High Speed Internet Test
Determines the amount of data transferred per second.
-
product
Battery Testing
Electric vehicles (EVs) rely on batteries as their primary source of energy storage. As battery packs require battery management systems (BMS) to operate safely and reliably, it is vital to test control algorithms for state of charge (SoC) estimation or cell balancing at an early stage.
-
product
Power Quality Testing
Weshine Electric Manufacturing Co., Ltd
Transformer K Factor, Power factors(PF)and displacement factors, Short-term voltage flicker, .Three phase unbalance (Current and Voltage), Waveform real-time display(4 channels voltage /4 channels current) True RMS values of voltages and currents
-
product
High Output Simulators
The Abet Gen II optical design, patent pending, dramatically increases the percentage of photons reaching the work plane.All electronics are packaged in the lamp house – no clutter of high power cables to deal with. A digital shutter timer allowing both manual and external control is included with every unit.Standard maintenance, lamp or filter replacement, does not require any tools.Locking indicator dials on all the system controls provide for a reproducible and stable setup.
-
product
Ethernet/LXI digitizerNETBOX 16 Bit High Speed Digitizer - 180 MS/s on 16 Channels, 16 Single-Ended Inputs
DN6.447-16
The digitizerNETBOX DN6.44x series allows recording of up to 24 synchronous channels with sampling rates of 130 MS/s up to 500 MS/s. These products offer outstanding A/D features in resolution, bandwidth and speed as a remote instrument. The powerful A/D amplifier section offers six different input ranges, two input paths, AC/DC coupling and noise reduction filters.
-
product
High 3.12 (88.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-72I40-8
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
-
product
MEMS Testing System
BK3010V2
The BaKo BK3010V2 is our updated MEMS Tester, based on our C-Mic tester, the best selling BK3010. It's small enough to carry under your arm and with a test time of under 0.5 seconds, it tests as fast as you can connect a microphone. Setting up the specifications is very easy and can be done in a few minutes. In addition, the new BK3010V2 can be connected to a computer so you can keep and view compiled data and track trends in variations in your C-Mics.
-
product
High Voltage EMC Surge Generator
TM510
TM510 Surge Generator is mainly used for testing power cable high-resistance and arc-over fault whose grade range is 0-10kV, co-operating with cable fault tester and locating devices to test and locate faults. If the user choose the professional digital milli-ampere-meter, as for cable with grade range about 0- 6kV, the instrument can also be used to do DC&voltage resistance test and current leakage test after the fault is repaired. The instrument is internally equipped with voltage-rise rectifying and discharging device, has complete functions, and is also convenient and safe to be wired and operated.
-
product
Magnet Testing
magtrack
The magtrack makes it possible to detect the absolute 3D position in space as well as the orientation of a magnetically marked particle over a course of time. The magtrack system is modular and can therefore be adapted to any installation and system.
-
product
Ethernet/LXI digitizerNETBOX 8 Bit High Speed Digitizer - 1.25 GS/s on 2 Channels, 500 MHz Bandwidth
DN2.221-02
The digitizerNETBOX DN2.22x series allows recording of up to 8 channels with sampling rates of 5 GS/s and a bandwidth of 1.5 GHz. These Ethernet Remote instruments offer outstanding A/D features both in bandwidth and signal quality. The combination of high sampling rate and resolution makes these digitizers the top-of-the-range for applications that require high speed signal acquisition. The digitizerNETBOX can be installed anywhere in the company LAN and can be remotley controlled from a host PC.
-
product
Dynamic High Pressure Sensors
Columbia Research Laboratories
Columbia's line of Dynamic Pressure Sensors can also serve as Acoustic Sensors (Microphones). They are designed to measure fast pressure variations, surges and dynamic blasts. The Sensors vary from low cost, small size, and lightweight to High Pressure (to 10,000psi) units, with all-welded contructions for extreme ruggedness, making them excellent choices for a wide range of applications.
-
product
RFID Test System
RFID test system of Peritec is making FPGA board (IF-RIO) the processing of the IF band. This reading of the code, called (Electronic Product Code) EPC is required for RFID tag ISO18000-6 TYPEC of (EPC C1 G2). However, it did not provide treatment too late in the traditional instruments.
-
product
In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
-
product
LXI High Voltage Switching
65-233-901-HI
The 65-233-901-HI plug-in module is part of a scalable high voltage switch platform that provides a high voltage switching solution with capability up to 9 kV.
-
product
Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
-
product
High Power/Anti-Surge/High-Voltage Resistors
ERJ-P Series
Panasonic Industrial Devices Sales Company of America
Panasonic’s ERJ-P Series High Power Resistors offer the ability to use smaller case sizes while still maintaining the same level of power or better in respect to conventional size Thick Film Resistors. The ERJ-P Series has a unique trimming pattern and high heat dissipation characteristics. These parts can be easily designed as replacements for existing Thick Film Resistors due to comparable technology and materials with use of better manufacturing processes. The ERJ-P Series has an operating temperature of -55°C to 155°C, with a smaller part, you have a higher solder-joint reliability. Less material means less solder which lowers risk for solder fracture due to thermal expansion or contraction. Panasonic High Power Resistors are AEC-Q200 Qualified.
