Integrated Development Environment
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Product
Conductivity-Resistivity Sensor Electronics and Integral System with PVDF Sensor
2850
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The Signet 2850 Conductivity/Resistivity Sensor Electronics are available in various configurations for maximum installation flexibility. The universal mount version is for pipe, wall, or tank mounting and enables single or dual (digital versions only) inputs using any standard Signet Conductivity/Resistivity sensor. The threaded j-box version can be used with these same Signet sensors for submersible sensor mounting. It is also available as a combined integral system configuration for in-line mounting and includes a conductivity electrode in a choice of 0.01, 0.1, 1.0, 10.0 or 20.0 cm-1 cell constants. The 2850 is ideal for applications with a conductivity range of 0.055 to 400,000 S or a resistivity range of 18.2 M to 10 k.
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Product
Integrating Display Output A/D Converters
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Renesas offers a selection of high-performance integrated display output analog-to-digital (A/D) converters.
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Product
Developers' Toolkits
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If you are a hardware developer, using RapidDriver Explorer with just a couple of clicks, you can easily start testing and debugging your USB, ISA, PCI or Parallel Port device. You do not have to perform any additional steps - everything is already done!If you are a software developer, you can write your own application with the help of RapidDriver Developer, TVicHW32 or TVicPort without writing a device driver and being a DDK expert - we have already built-in generic device drivers for you! Our toolkits include many test examples on direct port i/o access, interrupt handling, physical memory access, reading specific hardware registers and USB pipes to help you getting started. We also allow redistribution of drivers and DLL's as part of your software without having to pay royalties.For the software developers, we also offer an option to purchase the drivers and DLL source code. The source code can be directly edited and compiled with MS Visual C/C++ or with the DDK "build" utility.Not sure what product to choose? Compare them by features or contact us.
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Product
Class 1 Integrating Sound Level Meter and Advanced Analyzer
HD2110L
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HD2110L is an handheld integrating sound level meter performing either spectral or statistical analysis.
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Product
Type 39 CompacFrame Development Platform, 2 And 4 Slot 3U OpenVPX Aligned To SOSA
39S0xBWX9ZY2VCC0
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Elma’s CompacFrame is the next generation portable test platform designed to accelerate development and test of plug-in cards (PICs) aligned to the Open Group® SOSA™ Technical Standard. Accommodates up to 4-slot OpenVPX backplane.
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Product
Development Boards
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Advantech Development boards provide a schematic software & reference to reduce design effort at the development stage. Development Boards have been designed in order to allow customers to verify the functions of COM, text carrier board problems and support COM series. Advantech has designed a Development Board which can be used to test carrier board problems and support COM series, and Qseven, ETX / XTX form factors.
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Product
DBAir Safety & Environment Sound Level Meter
01GA141SE
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For professionals looking for sound measurement technology capable of a wide variety of applications, look no further than the dBAir Safety & Environment model.
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Product
Signal Integrity Test Products
RoBAT RCI
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*TDR & TDT, Measurement Capabilities*Impedance, Skew, Backdrill measurements*Automated Optical Inspection*DC Electrical Test*Now available with 4 heads*24 port (1 port per channel) TDR/TDT unit*Future capabilities – Fully automated VNA test (4 port S-Parameter Measurement)
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Product
Integrated Analyzer
OR35
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OR35 is the portable real-time multi-analyzer that integrates the best of sound & vibration analysis technology in a truly mobile instrument. OR35 is the synthesis of the ultimate OR3x technology and OROS? wealth of experience of measurement. Designed to be the best for field operations, OR35 takes any measurement situation in its stride. Choose OR35 and go on confidently.?
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Product
Light-resistant Integrating Sphere
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The integrating sphere is used for total luminous flux measurement. It uniforms the light by spatially integrating the collected light of light source. The integrating sphere has highly reflective diffusing plates formed on the spheres internal surfaces. These plates repeatedly scatter light rays from the light source with in the sphere to all other points to deliver uniform brightness distribution so measuring a portion of that light gives the total luminous flux. These years, the usage of integrating sphere for total luminous flux evaluation of light source is increasing. The large size integrating sphere over 1.5M is required for measuring a high brightness light source and a long light source such as fluorescent light.
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Product
Temperature & Environment Monitors
Room Alert
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Monitors Temperature, Humidity, Power, Flood/Water, Smoke/Fire, Motion, Room Entry, Air Flow, Panic Buttons, Network Cameras and more. Offers built-in sensors & allows external sensors to be added.Allows unlimited alert notifications & unlimited users. Allows notification via email, SMS, SMTP, dial-out page, audio alert, webpage update, logfile update and more.
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Product
Test Executive for Visual Development, Database Storage, and Run-Time Execution of Test Strategies
TestBase
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TYX TestBase is a test executive that supports the visual development, database storage and run-time execution of test strategies (also known as test plans or test sequences).TestBase integrates third-party applications such as: test programming languages, document viewers, report generators, database engines, Configuration Management systems and diagnostic tools.Its modular and open architecture enables system integrators and end-users to customize and extend the product and to integrate additional third-party applications.
