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Particle
fundamental objects of quanta.
See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection, Wave
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Submersible Laser-Diffraction based Particle Size Analyzer
LISST-200X
The LISST-200X is a submersible laser-diffraction based particle size analyzer designed to measure particle size and concentration in rivers, streams, ports, harbors, coasts and oceans, whether for biological, sediment transport, or environmental monitoring needs. Smaller, lighter, smarter, for starters, the LISST-200X combines the features of the original LISST-100X with new improvements to make a major advance in the technology of submersible particle size and concentrations measurements.
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Solid Particle Counting System
MEXA-2000SPCS series
The HORIBA MEXA-2000SPCS series measures the number of solid particles from engine exhaust gas in real-time.The series can complete engine/vehicle certification testing in the latest regulations*1, such as Euro 6/VI and China 6/VI,along with R&D testing of engines and particulate filters by direct sampling without dilution.
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Particle Size Analyzers
Mastersizer Range
The Mastersizer range of laser diffraction particle size analyzers set the standard for delivering rapid, accurate particle size distributions for both wet and dry dispersions. From assessing product uniformity and solubility, through to optimising packing density to improve final product performance and controlling powder flowability to increase manufacturing efficiency, particle size analysis is critical to understanding and controlling a wide range of properties. The Mastersizer range, with its intuitive software and industry-leading design and ergonomics, enables users to make these particle sizing measurements fast and routine.
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Turbidity And Standard Meters
Accurately measure the cloudiness of a fluid caused by suspended particles with turbidity meters and standards from HF scientific. Our turbidity meters and standards instruments include features that simplify installation, maintenance, and data access.We offer reliable turbidity meters including an online turbidity meter, handheld turbidity meter, and benchtop turbidity meter.
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Produce Quality Meter
F-750
The F-750 Handheld Brix & Dry Matter Meter uses near-infrared (NIR) spectroscopy to estimate quality metrics such as dry matter, Total Soluble Solids (TSS or brix), titratable acidity, and color. Working like a high-powered flashlight, the F-750 sends particles of light into a commodity, then measures the NIR light interactance with molecular components inside of the commodity to quantify user-selected traits. The F-750 has a wide range of applications, from determining optimal harvest timing by assessing fruit maturity, to providing an objective analysis of produce quality of fruit in packing houses and upon import. The F-750 is a handheld, fully integrated system, allowing users to operate it out in the orchard or inside the QA lab. Its simple, intuitive user interface makes it easy for anyone to use, while its model building software makes it customizable and versatile.
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PXIe-5763 , 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785160-01
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Non Destructive Testing (NDT)
NDT covers a wide group of testing techniques used to evaluate the properties of a material, part, product, weld or system without causing damage. NDT carried out at KLL includes:Liquid Penetrant Testing (LPT) is used for the detection of surface breaking discontinuities on magnetic and non-magnetic metallic materials.Fluorescent and colour contrast penetrants are available to be used in the following methods:-Water washableSolvent removablePost emulsifiableMagnetic Particle Inspection (MT/MPI) is used for the detection of surface breaking and slightly sub-surface (up to 2mm) discontinuities.Bench type crack detectors and portable units are employed producing various waveforms (i.e. A.C, HWDC and induced magnetic flow) to give both circular and longitudinal magnetism.On-site testing is carried out using electro magnetic yokes and permanent magnets producing induced magnetic flow.Ultrasonic Flaw Detection (UT), also known as Ultrasonic Inspection, is used for the detection of volumetric discontinuities in ferrous and non-ferrous products (forgings and castings etc.), and welds in magnetic and non-magnetic materials.UT is capable of penetrating metals, dependent on the material characteristics, up to 10m in length.Some thickness and depth checks can also be carried out using ultrasound.Radiography services are available through sub-contract booked in advance. Notice is required for on-site work.Personnel are available at short notice for in-house or on-site work in the UK and overseas.All inspectors undertaking non destructive testing (LPT, MT/MPI and UT) are qualified to, and meet a minimum of, PCN Level 2.PCN Level 3 supervision is available in-house for LPT, MT/MPI, UT offering consultancy services including procedure writing and commentary, auditing of techniques and Level 3 Supervisor cover.We can assist clients in product qualification, material testing, quality assurance and audit programmes.
