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Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
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IPTV Monitoring and Test Solutions
Net-x TVMS
The NET-xTVMS is a system of specialized computer probes networked to the enterprise server and clients. The probes, strategically located at the hub sites next to edge routers and edge QAMs, continuously monitor IPTV QoS with MPEG-TS transport metrics of SPTS and MPTS multicast streams as well as DVB-C MPTS streams. The NET-xTVMS is scalable from 1 to 1000 probes. Several types of probes are available to suit many different monitoring applications. Metrics are collected at the probes and alarms are sent to the server once they exceed predefined thresholds. A system wide alarm matrix, alarm logs and periodic metrics for each location can then be viewed via Internet on client computers.
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Remote Test Unit (RTU) Expert
RTU Series
VeEX’s Remote Test Units (RTU) are self-contained, scalable test and monitoring probes for communications networks. When used as part of the VeSion cloud-based monitoring system, these rackmount probes are optimized to work with a centralized server system. In addition, the probes can be operated in standalone mode via web browser.
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Dynatrol® Digital Viscosity Converters
Series 3000
Dynatrol® Series 3000 Digital Viscosity Converters were designed for use with all Dynatrol® Viscosity Systems. Using microcontroller technology, the digital converter accepts information from a Dynatrol® Viscosity Probe and calculates the viscosity of the liquid under test. The Series 3000 converter mathematically computes and displays the viscosity in standard units.
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Spectrophotometers
The new Specbos family offers compact, spectrometric instruments, designed to measure the color coordinates, spectral characteristics and light levels of transmissive and reflective targets. These small, modular, easy to use spectrographic systems offer accurate solutions within the UV, VIS and NIR ranges.The basic spectral diffuser used is a high quality holographic diffraction grating, which exhibits very low stray light and high dynamic range. Many instruments also incorporate built-in light sources and offer several measuring probes. All units are delivered complete with PC-compatible software, power supply, operations manual and transit case.
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500Mz Spectrum Analyzer
SM-5005
Is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Logic Analyzer Probes
FS2354 & FS2355
The FS2354 and FS2355 are logic analyzer probes used to test DDR3 SO-DIMM memory modules. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 SO-DIMM systems.
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Loop-Powered Transmitters and Drivers
4-20mA
Loop-Powered Transmitters convert the output from proximity probes, seismic sensors, into a 4-20mA DC current, which is proportional to the input being measured. The transmitter converts the displacement or vibration signal to DC voltage and/or current for a DCS or PLC system. They control a 4-20mA current loop for a specified vibration range (ex. 0-5 mils peak-to-peak). The transmitters have a two-wire hook-up, powered solely by the loop current and have a power supply range of 15 to 36 volts.
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Crack Testing
STATOGRAPH® Product Family
Foerster Instruments, Incorporated
The STATOGRAPH product family is used for testing surface cracks with the help of eddy current sensors. Eddy current testing for material cracks requires the appropriate evaluation electronics and probes adapted to the testing task. Depending on the test situation and test object, the STATOGRAPH family of test instruments offers the right system for this purpose.
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Multiparameter Water Quality Meter
ProDSS
Handheld multiparameter instrument with multiple cable optionsThe YSI ProDSS (digital sampling system) handheld multiparameter meter provides extreme flexibility with two main cable options. Choose between the fully loaded 4-port cable assembly outfitted with any four DSS sensors (with depth or no depth) or the ODO/CT probe and cable - where you get accurate DO measurements every time with an optical dissolved oxygen sensor with an inline conductivity sensor, allowing for real-time salinity compensation.
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Cryogenic Probe Station
TTPX
The TTPX probe station is an affordable, entry-level probe station capable of making a wide variety of non-destructive, standard electrical device measurements. The compact tabletop design is perfect for academic and laboratory research settings. The TTPX provides efficient cryogenic temperature operation and control with a continuous refrigeration system using either liquid helium or liquid nitrogen.
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DC12V Heavy Duty Circuit Tester
TE6-0706
Hangzhou Tonny Electric & Tools Co., Ltd.
*Heavy Duty probe *Heavy plastic handle and insulated ground clip*Testers light up and/or buzz to indicate testing result*Lights for easy visibility.*Heavy duty coil cord or straight cord (optional).*Durably designed for a long service life*For testing 6-12 volt systems for wire breaks, shorts, fuses, lamps, relays, armatures and more.*Suite able for a broad range of household, car, trucks, boats, trailers, vans, motorcycles, industrial and commercial uses.
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Fully Automatic 4 Point Probe System for Silicon Wafer
WS-8800
*Measurement of resistivity, thickness, conductivity(P/N) and temperature*Tester self-test function, wide measuring range*Thickness, measurement position and temperature correction function for silicon resistivity*Number of cassette station can be changed by customers request*Host (CIM) communication and SMIF or FOUP compatible
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Flying Prober Test
QTOUCH1202C
Qmax Test Technologies Pvt. Ltd.
he Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.The V-I signature test shall be in-built in the Prober system with “ Best fit Curve “ algorithm .Provision for adding various external Test & Measurement instruments like GPIB / USB / PXI Instruments is available.
