Measuring Microscopes
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Product
PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
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PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Manual Vision Measuring Machine
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Sinowon Innovation Metrology Manufacture Ltd.
High precision marble base and pillar ensures the high stability of vision measuring system; High precision toothless rod and fast moving locking device ensures repeatability error is less than 2um;High precise working stage with 0.5um optical linear scales ensures the accuracy is less than 2.5+L/200um;High definitive detent zoom lens and high resolution color camera ensures clear image without distortion;With programmable surface 4-ring 8-division LED Cold Illumination and contour LED telecentric illumination and built-in intelligent light adjustment, it can automatic control the brightness in the 4-ring 8-division.
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Product
Portable Measuring Arms
A-LINE
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Trimos A-line portable articulated measuring arms allow an extremely easy and accurate 3D measurement.
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Product
Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Film Thickness Measurement
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Film thickness measurement can be measured using a number of different techniques depending on the thickness and number of layers. In its simplest form a simple measurement can be made of a single layer with a reflective lower surface using interference fringes. For more complex materials with multiple layers interference measurement is still made, but the mathematical deconvolution becomes increasingly important as does the refractive index of each layer.
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Product
5B Measuring Amplifiers
MA Series
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Highest aim of our connection technology is user-friendliness. Very comfortable is the connection of our products to the most various sensors and signals.
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Product
Surface Roughness Measuring Machines
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Portable Surface Roughness Measurement instruments whose analysis function and operability are dramatically evolved
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Product
Net Radiation Measurement
NR Lite2
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The design of the NR Lite2 is unique. The detector is based on a Teflon coated, weather resistant black conical absorber. In contrast to other sensor designs, NR Lite2 requires no fragile plastic domes. This results in a virtually maintenance free design. The vertical stick prevents birds from affecting the output signal.
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Product
PXIe-4139, Benchtop Measurement Bundle with
865534-01
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Benchtop Measurement Bundle with PXIe-1090, PXIe-4139
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Product
CDNE For Emission Measurement On Luminaries
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CDNs have been used as coupling-/decoupling networks to measureconducted noise as well as for immunity testing so far.
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Product
Infrasound Measurements
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Is sound that is lower in frequency than 20 Hz (hertz) or cycles per second, the "normal" limit of human hearing. Hearing becomes gradually less sensitive as frequency decreases, so for humans to perceive infrasound, the sound pressure must be sufficiently high. The ear is the primary organ for sensing infrasound, but at higher intensities it is possible to feel infrasound vibrations in various parts of the body.
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Scanning Electron Microscope
E5620
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The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Product
Combination Measurement Workstation
WS500
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The WS500 is a combination measurement workstation that incorporates several different measurement types that can be included in a single characterization sequence.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Flow Measurement Products
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With ABB's knowledge about flow measurement and management, you have access to over 100 years of flow measurement and control experience to help you save cost and increase profits.
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Product
Measurement Power Amplifier
Qam
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The amplifier is DSP controlled, with a very straightforward operation. Included is a white/pink noise signal generator. The internal signal module provides low crest noise signals to be able to reach high power levels from sound sources or electromagnetic shaker. External input ofsignal is equally possible, with spectral linearisation or without. This can be used for music, RASTI or any other signal
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Product
Drawing Die And Wire Measurement
Drawing Die Inspector DDI
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Optik Elektronik Gerätetechnik GmbH
Special microscope setup for visual inspection of wire drawing dies.
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Product
Temperature Measurement System
Spider-80Ti
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The Spider-80Ti is a front-end from the Spider-80Xi hardware platform that enables temperature measurement. Spider-80Ti supports temperature measurements from Thermocouples and RTD (Resistance Temperature Detector) sensors.
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Electronic Test & Measurement Equipment
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We are known worldwide for the M.O.L.E. Temperature Profiler. The Mole is used in the Electronic, Paint, Food, and the Industrial marketplace. The Mole is a stand alone, 6 channel, temperature profiler that it is used in many harsh processes that require the temperature measuring instrument to be inside the heating chamber or "ride along" with the parts or process being measured over time such as Solder Reflow Ovens and Wave SolderMachines.
