Highly Accelerated Stress Screening
stress testing product to filter infant mortality. Also known as: HASS
See Also: HASS
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Highly Accelerated Stress Screening (HASS) Test
HASS consists of high and low temperature and 3 axis vibration testing performed either individually or in combination.Highly accelerated stress screening is a technique for identifying process flaws in equipment during production. HASS subjects equipment to overstress conditions but at a level which does not affect design life.For assistance in designing a HASS test program contact the laboratory.
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Environmental Stress Screening
ESS
Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of your product.
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HALT/HASS Testing
HALT HASS Chamber
AST applies stresses (such as temperature and vibration) to products well beyond its normal use environment. This type of testing is done to determine product operating and destruct limits. These stresses are applied as the product is functionally tested and continuously monitored for failures.Highly Accelerated Stress Testing (HALT) and Highly Accelerated Stress Screening (HASS) are two types of accelerated stress testing. These types of tests are commonly used to eliminate design problems, helping to develop a robust, mature product prior to market introduction. It can also be used to screen out infant mortality issues prior to shipment.
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High Accelerated Life Test Chamber
Guangdong Test EQ Equipment co., Ltd.
- Rapid Temperature Cycling: Achieves rates up to 100°C/min for accelerated stress screening hass.- Multi-Axis Vibration: Combines pneumatic (6-DOF) and electrodynamic vibration for multi-stress accelerated life testing halt simulations.- Precision Control: halt process ±0.5°C temperature uniformity and real-time monitoring.- Customizable Profiles: Supports stress levels user-defined stress protocols (step-stress, dwell times).- Durability: Robust construction with corrosion-resistant materials
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HALT HASS & AGREE Vibration Test Chambers
Weiss Technik series of HALT & HASS and AGREE Vibration test chambers provide combined testing for temperature, humidity and vibration for your testing applications.
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Missile Systems
IES Systems is a turnkey test system solution provider with proven experience in Acceptance Test Procedure (ATP) testing, Highly Accelerated Stress Screening (HASS) and Environmental Stress Screening (ESS) testing.
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Extremely Accelerated Stress Test Chambers
The extremely accelerated stress environment is defined by high temperature, high humidity and high pressure. WEIBER provides humidity resistance evaluation test for electronics components through customized Extremely Accelerated Stress Test Chamber. This chamber provides high performance test in minimal amount of time according to international IEC 60068-2-66 standard. This chamber also known as Accelerated Stress Test Chamber, Halt and Hass Test Chamber, Halt Test Chamber and Hass Test Chamber.This chamber reduces the time taken for humidity testing in electronic components. 2 types of tests saturated and unsaturated extremely accelerated stress test can be performed. In saturated test the temperature is maintained at 1210C at 100%RH, and for unsaturated temperature of 110, 120, 1300C is maintained at 85%RH. Normally for electronic components unsaturated type test is done.
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Test & Test Development for Circuit Card Assembly
Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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PXI FPGA & Measurement Accelerator
Keysight PXI FPGA & measurement accelerator provide digital-pre-distortion (DPD) and envelope tracking (ET) measurements that are embedded in high performance FPGA processing cards.
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PXIe Measurement Accelerator
M9451A
The M9451A PXIe Measurement Accelerator combined with Option DPD Digital Pre-Distortion & Envelope Tracking Gateware shows what is possible when you combine state of the art FPGA's with Keysight's trusted measurement expertise and PXIe's high speed data handling. As part of Keysight's RF PA/FEM Characterization & Test, Reference Solution, this combination provides unprecedented performance for demanding envelope tracking and digital pre-distortion measurements required for testing modern power amplifiers (PAs) and front-end modules (FEMs). Hardware acceleration provides better than 20x speed improvement over Keysight's previous host-based Reference Solution, with closed/open loop digital pre-distortion (DPD) and envelope tracking (ET) measurements taking just tens of milliseconds and overall measurement times less than 70 ms.
