Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
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Product
PXI Semiconductor/IC Test System
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A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Digital Test Instruments
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Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
SoC Test System
V93000 SoC / Smart Scale
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Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
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The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
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Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
RSE Wireless EMC Spurious Emission
TS8996
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The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
Universal In-System Programming Tool
ScanExpress JTAG Programmer
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ScanExpress JTAG Programmer is a universal in-system programming (ISP) solution designed for convenience and versatility—a modular, multi-functional, and high-performance tool to program, read, and verify Flash memories, serial EEPROMs, CPLDS, FPGAs, and more.Like all Corelis ScanExpress family products, ScanExpress Programmer is a tool for all phases of the product life cycle—whether programming early code during product development, programming production code during manufacturing, or reprogramming units out in the field, ScanExpress Programmer is designed to fit all in-system-programming needs.
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Product
Software Defined Radio Program
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Scientific Research Corp. STI Division
SRC is on the forefront of software defined radio technology, test, and interoperability. We provide systems engineering support for waveform testing, software and hardware integration, standards compliance, and information assurance.
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Product
BSD (Test Diagnostics)
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BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Digital Program Insertion Auditor
Torque DPI
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The DPI Auditor supports the ANSI/SCTE 35 2001 standard that defines a fully digital mechanism to control remote splicing equipment via cueing messages embedded in the transport stream. The core of the standard is centered on an SIT (Splice Information Table) which can contain a schedule message or an insert message.
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Product
Photonics Wafer Probing Test System
58635
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The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
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Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
In-Circuit Testing and Test Engineering
Teradyne Z1890
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2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
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Product
Wireless Device Test
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New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
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InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Product
PCIe 4.0 Test Platform
PXP-400A
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The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Product
Test Automation System for Brake Testing
STARS Brake
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STARS Brake is an integrated automation, data acquisition and control system platform that provides a comprehensive application functionality in a single, powerful environment. STARS Brake is designed to address the needs of a wide range of brake testing applications from component development to final component and system validation. It offers users a level of flexibility and openness that enables thorough investigations of brake systems.
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Product
Test Adapter
RAMCHECK® SIMM
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The RAMCHECK SIMM Adapter is another addition to the RAMCHECK memory tester. It provides a needed solution for testing older 72-pin EDO/FPM DRAM SIMM modules. An optional adapter for 30 and 72-pin SIMMs is also available
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Product
Test SIP
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VoIP, Video, and IPTV products must withstand and continue to function when facing all the conditions that occur on the Internet. These include attacks from hackers exploiting vulnerabilities in security and protocols as well as the common phenomenon of congestion, delay, jitter, drops, and so on. VoIP, Video, and IPTV products must demonstrate robustness and resiliency in the face of unusual and/or illegal conditions.
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Product
Hi-Pot Testing
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The CableEye HVX System combines our M3U tester with a high voltage module to provide Hi-Pot testing of insulation resistance and dielectric breakdown up to 1500Vdc and 1000Vac.
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Product
Package Testing
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AMERICAN TESTING LABORATORY tests all types of product packaging, from shipping crates to child resistant packaging. In addition, we test the effects of many types of physical and environmental shocks on products inside the packaging.
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Product
MPI Education Program
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MPI Advanced Semiconductor Test
Education plays a critical role in the economic success of any country or society. As a result universities are facing enormous pressure to ensure that every procurement decision meets the needs of not just today’s students, but tomorrow’s.
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Product
Testing Equipment
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Our product line of material testing equipment can perform several different types of tests and on different types of samples in tension and compression. With our testing software Califort, simply press the green arrow and your tests and measurements start.
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Product
Design for Test
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Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Product
Impact Testing
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The Impact Testing software of the m+p Analyzer real time analyzer includes useful tools like the selection of a roving hammer or transducer, selection of data points/nodes, double impact detection and rejection, definition of force and exponential window and a user-definable display configuration as a visual measurement feedback.
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Product
5G Testing
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Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
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Product
Electrical Testing
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Innovative Testing Solutions, Inc.
Our specialty is Direct Current automotive components. We perform product validation and design verification testing on both electrical components and systems. Also, we perform warranty investigation testing and failure analysis. We have voltage capabilities to 300 volts and current capabilities to 1000 amperes. Both two-wire and four-wire resistance measurements are supported from NanoOhms to GigaOhms.