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Bench-Top Macroscopic Raman Spectrometer
Modular Raman Microscope
HORIBA’s modular Raman spectrometers allow the user to have a flexible Raman system to handle high performance spectroscopy at a price to fit most budgets. The modular microscope can also be used with a range of sampling options, including remote probes. A Raman spectrum recorded with a fiber-coupled Raman microscope of acetaminophen is shown below.
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MPI Automated Probe Systems
MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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USB Analyzer for USB 3.2, USB4, and Thunderbolt 3 Testing & Verification
Voyager M4x
The industry’s most accurate and trusted USB analyzer platform now supports USB 3.2, USB4 and Thunderbolt 3 testing and verification. The legendary Voyager family combines best-in-class probe technology with industry-leading analysis software allowing designers and validation teams to debug problems and verify interoperability for next-generation USB systems.
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CombiVolt™ 1 Voltage/Continuity Tester
DL6780
Testing of AC/ DC voltages from 12 to 690 V AC/DC Continuity testing with optical and acoustic indication Automatic switching between voltage and continuity Phase rotation test system Single pole phase indication Fully compliant with GS38 Fully operational voltage indication even when batteries are discharged Will not trip any RCD when testing across Live and Earth Single pole detection when L2 probe connected above 100V
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Precision Flying Probe Platforms For Automated Test Applications
Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
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The Lorlin© Impact Series
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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High-Temperature and High-PressurepH Electrodes
UltraDeg
Corr Instruments offers a full range of exceptionally high performance, high-temperature and/or high-pressure UltraDeg probes, including pH electrodes, reference electrodes, platinum conductivity probes, and ORP(redox) electrodes, for temperatures up to 650F (343C) and pressures up to 5100 psi (35 MPa). These probes are ideal tools for corrosion monitoring, thermodynamic or electrochemical studies in harsh environments such as steam generators, nuclear power reactors, geothermal systems, deep oil/gas wells, and super critical water systems. Many of these UltraDeg probes are built upon our innovative sealing compound, Queon, which is the only known material in the world for sealing electrical conductors in metal sealing glands or compression feedthroughs that are operable at temperatures between 400F (200C) and 650F (343C).
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Fully Automatic MRAM Probe System With Initializers
*This system can measure MRAM characteristics automatically.*Automatically initializes(resets) before and shorten the time of measurement by having a built in initializer.*Generates strong and constant magnetic fields. (Prober: Max 1.5T, Initializer: 2.7T (the highest in the industry)
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6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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High Performance Liquid Chromatograph Triple Quadrupole Mass Spectrometer
LCMS-8045
Equipped with a heated ESI probe, the LCMS-8045 has the highest sensitivity in its class. The heated ESI probe, high-temperature heating block, desolvation line (DL) and drying gas, all act to promote desolvation and prevent contamination due to the penetration of liquid droplets into the MS unit. This improves the robustness, so reliable and high-accuracy data can be obtained over the long term. The LCMS-8045 also achieves the world's fastest scan speed (30,000 u/sec) and polarity switching speed (5 msec). These enable ultra-high-speed, high-sensitivity analysis. The excellent cost performance of this system is demonstrated in food safety, environmental analysis, and other quantitative analyses, it can be upgraded to the LCMS-8060.
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Complete Power Analysis System
PK3564-PRO+
PK3564-PRO+ complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, CASW Weather-Resistant Carrying/Operating Case, and 2-year deluxe warranty.
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Electrical Probe Systems
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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USB Sound And Vibration Measurement Bundle
The USB Sound and Vibration Measurement Bundle provides a portable, USB-based sensor measurement system that helps you measure signals from integrated electronic piezoelectric (IEPE) and non‑IEPE sensors such as accelerometers, tachometers, and proximity probes.
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Linear Testfixture (Cassette Not Included), UTT 306 x 248 mm
MG-02
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
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Active Probe
TETRIS®
PMK Mess- und Kommunikationstechnik GmbH
MK presents a unique inline probing system – the TETRIS® Active Probe which can contact adjacent square pins in 2.54 mm pitch simultaneously. 1 MΩ / 0.9 pF
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Measurement System for Heating and Air Conditioning R&D
ComfortSense
Our ComfortSense system is designed for research and development of heating and air conditioning systems requiring multi-point measurements of air velocity and temperature. The ComfortSense features omnidirectional sensors with a frequency response of 2 Hz to obtain draught measurements.A Humidity and an Operative Temperature probe are also available together with a powerful application software with graphical presentation of results including the Predicted Mean Vote (PMV) and Predicted Percentage Dissatisfied (PPD).
