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Scattering
a propagating wave or moving particle's linear trajectory, interrupted by non-uniformity in the medium they move through.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Small-Angle X-Ray Scattering (SAXS) Products
Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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X-Ray Photoelectron Spectrometer
AXIS Supra
AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Spectroscopy
*Femtosecond multi-pulse transient absorption and reflection measurements *Femtosecond fluorescence upconversion *Time-resolved femtosecond stimulated Raman scattering (FSRS) *Hundred picoseconds-to-microsecond time-correlated single-photon counting (TCSPC)
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Air Particulate Counter
CHY002
Using import semiconductor laser tube and import semiconductor photosensitive tube, assure sensitivity and response speed.Using import micropump，assure sampling volume steady，reduce noise.The key component-light scattering sensor obviously eliminate intracorporal stray light, improve SNR, test result more precise and reliable.The light scattering sensor got Chinese patent.Confidence measurement of this instrument，According to GB/T6167-2007 Standard，realize auto estimate clean class, creatively to auto estimate ≤9 location points clean class.1000 records stored, free to check previous data.User can optional PC data analysis software, realize data management.User can choose humidity sensor (optional accessories).Sampling volume display as digit, more intuitive and precise.“Measurement Number”function，realize multipoint management.Lithium battery，more safety，continuous working 6 hours.
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VIS/NIR Sensor
AF26
The AF26 is a high precision dual channel color sensor for inline operation; the secondary wavelength is designed to compensate the desired light absorbance measurement from any undesired light scattering influence, such as suspended solids, gas bubbles, immiscible fluids or window fouling. The AF26 sensor’s output can be correlated to almost any color scale including APHA and Hazen.
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Sample Analysis Services
Postnova Analytics offers a variety of unique sample analysis services for the characterization of biopolymers, proteins, liposomes and nanoparticles. Our European Application Laboratory Center EAC and our American Application Laboratory Center AAC represent the worldwide biggest and most advanced labs offering sample analysis services based on Field-Flow Fractionation and Light Scattering.
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Physical Contact Connectors
Amphenol Fiber Systems International
Physical Contact (PC) connections are characterized by the physical mating of two optical fibers. Precision ceramic ferrules are typically utilized for PC connections. A PC connection is accomplished by terminating the optical fiber into a precision ceramic ferrule. Epoxy is used to affix the fiber into the ferrule. The tip of the ceramic ferrule is polished in a precise manner to ensure that light enters and exits at a known trajectory with little scattering or optical loss. Polishing the terminated ceramic ferrule is a critical process in Physical Contact fiber optic connectors.
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Multi-angle Polarized Light Scattering Measurements
LISST-VSF
In-situ measurements of P 11, P12 and P22 elements of scattering Mueller matrix, (P11 is VSF) from 15-150º.VSF (P11) only at small angles, 0.05 to 10º in 32 logarithmic steps in angles.Only two detectors employed with absolute radiant sensitivity (A/W) calibration.Beam attenuation measured with optics similar to our LISST-100X.Roving Eyeball™ optics permit 1-degree resolution in angles between 15 -150º.Sampling rate at 3 seconds per measurement set (involves 3 turns of Roving Eyeball with unpolarized, vertical, and horizontal polarized laser).Daylight rejection by laser modulation.Dynamic range in VSF measurements extended via laser power modulation.Data from small and large angles in a single data stream, including depth and temperature.
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Gloss & Reflectance
Visual appearance can determine a person’s perception of a product. Colour and Gloss are two key parameters that are used to define a product’s overall quality. Perception is subjective, but Elcometer’s range of gloss meters, DOI meters and colour assessment equipment can quantify appearance measurement. The ability of a surface to reflect light without scattering is known as gloss. Using a gloss meter, gloss is measured by directing a constant intensity light beam at a fixed angle to the test surface and then by monitoring the amount of reflected light at the same angle. Different surfaces require different reflective angles.
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Omnisens Optical Fiber And Cable Measurement And Quality Control
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To provide quality control or help with the design and testing of fibers, Omnisens Vision offers fast, accurate strain and temperature measurements.Omnisens Vision is based on Brillouin scattering. In single mode fibers it produces precision readings with high spatial resolution over long distances and/or large loss test conditions. It is capable of high speed testing in dynamic situations such as flex fatigue.Its configuration flexibility makes the Omnisens Vision well adapted to a wide variety of test & measurement needs.
