Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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PXI 5W Programmable Resistor Module, 1-Channel, 2Ω to 26.7kΩ
40-252-132
The 40-252-132 is a programmable resistor module with 1 channel which can be set between 2Ω and 26.7kΩ with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Modular DC Electronic Load
N3300A Series
The new N3300A Series of dc electronic loads is fast, accurate, and ideal for increasing production throughput in high volume dc power supply manufacturing. This series consists of a full rack width (1800 watts max) mainframe and a half rack width (600 watts max) mainframe, and 7 interchangeable electronic load modules. The modules provide a variety of voltage, current and power ratings. New dc connectors for test system configurations are now available on all modules.
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Calibration
We also help to fulfil the recommended calibration cycles of the other measurement instruments within your test system. In case you can not go without the whole system we will find another solution like a change or loan of single devices.We also offer whole test system calibrations on-site as part of our preventive maintenance concept.
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PXI High Density Precision Resistor Module, 9-Channel, 3Ω to 6.97kΩ
40-298-030
The 40-298-030 is a high density programmable resistor module with 9 channels which can be set between 3Ω and 6.97kΩ with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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6-Slot LXI/USB Modular Chassis With Scan List Sequencing & Triggering
60-106-002
Pickering Interfaces’ 60-106-002 modular LXI/USB chassis occupies only a small, 1U rack-height form factor, making it suitable for portable and space-restricted rack-mount applications. It features remote control via USB or LXI Ethernet and this version of the chassis includes Scan List Sequencing & Triggering. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment.
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Conducted Immunity Test System
Conducted RF immunity tests acc. to IEC/EN61000-4-6 and BCI tests acc. to ISO 11452-4 and MIL-STD 461 CS 114 Signal generator,RF-power amplifier, RF-power meter and directional coupler (optional) in one 19”-caseStand-alone operation possible with optional available netbookControl-software includedMost important parameters are shown on an integrated displayAutomatic EUT-monitoringOperation via USB port of a PC or NotebookComplete range of CDNs available
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GPIB-ENET/1000, Ethernet GPIB Instrument Control Device
781630-07
Ethernet GPIB Instrument Control Device - The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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3U PXI-E System Controller
PX32101
LinkedHope Intelligent Technologies Co.,Ltd.
PX32101 is a 3U PXI-E system controller based on the newest Intel® Haswell platform. It is designed to provide comprehensive and reliable system controller to support hybrid PXIe-based systems for multiple environments test and measurement applications.Hybrid PXIe-based systems are often required to complete independent diversified complex testing tasks on the PXI test platform. PX32101 provides rich interfaces: 4 USB2.0 / 3.0 for peripheral connectivities; UART for communication or control equipment; dual 1000Base-T Ethernet, one port for LAN connection and the other one for the control of the next generation of LXI instruments. PX32101 can support 4 x4 or two PCIe x8-link, and up to 16GB / s system bandwidth. The ExpressCard 34 expansion slots on the front panel allow users to expand the system modules flexibly. If you install a hybrid multi-slot backplane in the system, then various standard PXI-E and PXI / CPCI peripheral cards could be fitted. In a multitasking environment, PX32101 processor is able to complete multiple tasks independently. The CPU and memory chips soldered with PCB increase reliability performance in shock and vibration environments. Combined with a variety of instrument control interfaces and reliable mechanical & electronic design, PX32101 can meet your hybrid PXIe-based testing for system application requirements perfectly.
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PXI High Density Precision Resistor Module, 9-Channel, 2Ω to 31.5Ω
40-298-110
The 40-298-110 is a high density programmable resistor module with 9 channels which can be set between 2Ω and 31.5Ω with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI Source Measure Unit
PXI Source Measure Units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility. These features include high channel density for building parallel SMU test systems, deterministic hardware sequencing for minimizing software overhead, and high-speed update and sample rates for quickly changing setpoints and acquiring data. Additionally, the flexible sampling rate and streaming capability of PXI SMUs allows you to use the instrument as a digitizer to capture transient behavior, and the digital control loop gives you the ability to adjust the transient response of the instrument. The ability to change the transient behavior of the SMU, called SourceAdapt, reduces SMU settling time and minimizes overshoot and oscillations, even with highly capacitive loads.
