Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
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Test Program Sets
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Each grouping may consist of 15 levels of development ranging from Complexity 0 to Complexity 14, with level 14 the most complex. Within each complexity, nine additional subcomplexity levels exist.
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Test Program Modules
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The BRAT Test Program developed will provide functional validation of an assembly based on customer supplied documentation. This does not include hardware (e.g., Interface Test Adaptors), documentation (e.g., technical orders), travel or travel related per diem, or site verification test or installation.
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Test Program Development
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Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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Test Program Management
TP-M
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TP-M utilizes TestInsight unique capability to read and analyze a whole test program from flow to every test pattern, timings, levels etc.
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Content based revision compare of Test Programs
Test program Comparator
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TP-C is part of the new test program life cycle solutions from TestInsightAddress concerns such as - Why does my test program yield differently in two sites ? Is it really the same program ? What is different in a given test program revision ?
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Test Program Sets & Custom System Level Software
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WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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JTAG Test Software
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JTAG Technologies software has been subject to a program of continuous development for over 20 years. The first products, launched in 1991 formed the start of our 'Classic' range of software and featured the first automatic boundary-scan test program generator (ATPG) for PCB interconnects plus associated test execution and diagnostics software. In 2006 JTAG Technologies launched it's new flagship tools platform JTAG ProVision.
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CAD / BOM Translation Software
ProntoTEST-FIXTURE
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In minutes the Unisoft ProntoTEST-FIXTURE software translates CAD and Bill of Materials (BOM) files into real reference designators, netlists, X/Y component pin geometries, values, tolerances, part numbers, etc. This data is then used by Test Engineers to program their ATE (Agilent/Hewlett Packard "board & board x/y", Teradyne "ipl", Genrad ".ckt"), MDA, and flying probe test equipment and design the "Bed of Nails" test fixtures.
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Digital Test Instruments
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High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
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Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
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Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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ATE System Power Supplies
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For more than 50 years, Keysight's automated test equipment (ATE) power supplies have changed the way engineers prove their designs, understand issues, and ensure product quality. Our programmable ATE system power supplies' compact design makes it easy to integrate them into any system. Keysight power supplies make it easy to update a test program with modern interfaces, LXI-core capability, and SCPI language. Accelerate test time with fast command processing and quick settling times.
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Analog Mixed Signal Testers
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- PC-performance independent: multiple SPEA CPUs provide test program timing, while pc replacement does not require the test program requalification- Pattern-based programming: -30% test time vs competitors- 64-line synchrobus and 16-line high-speed synchrobus for real-time instrument synchronization: no embedded delay when running pattern-based testing- 99% parallel test efficiency- Multi-site test capabilities for up to 256 devices in parallel- High-density, floating instruments, for true parallel analog test- Universal slot architecture, up to 1,408 channels- RF generators up to 3 GHz
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Test Programming
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Terotest offers a full test programming service for all of our Automatic Test Equipment. In many cases test programs can be generated from CAD data on the product or component under test, or from autolearn facilities within the test system. Such techniques maximise accuracy and test program fault coverage, and allow quick and easy test program generation.
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Product
DiodeTester
FECPLS500
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Frothingham Electronics Corporation
The PLS500 automatic tester is designed primarily to do SURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses and THERMAL RESPONSE either in DVF (mV) or degrees per watt. All three test types may be performed in a single test program.
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Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
788182-26
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The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
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Product
PCIe to 3U VPX Extender / Riser Card
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This adapter can be used to run, test or program a 3U VPX card in a standard PC PCIe slot. SSC switchable (ON/OFF) PCs available from PCI-Systems Inc.
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Prodution Testers
Effitest E50
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Effitest e50 is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.
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Laboratory Weathering
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Atlas Material Testing Solutions
Atlas Weathering Services Group (AWSG) operates one of the largest networks of ISO/IEC 17025 accredited accelerated weathering testing laboratories in the world. With laboratories in the USA, Germany, France and the United Kingdom, AWSG's indoor exposure laboratories offer artificial accelerated weathering tests and a variety of other environmental test programs, all designed to accurately simulate true end-use conditions and meet global weathering standards. Atlas has several accelerated laboratories around the world.
