Debugging
fixes identified bugs.
See Also: Debuggers, In-Circuit Debuggers, Code Debuggers, JTAG Debuggers, Source Debugers
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Product
PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
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PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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Product
Debug Adapters
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One thing is sure in the life of an embedded developer - your next microcontroller development board will be fitted with a different debug connector to the one used in your previous design.
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Product
CASS Instrument Real Time Controller
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External control of the Navy CASS ATE via Ethernet. Standardized graphical user interface (GUI) for individual control of each instrument independent of CASS software. Allows TPS developer or ATE maintainer to change/control instrument settings for TPS debug and instrument troubleshooting.
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Product
In-Circuit Debugger for Power Architecture 55xx/56xx (Nexus)
ICDPPCNEXUS
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P&E's ICDPPCNEXUS for Windows is a powerful tool for debugging code on a Freescale MPC55xx/56xx processor. The debugger comes with P&E's PROGPPCNEXUS flash programmer.
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Product
PCIe Smart Bus Extenders
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The PCIeEXT16HOT enables PCIe x16/x8/x4/x2/x1 boards to be rapidly tested, removed and swapped without having to reboot or power down the host system enabling rapid production testing and engineering debug. The hot insertion, current reporting, overcurrent indication and limiting and voltage margining capabilities make this board the highest performance PCIe bus extender in the industry.
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Product
Test & Programming Software
ScanExpress
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The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.
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Product
PCI Express PLL Test Application
N1081PLCA
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Keysight N1081PLCA PCI Express PLL Test Application designed to measure transmitter PLL bandwidth and peaking based on the PCI Express 5.0 TX PLL Specifications. Use N1081PLCA PCIe PLL test software to test, debug and characterize your PCIe designs.
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Product
Debug Probes
J-Link and J-Trace
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SEGGER Microcontroller GmbH & Co. KG
SEGGER J-Links are the most widely used line of debug probes available today. They've been proven for more than 10 years with over 250,000 units sold, including OEM versions and on-board solutions. This popularity stems from the unparalleled performance, extensive feature set, large number of supported CPUs, and compatibility with all popular development environments.
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Product
Lauterbach ΜTrace For Cortex M
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A new all-in-one debug and trace solution has been developed by Lauterbach in response to the breakthrough of Cortex-M processors into the embedded market. This lower cost system called µTrace specifically targets the Cortex-M family.
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Product
Ultra Portable SuperSpeed USB Analyzer
Advisor T3
Analyzer
Teledyne LeCroy’s Advisor T3 is an ultra portable SuperSpeed USB analyzer that delivers market leading accuracy at an extraordinary price. Designed to put precision USB protocol test tools in the hands of every engineer, the Advisor includes all the essential features for SuperSpeed USB debug.
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Product
Emulate Test in simulation
STIL-VT
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Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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Product
A Serial Data Link Monitor for Windows
Listen
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Listen is a Data Link monitor designed to assist debugging & troubleshooting serial communications links. Listen utilizes standard Windows COM port drivers to tap into RS-232 transmit signals for monitoring bi-directional communications between two devices.
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Product
SPICE circuits & model Debugger / Analyzer
SpiceVision PRO
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SpiceVision PRO takes the complex SPICE descriptions produced by many EDA tools and generates clean, easy-to-read transistorlevel schematics and circuit fragments, and design documentation to speed up debugging and project development.
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Product
Intel Atom® E3930 and Movidius™ Myriad™ X-Based Industrial AI Smart Camera Starter Kit
NEON-1000-MDX Series Kit
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- Integration of intel E3930 and Movidius Myraid X, image sensor and vision software suites, ready to deploy- All-in-one design minimizes cabling, footprint and maintenance- FPGA base DI/O for accurate real-time triggering- Validated and comprehensive accessories, saves effort on surveying and debug
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Product
Multipurpose Debug Board
DB40-HPC Debug Module
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The DB40-HPC Debug Card is designed for debugging of COM-HPC modules with FFC (FlexFoil Cable) debug connector. It includes an 80 port for Power on and Self-test (POST) via I2C interface, interface to SPI Flash for BIOS update, interface to EC for Embedded Controller (EC) update, Power and Reset buttons, and Status LEDs and Test Point for various debug tests.
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Product
Optical Probes- High Bandwidth
DPO7OE
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The DPO7OE series optical probes with a DPO70000 real-time scope deliver the performance and advanced debug capabilities designers need to fully troubleshoot 400G PAM4 signals, up to 56 GBaud, and reduce time to market.
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Product
Protocol Analyzer
RapidIO
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Sanifferr' s RapidIO architecture incorporates its protocol analyzer and traffic generator into the same hardware, making it an elegant and complete solution for debugging devices within a Serial RapidIO environment.
