Measuring Microscopes
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Product
Measurement
Power Meter
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Power Meter is used for determining the power of the electrical current coming to the input channels of ADC modules and FFT spectrum analyzers, or that of the electromagnetic signal.
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Product
Measurement & Test
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Electronic test engineers use a variety of precision instruments for R&D, vendor verification, and production testing. ETPS can supply a number of general test instruments that can be used in stand alone mode or automated for high throughput testing. Dedicated battery test systems with automatic charge and discharge modes with data logging are available. The standard 16 and 32 channel systems have range up to 5VDC ensuring their suitability for a wide variety of cells.
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Product
Scienlab Measurement & Control Modules
SL106XX Series
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The Scienlab SL106XX Series covers a wide range of test, measurement, and control tasks. If required, you can combine your measurement task and scope.
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Product
Film Thickness Measurement
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Film thickness measurement can be measured using a number of different techniques depending on the thickness and number of layers. In its simplest form a simple measurement can be made of a single layer with a reflective lower surface using interference fringes. For more complex materials with multiple layers interference measurement is still made, but the mathematical deconvolution becomes increasingly important as does the refractive index of each layer.
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Product
Digital Microscope
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A variation of a traditional optical microscope in which a digital/microscope camera is connected, and image output is displayed on a screen and/or monitor. Most models include software and a computer for use.
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Product
Measurements On The Same Device
How Many Item Family
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Quanti - the functional measurement and electrical safety The tester of the product family is believed to be the first of its kind, as our devices allow users to perform electrical safety and functional measurements on the same device.
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Product
Fast LID Measurements for EOL
KMP
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TechnoTeam Bildverarbeitung GmbH
The KMP is the solution to cost-effectively bring indirect light measurement technology to places with too little space for a BV room. Its lightweight and compact design allow it to be integrated into production lines, positioned next to production or in a small lighting lab.
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Product
400x Bench-Top Optical Fiber Microscope
FTM-400X
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Shanghai Fibretool Technology Co.,Ltd.
With coaxial illumination optic magnify system, FTM-400X can easily find the slight defects and scratches on fiber endface. High resolution image sensor and 8"pure black and white digital TFT LCD can show the most real details of fiber endface.This is an integrated fiber endface inspector, it combines optical microscope and monitor in a body other than separate designs. It has clear images and long life time. it has series of adaptors for various kinds of connectors such as multi fiber connectors, optical components. It is an essential instrument for optical manufacturing.
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Product
Stereo Zoom Trinocular Microscope
SPZV-50E
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SPZV-50E Stereo Zoom Trinocular Microscope 6.7x to 50x, max 200x with optional lenses on stand PLED with 60 eco friendly LED lights with dimmer. Attach any C or C/S mount camera to the trinocular port to view images on a monitor. Focus mount has coarse and fine focusing for precise control. Large 200 x 284mm base. Compact footprint helps save bench space. ESD Safe coating protects sensitive components from electrostatic discharge.
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Product
Strain Measurement Trainer Module
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Unitech Scales And Measurements Pvt. Ltd
Strain Measurement Module comprises of Cantilever Beam bonded with four strain gauges,pan and weights upto 1Kg. Digital 3½ digit indicator module is supplied to read the microstrain.
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Product
Scanning Electron Microscopes
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Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Product
Measuring Systems For Night Vision Systems
MTF Master IIT
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Optik Elektronik Gerätetechnik GmbH
Measuring system for MTF, SNR and EBI of Image Intensifier Tubes (IIT). The MTF MASTER IIT was specially developed to classify the quality of image intensifier tubes by the objective criteria of the MTF (Modulation Transfer Function).
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Multi-Function Test & Measurement System
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Optoplex’s Multifunction Test and Measurement System (TM100 Series) is designed to provide a flexible and cost effective optical test and measurement solution, particularly for manufacturing lines. The mainframe can be mounted in 19” rack or stationed on desk-top for ease of use. There are many selections of the pluggable modules, from tunable laser, optical spectrum analyzer, EDFA, power meter, ASE light source, optical tunable filter, optical performance monitor, …, etc.
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Product
5B Measuring Amplifiers
MA Series
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Highest aim of our connection technology is user-friendliness. Very comfortable is the connection of our products to the most various sensors and signals.
