Total Reflection X-ray Fluorescence
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X-ray CT System
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The surface and the internal parts, in one measurement. We provide “Dimensional X-ray CT System” that does not only observe the interior of the workpiece, but that can also perform high precision, contactless measurements.
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Product
Process Meter & Totalizer
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User-scalable for display to 999,999 for 0-1 mA, 4-20 mA, or 0-10 V process signals requiring zero and span adjustment. Ideal as flow rate meter or flow totalizer for analog flow meter signals. Includes 5, 10, 24 V transducer excitation output (user-selectable).
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Product
Fluorescence Lifetime Imaging Microscopy (FLIM) Camera
Toggel
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Lambert Instruments today announced the introduction of its next-generation fluorescence lifetime imaging camera: Toggel. This new camera makes fluorescence lifetime imaging microscopy (FLIM) and fluorescence resonance energy transfer (FRET) faster and easier with its excellent light sensitivity, sharp images and fast image acquisition. With Toggel, Lambert Instruments aims to minimize measurement duration, automate image acquisition and simplify data analysis. These factors are of great importance to many of its customers in cell biology, cancer research and high-throughput screening.
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X-Ray Inspection System
TruView™ Fusion
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The quality of your products is paramount to the success of your business. The TruView™ Fusion X-ray Inspection System allows you to "see inside" your products without destroying them, enabling unprecedented understanding of your manufacturing process. The TruView™ Fusion X-ray is the right solution if you are looking for a radiography system to inspect medical devices, printed circuit boards, electronic components, and mechanical parts.
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X5 Pack X-Ray Inspection
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Designed to be integrated into line with built-in automatic reject and available in 300, 500 and 600 mm belt width models, the X5 Pack is perfect for a variety of unpackaged and packaged products.
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X-ray inspection system for BLU, LED Long bar products
X-eye 9000LED
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X-ray Tube100kV / 200uAMin. Resolution5µmTable Size1,500mm X 500 mmDetectorFlat Panel Detector (High sensitivity)Dimension3,620(W) x 1,065(D) x 1,590(H)mm / 850kg
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Compact Photon Counting X-Ray Detector
HyPix-3000
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Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of greater than 10⁶ cps/pixel, a fast readout speed and essentially no noise.
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Product
X-Ray Detector
XRT Detector Onyx
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ONYX 1412-X is a performance-leading X-ray detector comprising a proprietary 2768 × 2376 active pixel sensor array of 50 × 50 µm pixels. This detector consists of a high-speed, low-noise, radiation-tolerant, 14 × 12 cm, 6.6M pixel CMOS image sensor, with a directly deposited high-resolution CsI scintillator on Fibre Optic Plate. The highly configurable sensor is accessed through a software interface, connected via a 10 GbE SFP+ hardware interface.
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Product
High Range UV Fluorescence SO2 Analyzer
Model N100H
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Teledyne Advanced Pollution Instrumentation
The Model N100H instrument uses the proven UV fluorescence principle, combined with a state-of-the-art modular architecture, and intuitive operating software to provide accurate and dependable measurements of high range SO2 gas. The instrument includes interferent rejection, providing a simple and precise solution for a broad range of continuous emission monitoring systems (CEMS) and stack testing applications.
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Product
Total Solution
SD 4.1 Family
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To meet the ever increasing data transfer rate in high end applications, such as professional broadcasting transmission or advanced high resolution display, the SD 4.1 specification calls out the maximum performance of 1.56 Gbps at UHS-II full duplex mode per lane or half duplex UHS-II at 3.16 Gbps. In real applications, due to the system overhead and different SD 4.1 device controller designs, the actual measured performance can vary dramatically from system to system. With the newly introduced ADMA 3, the OS driver is now able to issue multiple read or multiple write commands at once, without having to wait for the SD controller to complete one command at a time. Once the SD host controller has collected multiple commands, it will then manage and complete them without intervention from the host software drive. Thus, the UHS-II 1.56 Gbps interface can be more effectively utilized and maximize the system throughput. This feature can be very useful when running multithreaded applications where multiple applications are constantly updating their status or swapping their contents by writing or reading small chunk of data to or from the memory card.
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Fluorescence Imaging
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A next-generation fluorescence lifetime imaging microscopy (FLIM) camera that simplifies FLIM for researchers and imaging centers by combining excellent light sensitivity with easy image acquisition and data analysis.
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X-Ray Cameras
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A range of scientific camera solutions optimized for high energy / X-Ray detection.
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Product
X-Ray Inspection System
TruView™ Cube
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The Perfect Solution for a Powerful Small Form Factor X-ray Inspection System. The all new TruView™ Cube X-Ray Inspection System is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. Ideal for applications where space is premium, the the TruView™ Cube X-Ray sits comfortably on your laboratory bench.
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Product
Total Nitrogen Unit For TOC-L Series
TNM-L
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Perform simultaneous TOC and TN measurements. *720 °C catalytic thermal decomposition/chemiluminescence methods are adopted for TN measurement. There is no interference from metallic ions or bromine in sea water.*Measurements over a wide range with a detection limit of 5 μg/L for TOC-LCH to an upper limit of 10,000 mg/L.