-
product
Custom Testing Solutions
Test and MeasurementEnable increases the robustness of your test and measurement solutions, thereby reducing errors and associated costs. Data Acquisition (DAQ)Enable defines and builds custom DAQ systems for automated measurements of any process or manufactured part. Control and AutomationEngineeringEnable ensures that your processes are programmed to be safe, effective and optimized for both speed and quality. Real-Time and Mission CriticalSystemsEnable develops dependable real-time systems and Hardware in the Loop (HIL) simulations for high-speed applications. Motion ControlEnable creates software for synchronized multi-axis robotic control of velocity, position, force and action. Machine VisionEnable implements software and hardware-based solutions for precise image analysis, data extraction and vision-guided machine control. R&D Systems/Product DevelopmentEnable’s team of engineers and scientists works with you to address and solve problems containing technical challenges and uncertainties. Electronic Test SystemsEnable programs and builds software and hardware-based solutions for accurate measurements, from DC to RF. Mobile App DevelopmentEnable enhances your systems by integrating custom iOS and Android apps. Web DevelopmentEnable enhances your systems by integrating desktop and mobile web frameworks using PHP, CSS and HTML5. Database DevelopmentEnable decentralizes your data storage to be online, secure and accessible from anywhere.
-
product
Petroleum Testing Solutions
Acid andalkali testers, aniline test equipment, automatic bomb calorimeters, automatic dielectric tester, closed cup flash point tester, demulsibility characteristics tester, density tester, distillation tester, dropping point tester, engler viscometer, existent gum tester, kinematics viscometer, low temperature tester, octant number and cetane number tester, open cup flash point tester, oxidation stability tester, oxygen bomb calorimeter, penetrometer, residue carbon, rotational viscometer, rust and corrosion tester, specific gravity tester, sulphur content tester, vapor pressure, water content tester.
-
product
High 3.12 (88.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-72T1-8
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
-
product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
-
product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1Z1-8
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Testing Maturity Assessment
ZenQ helps companies improve the efficiency of their testing practices by 15 – 30% through its advisory and consulting services.
-
product
Optical Speed Sensors
Allows use in a wide range of hazardous environments in petrochemical, Gas and volatile materials processing industries, ideally suited for Condition Monitoring, Data collectors in balancing applications, these sensors give excellent performance with repeatable results, engineered for easy mounting with the optional Mounting Bracket and Mini Tripod Stand in hand held applications.
-
product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1H-INS-8
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Test & Calibration
Gamma Scientific is ISO/IEC 17025 accredited by NVLAP (NVLAP lab code 200823-0). In addition to assurance of measurement accuracy, accreditation ensures traceability to known standards, provides international acceptance of measured values, and is important for compliance purposes for your own ISO/IEC certifications. Our state-of-the-art, ISO 17025 accredited calibration laboratories in San Diego, California offer a range of test and calibration services including:
-
product
ELECTRICAL TEST Kit
1021 TK
Standard Electric Works Co., Ltd
2950 CL ● Pocket size.● 4000 counts.● Full automatic measurement : Voltage measurement. Current measurement. Resistor measurement.● Data hold function.● Continuity check.● Diode measurement.● Select function.● Low battery indication.● Auto off function.● Flashlight (auto off in 1 minute). ALS-2 ● Use with any clamp meter.● x10 mode allows for more accurate measurements of low amperage devices.● x1 mode allows for direct reading.● 4mm voltmeter input jacks.● Integrated ground conductor.● 10 amp capacity.● 10cm plug cord for greater flexibility.
-
product
Electromagnetic Interference Test
Electromagnetic interference (also known as radio frequency interference) tests are used to determine the electromagnetic characteristics of electrical, electronic, and electro-mechanical equipment. Electromagnetic interference, both radiated or conducted, can affect the performance of equipment. Electromagnetic interference tests are specified as follows: conducted emission, radiated emission, conducted susceptibility, and radiated susceptibility.
-
product
Sensitivity Testing
Response Dynamics Vibration Engineering, Inc.
Sensitivity testing involves making predictions of system response to environmental disturbance. The significance and importance of the system sensitivity estimates is very often overlooked. This gets companies in trouble and is one of the top reasons why we are called upon to provide timely solutions. Most teams are focused on getting their product to work and get it out the door. An engineering team will often not know how to quantify what to expect in the customer environment and how to test for those expected disturbances. We design hundreds of sensitivity tests and can explain the important concepts to consider in designing the tests and making the right measurements that allow for sound estimates of system response. This is an important expertise we use in our vibration, acoustic and magnetic field consulting services.
-
product
Custom Test Fixtures
Intrinsic Quality is proud to offer a variety of Test Fixture Development Services that include fixture building, tester interface building, harness building, troubleshooting, maintenance, design, and engineering. IQ’s fixtures are built to exacting specifications and configured to deliver quality production testing. Our global customers have trusted us for over 35 years to provide custom solutions applying leading edge technology. IQ consistently delivers cost-effective solutions with our client’s recognition and gratitude.
-
-
