Acceleration
rate of change in velocity.
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Product
400, 200, 100 Gbit Error Rate Tester
PAM-4 BERT
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The MI-PE5610-1 is a PAM-4 BERT with an integrated propriety, optical PAM-4 modulator. ROSA testing is tremebous simpliefied by the integration of the optical PAM-4 modulator in the BERT chassis. This ROSA testing solution saves time and avoids trouble shooting and accelerates your product development. The BERT provides an excellent optical PAM-4 reference output signal with adjustable OMA of the three PAM-4 eyes.The implemented 3-Eye BER technique measures the BER in real time of the 3 eyes simultanously.A wide range of selectable pattern for compliance test and signal analysis is supported.
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Product
8 Channel 100 MS/s 16-bit ADC
SIS3302
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The SIS3302 is the 16-bit extension to our 100 MS/s digitizer family. It is the 2nd DDR2 memory based digitizer unit in the SIS33xx family. The board is used for the readout of high resolution detectors, accelerator controls and other applications.
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Product
Oscilloscope
MXO 4
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The R&S®MXO 4 series is the first of a new generation of oscilloscopes that excels in both performance and value. The instruments deliver a once-in-a-decade engineering breakthrough for accelerated insight.
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Product
FPGA Servers
TeraBox™
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BittWare’s TeraBox™ range of certified server platforms feature the latest FPGA accelerators enabling customers to develop and deploy quicker with reduced risk and cost.
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Product
Random Drop (Non-Packaged) Test
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The random drop test is used to determine the effects on non-packaged components of random, repeated dropping due to handling, shipping, and other field service conditions. The test is an accelerated test designed to indicate structural and mechanical weaknesses of types not necessarily detected in shock and vibration tests.
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Product
Data Analytics
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KLA’s data analytics systems centralize and analyze the data produced by inspection, metrology and process systems. Using advanced data analysis, modeling and visualization capabilities, our comprehensive suite of data analytics products support applications such as run-time process control, defect excursion identification, wafer and reticle dispositioning, scanner and process corrections, and defect classification. By providing chip and wafer manufacturers with relevant root cause information, our data management and analysis systems accelerate yield learning rates and reduce production risk.
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Product
Reach-In Ageing Test Chambers
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Aging Chamber has been designed to simulate environmental condition to test the stability and reliability of products under stressed environment. Weiber is a leading manufacturer and supplier of Aging Test Chamber in India and abroad. Weiber offers scientific equipments at the most economical rates and versatile design. Microprocessor based Aging Test Chambers are made in accordance with the international testing standards. The equipments are NABL, NSF certified and CE approved. Aging Chamber maintains 25% to 95 % RH. The Test Chamber is digitally controlled delivering accurate result under controlled environmental conditions. This chamber also known as Accelerated Ageing Test Chamber.
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Product
MXM 3.1 Type A based on Intel® Arc™ GPU
MXM-AXe
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Integrating Intel’s latest line of powerful, discrete graphics — Intel® Arc™ — ADLINK introduces its MXM-AXe, one of the industry’s first MXM (R3.1) Type A discrete GPU modules. Packing hardware ray tracing, AI acceleration, and support for 4x 4K displays, the module enhances responsiveness, precision, and reliability for graphics-demanding, time-sensitive edge applications in commercial gaming, healthcare, media processing, and transportation. ADLINK MXM-AXe provides up to 8 hardware ray-tracing cores, 128 execution units, 4GB GDDR6, and 8x PCIe Gen4 at maximum 35W TGP and the industry’s first full AV1 hardware encoding.
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Product
Motadata ServiceOps – An ITSM Platform
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Enterprise are looking to accelerate Digital transformation with a modern ITSM for improved IT Business processes & IT service delivery Motadata ServiceOps is an ITIL-compliant IT Service Management software designed to help your IT teams organize information, automate workflows, eliminate manual complexities, encourage self-service for maximum productivity, and superior user experience.
