Embedded System
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Product
cRIO-9055, 1.33 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Artix-7 A100T FPGA, Extended Temperature, 4-Slot CompactRIO Controller
787043-01
Embedded Controller
1.33 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Artix-7 A100T FPGA, Extended Temperature, 4-Slot CompactRIO Controller - The cRIO-9055 is a rugged, deployable controller for data acquisition and control applications. It offers Intel Atom dual-core processing, an Artix-7 FPGA, and four slots for C Series modules. It runs the NI Linux Real-Time operating system with access to the I/O through NI-DAQmx drivers or with the LabVIEW FPGA module. The controller provides precise, synchronized timing and deterministic communications over the network using TSN, ideal for distributed measurements and control. This controller offers two Gigabit Ethernet ports, one USB 3.1 host port, one USB 2.0 device port, a trigger line, and a μSD card slot for storing data locally. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.
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Product
Scienlab Battery Test System – Module Level
SL1001A Series
Test System
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Product
Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
Test System
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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Product
Systems Integration (SIL) Lab Data Acquisition
System
Bloomy’s SIL data system allows testing and simulation of every system component on the aircraft. The functionality of these complex integrated systems are fully tested, debugged, and verified safely in the lab prior to flight testing. This reduces cost and schedule for new aircraft. Bloomy has applied its expertise to multiple SILs.
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Product
Mezzanine System
5041
System
ECM P/N 5041 provides eight channels of RS485 / RS422 I/O with fixed 120 ohm termination for each channel. Speeds are up to 30M bits per second. All channels power up as inputs. Also transceiver inputs are always enabled for loop back diagnostic use when the outputs are enabled. Software can enable outputs on a channel by channel basis.
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Product
High-Speed Signal Recording Systems
System
GaGe has a long history of providing high-speed, real-time signal acquisition, processing, and recording systems on PC-based platforms. This expertise saves customers time and eliminates uncertainties and risks with self-integrated systems.
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Product
PXIe-8822 2.4 GHz Quad-Core Processor PXI Controller
787881-01
Embedded Controller
The PXIe8822 is an Intel Core i3based embedded controller for PXI systems. You can use the PXI-8822 to create a compact or portable PC-based platform for industrial control, data acquisition, and test and measurement applications. This PXI Controller includes a 10/100/1000/2500 BASET Gigabit Ethernet port, two HiSpeed USB ports, two USB 3.0 ports, as well as an integrated hard drive, serial port, and other peripheral I/O.
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Product
PXIe8862, 2.6 GHz 8-Core PXI Controller
788818-01
Embedded Controller
The PXIe8862 is an Intel Core i7 8Core embedded controller for PXI Express systems. You use the PXIe8862 for processor-intensive RF, modular instrumentation, and data acquisition applications. The PXIe8862 includes two 10/100/1000/2500BASET (Gigabit) Ethernet ports, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive, serial port, two Thunderbolt 4 ports, and other peripheral I/O.
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Product
ESS Performance Test System
Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
In-Circuit Test System Repairs
Test System
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
The Compact AI GigE Vision Systems for the Edge with Intel Movidius Myriad VPU
EOS-i6000-M Series
System
The ADLINK AI Plug-and-Play (PnP) Solution is a set of ADLINK AI edge hardware and data connectivity platforms that help our partners build and deploy AI solutions faster and simpler. With ADLINK Data River™ enabled at AI edge platforms, devices, AI inferences, and data integrations, the AI PnP Solution offers a crossplatform, flexible, scalable solution that delivers business value.
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Product
Configurable Functional Test System
ATS-5000
Test System
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Product
VPX Development System
VPX370 3U
System
The VPX370 is a second generation VPX development platform that delivers, performance, flexibility, and scalability all in a compact 3U VPX form factor.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Intel® Celeron J1900 Fanless Or Fan, Dual Display 1U THIN Embedded PC
EPC-T1215
Embedded PC
Thin design with 43mm in height.Thin barebone system with multi-IO ports is suitable for variety of application environments with DC-in design.Easy/ quick installation for additional peripherals.Shock-resistant one 2.5" drive bay.Support Wall/ VESA/ Din Rail/ Rack mounting module.Lock type DC power jack.Support SUSI, WISE-DeviceOn and Edge AI Suite.
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Product
Mezzanine System
5047
System
The 5047 provides breakout of all ECM signals for debug, design validation and development. Plated through holes on the PCB allow soldering of probe wires to IO, Data, Power and Serial Identification signals. LEDs indicate presence of 3V, 5V, +12V, -12V and Ground. Elevates the ECM module by 2 mm and saves wear on the ECM carrier board connectors. Since this is a debug too there is no serial identification circuit.
