Product

Probing Machines

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Tokyo Seimitsu Co., Ltd.

Tokyo Seimitsu Co., Ltd.

Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.

Product

Probing & Analysis Adapters

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Ironwood Electronics

Ironwood Electronics

No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.

Product

CMM Contact Measurement (Probing)

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Exact Metrology

Exact Metrology

A method of collecting single points relative to each other in small or large volumes. This information can then be used for evaluation, inspection, layout or basic geometric reverse engineering. For capturing localized or small volume information, digitizing or articulating arms are ideal. For larger volumetric projects, optical solutions like laser trackers and photogrammetry CMMs perform best.

Product

Topside Probing for Functional Test Fixtures

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Circuit Check, Inc.

Circuit Check, Inc.

Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.

Product

DC- CV/IV Analytical Probing

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Signatone Corp.

Signatone Corp.

DC- CV/IV Analytical Probing

Product

Probing Solutions

ES62X-CMPS

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ESDEMC Technology LLC

ES62X-CMPS - ESDEMC Technology LLC

The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.

Product

Probing Adaptors

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Nexus Technology, Inc.

Nexus Technology, Inc.

Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.

Product

Portable Manual Probing Station

Model W4.0 x L6.5

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D-COAX, Inc.

Model W4.0 x L6.5 - D-COAX, Inc.

This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.

Product

Vacuum Probing Systems

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SemiProbe

SemiProbe

Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the  Vacuum Probing System. All key modules are interchangeable and upgradeable.

Product

Robotic Probing of Circuit Cards

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BCO, Inc.

BCO, Inc.

System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.

Product

Step Probes (F733SP) F73316B1055G150SP1

1009915

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FEINMETALL GmbH

1009915 - FEINMETALL GmbH

The Step Probes (F733SP) are precision-engineered components designed to deliver outstanding performance in diverse applications. With a significant pitch of 4.00 mm and a broad temperature range from -45°C to +100°C, these probes are suited for rigorous environments. The sophisticated design parameters allow for a preload of 50 cN and a maximum travel of 5 mm, ensuring optimal functionality in varying conditions. Moreover, the 0.10 mm pointing accuracy highlights their precision, making them ideal for applications that demand reliability and accuracy.