Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Product
NI-9218, 51.2 kS/s/ch, 2-Channel C Series Universal Analog Input Module
783362-01
Analog Input Module
51.2 kS/s/ch, 2-Channel C Series Universal Analog Input Module - The NI‑9218 is designed for multipurpose measurements. It offers built-in support for accelerometer, powered sensor, full-bridge, and voltage measurements as well as quarter-bridge, half-bridge, 60 V, and current measurements using measurement-specific adapters. Each channel is individually selectable, so you can perform different measurements on each channel. The NI‑9218 is ideal for creating universal test systems for automotive, off-highway, and data-logging systems.
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Product
Targets
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Targets from group A are developed to support mostly testing infrared imaging systems understood as thermal imagers. These targets can be used also in testing visible/near infrared cameras or SWIR cameras but such application is not optimal. IR targets are mostly used in DT systems for testing thermal imagers and in MS systems for testing multi-spectral systems.
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Product
Magneto-inductive Testing
MAGNATEST D-HZP
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Foerster Instruments, Incorporated
The MAGNATEST D-HZP by FOERSTER is the ultimate magneto-inductive test instrument: the fully automatic system tests materials for their properties. It operates in single coil absolute mode, making a comparator coil unnecessary. The combination of high excitation currents and complex evaluation electronic equipment detects even very small structural discrepancies. The MAGNATEST D-HZP also provides comprehensive options for documenting test results, such as test piece statistics, histogram, and test data export, which are displayed clearly on the large color display.
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Switchgear Testing Solutions
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IES Systems is a world leader in the design and manufacturing of power switchgear test systems.*GFCI/AFCI Circuit Breaker Test Solutions*Medium Voltage Breaker Test Solutions*Residential Circuit Breaker Test Solutions*Molded Case Circuit Breaker Test Solutions*AIR Circuit Breaker Test Solutions*Vacuum Bottle Test Solutions
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Product
Boundary-Scan DIMM Socket Tester
ScanDIMM
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Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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Product
PXI low-density general purpose switch modules
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These PXI low-density general purpose switch modules provide cost-effective solutions for applications where a high number of relays is not required. All of these modules use a 96 pin male connector that is supported by our comprehensive range of cable and connector accessories, ensuring they can be quickly integrated into your test system with minimum effort.
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Product
SIP-90-3 Test System Interface Probe
SIP-90-3
ICT/FCT Probe
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Melt Flow Testers
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nstron®'s CEAST Melt Flow Testers are specifically designed for easy and accurate measuring of the Melt Flow Rate (MFR) and the Melt Volume Rate (MVR). CEAST Melt Flow Testers range from systems that perform a simple manual test procedure to semi-automated testing systems performing multiple weight tests. Our testers meet ASTM and ISO standards.
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Product
Automotive EMC test systems
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Dozens of manufacturer's and other automotive immunity standards with their roots in ISO 7637 continue to evolve bringing new challenges to users of conducted immunity testing. Teseq continues to advance the state of the art, bringing simple, flexible solutions for the challenging and fast-changing requirements that are 42 V ready.Teseq has been at the forefront of the pioneering work to establish EMC tests for motor vehicle electronics. Automotive manufacturers and suppliers worldwide have come to trust test systems from Teseq. Active involvement in the standardization committees ensures that the latest advances are continously reflected in our test systems.
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Product
Arbitrary Waveform Generator
MGHCH
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MGHCH is designed to reproduce arbitrary waveforms, as well as to reproduce sinusoidal signals with amplitude, frequency, phase modulation or without modulation. MHVCh can be used for research, tuning and testing of systems and devices used in radio electronics, automation, computing and measuring technology, instrument making.
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TestStation Product Family
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TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide-range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.
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Vibration Test Systems
G-9 Series
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The G-9 Series Vibration Test Systems, featured by high eccentric moment and a large loading table supported by the unique rigid lateral suspension structure, are suited to transportation tests for relatively large specimens; packaged goods and electric apparatus. In addition, the unique structure enables horizontal tests of relatively heavy specimens without conventional horizontal slip tables.
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Product
PXI-2594, 2.5 GHz, 50 Ω, 4x1 PXI RF Multiplexer Switch Module
778572-94
Multiplexer Module
2.5 GHz, 50 Ω, 4x1 PXI RF Multiplexer Switch Module—The PXI‑2594 is ideal for applications that require the routing of high-frequency signals inside automated test equipment (ATE) systems because it can switch signals with very low insertion loss. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
Three-phase Fully Automatic Test System
TS33
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Calmet Smart Calibration Devices
The Calmet TS33 portable test system consists of a three-phase reference meter of accuracy class 0.02%, 0.04% or 0.1% and an integrated three-phase current and voltage source up to 3x120A/600V. The TS33 is designed for analysis of complete metering installations and local mains conditions.
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Visible / Infrared / Imaging Test System
System 1808
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Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Product
Point Universal Cable/Harness Tester
CableJoG 1024
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The CableJoG 512 and CabeJoG 512 Plus provide a flexible testing system to suit individual customer requirements. The CableJoG 512 and CableJoG Plus 512 can test up to 1024 individual connections of all manufacturers of connectors.
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Product
BNC To BNC Cable, 50 Ohm, 0.9 M
781887-01
Coax Patchcord
Connects measurement and signal generation devices. Model options include industry-standard coaxial connector types including BNC, SMA, SMB, and MCX. Long cables can act as antennae picking up extra noise that can affect measurements, so ensure you select only the length required for your test system. Also look at the impedance of your test system and consider buying a cable with the same impedance. Matched impedance can maximize the power transfer or minimize signal reflection from the load of your system.
