igintion Eigine under Two-speed Idle conditions and simple Driving Mode Conditions".The system can select the prompt mode of the dirver mode or the prompt mode of lattice screen.
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Testing
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Apogee Labs offers a wide variety of modular chassis types used for test applications with various Data Link Test Modules.
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Load Testing vs. Stress Testing
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A load test is a planned test to perform a specified number of requests to a system in order to test the functionality of the system under specific levels of simultaneous requests. A load test ensures that a web system is capable of handling an expected volume of traffic, and therefore is sometimes referred to as volume testing. The goal of a load test is to prove that a system can handle the expected volume with minimal to acceptable performance degradation. The threshold of acceptable performance degradation must be defined by the testers as some value considered acceptable to the end user so that users will not bounce from the site.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
Compliance Test, Development and Test Service
DinoStor
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With its focus on solving critical backup problems associated with Network-Attached Storage (NAS), DinoStor delivers a broad range of products and services to benefit users and vendors of NAS solutions.
