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Analog Ultrasonic Inspection System
ULTRAPROBE 100
The Ultraprobe senses high frequency sounds produced by operating equipment, leaks and electrical discharges. It electronically translates these signals by heterodyning them down into the audible range so that a user can hear these sounds through a headset and see them as intensity increments on the meter. Heterodyning works the same as a radio in that it accurately transforms the sounds so that they are easily recognized and understood.
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Auto Macro Wafer Defect Inspection
EagleView
EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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Automated I-V/AOI/EL and Sorting System
OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Inspection System for Die Casting
X-eye 7000BS
Appropriate for medium•large size component inspection and detecting surface structure and defects(inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's reduced significantly and enables long-term use with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Machine Vision Systems/Solutions
Machine Vision products alone will not do the work of a complete Machine Vision solution. FSI’s engineering expertise, vision lab, and flexible software and hardware options assure solutions for all industrial automatic inspection applications.FSI Vision Engineers have the expertise to design and build the best system for your vision application, using the latest in software and hardware technologies available. Add-on options include the APS program and training for key operation personnel. Research, feasibility and consultation services are available. Products and services can be purchased separately or as a complete engineered solution. To see examples of complete FSI Machine Vision systems that are in operation, see the Application Specific Systems page. For a list of general industries served by FSI, general applications using FSI Machine Vision solutions, and specific applications that are well suited to FSI Machine Vision, visit the General Applications page.
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Inspection System for high-power precise 3D X-ray CT
X-eye PCT225
Inspection System for 3D X-ray CT able to analyze defected area precisely by precise movement of axis with high polished Anti-vibration table. High-power X-ray Tube of max. 450kV and large area Flat Panel Detector of max.16 inches can be installed depending on the sample. Customized 3D CT equipment is available with selecting main parts by customers depends on their needs for size and material.
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Machine Solutions
Our machines employ industry-proven production technologies – micro-positioning, active/passive precision alignment, attachment via welding, soldering and/or bonding, and automated optical inspection. ficonTEC also provides a suite of test capabilities for individual components and hybrid opto-electronic devices, both on and off-wafer. Moreover, with everything being orchestrated by our flexible PROCESS CONTROL MASTER software, the machine platforms and product lines described below become so much more than just the sum of their parts. The technologies and capabilities implemented in all machine platforms translate into a broad and established spectrum of production process expertise. We are continually refining capability, modularity and design so that these systems reliably and cost-effectively meet and exceed efficiency and yield requirements even for cutting-edge production processes. For the team here at ficonTEC, we face your challenges every day.
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Defect Inspection System
F30
The F30 System boasts a five-objective turret that enables the resolution-throughput flexibility required by today’s multi-process inspection applications. Equipped with an advanced productivity suite (waferless recipe creation, simultaneous FOUP, recipe server and tool matching), the F30 System redefines inspection cost of ownership expectations.
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3D Solder Paste Inspection (SPI)
Systems designed for solder paste inspection (SPI) quickly and reliably check the solder paste deposits on the circuit board.
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Metal InspectionSystems
Metal surfaces must undergo a reliable inspection, because defects impair the functions of steel tubes or medical engineering products. Relying to the often appearing strong structures of such surfaces, special robust vision techniques are needed to make, for example, geometric measurements. Our systems are prepared to provide a fully automated, 100 % inspection rate in a rough industrial environment.
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Complete Non-Contact Inspection System For OLED/TFT/LTPS
GX3/GX7
*Fastest*Workable to large panel as well as fine pattern of medium-small panel*Workable to large mother glass of every generation*Possible to dock width Repair Machine
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Tracing-Type Non-Contact Inspection System For LCD/STN/Touch Panel/FPC
TTS
*"Probe + Non-Contact Sensor" enables to delect SHORT after sticking LCD*No Fixture in LCD Inspection*Applicable to FPC Inspection
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Capacitive Proximity Sensors
Sometimes you need to know what is hidden beneath a surface. Behind a wall, for example, inside a storage container, inside a shipping container, or behind a cover. Capacitive proximity sensors are ideal for level and feed monitoring. From solid material, such as paper or wood, to granules or liquids, they can be relied upon to detect what is happening in the production process and during final inspection. Is there something behind that cover? Is the finished package really full? How much paint is still left in the tank? For capacitive proximity sensors, these are easy questions to answer. SICKs capacitive proximity sensors are never far from the action. Sensing ranges between 1 and 25 mm allow them to be used in nearly all installation situations, making them extremely adaptable for a wide range of applications. These sensors are also remarkably resistant to interference. Impurities, contamination, dust, and airborne spray particles have little effect on them, nor does electromagnetic interference. No wonder they are installed in a wide range of industries, such as food and automotive, or in storage and conveyor systems.
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3D Microscope
BVM-5006
BVM-5006 Electric 3D Microscope features the quality optical system, high resolution, large field of view, high zoom ratio, novel design and one-up technology, easy and automatic operations. Includes: Motorized zooming, motorized observation angle for changing and optional motorized focusing. The speed can be adjusted while changing observation angle. With the angle attachment, the microscope can realize 3D image effects for observing the components and deep holes. The LED lights can generate high brightness. Theoretically the service life of LED lights can reach 20,000 hours. The LED lights with area control function can illuminate from different angles for convenient multi-angle inspections. The M-N3D Microscope can be widely used in micro-electronics, automated monitoring and testing industries. By selecting the appropriate objectives and video couplers, different magnification, field of view and depth of field can be acquired. Digital and Analog video systems can meet the different users' demands.