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Product
Circuit Breaker Endurance Test System
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Endurance testing involves operating – closing and opening – the circuit breaker repeatedly for a set number of cycles. This test is necessary to stabilize the circuit breaker mechanism and to identify “Early Infant Mortality” failures in the switchgear assembly.
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Product
Mechanical Creep and Rupture Testing Machine
MRC Series
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Jinan Testing Equipment IE Corporation
MRC series mechanical creep and rupture testing machine with single-lever structure is designed for long-term creep and stress rupture test applications. The series mechanical creep and rupture testing system is mainly for the metallic materials under room or elevated temperature according to GB/T2039, GB/T 20120, EN ISO 204-2009 and ASTM E139. The creep and rupture testing machine can also maintain constant loads for extended periods of time. Through the mechanical advantage of the lever arm loading system, constant loads can be maintained with a high degree of accuracy for long duration. This creep and rupture tester uses dead weights without continuous operation and the dependency of a mechanically powered drive. The creep and rupture testing system is an ideal equipment for metallurgy manufacturer, research institute, colleges and other relevant factories and mines.
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GPIB To Ethernet Instrument Interface
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*ICS's 4865B GPIB to Ethernet Instrument Interface adapts instruments with Ethernet interfaces to GPIB test systems.*ICS's 4865B provides a VXI-11 compliant interface for instruments that support the VXI-11 protocol and a smart, user-configurable, raw socket protocol that accommodates most instruments that use raw sockets. The 4865B replaces our earlier Model 4865 and is 2x to 5x faster than the original Model 4865. Click here for the original 4865 webpage.
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2-Slot USB/LXI Modular Chassis
60-104-001
Chassis
This 2-slot USB/LXI modular chassis offers a small lightweight form factor, making it ideal for portable, benchtop, and space restrictive applications. The chassis is designed for desk or rack mounting and features remote control via USB or LXI Ethernet. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment. The 60-104 chassis supports one or two 3U PXI modules and accepts Pickering's PXI products, it is the perfect platform to construct small scale applications. Possible systems include switching matrices up to 1104 crosspoints, 396 channel multiplexer or up to 36 channels of programmable resistor/sensor emulation.
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Product
PXI Embedded Controller
PXI-3982
Controller
The ADLINK PXI-3982 PXI embedded controller, based on the 6th generation Intel® Core™ i7 processor, is specifically designed for hybrid PXI based testing systems, delivering a rugged yet stable platform for a wide variety of testing and measurement applications.
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Product
PXI 2.5W Programmable Resistor Module, 4-Channel, 1Ω to 239Ω
40-251-113
Programmable Resistor Module
The 40-251-113 is a programmable resistor module with 4 channels which can be set between 1Ω and 239Ω with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI 10W Programmable Resistor Module, 2-Channel, 1Ω to 470Ω
40-253-014
Programmable Resistor Module
The 40-253-014 is a programmable resistor module with 2 channels which can be set between 1Ω and 470Ω with 2Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI High Density Pecision Resistor Card, 6-Channel, 3.5Ω To 102kΩ
50-298-040
Programmable Resistor Module
The 50-298-040 is a high density programmable resistor card with 6 channels which can be set between 3.5Ω and 102kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Solar Analyzers
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Max. solar system power (Pmax) search by Auto-scan: 1000V, 12A (12000W capability)The analyzer and the Remote Solar Detector is connected by Bluetooth wireless communication (Bluetooth 2.1 + EDR Class 1)The Remote Solar Detector is moisture-proofIntelligent test logic with no personnel attendance required in the field Solar system analyzer waits and tests the system until appropriate sunlight irradiance is detectedMax. voltage (Vpm) at Pmax, Max. current (Ipm) at Pmax Voltage at open circuit (Voc), Current at short circuit (Isc)Efficiency (%) calculation of solar systemTemperature measurement of solar panelsIrradiance measurement of sun lightSeries resistance (Rs) calculation of solar panelsWith data logging/open function, the I-V curves of solar system can be analysed / recorded for a period of time (e.g. 60 min.)Conversion of I-V curve under OPC to data under standard test condition (STC) based upon IEC standardProvide Operating Condition (OPC) and Standard Test Condition (STC) test reports for verification of solar panel performance (OK or NO OK)Users can set up the parameters of solar panelsUsers can set up the series number of solar panels. Parameters of many solar panels can be measured in one measurementThe Irradiances and Temperatures of solar panels can be continuously measured, monitored and recordedContinuously measure/monitor/record the DC power output of solar system and the AC power output of inverter (1 phase or balanced 3 phases)Calculate the efficiency of DC to AC power conversion and the efficiency of the max.output power
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Product
Integrating Sphere Spectroradiometer System for LED
LPCE-2(LMS-8000)
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LPCE-2(LMS-8000) is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE 127-1997 and IES LM 79-08 standards, it recommends using an array spectroradiometer with integrating sphere and photometer head to test SSL products. LISUN GROUP developed LPCE-2 test system for LED products.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 3Ω to 2.97MΩ
40-251-151
Programmable Resistor Module
The 40-251-151 is a programmable resistor module with 1 channel which can be set between 3Ω and 2.97MΩ with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Interface Test System (ITS)
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The SecuControl ITS is a modular test block designed to meet the stringent safety, reliability, and performance needs of IEC-based substations. With fully finger-safe construction, keyed STP test plugs, and built-in CT Shorting, the ITS enables safe, repeatable secondary injection testing, without the risk of open CT circuits or accidental trips. It is the ideal solution for structured, standardized testing across protection systems.
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Product
HV Test System for Patient Monitors
Test System
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
