Electron
-
Product
Electron Multipliers
-
Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
-
Product
Electron Diffraction System
-
Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
-
Product
Electron Sources
-
SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
-
Product
Electron Microscope Analyzers
-
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
-
Product
Scanning Electron Microscopes
SEM
-
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
-
Product
Electron Microscope Analyzer
QUANTAX EDS for TEM
-
Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
-
Product
Electron Probe Microanalyzer
EPMA-1720
-
Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
-
Product
Auger Electron Spectroscopy (AES)
-
Rocky Mountain Laboratories, Inc.
Auger Analysis, Auger Electron Spectroscopy (AES or Auger) is a chemical surface analysis method. AES measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
-
Product
Electron Multiplication (EM) Standard Image Sensors
-
EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
-
Product
Electron Microscope Analyzer
QUANTAX WDS
-
The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
-
Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
-
"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
-
Product
Electron Spectrometers
-
SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
-
Product
Electron Microscope Analyzer
QUANTAX FlatQUAD
-
QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
-
Product
Scanning Electron Microscope w/ EDX Laboratory
-
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
-
Product
Scanning Electron Microscope
Verios G4 XHR SEM
-
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
-
Product
Scanning Electron Microscope (SEM)
Prisma E
-
Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
-
Product
TERAHERTZ HOT ELECTRON BOLOMETER DETECTORS FROM 0.1 to 70 THz
-
Insight Product Company offers ultrafast superconducting hot-electron bolometers (HEBs) operating at terahertz frequency range. from 0.1 to 70 THz. Superconducting hot electron bolometers HEBs are designed to detect and register the electromagnetic radiation pulses in the frequency range from 0.1 THz to 70 THz.
-
Product
Electron Probe Microanalyzer
EPMA-8050G
-
This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
-
Product
Hot Electron Bolometer (HEB) Mixers/ Receivers In Terahertz Range
-
Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
-
Product
Workshop Equipment for Electronics
-
PeakTech Prüf- und Messtechnik GmbH
Is a new development for fast and uncomplicated voltage measurements as a two-pole voltage tester with digital LCD display and additional LED display of the current voltage values.
-
Product
Electronics
-
Flann provides control processors and switch drivers that support all Flanns current range of programmable attenuators, phase changers and waveguide switches
-
Product
Electronic Development & Manufacturing
-
Our employees offer proven expert knowledge and application know-how in the development of finished products, embedded electronic systems and software applications on the most varied complexity levels. Solutions for the automotive, aviation and production industries are created using a combination of modern development methods and tools and µ-electronics, embedded electronics, firmware and software.
-
Product
Yarn Count Tester
TY361
-
TESTEX Testing Equipment Systems Ltd.
Yarn Count Tester, automatically calculates count systems used for sliver, roving and yarn, and can also be used for fabric yield. Yarn Count Tester consists of an accurate electronic balance and built-in calculating program.
-
Product
USB Modular Oscilloscope, 100 MHz, 2 Analog Channels
U2701A
Oscilloscope
100 MHz2 analog channelsMore accurate analysis of electronic designs with deep 32 Mpts memory and high 1 GSa/s sample rateSimple USB setup with plug and play capabilityGet the debug power you need with advanced triggering, automatic measurements, math functions including FFTs and moreQuick and easy measurement configuration and acquisition with bundled Keysight Measurement Manager (KMM) softwareDocument results more easily using the high speed USB 2.0 interface
-
Product
PXI 12-Slot BRIC Matrix, 384x16 1-Pole (12 sub-cards)
40-558-121-384X16
Matrix Switch Module
The 40-558-121-384x16 matrix is part of a range of BRIC ultra-high-density large PXI matrices are available in 2, 4, 8 or 12-slot PXI sizes to suit all high-performance matrix requirements and are constructed using Pickering Electronics' 4mm x 4mm instrumentation quality reed relays.
-
Product
FAult Detector and OScilloscope 9 Functions in 1
FADOS9F1
-
Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
2 unique features are added to the FADOS9F1 over the FADOS71. First feature is the Programmable DC Power Supply; It can be adjusted between 0-16V and 20-1500mA with power output; the DC Voltage/Current graphs of the electronic card power supply can be produced. The second feature is the “IR Remote Temperature Measurement Sensor”; this sensor is used to find the components that heat up by drawing too much current. Using these two features together may reduce the time for trouble shooting some malfunctions by 5 to 10 times. These features can be used as a new technique for trouble shooting.
-
Product
Synchro or Resolver Angle Indicator Readout
AITM
-
Computer Conversions Corporation
This series of units were designed to satisfy Hi speed multiturn synchro/resolver applications where the output data must be fresh and no data staleness can be tolerated. The tranducers utilized are the same as in the regular MDS series, however different tracking electronics are used.
-
Product
PXI 12-Slot BRIC Matrix, 1024x8 1-Pole (16 sub-cards)
40-558-121-1024X8
Matrix Switch Module
The 40-558-121-1024x8 matrix is part of a range of BRIC ultra-high-density large PXI matrices are available in 2, 4, 8 or 12-slot PXI sizes to suit all high-performance matrix requirements and are constructed using Pickering Electronics' 4mm x 4mm instrumentation quality reed relays.
-
Product
High Definition MWIR Science-Grade Camera
FLIR X8580™
-
The FLIR X8580 midwave IR camera is designed for scientists and engineers who need to capture detailed imagery of high-speed events, perform custom radiometric measurements, or detect points of failure in composites, solar cells, and electronics. This thermal imaging camera combines 1280 × 1024 HD resolution with fast frame rates and integration times, allowing researchers to record stop motion on fast-moving subjects or rapid temperature changes—whether in the lab or on the test range. With a four-position motorized filter wheel and support for FLIR motorized focus lenses, the X8580 will provide higher quality recordings, save time, and mitigate frustration in dynamic acquisition environments.
-
Product
NI-9231 and cDAQ-9171 USB Sound and Vibration Measurement Bundle
865665-01
Sound and Vibration
NI-9231 and cDAQ-9171 USB Sound and Vibration Measurement Bundle - The USB Sound and Vibration Measurement Bundle with NI-9231 and cDAQ-9171 includes the NI-9231 C Series Sound and Vibration Input Module and the cDAQ-9171 CompactDAQ Chassis for sound and vibrations measurements. This bundle provides a portable, USB-based sensor measurement system that helps you measure signals from integrated electronic piezoelectric (IEPE) and non IEPE sensors such as accelerometers, tachometers, and proximity probes. The included NI-9234 features 8 channels with built-in anti-aliasing filters that automatically adjust to your sample rate. Additionally, the bundle supports simultaneous sampling and high dynamic range measurements necessary for modern measurement microphones and accelerometers.
