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Test Pattern
Test signals for the calibration and alignment of TV broadcast and reception equipment.
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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Vibration Testers
Analyzes vibration patterns within mechanical systems or individual components and structures to identify defects and evaluate the test object's overall condition.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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ISO Test Charts
ISO has been the governing body for Image Quality Testing all over the world. To that end, APPLIED IMAGE is proud to be a participant in assuring that the industry has products that meet or exceed the requirements of ISO. Since ISO covers many levels, we provide test patterns of various types that can be used for Image Capture and Evaluation of Optical and Imaging systems of all types.
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Continuous Time Interval Analyzer - PXI
GT668PXI-40
A true breakthrough in high-speed Time Measurement and test technology, GuideTech’s GT668PXI-40 leverages the power of its CTIA continuous time-stamping technology, eliminating the need for supplemental triggers, pattern markers or clock recovery circuits.GuideTech’s CTIAs enables serial interfaces pattern verification and full jitter analysis in milliseconds for fast, automated characterization and high-throughput production test on all ATE platforms, including low-cost and in-house testers.GT668PXI-40 cards can be expanded up to 36 Channels Single Ended Input in a single 3U PXI chassis.
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Logic Analyzer & Digital Pattern Generator
ScanaQuad Series
ScanaQuad (SQ) is a series of high performance 4 channels logic analyzers and digital pattern generators. They are designed to be your best companion when working on serial protocols like UART, SPI, I2C, 1-Wire, USB, I2S, CAN, LIN, RS232, RS485, and more. With ScanaQuad Logic Analyzers, you can capture signals, you can play them back, and you can even build genuine test signals and generate them!
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Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument
785855-01
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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Pattern Generator
1B-SDI-PTG
The 1B-SDI-PTG 3G-HD/SD SDI Pattern Generator - advanced SDI pattern generator with multi-format and multi-pattern support. Supports still and moving video test patterns, and provides a lot of useful features like audio SMPTE-291M. 1B-SDI-PTG Pattern Generator supports up to 8 channels of AES compliant audio with 48KHz sample rate. Multitasking of 1B-SDI-PTG comes from bypassing HDMI input which allows user to use more testing patterns for connected display or use 1B-SDI-PTG as SDI converter with 3G support.
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Micro Compression Tester
MCT Series
This is a strength evaluation tester for micro parts and micro particles generated in powder processing. It is capable of carrying out not only compression tests, but also loading and unloading tests, repeated tests, and various other load patterns, with excellent operability and functionality.
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Automated Bondtester
4600
The 4600 Bondtester is a benchtop system designed to automatically perform complex test procedures without needing operator input. The system can automatically complete shear and pull test patterns with different orientations of bonds, while recording failure mode images upon completion.
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Dynamic Digital I/O (3U), 32 Ch., Per Pin Control, Up To 100 MHz W/256MB Memory & LVDS
GX5292
The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 digital input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.Dynamic Digital I/O (3U), 32 ch., per Pin Control, up to 100 MHz w/256MB Memory & LVDS
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HDTV PATTERN GENERATOR
HG139
The HG139 is an easy-to-use handheld video pattern generator that generates a wide variety of test patterns for comprehensive testing, calibration, and repair of HDTV, analog television monitors, and other video equipments. The HG139 delivers the quality and functionality you would expect from the expensive high end HDTV pattern generator at a very affordable price.
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NTSC PATTERN GENERATOR
PG-28
Model PG-28 NTSC Pattern Generator can be use to quickly and easily troubleshoot, test, and align NTSC television. Features a wide selection of popular video patterns including Color Bars, Crosshatch, Dot, Staircase, Circle, Center Cross, Window, and Raster for accurate and comprehensive TV troubleshooting and testing. Supports both progressive and interlace scanning system. Composite video and S-Video output. 1KHz audio tone for audio troubleshooting.
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Digital/Pattern/PE Card
PA32S
The PA32S represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE32, the PA32S offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 512 bi-directional pins (16 boards). The PA32S also supports deep pattern memory by offering= 32 M of on-board vector memory with dynamic per pin direction control and with test rates up to 33 MHz. With new 32M capture/log memory, PA32S can capture 32 channels fail log.
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PCB Test Fixture Kits And Customized Fixtures
Mirotech manufactures portable benchtop PCB test fixture kits and provides customized test fixture solutions for the electronics industry. Our innovative, streamlined designs are compact in size and feature a linear collapsing system, interchangeable and reusable plate design, top and bottom probing, and are affordably priced. All fixtures are built using high quality hardware and materials and manufactured using the DATRON M8Cube, known for its precision and accuracy. Each of our custom designs are unique to our customer’s particular project requirements. Fixture kits come pre-assembled, and include blank plates ready for you to drill your test pattern.
