Product

Probe Cards

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Picoprobe

Picoprobe

PICOPROBE® PROBE CARDS by GGB Industries, Inc., allows for more chip design flexibility because each probe card is custom configured to your circuit for testing wafers on either manual or automatic probe stations. Probe cards with complex layouts consisting of numerous DC contacts and multiple microwave probes with operating frequencies of 40, 50, 67, or 110 GHz can be custom fabricated quickly and inexpensively.

Product

Stimulus Induced Fault Testing

SIFT

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FA Instruments

SIFT - FA Instruments

SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.

Product

Flying Probe Programming & Test Development

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Testing House, Inc.

Testing House, Inc.

Testing House offers full Flying Probe Programming and Test Development using its very own Seica Pilot LX Flying Probe Test Stations.

Product

Recirculating Chillers

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Lake Shore Cryotronics, Inc.

Lake Shore Cryotronics, Inc.

Recirculating chillers from Lake Shore offer high performance for improved cooling capacity for your Hall measurement system, VSM, probe station, or electromagnet application.

Product

Semi-Automated Probe Stations

SPS 2600, SPS 2800, and SPS 12000 Series

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MicroXact, Inc.

SPS 2600, SPS 2800, and SPS 12000 Series - MicroXact, Inc.

The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.

Product

C-V Plotters

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Materials Development Corporation

Materials Development Corporation

MDC will tailor your CSM/Win Semiconductor Measurement System for your exact requirements. Choose the best capacitance meter, output device, and probe station for your needs. All CSM/Win C-V plotters feature the latest Dell Computers. The computer and capacitance meters are rackmounted in one compact enclosure. When ordered with a hot chuck or probe station, MDC can deliver a turnkey system of unparalleled performance.

Product

Electrical Probe Systems

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Instec, Inc.

Instec, Inc.

INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.​Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.

Product

Custom solutions

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NOVACAM Technologies, Inc.

NOVACAM Technologies, Inc.

Novacam develops custom interferometric solutions to address particular inspection and imaging needs of specialized applications and OEM markets. Our modular interferometer components offer a superior and cost-effective platform for developing high-performance systems and assemblies. We will collaborate with your application experts to devise the optimal combination of inteferometric (OCT) hardware, non-contact fiber-based sensor probes, and system software.As needed, Novacam engineers: develop customized optical probes and inspection stations develop inline probe fixtures for production environments adapt Novacam standard interferometer component modules to suit your application help integrate Novacam systems or components with third-party tools write customized software

Product

Semi-Automatic LCD Probe Station/Laser Repair System

LCD 2424

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Korima, Inc.

LCD 2424 - Korima, Inc.

The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. Built on a steady and reliable anti-vibration table, the Model 2424 has powerfully built features that perform a number of specific tests required by all LCD/flat panel display manufacturers.

Product

Cryogenic Probe Station

CryoPro

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Materials Development Corporation

CryoPro - Materials Development Corporation

The MDC Model 441 Cryogenic Probe Station is a cost effective alternative to high-priced vacuum based cryogenic probe stations. With up to five probes available and sample diameters up to six inches, the MDC Cryogenic Probe Station allows for electrical measurements at temperatures near liquid nitrogen levels (77K).

Product

Electro Optical Terahertz Pulse Reflectometry

EOTPR 3000

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TeraView Ltd

EOTPR 3000 - TeraView Ltd

The EOTPR 3000 system is configured with a manual probe station to meet today’s tough FA environment which requires to isolate fault location in minutes rather than hours or days, while maintaining the EOTPR’s world leading sub-5 μm fault isolation accuracy.

Product

Vector Network Analyzer Extenders

VNAX

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Virginia Diodes, Inc.

VNAX - Virginia Diodes, Inc.

VDI''s VNA Extenders deliver high performance network analyzer frequency extension into the THz range. Models cover 50 GHz to 1,100GHz with additional bands in development. VDI modules come in a variety of form factors and configurations including our original Standard-size Modules and new Mini Modules that reduce volume up to 75%. In addition to our full Transceiver (TxRx) modules, VDI also offers Transmit-Reference (TxRef) modules and Receive only (Rx) modules that deliver optimized performance for specific applications. These modules combine high test port power and exceptional dynamic range to deliver industry leading performance. They are compatible with most network analyzers and can be integrated into probe stations and antenna chambers.

Product

High Power Devices

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SemiProbe

SemiProbe

SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).

Product

Probe Station

EPS300

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ECOPIA

EPS300 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided.

Product

Controlled Environment Probe Station

CG-196

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EverBeing Int'l Corp

CG-196 - EverBeing Int'l Corp

Everbeing controlled environment probe station allows vacuum and cryogenic probing down to 77K with liquid nitrogen or high temperature probing up to 1273K. Efficient in characterizing your devices at extreme temperatures, vacuum, specific gas, etc.

Product

Probe Station

EPS1000

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ECOPIA

EPS1000 - ECOPIA

Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided. - Maximum pcs of manipulators can be installed on the base unit of probe

Product

Portable Wafer Probe Station

PS-5026B

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High Power Pulse Instruments GmbH

PS-5026B - High Power Pulse Instruments GmbH

The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.

Product

Portable Manual Probing Station

Model W4.0 x L6.5

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D-COAX, Inc.

Model W4.0 x L6.5 - D-COAX, Inc.

This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.

Product

Cryogenic Probe Station

CRX-4K

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Lake Shore Cryotronics, Inc.

CRX-4K - Lake Shore Cryotronics, Inc.

Designed for versatility and high performance, the CRX-4K is our premium cryogen-free closed-cycle refrigerant probe station. This system is the solution for those looking for the convenience of cryogen-free operation and the exceptional measurement performance of a Lake Shore product.

Product

Cryogenic Probe Station

TTPX

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Lake Shore Cryotronics, Inc.

TTPX - Lake Shore Cryotronics, Inc.

The TTPX probe station is an affordable, entry-level probe station capable of making a wide variety of non-destructive, standard electrical device measurements. The compact tabletop design is perfect for academic and laboratory research settings. The TTPX provides efficient cryogenic temperature operation and control with a continuous refrigeration system using either liquid helium or liquid nitrogen.

Product

Automated DC Parametric Curve Tracer

MegaTrace

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Robson Technologies, Inc.

MegaTrace - Robson Technologies, Inc.

MegaTrace supports pin counts greater than 625 up to 2160 pins, with 1080 pins being popular. Comprised of a cart that contains the test chassis, PC monitor, drive bus box, and a test interface, MegaTrace is easy to move around and use with other instruments like emission microscopes, probe stations, and other remote testing requirements.

Product

Analytical Probe Station with Laser Cutting System

LCS- 4000 Series

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MicroXact, Inc.

LCS- 4000 Series - MicroXact, Inc.

The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All of these functions can be performed on a microscopic level, all on this one system which provides a high level of performance that is remarkably easy to use.