Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Ion Chromatograph Systems
HIC-ESP
The HIC-ESP is a new anion suppressor ion chromatograph with built-in electrodialytic suppressor, boasting the same low carryover and excellent injection precision characteristic of Shimadzu HPLCs to bring you highly-reliable results. The newly developed anion suppressor prevents peak spreading and achieves high sensitivity, providing stable functionality even over long periods of use. The HIC-ESP is suitable for applications in a wide range of fields including environmental science, medicine, chemistry and food science.
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*High-Power Beam Profiling
Beam analysis of high-powered industrial lasers have always proved to be difficult because of the power levels (affecting the power densities) that these lasers operate at. Yet, the measurement of these lasers are critical for their success because of thermal effects which are more of a factor at these higher powers. These high-power performance measurement products have proven to be solutions for laser users who operate and maintain these high-powered lasers
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Beam Directional Power Supply Mains 60 To 180 kV
SiteX D1802
Our SITEX and SITEXS are capable of the direct and accurate measurement of high voltage. This essential information enables the control system to guarantee the stability and reproducibility of the radiological parameters based on true high voltage, ensuring extremely precise measurements-based utilization.
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Beam Panoramic Power Supply Battery Crawler 40 to 160 kV
CP160CR
Designed to fit into 6” pipelines and higher, the CP160CR constant potential X-Ray generator for crawlers is – in its category – the most powerful panoramic X-Ray tube head in the world for crawlers. The generator is making the cutting edge constant potential technology of the CPSERIES even more compact into a 9.9 kg – 120 mm diameter X-Ray tube head. The crawler unit is capable of penetrating up to 28 mm of steel in 10 minutes, which corresponds to just a 25 second exposure time for 6” standard pipeline welds.
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Non-Contact Beam Profiler
BeamWatch
The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
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Beam Profiling System
BeamCheck
BeamCheck is an integrated laser measurement system designed to measure critical laser beam parameters for laser-based additive manufacturing systems BeamCheck includes a CCD camera for spatial measurements and a NIST-traceable power sensor that will provide a complete analysis of the laser power density profile.
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Economical Single Point Bending Beam Load Cells
ESP SERIES
The ESP Series is a economical, high accurate single point bending beam load cell. It is ideal for OEM applications such as electronic scales and weighing machines. The single point bending beam design is highly resistant to eccentric loading allowing direct mounting to the scale base and weighing platform. The ESP Series features a moisture proof sealant.
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Spectro UV-Vis Double Beam PC Scanning Spectrophotometer
UVD-2950
Spectro UV-Vis Double PC is a high performance UV-Vis double beam automatic scanning spectrophotometer. Spectro UV-Vis Double has a brand new optical system design, microcomputer controlled. It is capable of processing data, from analytical and spectrum testing. Precise with high accuracy of measurement and stability are also provided by the powerful built in software and large LCD screen, which can display the screen menu and other functions. It can also be linked to a computer and a printer to show Photometric and Spectral data in the PC monitor.
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Chloride Ion Test Kit for Water
134W
The Elcometer 134W is used to monitor recycled water (after it has been applied) to establish effectiveness of salt removal, this test is ideal for testing the salt contamination in wash water and blast water.
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Beam Directional Power Supply Mains
SiteX CP225D
The CP225D is currently the most powerful constant potential X-Ray generator in ICM's portfolio. Supplemental to its outstanding penetration capacity (up to 47 mm for steel in just 10 minutes), it includes a built-in multiple X-Ray output carrousel that features a Beryllium window for the inspection of lighter alloys such as aluminum and carbon fiber. The CP225D is one of the most versatile generators on the market and will adapt to an extremely wide variety of applications. In fields as diverse as the construction or petrochemical industries, its power and small focal spot, light weight, compactness and high penetration capacity will be much appreciated.
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Laser Diode Modules: 635nm-660nm Visible Wavlength, Elliptical Beam
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete cost-effective laser solutions.