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Product
SMARC Short Size Module With Qualcomm® QRB5165 Series Octa-Core SoC
LEC-RB5N
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- Qualcomm® Kryo™ 585 CPU (8x Arm Cortex-A77 cores)- Qualcomm® Hexagon™ Tensor Accelerator (HTA) running up to 15 TOPS- 4K HDMI/MIPI DSI display, MIPI CSI cameras- 2x PCIe x2 Gen3- 2x GbE Ethernet- 2x USB 3.1/2.0 and 4x USB 2.0- GPIO/SD and UFS- 5VDC +/-5% voltage input
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Product
Gear Tester
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MOTOMEA gear testing capabilities offer you an accurate and reliable “Gear Testing method” where you as a user can test the gear in a dynamic way, during gear acceleration period, and in a static way, by using two loading units with very accurate speed and torque sensors at the two gear sides
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Product
Infiniium EXR-Series Oscilloscope: 1 GHz, 4 Channels
EXR104A
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EXR104A Infiniium EXR-Series,1 GHz on all 4 channels, 8 instruments integrated in one, hardware accelerated plotting, and fully upgradeable to 2.5 GHz and 8 channels
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Product
COM Express Type 7 Basic Size Module with Intel® Xeon® D-1700 Processor (formerly codename: Ice Lake-D)
Express-ID7
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ADLINK’s Express-ID7 COM Express Type 7 Basic Size module is based on the Intel® Xeon® D-1700 processor and features integrated high-speed Ethernet for up to 4x 10G combined with 16 PCIe Gen4 lanes for instantaneous responsiveness and performance. Equipped with Intel® TCC, Deep Learning Boost (VNNI), AVX-512 technologies for optimal, accelerated AI performance, and support for Time Sensitive Networking (TSN), it provides precise control of hard-real-time workloads across all networked devices.
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Product
Interface Level Transmitter
Desalter
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The Drexelbrook Desalter Interface Level Transmitters accurately measure the electrical interface in the emulsion, even in upset conditions.DesalterThe Drexelbrook Desalter interface level transmitter provides an excellent solution for control of vessels that use electrostatic grids to accelerate separation.This reliable level transmitter is specially designed to maximize the throughput of oil/water separators and accurately measures the electrical interface in the emulsion even in upset conditions. This measurement is critical because the separation vessel operates at maximum efficiency when the electrostatic grid is close as possible to the interface.
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Product
Wheel Torque Transducer
WTT-Dx
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In automotive development, it is important to know the exact torques acting on the vehicle – especially under acceleration and braking maneuvers. With the WTT-Dx wheel torque transducer, a high-precision tool is available for making such measurements. The WTT detects the mechanical load directly where it is produced: the wheels that form the interface between the vehicle and the road.
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Product
Acceleration and Gyro Sensors
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Acceleration and gyro sensors specifically for the motorsports industry.
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Product
Vibration Test Systems
G-5 Series
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Both Shock tests at from relatively high acceleration(max. 4900m/s2 -500G) to low acceleration with wide pulse width, difficult to achieve with conventional Shock Test Systems and Vibration tests for not only IEC, MIL and JIS but also requiring higher acceleration, velocity and displacement than ordinary VTSs can be carried out with one system.
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Product
PNA-X Microwave Network Analyzer, 26.5 GHz
N5242B
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Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Ozone Test Chamber
EKT-2001OZ-HCLSX
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Designed and manufactured in accordance with ASTM D1149, ISO1431 & JIS K6259 standards. Providing precise and accurate ozone (OZ) concentration environment for rubber and polymer test. Widely applied to (1) Accelerated ageing research (2) Quality control and assurance tests and (3) R&D laboratory formula experiments for cracking resistance.
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Product
4U 18" Short-Depth Edge Server
HPC-7420+ASMB-977
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4U 18" short-depth edge server with dual 4th Gen Intel® Xeon® CPUs, 4TB DDR5, and 10 PCIe Gen5 slots. Built for massive AI acceleration and HPC.
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Product
Quantum Gravimeter
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The quantum gravimeter, the first commercial device of its kind in the UK, uses quantum interference of matter waves to measure the local value of gravitational acceleration, or ‘g’, with very high precision. Objects with different mass cause small fluctuations in the value of g measured on the surface of the Earth. The quantum gravimeter can be used to sense these objects hidden under the surface in a non-intrusive manner.