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Product
Laser Distance Measurer
NT-8560
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Ideal for measuring factory layout, facilities safety area, trench depth, roof area for solar, building maintenance, ceilings maintenance, road works, water level, sheet rock measurement.
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Product
NanoModeScan M² Measuring System
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This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
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Product
Optical Measurement Methods and Characterization Services
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The Fraunhofer IOF develops optical measurement methods and systems to customer requirements. Key areas include the characterization of optical and non-optical surfaces, coatings, components and systems in the micro and sub-nano range as well as 3D shape acquisition.
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Product
Non-contact Diameter Measurement
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Precision measurement is our focus. Our laser and ultrasonic-based technologies provide non-contact diameter measurements for a wide range of materials. Our accurate suite of tools cover outside diameter (OD), ovality (eccentricity), wall thickness (coating thickness/material thickness), concentricity, inside diameter (ID), and more.
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Product
Measurement
Multichannel Strain Gauge Meter
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The Software Multichannel strain gauge meter is used for performing all types of strain gauge measurements using strain gauge sensors (for instance, force and torque sensors, bridge and semi-bridge circuits based on resistive strain sensors), strain measurement data acquisition modules ZET 017-T and digital strain gauge sensors of ZETSENSOR series. The program enables simultaneous processing of up to 128 measuring channels using strain gauge station and up to 500 measuring channels in the case if digital sensors are used.
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Handheld Instruments for Measuring Humidity & Temperature
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Our range of handheld instruments are perfect for monitoring environmental conditions. Models with an interchangeable probe input have the wide measurement ranges -100…200 °C, 0…100 %rh with a Rotronic probe selected for the application.
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Product
Test & Measurement Cables
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Our test & measurement cables provide customers with a competitive edge over ordinary cable designs by addressing three important criteria for testing electronic components and systems: phase stability, insertion loss stability and repeatable measurements for the cable’s useful life.
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Product
Flicker Measuring Probe for LCM ATS
A712306
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The Chroma A712306 Flicker Measuring Probe for LCM ATS is specifically designed for adjusting the flicker on LCM automatically following the FMA(Flicker Modulation Amplitude) standards defined by VESA (Video Electronics Standards Association) and JEITA (Japan Electronics Information Technology Industries Association) for flicker measurement.
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Product
High-Resolution Scanning Probe Microscope
SPM-8100FM
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The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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MTF Measuring Systems For Industrial Applications
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The MTF (modulation transfer function) is a recognized quality criterion for the imaging quality of optics. OEG GmbH develops and manufactures computer-controlled, fully automatic measuring systems for MTF and other parameters for quality assurance in optics production, incoming goods inspection, research and teaching
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Product
High Resolution Microscope For Multi-fiber Connector
D SCOPE MT LWD
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Designed for inspection of MPO connectors, patch-cords or bulkheads, the D Scope MT LWD checks the cleanliness of the connector face and precisely measures the defects on the optical fiber end-faces. Using Deep Learning technology associated with a high-resolution optical bench, the scratch and defect detection thresholds are significantly improved compared to traditional software.
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Automatic Capsule Weighing & Measuring
CIW 7.4
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The automatic weighing system CIW 7.4 LAB is a special version to the CIW 7.2 LAB. In addition to weight, the CIW 7.4 LAB allows an optimal and almost force-free length measurement for capsules. The capsule is positioned without affecting the measurement of the capsule length.The CIW 7.4 LAB in the laboratory version is now equipped with the database-supported, intuitive all-in-one touch software and no longer requires additional software solutions for most areas of application. The functionality of the software can be extended modularly – fitting your needs and requirements.
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LCR Component Meter with Component Impedance Measurement
LCR45
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The new LCR45 does everything that the popular LCR40 does, but we've added some significant enhancements. The LCR45 features a new high capacity micro and high resolution ADCs.*Fluid measurements of L, C and R (continuous readings with selectable hold function).*Fine resolution for improved performance at low inductance/capacitance/resistance.*Auto and Manual component type.*Auto and Manual test frequency.*Frequencies: DC, 1kHz, 15kHz and 200kHz.*Display of component values, complex impedance, complex admittance and magnitude/phase.
