Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
-
Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
-
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
-
Product
Sputtering Systems
-
Known for precision and cleanliness, Veeco Ion Beam Sputtering (IBS) systems are ideal when engineers need tight control over film thickness, composition, and optical performance. Using a focused ion beam, IBS dislodges atoms from a target, depositing them onto a surface in smooth, ultra-uniform layers.
-
Product
Microscopy Software/Hardware
ZEISS Atlas 5
-
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
-
Product
TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
-
ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
-
Product
Etch System
-
When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
-
Product
Ion Beam Milling Systems
-
When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
-
Product
Ion Beam System
-
Veeco's unmatched Ion Beam know-how delivers proven etch and deposition performance enabling the data storage and MEMS markets for decades.
-
Product
ION 100 Portable Ion Meter
-
The new addition to the Environmental Express Oakton product line features updates to measuring water quality easier and faster. The larger LCD display is 2.75 in. by 2.0 in. for a better viewing angle, and has indicators for battery life, stability, and calibration. The ION 100 meter measures pH, mV, ion concentration of 16 commonly measured ions, and temperature. The microprocessor-based meter features automatic calibration, automatic temperature compensation, function setup, self-diagnostics, automatic power-off, and low voltage display. The meter uses advanced digital processing technology, intelligently improving the response time and accuracy of your measurements. Easily switch units among pX, mol/L, and mg/L (ppm).
-
Product
ION Meters
-
GAOTek offers a wide selection of ion meters for precise calculation of number of ions in various kinds of solutions. These devices determine whether the solutions have positive or negative ion charge. A solution of known concentration is accurately prepared, and its mV value is plotted on a graph of mV vs. concentration to determine the corresponding unknown concentration. These devices are durable and easy to use portable field instruments.
-
Product
Ion Chromatography
Hyphenated Techniques
-
Extend the scope of ion chromatography by interfacing your Metrohm IC with various sampling system and detection techniques
-
Product
Beam Profiler
BladeCam Series
-
0.65" Thin! Portable, Port-Powered, USB 2.0, Beam Profiling for Windows XP & Vista, Intel-Mac.
-
-
Product
15% Beam Splitter
10725C
-
The 10725C 15% beam splitter, designed for beam diameters of 9 mm or less, reflects 15% of the total incoming laser beam and transmits 85% straight through. This optic is without housing and requires a user-supplied mount.
-
Product
Benchtop Ion Meters
-
Benchtop Ion Meters for Cl (chloride), F (fluoride), Na (sodium), Ca (calcium), Br, (bromide), NH4 (ammonium), NH3 (ammonia), Cn (cyanide), Ag (silver), K (potassium), S (sulphide), Pb (lead), I (iodide), Cu (copper), Cd (cadmium)
-
Product
Beam Load Cell
EST-70
-
Technopark Automation & Control
The EST-70 Shear Beam Load Cell is commonly used on platform, hopper weighing and pallet weighing applications. It is low cost and available in capacities from 500 kg to 2000 kg.
-
Product
Ion 700 Benchtop Meters
-
Oakton benchtop 700-series meters are designed for use in crowded laboratory settings. Compact footprint of less that 6" x 7" (16 x 18 cm) conserves valuable space, while the large, dual-display LCD provides excellent visibility—even from a distance. Ion 700 meter measures pH, mV, relative mV, ion concentration and temperature. Automatic temperature compensation (ATC) maintains reading accuracy even with fluctuating temperatures. Models feature five-point pH calibration with automatic buffer recognition for both USA (pH 1.68, 4.01, 7.00, 10.01, 12.45) and NIST (pH 1.68, 4.01, 6.86, 9.18, 12.45) pH buffers. Meters additionally feature ion concentration calibration of up to 5 points. Meter features include Auto-Hold, selectable °F or °C measurement, and easy recall of electrode slope or offset. The convenient pull-out quick reference card keeps procedures handy at all times. Use 700-series meters with any pH, ORP, or ISE electrodes with a BNC connector.
-
Product
Ion Sensor
984v2
-
The Meech Model 984v2 Ion Sensor is an easy-to-use device for checking the performance of both AC and DC powered static eliminator bars.
-
Product
Gridded RF Ion Sources
-
Veeco's gridded RF ion sources are designed for improved production of long-run ion beam deposition processes.
-
Product
Beam Profiler Software
RayCi
-
CINOGY’s beam profilers are available with the specifically designed beam profiling software RayCi, which utilizes new developed correction algorithms and incomparable visualizations modes. This ensures the highest accuracy in beam profile analysis according to ISO standards.
-
Product
Technology that Focuses on Measurable Safety
Foretify™
-
A Measurable Scenario Description Language (M-SDL) used to describe both scenarios and coverage goals at a very high level (soon to be made open) to enable a ‘measurable safety’ ecosystem
-
Product
Ion Chromatography
IC Software- MagIC Net
-
MagIC Net is the software to control your Metrohm ion chromatograph and any modules for liquid handling, sample preparation, and automation connected. Intuitive operation, comprehensive system monitoring, and straightforward data management make MagIC Net, what it is: the preferred software for state-of-the art ion chromatography.
-
Product
Specialized Beam Profiler Systems
-
DataRay offers specialized beam profiler systems. These systems offer solutions for complex applications. The large beam profiling system is suitable for beams up to 200 mm image area, and the line laser profiling system provides for direct measurement of line lasers up to 200 mm in length.
-
Product
Chloride Ion Test Kit for Water
134W
-
The Elcometer 134W is used to monitor recycled water (after it has been applied) to establish effectiveness of salt removal, this test is ideal for testing the salt contamination in wash water and blast water.
-
-
Product
High Power Beam Analysis
-
The advantages of fiber lasers are their high power, mechanical stability and good beam quality; however beam quality and beam profile has to be periodically checked. In general, there are many difficulties in checking beam quality especially at the focal point, where densities will exceed 50KWatt per square cm. On one hand those energies are capable of melting and destroying most known materials, while on the other hand measuring a focused profile is the most significant measurement.
-
Product
33% Beam Splitter
10700A
-
The Keysight 10700A beam splitter is designed for beam diameters of 6 mm or less. It reflects one third of the total incoming laser beam, and transmits two thirds. It includes a housing for standard mounting.
-
Product
Ion Chromatography
Eco IC
-
Discover Eco IC, an ion chromatography system that focuses on the essentials while not compromising on quality, robustness, and reliability. Eco IC has been developed to enable more users to benefit from this technique. Whether you need to perform routine water analysis or you’re looking for an instrument for higher education, Eco IC comes with all the components you need. In addition, you can also save time and reduce work by getting an automated system.
-
Product
Camera Based Beam Profiling
BeamGage
-
See your beam as never before with BeamGage®. The camera-based beam profiling system consists of a camera and analysis software. Often times, this system will need to be used with beam attenuation or beam sizing accessories, depending on your laser application. The advantage to camera-based beam profiling is the real-time viewing and measuring of a laser’s structure. BeamGage software includes an extensive set of ISO quantitative measurements, features a rich graphical interface, and features its patented UltraCal™ algorithm, providing the industry’s highest accuracy measurements.
-
Product
Beam Lead Capacitors
-
Beam lead capacitors have high insulation resistance, low dissipation factor, and low temperature coefficient, which allow for use in military and aerospace designs. Their robust performance and small form factor provide repeatable performance.
-
Product
*High Power Laser Beam Dumps & Low Power Beam Traps
-
Laser beam dumps for high power laser processing, laser measurement and other applications, and low power beam traps