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Materials Test Systems
An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Load Cell Measurement
Designed specifically as a single-board solution for material testing system (MTS) applications, the PCI-9524 combines a high 24-bit resolution with 1/200,000 count accuracy to provide the most precise load cell measurement PCI board available in the market today.
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AOI & SPI Test Systems
To keep the quality of your production at its best you need a good inspection of your boards. For efficient and detailed in-depth board inspection ensure you have SMT inspection equipment that meets your needs. Our AOI & SPI units will provide the quality you need for reliable inspection of soldering inspection.
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Spring Tension & Compression Testing Machine
WDW-T Series
Jinan Testing Equipment IE Corporation
WDW-T Spring Testing System (STM) is a specialized application on the basis of WDW-E series Economic materials testing systems. The STM for Tension & Compression adopts rigid load frames, accurate load weighing system, advanced PCIE measuring & control system, and intuitive modular application software. The Spring Testing System is a perfect choice for spring testing, of which the parameters are much better than that of other existing spring testing machines on the market.
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Portable Test System
MT686s
Actual value, vector, curve displaypower generationerror measurementMeasurement of harmonics up to the 40thVoltage supply via existing measurement voltage
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G12x - 18 Module Solution
The G12x Receiver has four removable rubber feet below the platform and also allows for permanent tabletop mounting. Available with 15" or 20" platforms. The G12x accepts ITAs designed for both the G12 and G12x allowing versatility with your test system.
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Electrical Ground Support Equipment:
EGSE
Keysight provides a variety of configurable test systems for satellites and satellite flight hardware; including Solar Array Simulators, Battery Simulation and Conditioning, RF signal simulation and analysis as well as fully custom solutions.
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Leak Test System
NorCom 2020
The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.
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Type 39 E-Frame Development Platform, 2 Slot 6U VPX
39E02PSX94Y2VCEX
The Type 39 E-Frame test platform supports 6U or 3U VPX based system development. With a rugged aluminum construction, the versatile concept chassis design allows easy access for test and system architecture development for up to 12 slots.
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Testing Aircraft Components
Sun Test Systems develops, produces, installs and services high-quality test equipment for testing various components of civil and military aircraft and helicopters.
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GNSS Testing & Simulation
Safran Federal Systems is a leading provider of advanced GNSS Testing & Simulation systems and tools for NAVWAR environments.
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PXI High Density Precision Resistor Module, 9-Channel, 3Ω to 13.6kΩ
40-298-031
The 40-298-031 is a high density programmable resistor module with 9 channels which can be set between 3Ω and 13.6kΩ with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI Vector Network Analyzer
PXI Vector Network Analyzers feature two ports, so you can choose between T/R test sets or full S-parameter capabilities. The PXI Vector Network Analyzer supports automatic precision calibration, full vector analysis, and reference plane extensions, so it is an ideal vector network analysis solution for your validation and production operations without the high cost and large footprint associated with a traditional benchtop VNA. These models seamlessly integrate into test systems for highly accurate, fast RF measurements.
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Flying Probe Tester
FA1817
Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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128-Ch 0,250A-100VAC 24VDC Multiplexer/Matrix
YAV90128
A unique YAV90128 module is able to do all combinations of signal computation at low frequency between the device under test and the various measuring instrumentation inside a test system.
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Incline Shock Tester
HIACC Engineering & Services Pvt. Ltd.
Inline shock test system simulates a real shock environment to estimate the impact resistance or damage level of a product. The simulated environment replicates shocks produced during product handling, stacking shelves, loading/unloading and transportations. The incline shock test system is widely used in the packaging industry, scientific research institutions and transportation industry.
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Trend Tracker Software
Data Collection
Electronic Systems of Wisconsin, Inc.
ESW recognizes that our test systems provide vital information our customers need to control and understand their process. We have developed our Trend Tracker Software to aid customers with total process control of their line. This software is designed to use information that the tester is gathering on every part tested. Information from all parts tested are stored by part number or other designator. Trend Tracker screens are simple and easy to navigate using drop down menus for each test to select the desired test data to view on the graphs. Once a test is selected, the Test Readings Graph and Histogram are updated automatically. These graphs show a graphic representation of the readings obtained for the selected test.
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Bump Test Machine
Labtone Test Equipment Co., LTD
Bump test systems for electrical products repeating impact testing during transportation