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PCIe-5763, 16-Bit, 500 MS/s, 4-Channel PCI FlexRIO Digitizer Device
786166-01
The PCIe-5763 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PCIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Software / Data Management
Provides a central hub for a facility monitoring system. The Processor communicates with cleanroom sensors, including particle and microbial monitors, while buffering data and checking tolerances for alarm activation.
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Microelectro Mechanical Systems And MEMS Sensors
NevadaNano has spent a decade integrating multiple, complementary chemical sensors on a single silicon chip. We call it the Molecular Property Spectrometer™ (MPS™). The MPS Gas Sensor works together to measure a variety of thermodynamic and electrostatic molecular properties of sampled vapors, liquids, and particles. In less than a second, the chip creates a large, rich dataset of chemical information. Then, Custom MPS software identifies the types of molecules present in an unknown sample.
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Aerosol Neutralizer
3012
Aerosol neutralization is an important component of aerosol science and engineering. Neutralizing aerosol particles can reduce electrostatic losses of particles within tubing or to other surfaces. Neutralization is also critical to gathering reliable particle size data when using a sizing instrument based on electrical mobility.
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SOI Bonding Systems
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection are combined in one high volume production system. EVG850 is the only production bonding system built to operate in high throughput, high-yield environments and guarantees void-free SOI wafers up to 300 mm.The EVG300 series single wafer cleaning systems are designed for efficient removal of particles. In semiconductor processing, efficient cleaning and particles removal prior to critical process steps enables maximum yield. Wafer Bonding is a process which is strongly affected by particles: each particle on the wafer surface produces a void orders of magnitude larger than its diameter, contributing to a dramatic yield loss.
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Electromagnetic Express
EM-X
Is a physics modelling package for electromagnetic fields and charged particles. A CAD component allows the definition of mechanical parts and assignment of electric potentials, magnetization and charged particle sources. A time domain, particle-in-cell (PIC) tool then solves the electromagnetic fields and moves the particles within them. The particles’ own charges andmotions are fed back into the electromagnetic fields allowing the effects of space charge and selfmagnetism to be accounted for.
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Microscopy Image Analysis Software
analySIS FIVE
The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
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Engine Emission Test System
By adding transient operation functions (self-learning/predictive driving + each test mode performing) to measurement•control panel, Ono Sokki can build up engine test system that can perform transient mode tests supporting worldwide gas emission controls including TRIAS, FTP, EURO, and ISO. (e.g. WHDC, NRTC).This system provides good reproducibility for Transient mode test. Delay compensation and rotation inertia compensation function have greatly improved as well as self-learning / predictive driving function.Automatically processes from measurement to data output of test result, in conjunction with gas emission analyzer, tunnels, gas emission particle measurement system, smoke meter, etc.
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PCIe-5764, 16-Bit, 1 GS/s, 4-Channel PCI FlexRIO Digitizer Device
785961-01
The PCIe-5764 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PCIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Particle Sizers
For over four decades, TSI has been at the forefront of providing state-of-the-art aerosol sizing instruments. Our commitment to advancing research and driving innovation spans various industries. TSI is a trusted manufacturer of cutting-edge particle sizing instrumentation and systems, covering a wide range of particle sizes, from 1 nm to 20 micrometers.
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Fiber Inspection and Cleaning
Dust - just because you can't see it doesn't mean it's not there. A 1-micrometer dust particle on a single-mode core can block up to 1% of the light (a 0.05dB loss). The only way to know it's clean is to inspect it before you connect it. And if it's dirty, it needs to be cleaned with the right tools or you might just make it worse. Know it's clean with our cleaning and inspection tools.
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Portable Particle Size Analyzer
LISST-Portable|XR
Truly portable – completely self-contained with built-in data logger, processor, rechargeable battery, and 7” color touch screen display.Particle Size Range 0.35 to 500 micronsPumped and recirculating mixing chamber that keeps large and heavy particles suspended.Shock mounted optics block that can withstand the rigors of field use.A built-in ultrasonic probe for complete sample dispersion.Touch panel allows for easy SOP programming, sample analysis and display of data without a PC.Multiple Mie models as well as Fraunhofer model available for inversion, selectable from the touch panelAll data-processing is performed on board and stored in ASCII format. No post-processing necessary.Outputs: Total volume concentration, mean size, standard deviation, optical transmission, D5, D10, D16, D25, D50 (median grain size), D60, D75, D84, D90, D95, D60/D10 (Hazen uniformity coefficient), particle surface area, silt fraction, silt volume, size distribution, battery voltage, sample notes.Based on the laser diffraction principle. Compliant with ISO-13320-1 standard.