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Product
Mezzanine System
5174
System
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
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Product
cRIO-9055, 1.33 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Artix-7 A100T FPGA, Extended Temperature, 4-Slot CompactRIO Controller
787879-01
Embedded Controller
1.33 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Artix-7 A100T FPGA, Extended Temperature, 4-Slot CompactRIO Controller - The cRIO-9055 is a rugged, deployable controller for data acquisition and control applications. It offers Intel Atom dual-core processing, an Artix-7 FPGA, and four slots for C Series modules. It runs the NI Linux Real-Time operating system with access to the I/O through NI-DAQmx drivers or with the LabVIEW FPGA module. The controller provides precise, synchronized timing and deterministic communications over the network using TSN, ideal for distributed measurements and control. This controller offers two Gigabit Ethernet ports, one USB 3.1 host port, one USB 2.0 device port, a trigger line, and a μSD card slot for storing data locally. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.
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Product
PXIe8862, 2.6 GHz 8-Core PXI Controller
789546-01
Embedded Controller
The PXIe8862 is an Intel Core i7 8Core embedded controller for PXI Express systems. You use the PXIe8862 for processor-intensive RF, modular instrumentation, and data acquisition applications. The PXIe8862 includes two 10/100/1000/2500BASET (Gigabit) Ethernet ports, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive, serial port, two Thunderbolt 4 ports, and other peripheral I/O.
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Product
Desktop PCB Test System
BOARDWALKER 9627
Test System
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
Battery Cell Formation System
17000 series
System
Chroma 17000 series is specifically designed for the formation of Lithium Ion and Lithium Polymer secondary batteries. The 17000 series is a complete turn-key system, including carrier trays, robust battery probe contacts, high quality charge/discharge modules and intuitive software all under computer control. Patented Battery Voltage Tracking (BVT) DC-DC conversion power modules minimize power consumption in battery charging, and Energy Recycle Modules (ERM) recycle the discharged energy directly back to the DC power system for increased power efficiency. These power saving designs provide a planet friendly solution along with cost savings by reducing energy consumption. The intuitive software provides a flexible selection in the charge/ discharge channel, current rating, and modules under test. These features allow the Series 17000 to be used for final cell development, pilot line production, high volume production and ongoing reliability monitoring/quality control.
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Product
Intel® 6th/7th Generation Core™ I3/i5/i7 Performance Embedded PC
EPC-B2205
Embedded PC
Supports Intel® 7th & 6th Gen Core™ i processor (LGA1151) with Intel Q170/H110 chipset.Two 260-pin SO-DIMM up to 32GB DDR4 2133 MHz SDRAM.Supports triple display of VGA/DP/DVI.One expansion slot (low profile).Two Shock Resistant 2.5" drive bays.Support SUSI, WISE-DeviceOn and Edge AI Suite.
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Product
Robust DIN-rail Fanless Embedded System With Intel® Celeron® Processor N3350, 2 COM, LAN, 2 USB And DIO
ICO100-839
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The ICO100-839 is a DIN-rail fanless embedded system designed to support the low-power Intel® Celeron® processor N3350. This DIN-rail industrial IoT gateway supports one DDR3L SO-DIMM slot with up to 8 GB system memory. Its proven rugged construction ensures reliable operation in harsh environments with an extended temperature range of -20°C to 70°C and anti-vibration up to 2G. Additionally, the wide range 12V-24V DC power input with a lockable terminal block type connector is suitable for industrial automation fields. The overvoltage and reverse protection lowers the risk of crucial data loss. The outstanding Intel® Atom™-based ICO100-839 is a perfect solution for industrial IoT applications such as smart factory automation and smart energy. The DIN-rail industrial IoT gateway offers an outstanding price/performance ratio with good quality. It comes with sufficient I/O connectivity while measuring only 31 x 100 x 125 mm. The I/O interfaces include two RS-232/422/485 ports, two USB 2.0 ports, one Gigabit Ethernet, one VGA and one DIO. Furthermore, the Intel® Apollo Lake-based ICO100-839 is equipped with two PCI Express Mini Card slots, one for mSATA storage card and another for 3G/GPRS/Wi-Fi connections.
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Product
AI Inference System
MIC-741-AT
Edge AI Inference System
AI Inference System Powered by NVIDIA® Jetson Thor™. Embedded with NVIDIA® Jetson T4000™ up to 1200 TFLOPS (FP4). Supports 1 x SFP28 (1 x 25GbE). Supports 2 x 1GbE, 2 x 10GbE4, 6 x USB 3.2 Gen 2, 2 x M.2 2280, 1 x M.2 Ekey (Support both WiFi AEKey), 1 x M.2 Bkey (LTE,5G).
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Product
Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
