Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Shear Beam LoadCells
Shear Beam LoadCells are designed for low profile scales and process applications. These loadcells should be mounted on a smooth flat surface using high strength hardend bolts. The mountaing holes are at the opposite end to where the cell is loaded. Some of the larger Shear Beam Loadcells use multiple mounting holes to allow extra bolts to hold them in place and keep them from stretching under the stress.
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Heavy Duty Shear Beam Load Cells
SBL SERIES
The SBL Series heavy duty shear beam load cells are ideal for process weighing and for use in low profile industrial scales. These economical load cells are easy to install and durable in the field. Environmental protection is afforded through water resistant potting, a compression sealed and strain relieved cable entry, and corrosion resistant nickel plated steel.
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Bending Beam Load Cell
EST-7
Technopark Automation & Control
The EST-7 is a Bending Beam Load Cell suitable for use on lower capacity weigh hoppers, filling machines, packaging machines and conveyor belt scales. This load cell is available in capacities from 10 kg to 200 kg.
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Ion Sensor
984v2
The Meech Model 984v2 Ion Sensor is an easy-to-use device for checking the performance of both AC and DC powered static eliminator bars.
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Waterproof pH/mV/Ion Meter
CyberScan pH 620
Measures pH and Ion with up to 0.001 Resolution. Cal-Due Alarm Prevents Out-dated Calibrations, while Set-Point Alarms warns when readings are outside set-point limits.
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Beam Directional Power Supply Mains
SiteX CP160D
The CP160D is the lightest and most compact generator of the CPSERIES. Featuring a built-in Beryllium window, it is the perfect generator for the inspection of light alloys such as aluminum, magnesium or fiber based materials like glass and carbon, as well as the greater thickness of steel. In fact, with its penetration capacity that is capable of reaching up to 37 mm of steel, the CP160D is able to execute many different types of NDT tasks without the need to ever have to add extra accessories.
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Sodium Ion Concentration Pocket Water Meter
LAQUAtwin Na-11
The only pocket meter that directly measures sodium ion concentration in 0.3ml sample (or 0.05ml sample with sampling sheet B). Unique sensor allows measurement of viscous liquids, solids, and even powder samples. No need for a beaker to calibrate your meter or measure a sample. Just place few drops of the standard or sample onto the flat sensor. This procedure saves you time and prevents wasting your precious sample.
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Capacitors - Beam Lead
Macom Technology Solutions Holdings Inc.
MACOM’s MMI-9000 and 9100 Series Chip Capacitors feature high stand-off voltage and low dielectric loss leveraging nitride/oxide dielectric layers. Gold bonding surfaces, top and bottom provide ease of bonding and minimum contact resistance. MACOMs beam lead capacitors have high insulation resistance, low dissipation factor, and low temperature coefficient, which are features that produce devices with excellent long-term stability.
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Benchtop pH/ORP/Ion Meter
LAQUA ION2000
Water quality analysis is repeatedly performed in laboratories on a daily basis. Our compact and powerful benchtop model was developed to provide simplicity with excellent on-site usability.
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Waterproof pH/mV/Ion/ Conductivity/TDS/ Resistivity/SalinityHandheld Meter
CyberScan PC 650
Combining two of the most popular electrochemistry parameters, the Eutech’s CyberScan PC650 allows you to measure pH, conductivity and temperature with one handheld, at the same time.
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Beam Position Detectors
We offer a wide range of laser beam position detectors for optical alignment including Quadrant Cell Photoreceivers, PSDs, and Thermopile Position Sensors. Please see our Beam Position Sensor Guide for more information.
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Beam Pattern Measurement System
BP100
The BP100 is purpose-made for luminous intensity measurement of lamps, using a diffusely transmitting screen to provide a flat image that can be measured by an imaging photometer. This is a low cost, versatile solution in comparison to the traditional method of measuring lamp properties as a function of angle of emission, using Goniometers that are often costly and dedicated for one specific measurement.
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ION 100 Portable Ion Meter
The new addition to the Environmental Express Oakton product line features updates to measuring water quality easier and faster. The larger LCD display is 2.75 in. by 2.0 in. for a better viewing angle, and has indicators for battery life, stability, and calibration. The ION 100 meter measures pH, mV, ion concentration of 16 commonly measured ions, and temperature. The microprocessor-based meter features automatic calibration, automatic temperature compensation, function setup, self-diagnostics, automatic power-off, and low voltage display. The meter uses advanced digital processing technology, intelligently improving the response time and accuracy of your measurements. Easily switch units among pX, mol/L, and mg/L (ppm).
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Ion & Electron Detection
Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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High Power Beam Analysis
The advantages of fiber lasers are their high power, mechanical stability and good beam quality; however beam quality and beam profile has to be periodically checked. In general, there are many difficulties in checking beam quality especially at the focal point, where densities will exceed 50KWatt per square cm. On one hand those energies are capable of melting and destroying most known materials, while on the other hand measuring a focused profile is the most significant measurement.