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Product
Edge AI Platform Powered by NVIDIA® Jetson AGX Xavier™
DLAP-401-Xavier
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- Deep learning acceleration with NVIDIA Jetson AGX Xavier- Compact system 150(W) x 145(D) x 85(H) mm- 3x USB 3.1 Gen1 lockable type, 2 GLAN, 1 Type C USB 3.1 OTG- Internal function expansions by M.2 E key 2230, M.2 B key 3042- 24V DC input- Additional storage by M.2 B key 2242
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Product
Ci Series Xenon-Arc Weather-Ometers
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Atlas Material Testing Solutions
The Ci Series Weather-Ometers are the most widely used rotating rack water-cooled xenon-arc weathering testing instruments in the world. Their large capacity and full-functional performance make these instruments the best choice for a wide variety of accelerated weathering test methods. They offer superior irradiance and temperature uniformity within the test chamber, as well as a wide performance envelope for all weathering testing parameters. They are commonly referenced in OEM weathering test standards and specifications. The intuitive user interface makes operation and programming very simple. Several revolutionary options and accessories are available to allow researchers to get the most out of their weathering testing programs.
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Product
Hailo-8™ M.2 AI Acceleration Module
EAI-1200
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26 TOPS AI Computing delivered by Hailo-8 NPU. Compact M.2 AI module key B+M / A+E. -40~65°C operating temp. w/ optional heatsink. Typical 2.5W low power consumption. Rich AI Dev. Toolkits including Model Library, Model Converter, Runtime SDK Integration.
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Product
EasyEXPERT Group+ Software (for B150x Mainframe)
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Keysight EasyEXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
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Product
Accelerometers
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Analog Devices accelerometers and iSensor® MEMS accelerometer subsystems provide accurate detection while measuring acceleration, tilt, shock, and vibration in performance driven application. Our portfolio leads the industry in power, noise, bandwidth, and temperature specifications, and offers a range of MEMS sensor and signal conditioning integration on chip. Our MEMS-based Circuits from the Lab® reference designs have been built and tested by ADI experts to help you jumpstart your next system design.
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Product
Acceleration Testing
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The acceleration test is performed on a centrifuge to assure that material can structurally withstand the steady state inertia loads that are induced by platform acceleration, deceleration, and maneuver in the service environment, and can function without degradation during and following exposure to these forces. Acceleration tests are also used to assure that material does not become hazardous after exposure to crash loads. The acceleration test method is applicable to material that is installed in mobile platforms such as aircraft, helicopters, aerospace vehicles, air-carried stores, ground-launched missiles, trains, ships, automotive vehicles, etc.
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Product
Tabletop Light Fastness Tester
TF421
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TESTEX Testing Equipment Systems Ltd.
Tabletop Light Fastness Tester is a powerful xenon instrument with affordable price for conducting accelerated tests of light fastness and photo stability test.
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Product
3U OpenVPX Ethernet Switch and Multifunction I/O Board
68G5E
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The 68G5E is a 3U OpenVPX board that is configured with an Ethernet Switch module (choose the ES1, 12-Port GbE Cu legacy unmanaged Ethernet Switch, or the ES2 16-Port Cu GbE managed Ethernet Switch with optional 4x 10GBASE-SR 850 nm multimode Fiber Optic interface) and provides additional support for one NAI smart I/O and Communications function module. Uniquely designed, the 68G5E provides ‘independent’ Ethernet Switch capabilities and can operate as a MFIO board end point with access via the 1 x1 PCIe and/or 1x 10/100 Ethernet motherboard Control Port which hosts the NAI Ethernet Protocol Server/Listener application for direct GbE MFIO control. Ideally suited for rugged Mil-Aero applications, the 68G5E delivers off-the-shelf solutions that accelerate deployment of SWaP-optimized systems in air, land and sea applications.
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Product
Tunable Laser Source, High Power And Lowest SSE, Top Line
N7776C
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The new Keysight N7776C top line tunable laser source is designed to reach best-in-class accuracy in static and swept operation for outstanding test efficiency. Two-way sweeps up to 200 nm/s speed with sub-picometer repeatability and without impacting the specified dynamic accuracy accelerate wavelength-dependent alignment processes and the automated calibration of wavelength-selective devices. Shorter time to testing and faster swept-wavelength tests help reduce test cost per device, improve test margins and lower the cost of ownership.
