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Product
Massively Parallel Parametric Test System
P9001A
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The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Temperature Test Chamber
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Temperature Test Chamber is designed for testing the capability of heat-endurance, cold-endurance, dryness-endurance, and humidity-endurance, suitable for quality control of the industries of electron, electrical equipment, vehicle, metal, foodstuffs, chemistry, building materials, luggage, adhesion tape, printing, packaging, etc.
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Product
AC Hipot w/ Ground Bond Test Capability
HypotULTRA® Series
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In a world where data is king, HypotUTLRA improves traceability with on-board data storage and allows you to automate hipot testing with a variety of communication interfaces. Increase efficiency with our direct barcode scanner connection and intuitive touch screen interface. Models 7804 and 7854 are a 4-in-1 solution with the addition of 40A AC Ground Bond test capability added to HypotULTRA's already impressive feature list. HypotULTRA is a dielectric analyzer designed to take your production line to the next level.
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Product
Environmental Test Probe, PH, Tenma 72-6783 PH Meter
72-6784
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The 72-6784 is a typical 0 to 14pH Probe with epoxy body, BNC connector. It is used with pH meter 72-6783 model.
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Product
Manual Model for Integrated use in VLT Test Lanes
VLT 0939TL01
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Manual Headlight Beam Tester with Same measuring Techniques as our Fully Automated models. This Manual operated model for use in VLT Test Lanes, with cable boom connection to the Test lane Computer. Including rechargeable battery pack and charge.
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Product
ZIF PCI Test Connector
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Meritec's ZIF PCI Test Connector offers the user an accurate and reliable way in which to test their PCI cards. With over 20,000 reliable cycles, it eliminates the need to constantly replace your PCI Connectors. Meritec's Test Connector assembly plugs directly into the PCI Connector in the test bed and is actuated by a lever for easy loading and unloading of cards. Meritec's solution eliminates the uncertainty associated with intermitancy between the PC Board and Test Connector during the test cycle.
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Product
Conductor Damage Test Set
CD-2M
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Is designed to carry out tests specified for Switches used for Domestic and similar applications as included under IS:3854:1997. It is used to ensure that Screwtype terminals of switches are such that they clamp the conductor without causing undue damage to the conductor strands. It is a compact and robust andequipment housed in a bench top enclosure. The CD-2M is motorized to allow easy operation. The Instrument is designed to meet the requirements of IS:3854:1997 and other related specifications.
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Product
Loss Test Set
HPT-5100
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The HPT-5100 represents a significant improvement in technology at a competitive price. This high performance loss test set has advanced features commonly found in instruments costing far more.
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Product
ServiceJunior Test-Kit
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Parker's ServiceJunior diagnostic test kits are ideal to digitally measure pressure and capture min and max fluctuations in any hydraulic or pneumatic system.
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Product
Non-Destructive Resonant Inspection Drop Test Fixture
RAM-DROP
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The Drop Test Fixture, Model RAM-DROP, Resonant Inspection System, allows automated sorting and quality testing of small metal injection molded (MIM), powder injection molded (PIM), additively manufactured, and other small parts by using the Resonant Acoustic Method (NDT-RAM).
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Product
Battery Test & Automation Solutions
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Chroma specifically developed battery cell test solution which is an integrated solution for battery cell formation & grading processes. From battery cell formation procedure to grouping process, Chroma 17900 series are customized with professional planning service which includes manufacturing flow path planning, test station/ equipment planning, test data management and so on to create high performance manufacturing capability.
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Product
Telcom Test Sets
T62 Recon
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The RECON is the first true 21st century telecommunication line analyzer setting a new standard for POTS butt sets. It is a field instrument that delivers more information of online conditions & status than any other test set on the market, anywhere in the world!!
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Product
Vibration Test Package
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Whether you are collecting data for operating deflection shapes (ODS) or measuring overall vibration levels for ISO standards, the Vibration Test Package contains all the hardware needed to acquire quality data.
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Product
Digital Test Instruments
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High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
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Product
IEC60335-2-4 100mm Drop Test Device With 40I - 50I RHD Galvanized Steel Hammer
CX-21673
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Shenzhen Chuangxin Instruments Co., Ltd.
IEC60335-2-4 100mm Drop Test Device With 40I - 50I RHD Galvanized Steel Hammer
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Product
Benchtop Temperature And Humidity Environmental Test chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Benchtop Temperature and Humidity Test Chamber provides a compact footprint and multi-function test performance. It is very popular for labs and product manufacturers to test various small electronic product, electronic components and materials with simulating temperature and humidity environment condition.
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Product
EMI and EMC Test System
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EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem.