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Product
Non-contact Film Thickness Measurement
ALTO-IRT-7000
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ALTO-IRT-7000 (IMPEDANCE RESONANCE TECHNOLOGY ) FILM THICKNESS METROLOGY TOOL UTILIZES NON-CONTACT CAPACITIVE AND EDDY CURRENT TECHNOLOGY TO ANALYZE MICRO SECTORS ON COATED SURFACES THAT ARE 1000 TIMES SMALLER THAN ANY COMPARABLE EDDY CURRENT PRODUCTS. BUT MOST IMPORTANTLY, THIS UNIQUE IRT TECHNOLOGY ALLOWS FOR SOPHISTICATED ANALYSES OF THE CONTINUOUS AND DISCRETE FILMS BELOW 50 ANGSTROMS, DRAMATICALLY IMPROVING THE ACCURACY OF QUALITY CONTROL READINGS.
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Product
Measurement, Communications & Testing
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Process & Analytical Instruments division of AMETEK
Measurement Communications & Testing provides the design, integration and installation of critical communication systems, workflow, life-safety solutions and calibration instruments for temperature, pressure and process control. It also is a leader in level measurement devices, continuous position sensors, hardness testers, force measurement devices and retractable cord reels. In addition, it offers a line of weathering test instrumentation along with laboratory and outdoor testing services.
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Product
Torque Measuring and Monitoring System
WISER 4000
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TECAT Performance Systems, LLC
The WISER 4000 system is the latest release of TECAT’s low-cost, ultra-low power and extremely accurate torque sensor. The wireless system has the optional ability to measure 3-axis acceleration, barometric pressure and ambient temperature, all within the same incredibly small footprint. The 4000 includes on-board data logging without PC or DAQ connectivity, and remote flash capability, which enables firmware upgrades without removing the system from the unit under test. Featuring shunt calibration, TECAT’s latest WISER system is designed to simplify instrumentation verification for users, while allowing them to check calibration of the system in the field. In addition, the WISER 4000 has been enhanced with two additional outputs, a higher-speed recording, and is available with custom-built remote enclosures to protect the system’s remote unit and battery from damage due to debris.
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Product
Ultrafast Laser Pulse Measurement
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Ultrafast Laser Pulse Measurement Products by MesaPhotonics
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Product
Measuring Light Curtains
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Leuze electronic GmbH + Co. KG
These devices are perfect for measuring moving objects as they pass by. The measurement results can be output via the fully integrated interface. At the same time, the programmable switching outputs allow downstream elements to be manipulated. Likewise, multiple light curtains can be cascaded. The nearly unlimited possibilities for configuring multiple measurement areas and evaluation functions make the devices problem solvers for a variety of measurement tasks. The range of available resolutions and measurement field lengths ensures optimum adaptation to your application.
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Spectral Sensitivity Measurement
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It is a device which measures the spectral sensitivity characteristics and quantum efficiency of various solar cells by irradiating solar cells with monochromatic light of constant energy and constant photon without wavelength dependence. We are constantly monitoring irradiation light quantity with our real real time light quantity monitor control system and are not influenced by fluctuation of light source, so it is a well-established control system with excellent measurement stability and measurement reproducibility.
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M² Measurement Systems
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Thorlabs' M2 Measurement Systems provide self-contained, turn-key solutions for measuring M2, divergence, focus diameter, waist position, Rayleigh length and other laser beam quality metrics. Pre-configured, factory-aligned systems covering wavelength ranges between 250 nm and 2700 nm are available. Choose from among systems that have a scanning-slit beam profiler, a camera beam profiler, or no beam profiler.
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Product
Current Measurements of PWM or Inverter
DCT-17
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MULTI MEASURING INSTRUMENTS Co., Ltd.
For measuring DC current comply with watt-hourmeter (split-core type)
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Product
Torque Measurement Trainer Module
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Unitech Scales And Measurements Pvt. Ltd
Torque Measurement Trainer comprises of strain gauge based reaction type torque transducer, fulcrum arm of 1 M length with L angle to mount the sensor, Pan & weights with digital torque indicator to read the torque in Kg-m.
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Test & Measurement
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NIF (Dutch Instrument Factory, later Nieaf-Smitt) started in 1900 as one of the first organizations in the world with the design and production of instruments for electrical values. The portfolio of test tools, digital multimeters, current clamps, device testers, installation testers and power analyzers is characterized by quality and reliability.