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4% Beam Splitter
10725B
The 10725B 4% beam splitter, designed for beam diameters of 9 mm or less, reflects 4% of the total incoming laser beam and transmits 96% straight through. This optic is without housing and requires a user-supplied mount.
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Technology that Focuses on Measurable Safety
Foretify™
A Measurable Scenario Description Language (M-SDL) used to describe both scenarios and coverage goals at a very high level (soon to be made open) to enable a ‘measurable safety’ ecosystem
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UV-NIR Beam Profiler
CinCam
CINOGY Technologies CinCam is optimized to provide excellent sensitivity from the UV to NIR spectral range involving CCD/CMOS/InGaAs technologies. Thanks to its high resolution and its small pixel size, the CinCam ensures the highest accuracy in laser beam analysis of cw and pulsed laser systems. The plug and play design facilitates easy and flexible adaption to standard optical components.
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Camera Based Beam Propagation Analyzer: M2
BeamSquared
The BeamSquared® system is a compact and fully automated tool for measuring the propagation characteristics of CW and pulsed laser systems from the UV to NIR to Telecom wavelengths. Users can also measure wavelengths above 1.8 microns, including CO2 and terahertz in manual mode (a bench set-up; without the automated optical train) with a Pyrocam IV or IIIHR. Our longer optical train and patented Ultracal™ Calibration makes BeamSquared the most accurate product on the market and is ISO 11146 compliant. Its operational robustness and reliability ensures continuous use applications in industry, science, research and development.
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Blue-violet Laser Diode Modules: 450nm, Elliptical Beam
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete cost-effective laser solutions.
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*Beam Propagation Analysis
M²
M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
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Bending Beam Load Cell
Futek Advanced Sensor Technology, Inc.
Are the best fit for many measuring tasks. Here, the signal, on principle, depends on the bending moment.
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Medium Capacity Single Point Bending Beam Load Cells
SPL SERIES
The SPL Series single point load cell simplifies scale designs, packaging machinery and other industrial weighing equipment. Their single point design eliminates the need for multiple load cells and summing boxes, and thus, simplifies the design and reduces the cost. All SPL Series load cells employ 100% aluminum construction and features a moisture proof sealant which also makes them suitable for damp environments.
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Full Bridge Thin Beam Force Sensors
TBS SERIES
The TBS Series thin beam force sensors many different parameters found in medical instrumentation, home appliances, process control, robotics, and automotive are exceptionally suited for small load measurements. They are designed to measure and many other high volume applications. A specially developed integrated strain gage includes all balancing, compensating and conductive elements and is laminated to the beam to provide excellent stability and reliability.
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Large Aperture Beam Profilers
Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
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UV-Vis Double Beam Research Spectrophotometer
UVD-3500
The high- performance blazed holographic grating and the optimized CT-type Monochromator reduce stray light, and widen the photometric range. Wavelength range: 190 nm – 900 nm. Spectral bandwidth: 0.1, 0.2, 0.5nm, 1.0nm, 2.0nm, and 5.0 nm.(UVD-3500).
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Taper System, CCD Beam Imaging Camera
TaperCamD series
355 to 1150 nm, standard CCD detectorHyperCal Dynamic Noise and Baseline Correction software (Pat. Pending)CTE Comet Tail Elimination for > 900 nm (Pat. Pending)Port-powered USB 2.0; flexible 3 m cable, no power brick14-bit ADC, 4 MB image buffer & on-board microprocessorWindow-free sensors standard for no fringing25,000:1 electronic auto-shutter, 40 s to 1000 ms1,000:1 SNR (30/60 dB Optical/Electrical)
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*High Power Laser Beam Dumps & Low Power Beam Traps
Laser beam dumps for high power laser processing, laser measurement and other applications, and low power beam traps
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Cold Atomic Beam System
Detailed description of item: Complete cold atomic beam sources for alkaline-earth precision experiments and atomic devices. Small chambers with patented permanent-magnet Zeeman slowers and in-vacuum 2D MOT optics allow high flux with low outgassing and no thermal beam flux at the cold atom port, which provides a CF-133 connection to customer vacuum chamber. Advanced thermal design of the effusion oven allows long-lifetime operation at minimal heating power, with no water cooling. An integrated low-outgassing hot window is provided for coupling of on-axis Zeeman cooling light. Ion and getter pumps integrated into the chamber manage outgassing from the oven at temperatures up to 520 °C. Operating baseline pressures below 1×10-11 mbar can be attained in the customer’s downstream cold atom (typically 3D MOT) science chamber, with suitable pumping speed provided at the differentially-pumped cold beam output port.
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Ar Gas Cluster Ion Source
GCIS
The Kratos Ar Gas Cluster Ion Source (GCIS) is optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode, dependent on the operating parameters defined by the user and the type of material to be profiled. In Arn+ ion cluster mode the ions can be accelerated up to a maximum of 20 keV. This enables the successful sputter depth profiling of the widest range of polymer materials to be undertaken. However, Arn+ cluster depth profiling has been shown to give very low sputter yields for inorganic materials. In order to retain the capability of generating depth profiles from this class of materials this ion source can also be operated in the more conventional Ar monomer (Ar+) mode.