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Scattered Light Dust Measuring Devices
The reliable way to detect low dust concentrationsLight scattering by dust particles is a measurement principle that allows even very low concentrations of dust to be detected. Depending on the system-specific requirements, either forward scattering or backward scattering can be used in this context. Both measurement principles return stable and reproducible measurement results, regardless of the gas velocity, humidity, or dust particle charges.
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Particle Size Analyzers
NanoBrook Series
Brookhaven Instruments Corporation
Rapid and accurate protein & nanoparticle size distributionsMultimodal & unimodal size distribution softwareISO 13321 and ISO 22412 compliant resultsRange: < 0.3 nm to 10 mThree measurement angles: 15, 90, and 173Ideal for fast, routine sizing applications in research or quality controlHigh power 35 mW diode laserDynamic light scattering at 173 and 90Temperature control, -5 C to 110 CCompact bench top unit, USB connectionMolecular weight determination (relative and absolute through Debye plot)
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Molecular Weight Analyzers
Brookhaven Instruments Corporation
Molecular weight and size are two key properties of all macromolecules including biologically important and synthetic polymers. Performance and processability are directly related to these parameters. Light scattering is capable of absolute measurements in either batch or flow mode. For distribution information, couple a GPC/SEC instrument to a light scattering detector.
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Field-installation Type Turbidity Meter (Four-Wire Transmission, High-sensitivity)
HU-200TB-H
HU-200TB-H connects flow-through type turbidity sensor (SS-120-H) and measures turbidity. It accurately measures turbidity in the range of low to medium concentration (10 degrees) by the 90-degree transmission scattering method with less stray light.Optimal for control and monitoring of wastewater treatment and production processes.
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Deep Submersible Particle Size Analyzer
LISST-Deep
The LISST-DEEP instrument obtains in-situmeasurements of particle size distribution,optical transmission, and the opticalvolume scattering function (VSF). Using ared 670nm diode laser and a customsilicon detector, small-angle scatteringfrom suspended particles is sensed at 32specific log-spaced angle ranges. Thismeasurement is post-processed to obtainsediment size distribution, volumeconcentration, optical transmission, andVSF. The electronics and opticalconfiguration in the LISST-DEEP are verysimilar to Sequoia’s workhorse, the LISST-100X. However, because of the extremedifficulty associated with keepingalignment under high pressure, the LISSTDEEPhardware design is radically differentfrom the LISST-100X. This allows theLISST-DEEP to be deployed down to 3000m and obtain reliable measurements ofthe in situ particle size distribution andvolume concentration in waters withoptical transmission up to 98.5%.
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Laser Scattering Particle Size Distribution Analyzer
Partica mini LA-350
HORIBA's new LA-350 Laser Diffraction Particle Size Distribution Analyzer is the ideal combination of performance, price, and packaging. The LA-350 excels in applications as diverse as slurries, minerals, and paper chemistry. Based on the advanced optical design of previous LA-series analyzers, the LA-350 strikes a harmonious balance between high-functionality, easy operation, low maintenance, and cost-effectiveness.Bench space is used efficiently due to the LA-350’s compact size (297 mm x 420 mm). The clever design and precision, high quality manufacturing ensure convenient, reliable operation and accurate results, now with a wider size range (0.1-1,000 µm).
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Benchtop Small Angle X-ray Scattering (SAXS) Instrument
NANOPIX mini
Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
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3D Electromagnetic Simulation Software
XFdtd®
A full-featured simulation solver, XFdtd outpaces other methods in efficiency as the number of unknowns increases. XF includes full-wave, static, bio-thermal, optimization, and circuit solvers to tackle a wide variety of applications, including antenna design and placement, biomedical and SAR, EMI/EMC, microwave devices, radar and scattering, automotive radar, and more. It also works with Remcom's ray-tracing products to provide thorough simulation capability at the low-, middle-, and high-end of the electromagnetic spectrum.
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Non-Contact Beam Profiler
BeamWatch
The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
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Vector Network Analyzer
SNA5000A
The SIGLENT SNA5000A series of Vector Network Analyzers have a frequency range of 9 kHz to 8.5 GHz, with 2 and 4 port models available. Designed to give you instant insight into scattering, differential, and time-domain measurements. They are effective instrumentation for determining the Q-factor, bandwidth, and insertion loss filters and feature impedance conversion, movement of measurement plane, limit testing, ripple test, fixture simulation, and adapter removal/insertion adjustments. There are five sweep types: Linear-Frequency, Log-Frequency, Power-Sweep, CW-Time, and Segment-Sweep mode. The SNA5000A series VNAs also support scattering-parameter correction of SOLT, SOLR, TRL, Response, and Enhanced Response for increased flexibility in R&D and manufacturing applications.