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Product
MMIs for Test and System Integration
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Laying out a custom PCB is too time consuming and costly for most rush projects. Pulse Research Lab has developed Mini Modular Instruments ™ to provide cost effective solutions to the most common engineering challenges.
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Product
Motor Test for Electric Scooters
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*The performance data of electric motors, in the majority of all cases, is performed by a brake test. Power input is calculated from current and voltage. Torque and power output are measured with a brake. It is important to reach, for each point, a persistent temperature. In case of large outer rotor BLDC motors, which are usually used for electric scooters, this traditional procedure may take many hours to complete, and is very complicated. *For several years, an innovative motor tester of MEA Testing Systems Ltd. is on the market. This testing system avoids any temperature confusion by testing a motor at constant temperature over the entire speed range. The test procedure is very fast, and gives the full load performances, including PWM current, voltage, torque, and driver efficiency, from stall up to no load. *During the test procedure, the motor is freely accelerated from stall to no load speed. The load of the motor is only the predetermined inertia of the rotor. From the moment of inertia and the acceleration, the torque of the motor is calculated and, also, the power output over the whole speed is given. Since the entire measuring time, depending on the motor size, is usually less than one second, the motor has no time to warm up. It remains at room temperature.
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Product
Radiated Immunity Test System
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Beijing KeHuan Century EMC Technology Co,.LTD
Radiation Immunity Test System.
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Product
Automatic Test Equipment (ATE) Automatic Electrical Measurement Platform
i7000 Series
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Automatic Test Equipment (ATE) Automatic Electrical Measurement Platform by ADSYS
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Product
MIL-STD-1553 Test & Simulation Instrument for VXI
VXI-1553
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Avionics Interface Technologies
Dual redundant, multi stream configurations availableSoftware selectable Transformer, Direct, and Bus Stub Coupling Modes - Concurrent Bus Controller, 31 Remote Terminals, & Bus Monitor operation - Full error injection and detection - Multi-level trigger for capture and filtering - IRIG-B time code encoder/decoder - Real-Time recording and physical bus replayANSI Application interface supporting C, C++, C#, and .NET development - VISA based VXI “Plug & Play’ Device driver provided
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Product
Walk-In Climatic Test Chamber
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WEIBER climatic test chamber is ideally suited for specimen test requiring quick changes of temperature. It covers various applications from JEDEC and IEC test standards. The climatic chamber is equipped with advanced technology such as specimen temperature control which allows linear specimen temperature rates of change during rapid thermal cycling or accurate temperaThe walk in option provides facility to test large sized, heavy weight specimen as well as the facility to test the specimen in bulk. Capacities ranging from 2000 to 10,000 Lt are available. Standard as well as customizable sizes and facilities are provided.
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Product
Semiconductor Test Equipment
IC Tester
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Equipment to determine the pass/fail of devices in the wafer inspection process and the final inspection process after packaging.
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Product
Highly Accelerated Stress Test Chambers
HAST
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Our HAST systems have a modern design that's easier to use: Automatic humidity filling; Automatic door lock; A more square workspace; allowing more product to be loaded;Convenient, hermetic power-pin system for bias testing. We are now able to offer a hermetic port system to allow special signal lines like coax or fiberoptics to be run into the chamber.
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Product
Flat Panel Display Test Solutions
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Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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Product
Inspection Tools
Multi Disk Test System (4-Port)
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16 types of inspection modes can be registered and edited. More accurate acceptance inspections can be performed using various types of inspections.High speed data communications using USB interface for communicating with host computer.Acceleration testing for temperature loaded HDD can also be performed. (Optional)Easy attaching and removing HDD using optional plug-in unit.
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Product
DDR4 Pro Memory Test Adapter
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This memory test adapter for the RAMCHECK LX includes an extraordinarily rugged test socket for many thousands of insertion/removal cycles.
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Product
Test Advisory Services
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The QA function has unique challenges in every enterprise, be it a small enterprise that is just at the beginning to set up a QA team or a multi-billion dollar giant with matured QA processes. The right QA strategy can help you improve the overall product quality, reduce release cycle time enabling faster time-to-market and controlling the rising QA costs. TestingXperts’ Test Advisory Services provides you the specialist advice to achieve these objectives and help you move to the next maturity level in QA. We deliver custom solutions that address your current business needs and align with your future aspirations.
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Product
Millimeter-wave Test Set Controller For PNA/PNA-X Network Analyzer Series, 2- Or 4-port
N5292A
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The N5292A millimeter-wave controller provides 2- or 4- port interface capability to the millimeter-wave frequency extender modules and with a PNA or PNA-X Series B model network analyzers.
