Total Reflection X-ray Fluorescence
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Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Total Reflection X-Ray Fluorescence (TXRF) Products
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Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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TXRF Spectrometers
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Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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TXRF Spectrometers
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Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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X-ray Fluorescence, XRF Analysis Services
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Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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X-ray Fluorescence Sulfur-in-Oil Analyzers
SLFA-2100/2800
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The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
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Wavelength Dispersive X-ray Fluorescence Spectroscopy
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Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
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SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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Energy Dispersive X-ray Fluorescence Spectrometer
EDX-7000/8000/8100
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One EDX over all others The EDX-7000/8000/8100 offers a high level af accuracy and speed in analyzing elements contained in various samples.
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Continuous Particulate Monitor with X-ray Fluorescence
PX-375
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There has been a growing concern regarding particulate matter (PM) pollution and its effects on health. For effective preventative measures, the determination of source PM concentration is extremely important. Therefore, indication of PM and elemental concentrations is critical. The PX-375 analyzer employs automatic sampling, continuous on-line PM quantitative and qualitative analysis for rapid air pollution measurements.
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Reflective Memory
VME-5565
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The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
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Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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Energy Dispersive X-ray Fluorescence (ED-XRF) Spectrometer
XEPOS
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SPECTRO Analytical Instruments GmbH
The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
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X-ray sources / X-ray optics
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X-ray sources are the heart of every X-ray analytical instrument. In combination with advanced X-ray optics, they generate the required X-ray radiation for structure analysis in various fields of material and life sciences. X-ray sources must offer perfect thermal constancy for excellent position stability of the X-ray beam as well as high intensity, even at low power levels. The design has to guarantee easy integration into advanced X-ray equipment paired with straightforward operation to keep uptimes high and to guarantee maximum radiation safety for operators and equipment.
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Reflective Memory Analyzer
PEAZ-5565
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Abaco Systems' PEAZ-5565 Reflective Memory Analyzer is a powerful analytic tool for the industry-leading 5565 Reflective Memory (RFM) product family. By creating a window into network traffic, the analyzer allows you to deep dive into your application code to start solving problems.
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Total Stations
Zoom50 Series
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When you need highest performance on all levels even under most challenging conditions, the GeoMax Zoom50 series is the perfect choice for you. The longer measurement range means a wider operational coverage and significant less time lost with switching setups. The new PowerLock protection mechanism prevents use by unauthorized persons and deters theft.
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Diffuse Reflectance Sphere
DRS100
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Mobile displays are used in a variety of ambient lighting environments. The evaluation of mobile displays under diffuse illumination conditions is critical to the understanding of display performance in the real world, as mobile displays are used in a wide range of ambient lighting environments. The DRS100 is purpose-made to completely characterize the diffuse reflectance properties of mobile displays, providing uniform hemispherical illumination.
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Reflective Condenser
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Reflective condensing system and focusing accessory for coupling light sources to monochromators. It uses two mirrors to focus to the entrance slit. The reflective system eliminates chromatic aberration, provides maximum spectral range, and does not require refocusing. Accessories like light choppers and filter wheels can also fit inside next to the slit. Versions with rotatable mirror available for up to four source direction.
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X-ray Fluorescence Spectroscopy (XRF) Services
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Work we''ve done: Coating identification, Measuring lead levels in paint and solder, Elemental comparison of two metal ingots, Restriction of Hazardous Substance (RoHS) testing.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-20
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The SLFA-20 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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Reflectance Standards
STAN Series
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Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
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Ubuntu Total Solutions
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The Ubuntu is a reliable, secure, and versatile environments for use, it gives unparalleled freedom and control which continues to expand into IoT.
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X-ray Microscopy
ZEISS Xradia Versa
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Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.
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Fluorescence Spectrometers
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Our experience and expertise as manufacturers of fluorescence spectrometers is second to none. Spanning more than 50 years, we have over 1000 high-end spectrometers installed in universities and leading research laboratories worldwide. Our sales team would be delighted to assist you with your fluorescence spectroscopy analysis and instrumentation requirements.
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Hybrid Diffuse Reflectance Spectrometer
Mono602™
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Solar Light has developed the fastest performing DRS instruments on the market, keeping product research, formulation and clinical testing in mind. HDRSplus™ software is designed specifically for a clinical testing laboratory environment and simplifies all HDRS calculations.
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Process Meter & Totalizer
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User-scalable for display to 999,999 for 0-1 mA, 4-20 mA, or 0-10 V process signals requiring zero and span adjustment. Ideal as flow rate meter or flow totalizer for analog flow meter signals. Includes 5, 10, 24 V transducer excitation output (user-selectable).
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X-Ray Cameras
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A range of scientific camera solutions optimized for high energy / X-Ray detection.
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Transmission / Reflection Measurement
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Measure spectral transmittance and reflectance of optical elements such as lens, plate glass, filter, reflector, prism and so on.The wavelength range is 350 to 1100 nm as standard and 220 to 2000 nm as an option.Reflection measurement of a general spectrophotometer can only measure several types of fixed angles, but in this device the incident angle of the sample at the time of reflectance measurement is variable at an arbitrary angle and the minimum incident angle at reflectance measurement is 15 ° ( Optical axis angle 30 °) can be set up.