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Product
Total Sulfur Process Analyzer
NEX XT
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Applied Rigaku Technologies, Inc
Featuring third-generation X-ray transmission technology, the NEX XT represents the next evolution of process gauge for sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.The Rigaku NEX XT system is faster, more sensitive and far more compact than competitive systems, and provides continuous, reliable detection of sulfur at pressures up to 1480 psig. Rigaku NEX XT can operate as a stand-alone analyzer or provide real-time closed-loop control when tied into a blending or plant-wide automation system. Among its other key features are a simplified user interface, reduced standards requirement, automatic density compensation, password protection, and standard platform for communicating sulfur and density to a plant-wide DCS. Due to its unique design and robust construction, sample conditioning and recovery systems are typically not required.
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Product
Total Halogen and Sulfur Analyzer
XPLORER-TX/TS*
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The XPLORER-TX/TS is a microcoulometric combustion analyzer for the analysis of total halogens and total sulfur. The small footprint allows it to blend into every laboratory environment, whether it is in R & D, refinery, chemical, or petroleum applications. This next generation analyzer surpasses all others in its class in performance. It is robust, precise and ideal for harsh testing environments.
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X-ray Inspection System
Cougar ECO / Cheetah ECO
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Cheetah and Cougar ECO X-ray inspection systems for use in the electronics industry. These microfocus systems, which have been developed by Yxlon in Germany, are characterized by an excellent price-performance ratio. Being entry-level systems in two sizes, each of them provides best inspection results in quality control in the SMT and semiconductor industries.
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Fluorescence Microscopes
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Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology. Our confocal systems enable cell biologists to study function and structure using live-cell imaging in cell cultures and invertebrate model organisms at speeds and durations previously not possible. Bruker’s super-resolution microscopes are setting new standards with quantitative single molecule localization which allows for the direct investigation of the molecular positions and distribution of proteins within the cellular environment. Our latest addition, Luxendo light-sheet microscopes, are revolutionizing long-term studies in developmental biology and investigation of dynamic processes in cell culture and small animal models.
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Process Totalizer (analog input)
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Displays and totalizes 0-1 mA, 4-20 mA, or 0-10 V process signals. Square root extraction is standard for flow applications, allowing display of volume from the 4-20 mA signal of a flow transducer with a linear or squared output.
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Digital Cabinet X-ray System
XPERT 80
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Kubtec's XPERT 80 brings high quality imaging and ease of use to science and research. The XPERT 80's compact self-contained cabinet, with a high resolution x-ray source, provides the sharpest images for every application. Optional sources are also available for micro-focus and soft x-ray applications.
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Product
Reflectance Standards
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Diffuse reflectance calibration standards in white or different grey levels. Traceable calibration for the wavelength range from 250 nm to 2450 nm.
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PRO Total Dissolved solids (TDS) Monitor
MC410
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The Milwaukee MC410 PRO Total Dissolved Solids (TDS) monitor lets you measure TDS levels automatically and alerts with an alarm when out of the set point range.
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Nano-focus X-ray Inspection System
X-eye NF120
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Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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Industrial CT X-Ray Inspection System
X3000
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The X3000 is North Star Imaging’s newest standard system. Whether you are inspecting small or large components, the X3000 is the best option for customers needing a compact system with unique capabilities generally available on a larger X-ray or CT system.
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X-Ray And Gamma Detector Systems
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The XR-100CR is a new high performance x-ray detector, preamplifier, and cooler system using a thermoelectrically cooled Si-PIN photodiode as an xray detector. Also mounted on the 2-stage cooler are the input FET and a novel feedback circuit. These components are kept at approximately -55 °C, and are monitored by an internal temperature sensor. The hermetic TO-8 package of the detector has a light tight, vacuum tight thin Beryllium window to enable soft xray detection. The XR-100T-CdTe represents a breakthrough in xray detector technology by providing “off-the-shelf” performance previously available only from expensive cryogenically cooled systems. The XR-100-CdTe is also suited for measuring gamma rays.
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Total Organic Carbon Monitor
HT-110
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The continuous online TOC-Analyzer HT-110 is suitable for the measurement ot total organic carbons in Purified Water (PW), Water For Injection (WFI) and Highly Purified Water (HPW). The unit is operating according to USP 643. It is applicable for pharmaceutical and/or semiconductor manufacturing. The measuring principle is based on UV-Oxidation and measurement of the difference in conductivity. TOC concentration measurement (TOC concentration 500 ppbC or lower) is necessary to perform quality control according to GMP (Good Manufacturing Practice).
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X-Ray Inspection
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X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-6000
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HORIBA Scientific, a market leader in sulfur-in-oil analysis, announces the launch of the new SLFA-6100/6800 Energy Dispersive X-ray Fluorescence Analyzer, which measures sulfur in oil ranging from 5 ppm to 9.9999%. This new, compact, and accurate analyzer meets the needs of anyone wishing to conform to ASTM D4294, ISO 8754 or JIS K2541/B7995.
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Product
UV Fluorescence SO2 Analyzer
Model N100
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Teledyne Advanced Pollution Instrumentation
The Model N100 instrument uses the proven UV-fluorescence principle, combined with a state-of-the-art modular architecture, and intuitive operating software to provide accurate and dependable measurements of low-level Sulfur Dioxide (SO2) gas.