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Product
Keysight N7800A Test Management Environment (TME) Software
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Special recommended calibration options: The N7800A software calculates point-to-point ISO GUM measurement uncertainty. The special “H-series” calibration options in the link below provide lower measurement uncertainties through use of direct comparison to devices directly characterized by NPL or NIST (or another NMI), along with data on a CD for easy import into the N7800A (avoids manual entry). The overall resulting N7800A measurement uncertainty then incorporates this lower device uncertainty in the overall calculated uncertainty. For more information on the special options please view this spreadsheet N7800A Special Calibration Matrix.
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Product
ABex Terminal Module with Integrated 32x4 Matrix for NI PCIe-657x DPI Cards
ABex TM-6570 DPI
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The ABex TM-6570 is an ABex terminal module to interface with NI PXIe 6570 / 6571 cards.In combination with the NI PXIe 6570/6571 it features a 32 channel Digital Pattern Instrument (DPI) and a 32×4 matrix, which could also be configured as a dual 16×4 matrix.As a DPI in combination with the NI PXIe 657x it offers 32 channels with up to 100Mhz, which can be individually connected and disconnected from the ABex front connector or routed to the ABex analog bus.
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
Integrated Leeb Hardness Tester
TIME®510D
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Beijing TIME High Technology Ltd.
TIME®510D is an updated version of TIME5120 Leeb Hardness Tester, the cheapest and most popular leeb hardness tester manufacturer by TIME. It is portable and integrated with universal impact device D. Compared to TIME5120, the new product offers significant improvements in both outlook and performance.
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Product
COM Express Type 7 Development Baseboard
CEB94701
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*Two 10GBASE-KR SFP+ ports*2 SATA-600*VGA*4 USB 3.0*2 PCI Express Mini Card slots*2 RS-232/422/485
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Product
Digital Current Integrator
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The ORTEC Model 439 Digital Current Integrator was designed to accurately measure DC currents or the average value of pulse currents such as produced by accelerator beams. It digitizes the input current by producing an output pulse for specific values of input charge. A front-panel switch permit the selection of three different amounts of charge (10–10, 10–8 or 10–6 coulomb) required to produce an output pulse. The instrument has a digitizing rate from 0 to 10 kHz to provide wide dynamic range on each setting and high-resolution readout without meter interpolation.
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Product
Integrating Spheres - Luminous Flux Measurement For LEDs And Lamps
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Konica Minolta Sensing Americas, Inc
One of the most important tests in light measurement is the assessment of the total radiant power or luminous flux of light sources using integrating spheres. An integrating sphere’s inside surface is coated with a diffusely reflecting material which guarantees complete integration and homogenization of the emitted radiation. The integrated light is then measured at the detector port.
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Product
Type 39 E-Frame Development Platform, 2 Slot 6U VPX
39E02PSX94Y2VCEX
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The Type 39 E-Frame test platform supports 6U or 3U VPX based system development. With a rugged aluminum construction, the versatile concept chassis design allows easy access for test and system architecture development for up to 12 slots.
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Product
NI LabVIEW Base Development System for Windows
System
NLabVIEW is system engineering software designed for applications that require test, measurement, and control with rapid access to hardware and data insights. The LabVIEW Base Development System is recommended to integrate NI hardware and third-party devices together to build automated desktop measurement applications with an intuitive graphical programming syntax.For applications that require advanced inline analysis or PID control, consider LabVIEW Full Development System.
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Development Tools
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Renesas Electronics supports your entire development process for embedded applications through development tools such as easy-to use emulators and programming tools, as well as integrated development environments (the e² studio and CS+) that greatly enhance your development environment. The integrated development environments support use of the Solution Toolkit extension plug-ins, which accelerate development and reduce total costs. The CS+ also supports model-based development, which is handy if you are developing in-vehicle systems. We offer a rich range of licenses for compilers to suit various scales and types of development.
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Product
PAM analysis upgrade for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-UPG-PAM
Analyzer
Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
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Product
1-Slot 3U VPX Development Chassis for Quartz Products
Model 8257
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- 1-slot, small footprint development chassis- Optional dual MPO interfaces support 100 GigE- Supports VITA-66.4
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Product
Integrating Sphere FT-NIR Spectrometer
QuasIR 3000™
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The QuasIR™ 3000 was designed from the ground up to offer the industry a new kind of NIR analysis solution – a solution that brings together the portability required to move NIR analysis closer to point-of-need, combined with unmatched spectroscopic performance for the fastest and most accurate results.
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Product
PathWave Test Executive For Manufacturing Developer Version
KS8328A
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PathWave Test Executive for Manufacturing (PTEM) is a plug-in that enhances the user experience in developing automated test programs using PathWave Test Automation Platform (TAP). With powerful PathWave Test Executive software, we eliminate the need to maintain or develop a test platform by users, especially in a manufacturing environment where a high mix of products exist, the maintenance, enhancement, and control of it could become challenging. Development of a test execution platform should not be a priority for valuable resources, instead optimizing and improving test coverage should be the key area of focus.
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Product
Network Integrated Test, Real-time Analytics & Optimization Solution
Nitro
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The VIAVI Network Integrated Test, Real-time analytics and Optimization (NITRO) solution is the first real-time intelligence platform that connects testing and service activation data from instruments with software-based planning, provisioning, assurance and optimization probes and applications, working seamlessly across mobile, fiber, cable, cloud and enterprise networks.
