Probing
See Also: Probers, Probing Stations, Nano Probes
-
Product
Probing Machines
-
Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.
-
Product
Probing, Monitoring & Setting
-
Marposs offers solutions and equipment that make your machine tool an instrument of unprecedented precision, productivity and reliability. Touch probes and laser-based tool setters hold the cutting process accuracy in check. Our balancing actuators and many dedicated sensors guarantee that your machine tool's functional processes never deviate from their specified set points.
-
Product
Probing Solutions
-
High Power Pulse Instruments GmbH
Probing Solutions and Probe Arms by HPPI GmbH
-
-
Product
Probing Adaptors
-
Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.
-
Product
Auxiliary Equipment For Probing Machines
-
We have a lineup of products that support the probing process.
-
Product
CMM Contact Measurement (Probing)
-
A method of collecting single points relative to each other in small or large volumes. This information can then be used for evaluation, inspection, layout or basic geometric reverse engineering. For capturing localized or small volume information, digitizing or articulating arms are ideal. For larger volumetric projects, optical solutions like laser trackers and photogrammetry CMMs perform best.
-
Product
Vacuum Probing Systems
-
Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
-
Product
Portable Manual Probing Station
Model W4.0 x L6.5
-
This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.
-
Product
Robotic Probing of Circuit Cards
-
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type Q, Ø0.80mm, 155gf
K100-Q080155-SKAU
-
K100 Series, Pitch 100mil, Tip Style Q, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 155gf
K100-A080155-SKAU
-
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
-
Product
Pyramid, 3-Sided Chisel 30°, Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0T
-
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
-
Product
Standard 0.79 (23.40) - 1.75 (49.60) General Purpose Probe
HPA-40A
-
Current Rating (Amps): 2Average Probe Resistance (mOhm): 35Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 660Overall Length (mm): 16.76
-
Product
LTP-72 High Performance Long Travel Probe
LTP-72
-
Current Rating (Amps): 6Average DC Resistance lower than (mOhm): 100Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 400Full Travel (mm): 10.16Full Travel Remark: Alternate Spring: 400 mil / 10,16 mm, High Spring: 350 / 8,89 mmRecommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 50,000Overall Length (mil): 1,850Overall Length (mm): 46.99
-
Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1B-7
-
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Standard 1.10 (31.00) - 3.85 (109.00)General Purpose Probe
SPA-64-1
-
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3: 0,365″; Tip 8: 0,385″; Tip ,9,10: 0,363″
-
Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3F
-
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
P2247-1W General Purpose Probes
-
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 225Test Center (mm): 5.72Full Travel (mil): 300Full Travel (mm): 7.62Recommended Travel (mil): 200Recommended Travel (mm): 5.08Overall Length (mil): 1,145Overall Length (mm): 29.08
-
Product
SIP-90-4 Test System Interface Probe
SIP-90-4
-
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
-
Product
LFRE-72 High Performance Lead Free Probe
LFRE-72
-
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,700Overall Length (mm): 43.18
-
Product
Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1J-1
-
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
-
Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type G, Ø1.50mm, 155gf
K100-G150155-SKAU
-
K100 Series, Pitch 100mil, Tip Style G, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
-
Product
250 MHz 60 V Common Mode Differential Probe
DL02-HCM
-
60 V of common mode and 80 V differential input range with 1 GHz of bandwidth, make these probes ideal for lower voltage GaN power conversion measurements. The 60 V of common mode is well suited for handling any float of the battery and bulk/absorption voltage during charging, while the 80 V differential input range provide margin for any overshoot.
-
Product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25B-16
-
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1B-8-S
-
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25L36-10
-
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
-
Product
Packet Analysis Probe for PCI Express
N4220A/B
-
When purchased with a logic analyzer, the application software you order is installed on the instrument hard drive. If you need to add application support after your initial logic analyzer purchase or are controlling a logic analyzer from a host PC, you must install the appropriate software before you can make measurements.
-
Product
Alternate 3.00 (85.00) - 5.70 (162.00) General Purpose Probe
P2664G-2R2S
-
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 10Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 114Full Travel (mm): 2.90Recommended Travel (mil): 84Recommended Travel (mm): 2.13Overall Length (mil): 895Overall Length (mm): 22.73Overall Length Remark: Tip 1C: 845 mil (21.46 mm) Tip 2R: 935 mil (23.75 mm)