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Particle Metrology System
Archimedes
Archimedes is an innovative instrument which uses the technique of resonant mass measurement to detect and accurately size and count particles in the size range 50nm to 5um*. Archimedes can distinguish different species from their buoyant mass is particularly useful when characterizing proteinaceous aggregates from contaminating silicon oil in biopharmaceutical preparations, in distinguishing bubbles from lipid micelles and contaminants in ultrasound contrast agents or protein from fat in dairy products.
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Magnetic Particle Flaw Inspection System
This model can perform every kinds of magnetic particle flaw inspection in our unit. circular magnetization longitudial magnetization continuous magnetization, residual magnetization threading bar magnetization current induction magnetization, AC magnetization AC demagnetization DC magnetization, DC demagnetization.
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Particle Deposition Systems
Sets the standards for wafer inspection and metrology equipment. This advanced tool is vital for increasing the yield of future leading-edge devices, while meeting the measurement needs of today.
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Radiation Meters
A radiation meters is a device designed for measuring varying types of radiation. These devices are portable and are used to inspect personnel, equipment, and facilities for radioactive contamination by measuring the emission of certain radiation particles. They are used to measure external or ambient ionizing radiation field to assess the direct exposure hazard.
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NIM-Modules
The "dual channel" TDC'''' - Model 7072T - converts time directly to a digital output. They offer improved performance and linearity specifications compared to separate TAC and ADC modules. There is also the Wilkinson-type ADC, Model 7070 which is suitable for high resolution HPGe detectors. Our Constant-Fraction discriminators are still state-of-the-art even after a more than 20 Year history. The Differential CFD - Model 7029A - still offers the highest counting rate (>50 MHz) of any such devices. Our Pulse-Shape Discriminator - Model 2160A - can be used to separate neutron and gamma particles, alphas and protons, electrons and alphas etc depending on the detector used.
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Particle Impact Detection System 10
BW-LPD-DAQ4000HD
This system is capable of vibration testing up to 10 pounds and detecting defects that produce noise, such as loose screws, particles, etc. Right from the start of PIND testing, B&W patented the first MIL-STD compliant system outperforming the competition by over 30% better detection rate as tested by the NBS (now National Institute of Science and Technology) in a well known 1978 study (NBSIR 78-1590 NASA).
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Aerodynamic Particle Sizer (APS)
3321
The Aerodynamic Particle Sizer® 3321 (APS™ spectrometer) provides high-resolution, real-time aerodynamic measurements of particles from 0.5 to 20 microns. These unique particle sizers also measures light-scattering intensity in the equivalent optical size range of 0.37 to 20 microns. By providing paired data for each particle, the APS spectrometer opens up exciting new possibilities for those interested in studying the makeup of an aerosol.
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Cascade Impactors
TSI’s suite of cascade impactors can collect particles with aerodynamic diameters (cutpoints) from 10 nm to 10 µm, in 3 to 13 different size fractions, and at flow rates of 2, 10, 30 or 100 L/min. The number of stages determines the size resolution of the collected samples, and consequently determines the level of detail of the data generated from the quantitative analysis of these collected samples. MOUDI II impactors have rotating stages. When the stage is rotated relative to the nozzle plate, the impacted particles are deposited in a more uniform manner across the impaction surface. This increases the amount of particle mass that can be collected, reduces the probability of particle bounce and re-entrainment, and optimizes quantitative analysis of the collected samples.
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Reticle / Mask Particle Detection System
PR-PD2HR
In semiconductor plants, where high performance and demanding functionality are required, the HORIBA PD Series'' high operating rate and long-term dependability have earned it a solid reputation. Inheriting a transfer system that has proven to provide stable, high performance and superior throughput over long operating periods, the PR-PD2HR now offers the most sensitive detection in the series with exclusive signal processing that can detect particles as small as 0.35 m.
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Micro Compression Tester
MCT Series
This is a strength evaluation tester for micro parts and micro particles generated in powder processing. It is capable of carrying out not only compression tests, but also loading and unloading tests, repeated tests, and various other load patterns, with excellent operability and functionality.
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Timer Counter, Particle, 0 °C, 50 °C, 6, 0% to 100%, 5000, Concentration, Cumulative, Differential
72-10190
Measure air particles, temperature (IR and air), with this affordable air quality tester for environmental and safety testing.