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Cryogenic Millimeter-Wave / Microwave Test Fixtures and Calibration Kits
upj10
KEYCOM''s cryogenic millimeter-wave / microwave test fixtures and calibration kits are specifically optimized for testing the performance of patterns between the edges of printed boards(edge type) and circuit testing on the printed boards(probe type). They are also designed to minimize heat capacity by miniaturizing their dimensions so they cool off efficiently, and materials with low coefficient of linear thermal expansion such as invar are used for major parts where high dimensional stability is required. Their operating frequency ranges from DC to 110GHz.
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DisplayMate Multimedia with Test Photos Edition
DisplayMate Technologies Corporation
DisplayMate Multimedia with Test Photos Edition is an enhanced version of the standard Multimedia Edition that adds a carefully chosen set of very high quality high resolution photographs for calibrating, testing, evaluating, and tweaking monitors, projectors and HDTVs, automatically scaled to the native resolution of the display. It has everything in the standard Multimedia Edition including all of its 500+ test patterns up through 4100 x 4100 resolution.
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FUEL INJECTOR CANISTER CLEANER
FIT470B
*Cleans carbon from intake valves, fuel passages and cylinders with a professional carbon cleaning solution*Will restore the original spray pattern more effectively, giving improved performance, fuel economy and emission tests*Uses shop air with any professional canister cleaning solution on the market
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Flat Panel Display Test Solutions
Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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Global Standard Model For 4 Point Probe Sheet Resistance Automatic Measurement System
RT-3000/RG-1000F
*Fully automatic system for large sizes of flat panel with glass loading robot*Tester self-test function, Measurement position correction function, wide measurement range*Min. 0.1 mm meas. resolution and user programmable test pattern*Host (CIM) communication and 2-D/3-D Mapping software
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370MHz To 6GHz Radiation Measurement System
RMS-0460
The MegiQ Radiation Measurement System (RMS) is a compact test system that performs 3-axis radiation pattern measurement in non-anechoic spaces.
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Oscilloscopes
Anritsu sampling oscilloscope is an ideal solution for Eye pattern analyses and Eye Mask tests. In addition, The excellent performance and high sampling speed reduce measurement times and help hold-down equipment costs.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Bit Error Rate Testing
BERT
An invaluable tool for manufacturing, development engineers, and field service engineers*Generate multi-speed, multi-application, and custom test patterns*Verify and validate lowest level connectivity down to 10-12*Support up to 32 ports of testing
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MMW Field Sensors
ITS-9050
The Innovative Technical Systems ITS-9050 Detector is a sensitive, harmonic mixing detector designed to measure millimeter-wave free-space radiation. It is ideal for measuring radiation patterns of antennas inboth the near and far-field. The ITS-9050 employs a free-running dielectric resonator oscillator (DRO) and an integrated harmonic mixer with a waveguide RF input that either connects directly to a circuit under test or to an antenna for radiation detection. The resulting IF is amplified and detected by an IF log-detector that drives a front panel LCD voltmeter to provide an indication of signal strength. A DC output voltage from the log detector is available on a BNC connector to drive external data acquisition instrumentation. Also, a sample of the IF output is provided for measurement on a spectrum analyzer.
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Silicon Test & Yield Analysis Solutions
Tessent®
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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370MHz To 4GHz Radiation Measurement System
RMS-0440
The MegiQ Radiation Measurement System (RMS) is a compact test system that performs 3-axis radiation pattern measurement in non-anechoic spaces.
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Food Testers
These automated food testers are designed for clean, smooth trouble-free operation.Food Rheology testers automatically test firmness, elasticity or viscosity using a load cell combined with programmable movement control. The easy-to-use program dial and menu screens control probe positioning and speed. Select from three movement patterns. The USB port streams 1,000 force data/second to the Force Data Analysis Software (included).
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Digital IO
PA32IX
The PA32IX represents a new level of performance and capabilities for PXI-based digital instrumentation. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 512 bi-directional pins (16 boards). The PA32IX also supports deep pattern memory by offering 64 M of on-board vector memory with static per pin direction control and with test rates up to 50 MHz.
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Digital Flight Control Computer
The Digital Flight Control Computer is a Quadruple Redundant Flight Control Computer designed by DRDO and ADE and manufactured by Bharat Electronics Limited. Data Patterns has designed and manufactured the Automated Test Equipment required for the validation of this DFCC.