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Fixed Magnification Interferometer
FiBO 250
FiBO 250 offers a solid and economical solution to automated fiber testing by bringing together full 2D visual inspection capabilities and true phase-shifting interferometry to achieve exceptionally accurate measurements. A fixed focal length 10x magnifier ensures maximum system stability and a very high level of repeatability.
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Conformal Coating Inspection System
TROI 8800 CI
The PEMTRON CI Series addresses the limitations of the area of theinspection due to the diversity of wavelengths of the existing UV,and performs a clearly separated area of coating onvarious wavelengths.
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High-Accuracy Automated Optical Inspection Systems
Fully-automated and high-accuracy 3D inspection and measurement systems. High-power, long working distance optics and high-resolution digital camera are perfect for high-magnification applications. These are full-color systems capable of high-accuracy measurements, automated defect detection and color verification.
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2D CMOS Image Sensors
Emerald 36M
Superior 36 Megapixel resolution - 6K square resolution - Multi-ROI feature enabling more objects to be captured in a single high resolution shot - Small global shutter pixel for blur-free images.With its high resolution, Emerald 36M improves inspection accuracy, increases throughput through an optimized inspection system path, and covers wider areas for surveillance or aerial mapping.
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2D/3D AOI Series
MV-6e
- Exclusive10MP/18MPCameraTechnology- Precision Telecentric Compound Lens Design- Eight Phase Color Lighting System- 10MP / 18MP SIDE-VIEWER® Camera System- Extremely Simple Programming and Operation- Integrated INTELLI-SCAN® Laser Inspection System- 3D Co-Planarity Inspection of Gull-Wing Leads, BGA and CSP - - -- Devices- Enhanced 3D Solder Paste Height Measurement Capability- INTELLISYS® Industry 4.0 Intelligent Factory Automation System
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Laser Diode Characterization System
58620
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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SiteVision
A user-friendly outdoor augmented reality system used for communicating new designs and changes to field crews, inspections, determining productivity and calculating quick measurements on site including points, lines and cut/fill values.
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Inspection Microscope
Z-NIR
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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64-bit PXI Extension Card
52906
The function of PXI extension card is to extend the PXI backplane signal outside of the chassis. Inserting the PXI card to extension card can easily check or measure the PXI card's signal under power on condition, which resolves the problems of inconvenient inspection due to the PXI card inside the chassis for RD or maintenance personnel. PXI extension card is able to isolate the voltage and signals sent to the PXI card for hot swap when the system is powered on. Every time the extension card activates it can supply the power required for PXI initialization. It eliminates the need for rebooting PC when users read and re-write the configuration files.
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Inspection System
X-eye 7000B
Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Automated Test Equipment
Viewpoint Systems offers design verification and manufacturing quality inspection systems to help customers reduce human error in repetitive tests, increase testing speeds, and ultimately get products to market faster at a lower cost. Viewpoint Transforms Test from Design to End-of-Line. Our R&D test systems are designed with the flexibility to validate ever-changing prototypes while accelerating your development schedule.
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Vision System
Axiomtek's vision system series is designed to focus on vision inspection, guidance, measurement and identification applications. The products have already gone through a complete set of compatibility experiments to eliminate potential integration problems, significantly helping users reduce development and staffing costs as well as accelerate system deployment in factory automation environment.
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The Lorlin© Impact Series
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Professional Thermal Camera
FLIR T540
Diagnose potential faults in industrial, electrical, and mechanical systems, or discover temperature anomalies in R&D testing with the 464 × 348 resolution FLIR T540. This portable, ergonomic thermal camera offers advanced features like 1-Touch Level/Span and continuous laser-assisted autofocus, making it the perfect non-contact diagnostic tool for condition monitoring and research applications. Streamline electrical/mechanical surveys, troubleshooting, and repairs with Inspection Route mode, which runs pre-planned routes created in FLIR Thermal Studio Pro (Route Creator plugin required) so users can record temperature data and imagery in a logical sequence. The built-in Macro Mode allows R&D users to quickly switch from wide angle to close-up analysis without changing the lens. When coupled with Research Studio software, the T540 helps engineers assess unexpected hot spots and find potential design flaws. The T540 also features FLIR Ignite for automatic uploading of images directly from the camera to the cloud for easy, secure storage and sharing. The purchase of a T540 camera includes a 3-month subscription to FLIR Thermal Studio Pro and FLIR Route Creator.
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Professional Thermal Camera
FLIR T530
The FLIR T530 has the features professionals need to accurately troubleshoot hot spots and potential faults. With the 180° rotating lens platform and a bright 4" LCD, the FLIR T530 is engineered to help users diagnose hard-to-reach components in any environment. Advanced on-camera measurement tools, laser-assisted autofocus, and FLIR’s industry-leading image quality ensure you’ll find and diagnose problems quickly. With on-board Inspection Route mode, you can download and run survey plans to your camera from FLIR Thermal Studio Pro (with Route Creator plugin). Together these systems will help you record temperature data and imagery in a logical sequence for faster troubleshooting and repair. The purchase of a T530 camera includes a 3-month subscription to FLIR Thermal Studio Pro and FLIR Route Creator.
