Embedded System
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
Positioning Test System
TS-LBS
Test System
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Product
USB2.0 Module With 2 CAN Bus Nodes ARINC825 Compliant For Testing & Simulation of Avionic ARINC825/CAN Bus Systems
APU825-2
System
USB2.0 module with 2 CAN bus nodes ARINC825 compliant for testing and simulation of Avionic ARINC825/CAN bus systems.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Conformance Test System
TS-RRM
Test System
The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
PXIe-8842 2.6 GHz 6-Core Processor PXI Controller
788816-0118
Embedded Controller
The PXIe8842 is an embedded controller for PXI systems that you can use for processor-intensive modular instrumentation and data acquisition applications. The PXIe8842 includes two 10/100/1000/2500BASET (Gigabit) Ethernet ports, one Thunderbolt 4 port, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive, serial port, and other peripheral I/O. Thunderbolt is a trademark of Intel Corporation or its subsidiaries in the US and/or other countries.
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Product
Intel Atom® Processor-Based Ultra Compact Embedded Platform
MXE-200 Series
Embedded Platform
ADLINK's new Matrix MXE-200 series Ultra Compact Embedded Platform, based on the Intel Atom® SoC processor E3845/E3826, With superior-class construction meeting a wide variety of specific industrial needs, the MXE-200 series offers the most reliable Ultra Compact Embedded Platform for use in harsh environments, compliant with industrial grade EMI/EMS (EN61000-6-4,61000-6-2), protecting customer assets and reducing TCO. Opposing conventional correlations between size and computing power, the MXE-200 series features large-scale performance in an ultra-compact package.
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
cRIO-9048, 1.30 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, -40 °C to 70 °C, Kintex-7 160T FPGA, 8-Slot CompactRIO Controller
785619-01
Embedded Controller
1.30 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, -40 °C to 70 °C, Kintex-7 160T FPGA, 8-Slot CompactRIO Controller - The cRIO-9048 is a rugged, high-performance, customizable embedded controller that offers Intel Atom dual-core processing, NI-DAQmx support, and an SD card slot for data-logging, embedded monitoring, and control. It includes a Kintex-7 160T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
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Product
3U Intel® Core™ i7-2715QE 2.1 GHz Quad-Core Processor-based PXI Controller
PXI-3980
Embedded Controller
The ADLINK PXI-3980 PXI embedded controller, based on the second generation Intel® Core™ i7 processor is specifically designed for hybrid PXI based testing systems, delivering a rugged yet stable platform for a wide variety of testing and measurement applications.
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Product
cRIO-9040, 1.30 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -20 °C to 55 °C, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller
785624-01
Embedded Controller
1.30 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -20 °C to 55 °C, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller - The cRIO-9040 is a rugged, high-performance, customizable embedded controller that offers Intel Atom dual-core processing, NI-DAQmx support, and an SD card slot for … data-logging, embedded monitoring, and control. It includes a Kintex-7 70T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
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Product
EMS Test System
TS9982
Test System
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
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Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
BMS Manufacturing Test System
Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Embedded System Supporting MXM Graphics Module with 8th/9th Generation Intel® Core™ i7/i5/i3 in LGA1151 Socket
DLAP-3000-CF Series
Embedded Platform
ADLINK provides an optimized, highly-available computing platform with expandability options, including the MXM cards. The DLAP-3000-CF series platforms support performance-hungry workloads (e.g., deep learning) with active cooling for applications requiring very high levels of computing in a limited space. DLAP-3000-CF Series features: - Smallest Embedded GPU Platform (3 liters) - Reliable MXM GPU Design with Low TDP - Scalable Graphics Processing Ranging from Pascal to Turing GPUs
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Product
SSD Test Systems
Test System
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Product
Mezzanine System
5181 MMS ECM
System
ECM P/N 5181 uses TI TLV320AIC23 high resolution audio codecs to provide two channels of Audio input and two channels of Audio output. Each input channel consists of two inputs a left and a right, and each output channel consists of two outputs left and right. The outputs are muteable.
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Product
Inflight Entertainment System Hardware
System
Innovative IFEC solutions that enable connectivity, entertainment, and control.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
Flying Prober Test System
QTOUCH1404C
Test System
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Product
Desktop PCB Test System
BOARDWALKER 9627
Test System
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
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Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
cRIO-9030, 1.33 GHz Dual-Core CPU, 1 GB DRAM, 4 GB Storage, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller
783450-01
Embedded Controller
The cRIO-9030 is a rugged, fanless, embedded controller that you can use for advanced control and monitoring applications. This software-designed controller features an FPGA, a real-time processor running the NI Linux Real-Time OS, and embedded user interface capability. You also can use the Mini DisplayPort to add a local human machine interface (HMI) for application development. Additionally, the cRIO-9030 features an SDHC slot and a variety of connectivity ports, including two tri-speed RJ-45 Gigabit Ethernet, two USB host, one USB device, and two RS-232 serial. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.
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Product
In-Process Wafer Inspection System
7945
System
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