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Drop-In Functional Test Fixtures
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Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
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Custom Testing Solutions
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Test and MeasurementEnable increases the robustness of your test and measurement solutions, thereby reducing errors and associated costs. Data Acquisition (DAQ)Enable defines and builds custom DAQ systems for automated measurements of any process or manufactured part. Control and AutomationEngineeringEnable ensures that your processes are programmed to be safe, effective and optimized for both speed and quality. Real-Time and Mission CriticalSystemsEnable develops dependable real-time systems and Hardware in the Loop (HIL) simulations for high-speed applications. Motion ControlEnable creates software for synchronized multi-axis robotic control of velocity, position, force and action. Machine VisionEnable implements software and hardware-based solutions for precise image analysis, data extraction and vision-guided machine control. R&D Systems/Product DevelopmentEnable’s team of engineers and scientists works with you to address and solve problems containing technical challenges and uncertainties. Electronic Test SystemsEnable programs and builds software and hardware-based solutions for accurate measurements, from DC to RF. Mobile App DevelopmentEnable enhances your systems by integrating custom iOS and Android apps. Web DevelopmentEnable enhances your systems by integrating desktop and mobile web frameworks using PHP, CSS and HTML5. Database DevelopmentEnable decentralizes your data storage to be online, secure and accessible from anywhere.
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Touch Screen Controller
EZT-570i
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The EZT-570i Touch Screen Controller offers a 7" (18mm) or optional 10" (25 mm) touch screen and the latest in test chamber programming for ease of use . The controller comes standard with data logging, data file access via memory stick or PC, Ethernet control and monitoring, alarm notification via email or phone text message, data file backup, full system security, online help & voice assistance in multiple languages and more.
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Software for the Development and Implementation of Test Programs using IEEE 1641
newWaveX Suite
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We Have a unique suite of tools to support the development and implementation of test programs created using IEEE 1641 to define the signals and tests. These include the entry-level version of newWaveX (newWaveX–Lite), the development versions of newWaveX (newWaveX–SD and newWaveX–PD) and the complete integrated development environment for IEEE 1641, SigBase. These tools provide everything necessary to work with IEEE 1641, from creating simple signals through to implementing and managing a complete 1641 test environment. All of our 1641 tools are commercial off-the-shelf (COTS) items that may be used stand-alone or integrated into a complete test development environment. newWaveX products may be integrated with third party test executives and associated software.newWaveX is an intuitive user-friendly suite of products that does not require specialist training for users to acquire the skills to develop 1641 programs. Completing the IEEE 1641 User/Developer training course (which uses newWaveX Signal Development for the hands-on element), together with the associated 1 day newWaveX–SD User/Developer training course, provides complete information for the newWaveX user. Further support is provided for users of newWaveX packages under the maintenance agreements for those products.
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Engineering Services
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In addition to the highest quality test programming, maximizing board coverage, and efficient board testing, TTCI offers a full array of other engineering services, including CCA (Circuit Card Assembly) Testing, Design for Test, ASTER TestWay electrical design for test analyzer, Feasa LED analyzer, SMH Technologies FlashRunner in-system programmer, finite element analysus, installation, reverse engineering of Gerber to CAD, Training, Test System PC, Hardware, and Software Upgrades, and more.
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High Performance EV Battery Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
The 6V series battery test system uses a full-bridge circuit topology with a higher digit sampling chip. It can provide higher precision and more dynamic test data, and can provide a complete test program for mainstream lithium-ion batteries and batteries with a variety of material systems such as sodium batteries.
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Development Software Suite
JTAG ProVision
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The JTAG ProVision software suite is used to generate boundary-scan tests and in-system programming applications for assembled PCBs and systems. This professional development tool is fully automated and supports the import of design data from over 30 different EDA and CAM systems. Other key data inputs are JTAG device BSDL models and a large, well-maintained model library describing thousands of non-JTAG devices.
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In-System Test Programming System
WriteNow
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Based on proprietary WriteNow! Technology, the WriteNow! Series of In-System Programmers is a breakthrough in the programming industry. The programmers support a large number of devices from various manufacturers and have a compact size for easy ATE/fixture integration. They work standalone or connected to a host PC, and are provided with easy-to-use software utilities.
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ASIC Testing
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Silicon Turnkey Solution, Inc.
As ASIC designs increasingly become more complex, so does the testing process—in fact, it can even be the bottleneck that constrains the total design cycle time and therefore impacts time to market. Effective and accurate testing requires in-depth knowledge of the hardware design itself as well as the software skills to conceive and create the appropriate test programs.
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Product
Vector Network Analyzer (VNA) Simulator – Standard
S94050B
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S94050B puts flexible S-parameter analysis into your own computer. Dive deeper into measurements captured on a network analyzer or develop and optimize test programs before deploying them onto an instrument.
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Remote Control Voice Recognition Tester
BK3013
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Ready to help you take on the leading edge of consumer technology, we have designed a machine that tests microphones which both use RF and are used for voice recognition. The BK3013 runs a uniform SPL sweep to calculate FRF and also runs an SPL sweep that allows you to test the SPL range of your mic. Our "Test Shop" program will show you the results in graphs and allows you to have the computer check specific points in the test.
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Product
PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
788182-08
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The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