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Ultrasonic Angle Beam Probes For Weld Seam Testing
SONOSCAN W
The ergonomic angle beam probes for Non-destructive Testing (NDT) from the SONOSCAN series inspect metals for cracks and inclusions. In the metal industry they are mainly used for weld seam testing. Our SONOSCAN probes are powerful, robust ultrasonic transducers which can be connected to all standard ultrasonic testing gauges.
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Ion Chromatography
Eco IC
Discover Eco IC, an ion chromatography system that focuses on the essentials while not compromising on quality, robustness, and reliability. Eco IC has been developed to enable more users to benefit from this technique. Whether you need to perform routine water analysis or you’re looking for an instrument for higher education, Eco IC comes with all the components you need. In addition, you can also save time and reduce work by getting an automated system.
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Electron Beam Lithography System
Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving.
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Laser Diode Collimators, 520nm - 785nm, Elliptical Beam
The Optoelectronics Company Ltd
Custom lasing wavelengths and power options are available. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete, cost-effective laser solutions.
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4ch Beam Forming Sound Source Visualization System
BF-3200/MI-5420A/BF-0310
Beam Forming is one of the sound visualization techniques that obtains the sound pressure distribution using the phase differece information from the sound source to the microphone, and makes it visualized with the color map.This technique requires a lot of microphones to cover a wide area and generally tends to increase the size of the system. By this Beam Forming system, Ono sokki achieved real time sound source visualization with just 4 microphones.
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Infrared Laser Diode Modules: 830nm-852nm, Elliptical Beam
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete cost-effective laser solutions.
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Shear Beam Load Cell
SB-1.0
The Shear Beam Load Cell SB-1.0 is a single point weighing device, suitable for use in multiple applications.
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Low Capacity Single Point Bending Beam Load Cells
LSP SERIES
The LSP Series is a low capacity, low cost, high accurate single point bending beam load cell. It is ideal for OEM applications such as electronic scales and weighing machines. The single point design is highly resistant to eccentric loading allowing direct mounting to the scale base and weighing platform. The LSP Series features a moisture proof sealant.
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Automated Laser Beam Quality Measurement System
Beamage-M2
Large Apertures: The only M2 system on the market equipped with a complete set of 50mm optics. Also, the sensor is 11.3 x 11.3 mm. Simple Alignment: Two beam-steering mirrors are included for quick and easy alignment of your laser into the system. The internal mirrors are factory-aligned and the pre-set height also simplifies the alignment.Available Fall '17
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UV-Vis Double Beam Research Spectrophotometer
UVD-3400
UVD-3400 has an excellent performance blazed holographic grating optimized and optional reflectance attachment CT-type Monochromator and reduces stray light and widen the photometric range. Wavelength range: 190 nm – 900 nm ; Spectral bandwidth: 2nm
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Secondary Ion Mass Spectrometry (SIMS Analysis)
Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Shear Beam Force Sensors For Pull/push Direction
INELTA Sensorsysteme GmbH & Co. KG
Inelta Force Sensors operate with foil strain gauges
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Beam Diagnostics Systems
Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
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X-Ray Beam Monitors
When standard products just aren’t good enough—or the measurement technology does not yet exist—Sydor Technologies develops technology to enable these complex imaging measurements. Just as we’ve developed next-generation streak cameras and x-ray detectors to meet novel, emerging requirements in national laboratories, we’re doing the same with x-ray beam monitors.
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Beam Diagnostics
We offer camera-based devices with wavelength ranges from UV to IR. All are cameras are USB3.0, for the fastest data transfer rates.
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Single Light Beam Safety Devices
Leuze electronic GmbH + Co. KG
Single light beam safety devices can be integrated flexibly into machine concepts – particularly in constrained spaces or where no flat mounting surfaces exist. They are used for point of operation and access guarding as well as for collision avoidance. The safety sensors are available as type 2 and type 4 devices with external monitoring as well as self-monitoring type 4 devices.
