Production Test Systems
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Long-Stroke Tensile Testing System For Vulcanized Rubber
Capable of Measuring Even Specimens with a Large Break Strain A tensile test method for vulcanized rubber is stipulated in JIS K6251 (Rubber,vulcanized or thermoplastic-Determination of tensile stress-strain properties). One of the properties of vulcanized rubber is significant elongation. This long-stroke tensile testing system for vulcanized rubber has a long stroke that is required for calculating these tensile characteristics of rubber, and accommodates dumbbell specimens Nos.1 through 6 stipulated in JIS K6251.
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Boundary Scan / JTAG Test Development System
onTAP Development
The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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IOT & Analytics Products
Maya Heat Transfer Technologies Ltd.
Information from enterprise data, the industrial internet of things (IIoT), and analytics reveals actionable insights. Software solutions help optimize production and performance with greater visibility and data-driven decisions.
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Software Products
In our catalog you will find the right software products for your measuring and testing tasks.
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Solid State Relay Products
DARE Electronics? solid state relays incorporate advanced microelectronic hybrid technology and are available from low level to 50 amps. Solid state relays have distinct advantages over electro-mechanical devices including: no contact bounce, arcing or flashing; immunity to contact contamination and oxide formation in dry or normally open circuits; and immunity to shock and vibration thus preventing unwanted contact closures
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VXI To PXI Transition Products
PXI/cPCI Carrier
The VX407C is an intelligent VXI carrier that allows PXI and cPCI modules to be used in VXI systems.
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Piezoelectric Application Product Group
This section introduces a group of assembled products thatintegrate or case piezoelectric ceramics elements with other components depending on the intended use.
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MB Millenium Dynamic Test Control System
MB Millenium
The MB Millenium™ from MB Dynamics is a multiple-input, multiple-output (MIMO) and/or a multiple-input, single-output (MISO) dynamic test control system.
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Hi-Speed Discrete Test System
QT-6000
QT-6000 Test System, with built-in capacitance test (DC+CAP) and Scanbox etc, is applicable to devices like medium & small power transistors, MOS-FET, diodes and Wafer.
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Board Level Products
MicroImage Video Systems offers many of our products as board level allowing OEM’s (Original Equipment Manufacturers) to utilize MicroImage technology in their own products. While we offer many off the shelf products in board level, we can also offer customized versions with different connections and features in reasonable minimum quantities (starting as low as 25 pcs per order for some products). If you don’t see exactly what you are looking for, ask us, it may be something we have already designed or something we can change easily. Contact us today with your requirements.
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19” Rackmount Data Collection System
DCS-211
- Intel Atom® x5-E3930 processor- Up to 8x DI and 6x DO with two 2A relays- 3x M12 GbE, 1x RJ-45 GbE, 2x isolated RS232/422/485, 2x USB and one lockable HDMI port- Up to 3x PCI Express mini slots with one USIM card slot each- Storage: up to 64GB eMMC 5.0, 1x 2.5” SATA drive bay
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Polarity & Burn in Test Systems
Our polarity and burn-in test systems are available for components such as multilayer, disc type or hollow ceramics.
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Miniature Vibration Test System
G-2 Series
The G-2 Series Miniature Vibration Test System, though compact & handy, consists of a sweep oscillator, sine controller, power amplifier and vibration generator, thus suited to a variety of applications; calibration of sensors, standardized vibration tests for small parts, school teaching materials and modal analysis. The G-2002 is handy, with all the composed units being incorporated in a portable case.
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Small Drop Test System
KRD41 series
KRD41 series small drop tester is suitable for free-fall test of small consumer electronics and components such as mobile phones, walkie-talkies, electronic dictionaries, CD / MD / MP3 and so on, applicable standards JISC 0044 and IEC 60068-2-32. Through standard tests on electronic products (surface drop, corner drop, edge drop, etc.) and collecting data, it simulates the vertical drop impact of electronic products during transportation and handling. It provides a basis for the design of the product's buffer and vibration damping and the selection of structural materials.
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Custom Motor Test Systems
Magtrol's Customized Motor Test Systems (CMTS) are PC-based, turnkey systems custom designed and built to meet your specific motor testing requirements. By integrating Magtrol's motor test equipment with power supplies, adaptable fixtures, custom tables/cabinets, printers, etc., Magtrol's engineering team can customize PC-based, turnkey systems and modular test benches for almost any motor test application.
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LitePoint RF Test System
J750
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Printed Circuit Products
Murata's board products include multilayer LCP products, Stretchable Printed Circuits, and iPaS™ products.Our multilayer LCP products have outstanding high-frequency characteristics. They are also thin and enable circuit design with freedom of shape. Our highly reliable Stretchable Printed Circuits can be stuck firmly to the body surface and remain affixed there securely. Our iPaS™ products are built in and integrated with capacitors and inductors. It is expected that these board products will contribute to the creation of new markets and new lifestyles.
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Low Voltage Burn-in and Test System
Max 450
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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Non-Destructive Test Resonant Inspection System
RAM-AUTO
Resonant Acoustic Method is designed to help deliver fully inspected parts, economically and on time. Every component has a unique resonant signature or pattern that reflects its composition.
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Handset Noise Under RF Test System
BK8021
If you need to evaluate the resistance of cellphones to RF interferance, the BaKo Type BK8021 Handset Noise Under RF Test System is what you need. It performs four tests to evaluate the Sending Noise, Sending Sensitivity, Sending Loudness, Sidetone Masking, Receiving Sensitivity and Receiving Loudness. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When testing is complete, you can print the data as an MS Excel report or save it for comparison and analysis.
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Test System
LB302
Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Electro-Dynamic Vibration Test System (Air Cooled)
HIACC Engineering & Services Pvt. Ltd.
The air-cooled electro-dynamic vibration test system has a wide frequency range, high reliability, easy to operate and small foot-print area. The force ranges from 1kN to 70kN, and maximum load is from 70 kg to 1000 kg. This product can be integrated with HIACC’s environmental chambers.
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Functional Test Systems
With extensive experience in functional test equipment, a world-wide service and support organization, and a broad range of software/hardware options, we will supply cost-effective production-ready test solutions to meet your test challenges. Proposals developed by our functional test engineering team include a detailed description of system requirements, test instrumentation, estimated test cycle times (as applicable), footprint, and other key specifications.
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Voice Quality Test System
MultiDSLA
MultiDSLA solution is a state of the art measurement system for Voice Quality Testing and Performance Assessment used by many organisations as the reference measurement in applications ranging from core technology development to network operations.
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Automatic Transformer Test System
TH2829AX-48
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 48 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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Test system software
CITE
CITE (Computer Integrated Test Environment) is the software platform for all Digitaltest test systems. It is a real-time system offering a vast number of tools to ensure high test quality and shortening testing time. The software also provides you with several different programming languages that you can choose from.
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Device Modeling Products
Our products and premier solutions provide for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight's expert engineers and advanced labs. Our key device modeling and characterization EDA software and hardware solutions are included below.
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AOI & SPI Test Systems
Xceed AOI
Most defects in the circuit-board assembly are due to the solder paste or the process of printing solder paste. Since the transition to lead-free soldering, a whole new spectrum of problems has emerged in older paste printing and its due processes. Incomplete coalescence of ball grid array (BGA) spheres and solder paste deposits are failure modes that have increased in frequency since the transition to lead-free soldering. The Xceed enables true 3D measurement and provides the most accurate and repeatable inspection results with the minimum false calls. It’s designed with Advanced Signal Processing which gives results in noise-less, clear, and accurate 3D images.
