Debugging
fixes identified bugs.
See Also: Debuggers, In-Circuit Debuggers, Code Debuggers, JTAG Debuggers, Source Debugers
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Product
Microelectronics Test & Engineering Services
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EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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Product
DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
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NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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Product
68 Pin Breakout Interface
VSI-Breakout-68
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The VSI-Breakout-68 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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Product
PCI/PCIe Bus Extenders
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Enables PCIe x16/x8/x4/x2/x1 boards to be rapidly tested, removed and swapped without having to reboot or power down the host system. Enabling rapid production testing and engineering debug, the hot insertion, current reporting, overcurrent indication and limiting and voltage margining capabilities make this board the highest performance PCI-e bus extender in the industry.
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Product
ESPI Analysis Application
TP601010
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First released by Intel in June 2013, the Enhanced Serial Peripheral Interface (“eSPI”) is designed as a replacement for the Low Pin Count (“LPC”) bus. eSPI supports communication between Embedded Controller (EC), Baseboard Management Controller (BMC), Super-I/O (SIO) and Port-80 debug cards. eSPI was available in the Sky Lake chipset (2015) and is available in the Kaby Lake [current] chipset. Cannonlake will support eSPI and is slated for release the second half of 2017. Icelake is scheduled for release in 2019 and it will mark the first chipset when eSPI becomes mandatory.
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Product
PCI Express 5.0 Transmitter Electrical Performance Validation and Compliance Software
D9050PCIC
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Use the PCIe 5.0 Tx compliance software to test, debug and characterize your PCIe Gen5 designs quickly and easily. It automatically configures the oscilloscope for each test and generates an informative HTML report upon test completion. The application compares the results with the specification test limit and includes margin analysis which indicates how closely the device passes or fails each test. With the option InfiniiSim Waveform Transformation Toolset, the software supports integrated de-embedding of the breakout channel of the test fixture.
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Product
Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
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Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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Product
JTAG (and IJTAG) Environment Tool Suite
SAJE
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SAJE is the SiliconAid Suite of JTAG related standards focused tools for chip development, verification, validation and patterns generation of ATE, Board, and System Test. Each tool can be used as a point tool by itself to compliment other tools in your flow. However, the SAJE Tool Suite used together in a flow can provide a total solution that also leveraging previous steps for debug and analysis.
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Product
Ultra Portable SuperSpeed USB Analyzer
Advisor T3
Analyzer
Teledyne LeCroy’s Advisor T3 is an ultra portable SuperSpeed USB analyzer that delivers market leading accuracy at an extraordinary price. Designed to put precision USB protocol test tools in the hands of every engineer, the Advisor includes all the essential features for SuperSpeed USB debug.
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Product
CoreCommander
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While many ICs are equipped with a JTAG (IEEE Std. 1149.1) boundary-scan register (BSR), a significant number of microprocessors and DSPs can be found with deficient or even non-existent BSRs. CoreCommander Micro uses the on-chip debug mode of processors to access ports and embedded peripheral controllers to promote ''kernel-centric'' testing. Similarly, in the case of today's Field Programmable Gate Arrays (FPGAs) test engineers can ''bridge'' from the JTAG interface to the resources of the gate array itself. Our CoreCommander FPGA product implements a translatorinterface that allows our JTAG hardware to control embedded IP cores via a variety of bus interfaces (e.g. Wishbone Avalon etc.).
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Product
Advanced Circuit Card Automated Test
ACCAT
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The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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Product
16 Channel 12C Relay Expansion
FXA-105 I2C Relay 16CH
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The FXA-105 provides sixteen I2C controlled relays. It is equipped with a wide range 7V to 24V power supply and based on a 16bit I2C Port Expander (PCA9535). To simplify debugging each channel is equipped with a status led. In addition, it is delivered with an installed DIN rail carrier.
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Product
SATA 3 Receiver Test Automation Software
N5991ST3A
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The N5991ST3A is the latest receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize SATA devices and hosts.
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Product
JTAG Probe
MAJIC
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MAJIC (Multi-Architecture JTAG Interface Controllers) JTAG Probes are small, stand-alone, processor-based systems that provide an intelligent connection between host-based development tools (the debugger) and an embedded processor via its standardized JTAG debug logic IP macrocell.
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Product
cRIO-9043, 1.30 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, -40 °C to 70 °C, Kintex-7 160T FPGA, 4-Slot CompactRIO Controller
785620-02
Embedded Controller
1.30 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, -40 °C to 70 °C, Kintex-7 160T FPGA, 4-Slot CompactRIO Controller - The cRIO-9043 is a rugged, high-performance, customizable embedded controller that offers Intel Atom dual-core processing, NI-DAQmx support, and an SD card slot for data-logging, embedded monitoring, and control. It includes a Kintex-7 160T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
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Product
Debug probe for ARM Cortex processors
USB Multilink ACP
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P&E’s USB Multilink ACP is a debug probe which allows a PC/laptop access to JTAG/SWD on ARM Cortex devices from several manufacturers (see complete list below). It connects between a USB port on a Windows machine and the standard debug connector on the target. The product photos to the left of this page show how the headers can be accessed by simply flipping open the plastic case. Ribbon cables suitable for a variety of architectures are included. By using the USB Multilink ACP, the user can take advantage of the debug mode to halt normal processor execution and use a PC to control the processor. The user can then directly control the target’s execution, read/write registers and memory values, debug code on the processor, and program internal or external FLASH memory devices.