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Product
File Import Tool For Importing And Converting STIL, WGL, VCD/EVCD Vectors
DIOEasy-FIT
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Marvin Test Solutions' DIOEasy-FIT option offers test engineers a software tool set for importing and converting STIL, WGL, VDC/EVCD files to a Marvin Test Solutions' digital instrument file format. DIOEasy-FIT works in conjunction with Marvin Test Solutions' DIOEasy waveform display and editor software which provides an efficient tool set for developing, debugging, and executing digital test vectors for all MTS dynamic digital instruments.
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Product
Eclipse Test Development Environment
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The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Product
cRIO-9048, 1.30 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, -40 °C to 70 °C, Kintex-7 160T FPGA, 8-Slot CompactRIO Controller
785619-02
Embedded Controller
1.30 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, -40 °C to 70 °C, Kintex-7 160T FPGA, 8-Slot CompactRIO Controller - The cRIO-9048 is a rugged, high-performance, customizable embedded controller that offers Intel Atom dual-core processing, NI-DAQmx support, and an SD card slot for data-logging, embedded monitoring, and control. It includes a Kintex-7 160T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
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Product
High-Performance Intelligent Pod for Corelis Boundary-Scan Controllers
ScanTAP 4 & 8
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Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires equipment with high-performance specifications and extended features.Corelis ScanTAP pods are designed for use with PCI-1149.1/Turbo and PCIe-1149.1 high-speed JTAG controllers. Featuring 4 & 8 independent Test Access Ports (TAPs), up to 80 MHz clock rates, and advanced TAP capabilities such as analog voltage measurement, the ScanTAP family of intelligent pods is the ideal JTAG interface for high-performance environments.
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Product
LPDDR3 178-ball BGA Interposer For Logic Analyzers
W3301A
Interposer
The W3301A LPDDR3 rigid BGA interposer for LPDDR3 178-ball DRAM enables capture of simultaneous read and write traffic at data rates in excess of 1866 Mb/s. E5406A Soft Touch probes and U4201A cables connect the W3301A LPDDR3 BGA interposer into the U4164A logic analyzer module. The W3301A LPDDR3 178-ball rigid BGA interposer allows signal access to the LPDDR3 signals critical to your debug and validation effort through a U4164A logic analyzer. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DRAM using a LPDDR3 178-ball riser (included) or an optional 3rd party socket (not provided), enabling operation and acquisition of LPDDR3 signals.
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Product
Oscilloscope
2563-MSO
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The 2560 Digital Storage and Mixed Signal Oscilloscope (MSO) Series delivers advanced features and debug capabilities for a wide range of applications. With up to 300 MHz bandwidth in a 4-channel configuration, each model offers a maximum sample rate of 2 GSa/s, and a maximum memory depth of 140 Mpts. In addition, these oscilloscopes provide an 8” color display with 256 levels of color grading combined with a high waveform update rate up to 140,000 wfms/s, which allows the instruments to capture infrequent glitches with excellent signal fidelity.
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Product
Debugger
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Most cores for the embedded market provide access to on-chip debug features via a debug port. TRACE32 tools connect to this to control the core, access the data being processed by the core and provide developers with debugging over the embedded device: start, stop, step control; reading and writing memory and registers; setting breakpoints; tracking values of variables and so on. This means developers can diagnose software failures and memory corruption issues and correct the system to make it perform as expected.
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Product
WaveMaster Oscilloscope, 6 GHz Bandwidth, 4 Input Channels, 40 GS/s Max Sample Rate
WaveMaster 806Zi-B
Oscilloscope
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
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Product
LabVIEW Full Development System
System
LabVIEW is engineering software designed specifically for test, measurement, and control applications that require rapid access to hardware and data insights. The LabVIEW Full Development System is recommended to customize your engineering application with advanced inline analysis and control algorithms. For applications that require software engineering tools to develop, debug, and deploy professional applications, consider LabVIEW Professional Development System.
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Product
BMC Card
SOM-RM10
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ASPEED 7th Gen AST2600 BMC Card, OCP RunBMCv1.5 ASPEED 7th Gen AST2600 Server Management Processor. Up to 2GB DDR4 on-board, 128MB SPI flash on-board, 1GbE LAN for mainly connectivity & VGA 800x600 for easier on-site debug.
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Product
Program Development for Multisite Test
IG-XL
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Teradyne’s award winning IG-XL software transforms test program development for the FLEX, UltraFLEX and J750 family of testers. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.
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Product
COM Express Type 10 Development Baseboard
CEB94017
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*COM Express Type 10 baseboard*2 SATA-300 and SD card slot*1 PCI Express Mini Card slot*5 USB 2.0 and 2 USB 3.0*Port 80 display for debugging
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Product
Signal Generator
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Tektronix signal generators cover a wide range of applications, from replicating sensor signals to creating RF and the fastest high speed serial data signals. Each versatile signal generator can create a virtually unlimited number of signals - analog or digital, ideal or distorted, standard or custom. From the world's only direct synthesis of high-speed serial data waveforms for simplified receiver testing, to the world's most versatile arbitrary function generator for common stimulus signals, Tektronix has a signal generator to meet your debug challenge.