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Particle Sensor
HPM Series
Honeywell Industrial Automation
The Honeywell HPM Series Particle Sensor is a laser-basedsensor which uses the light scattering method to detectand count particles in the concentration range of 0 g/m3to 1,000 g/m3 in a given environment. A laser light sourceilluminates a particle as it is pulled through the detectionchamber. As particles pass through the laser beam, the lightsource becomes obscured and is recorded on the photo orlight detector. The light is then analyzed and converted toan electrical signal providing particulate size and quantity tocalculate concentrations in real time. The Honeywell particlesensor provides information on the particle concentration forgiven particle concentration range.
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UltraScan VIS Spectrophotometer
Hunter Associates Laboratory, Inc.
The UltraScan VIS easily measures both reflected and transmitted color as well as transmission haze and meets CIE, ASTM and USP guidelines for accurate color measurement. UltraScan VIS uses diffuse/8° geometry with automated specular component inclusion/exclusion. For transmission measurement, the use of a robust CIE-conforming sphere instrument (TTRAN Total Transmission mode) effectively negates the effects of minor scattering typically found in transparent samples.
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C-Band Separate Dispersion Compensation Raman Fiber Amplifier
DRA5228/F
Hangzhou Huatai Optic Tech. Co., Ltd.
Raman Fiber Amplifier (RFA) utilizes the optic gain in the Stimulated Raman Scattering (SRS) in the optical fiber and realizes the amplification of the signal optic. FRA, with very low equivalent noise and a wide gain scope, can further widen the gain bandwidth by adopting multi-wavelength optical bump, which represents the development direction of the new optical fiber amplifier.
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Modular SEC system
SC2000
The new Postnova SC2000 Modular SEC system offers unrivalled flexibility in Advanced SEC/GPC analysis. It is the first truly modular multi-detector SEC system available allowing flexible access to a wide range of applications. The system incorporates state-of-the-art detection technologies including light scattering (MALS > multi-angle light scattering) for absolute molecular weight and Viscosity detection for structural and conformational data. Many other detector and accessory options and combinations are available to build a system uniquely tailored to your application requirements, with the benefit of modularity to allow easy future expansion. In addition, the SC2000 can be further expanded to include FFF modules to widen the application range and allow both SEC and FFF separations to be carried out on the same sample within one instrument platform.
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Laser Scattering Particle Size Distribution Analyzer
Partica LA-960V2
This latest evolution in the LA series advances scientific knowledge for tomorrow's world through intuitive software, unique accessories, and high performance.The LA-960V2 continues HORIBA's proud tradition of leading the industry with innovative design.
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Raman Probes
As with Raman spectrometers, a Raman probe is used to measure the inelastic scattering of light from a sample. Raman scattering is produced when the energy levels of photons are shifted up or down as a result of excitation by a monochromatic source (usually a laser). The change in vibrational frequency is used to determine the composition of a target substance.
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Laser Turbidity Meter
HU-200TB-EH
HU-200TB-EH is a laser-type turbidity meter that can measure turbidity of membrane filtered water, etc. with a resolution of 0.0001 degrees. A high-sensitivity turbidty meter with a minimum resolution of 0.0001 degrees at a measurement range of 0.0000 to 2.0000 degrees, which uses a long-lasting semiconductor laser as the light source and employs a transmission 90-degree scattering light method.This is best suited for sensitive measurement of turbidity on surface water.
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Raman Spectroscopy
Raman is a spectroscopic technique that uses laser light to interact with molecular excitations and determine what a substance or element is composed of. It relies upon the inelastic scattering of photons which produces a weak signal, making the collection of information challenging particularly when the substance to be measured is at distance or can only be given short exposure times. Our Raman spectrometers are particularly effective at making Raman measurements due to their configuration which delivers a higher throughput/etendue than standard instruments.
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Water Treatment Plant Analyzer
Aqualog
Aqualog® is the only instrument to simultaneously measure both absorbance spectra and fluorescence Excitation-Emission Matrices. EEMs are acquired up to a 100 times faster than with other instruments. Dedicated software automates traceable Quinine Sulfate Unit calibration and correction of inner-filter effects and Rayleigh and Raman scattering lines, enabling rapid export to modeling algorithms like PARAFAC.