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Product
Teradyne Software Solutions
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From design through production, whether developing and debugging code or performing characterization, Teradyne offers an array of seamless solutions that extend beyond our core software to reduce your engineering efforts and speed development.
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Product
Power PC 8641D Based Board
MS 2501
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Ethernet Port:4 Channel (1GBPS)CAN Port:1 ChannelMIL1553B:1 Channel (Dual redundancy)RS232:4 Channels (512 byte FIFO, 4MBPS)RS422:12 Channels (512 byte FIFO, 4MBPS)JTAG:Flash Programming and Debugging
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Product
MIPI M-PHY V5.0 Receiver Test Software (Frame Generator)
N5991MM5E
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Generate MIPI M-PHY 5.0 sequences and signaling at HS-GEAR5 and lower speeds, for debugging, troubleshooting, and conformance test purposes, using the N5991MM5E Frame Generator software, for the M8040A BERT platform.
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Product
SpaceWire Recorder
317
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The SpaceWire Recorder is designed to support the validation and debugging of complete SpaceWire systems. Using the advanced SpaceWire technology from STAR-Dundee Ltd and the very latest solid state data storage technology the SpaceWire Recorder offers exceptional SpaceWire recording capabilities.
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Product
Software Test Tool
testIDEA
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The basic premise behind the development of testIDEA was simple: if our development tools have access to the source code and binary code of an embedded application, and our debug hardware can access all of the internal workings of the microcontroller, surely we can simply test embedded software on the target microcontroller.
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Product
Test & Measurement Equipment And RF Components
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Is necessary for the design, test, manufacture, and debug of radio frequency devices.
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Product
I2C Bus Monitor - USB
Model JI-216
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The JI-216 I2C Bus Monitor is a low cost, easy-to-use PC hosted instrument specificallydesigned for troubleshooting and debugging I2C networks. The JI-216''s FPGA basedarchitecture provides for the capture and display of all valid or invalid messages and I2Cbus events. Captured I2C messages are available for display in two modes: real-timestreaming, or triggered. These modes provide optimized data display for either hardwareor software development. The SDA/SCL timing display aids in tracking down and solvinghardware timing problems. JI-216''s broad bandwidth (DC 3.4Mbits/s), wide input signalrange (0 15.0V), and variable signal filtering provides flexibility in monitoring a variety ofI2C bus systems. An intuitive Windows application manages instrument setup andcontrol. Communications and unit power is provided via a USB 2.0 link.
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Product
PCIe 6.0 Protocol Analyzer
P5570A
Protocol Analyzer
Keysight PCIe 6.0 Protocol Analyzer redefines protocol debugging and validation through a new innovative CEM card form factor, bringing vast improvement in signal integrity and equalization with instant link-up to systems as well as devices under test
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Product
Netlist Analyzer
GateVision
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GateVision PRO is the third generation of graphical netlist analyzers from Concept Engineering. Completely rewritten to run on modern 32/64bit platforms, GateVision PRO provides the designer of even the largest chips with intuitive design navigation, schematic viewing, logic cone extraction and interactive logic cone viewing for debug support and design documentation.
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Product
Test System
USB Explorer 280
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The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Product
Incident-based Abnormal Software Behavior Analysis Services
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If you have a software problem that no one can analyze, need training to get your developers, support and escalation engineers improve their troubleshooting, debugging, memory dump and software trace analysis skills or just need the expert opinion on an existing analysis report please don't hesitate to contact us.
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Product
Eclipse Test Development Environment
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The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Product
cRIO-9042, 1.60 GHz Quad-Core CPU, 4 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller
785622-01
Controller
1.60 GHz Quad-Core CPU, 4 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller - The cRIO-9042 is a rugged, high-performance, customizable embedded controller that offers Intel Atom quad-core processing, NI-DAQmx support, and an SD card slot for data-logging, embedded monitoring, and control. It includes a Kintex-7 70T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
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Product
Multiple Instrument Station
SYSTEM 8 MIS 4
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The Multiple Instrument Station MIS4 provides you with all the instruments required for the test and measurement of electronic components and PCBs. ABI's SYSTEM 8 MIS4, along with the Ultimate software, is a faster and more economical solution than using traditional oscilloscope, metering and other bench test instruments, and can quickly produce the required Pass/Fail or other test and debug results.