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Halt Hass Chambers
HALT and HASS chambers from WEIBER provide extreme temperature & vibration capabilities used during the product design and manufacturing cycles to compress the time normally required to identify design and process weaknesses. HALT techniques are important in uncovering many of the weak links inherent to the design and fabrication process of a new product. HASS techniques are incorporated during the production phase to find manufacturing process defects that could cause product failures in the field.
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Accelerated Stress Test Chamber
CSZ's accelerated stress test chambers combine mechanical refrigeration; LN2 cooling and high velocity air flow for fast product temperature change rates. Chambers are typically designed with a change rate up to 30C (54F) per minute based upon the part temperature. Common uses are production stress testing circuit boards, electronic drives, assemblies, etc. Design allows the user to quickly control and change the temperature of the product.
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Environmental Stress Screening (ESS) Chamber
ESS
Developed to help electronics manufacturers detect product defects and production flaws, Environmental Stress Screening (ESS) forces infancy product failures that would otherwise occur after final assembly and product delivery. ESS’s goal is to improve profitability by eliminating defective products. ESS Systems can meet individual performance needs, product loading, and throughput requirements. Thermotron has the experience to provide the best solution for ESS testing at your company.
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Environmental Stress Screening (ESS) Chamber
Guangdong Test EQ Equipment co., Ltd.
- Integral structure, the inner wall special process rolling molding, the whole using TIG seamless welding, beautiful appearance; Door lock device adopts lever power opening mechanism.- The use of Chinese+English color LCD touch man-machine interface + high-performance programmable controller (PLC), with TESTEQ test box special software, with automatic, intelligent, human control and other characteristics.- Control mode: constant operation mode, program operation mode.- Patented "Cold and heat balance technology”, low temperature constant temperature season can be more than 30%.- Refrigeration compressor and key accessories are selected international and domestic well-known brands, long-term and reliable operation; Environmentally friendly refrigerant, in line with the requirements of international environmental protection conventions.- Configure RJ45 communication interface, remote control system (open data transmission protocol support Modbus/OPC).- Surface electrostatic powder spraying; Box color "TESTEQ White ", controller panel color "TESTEQ Blue ".- TESTEQ patent cold well adsorption anti-condensation function (optional).
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Highly Accelerated Life Testing (HALT)
Quickly validate reliability and identify manufacturing defects that could cause product failures in the field with MET’s Highly Accelerated Life Test (HALT)HALT technique uses a combination of accelerated stresses to expose product flaws early in the design and manufacturing stages, which improves product reliability and customer confidence inherent to the design and fabrication process of a new product as well as during the production phase to find manufacturing defects that could cause product failures in the field.
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Stress Hysteresis Measurement
500 Series
Stress Hysteresis Measurement up to 500C for thermal property and stability tests of thin films in air.Non-Contact Laser Scanning Technology.
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Backgrinding & Stress Relief
Grinding and Dicing Services, Inc.
GDSI delivers complete backgrinding solutions to the semiconductor, MEMS and biomedical industries. Backgrinding is a necessary process step to reduce wafer thickness prior to dicing and final assembly. By utilizing fully automated grinders staffed by highly qualified engineers, GDSI’s grinding procedures produce unsurpassed precision and repeatability.
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Acceleration (Centrifuge) Testing
Environment Associates provides centrifuge equipment for acceleration testing. Our acceleration testing equipment measures 3 ft. (0.91 m) and a 6 ft. (1.82 m) lengths that provides constant accelerations of 50 Gs and can handle payloads of 20 lbs. to 50 lbs. The Acceleration Testing is also called G-Force Testing
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Stress Testing System
Load Dynamix
LoadDynamix (former Swifttest) is famous for its IP based converged storage system stress testing, including iSCSI, SMB/CIFS, NFS, FC and HTTP/HTTPS based storage systems. Its GUI interface is very easy to use and allow customer engineer to fully configure all the parameters at the protcol layer. Nearlly all the major IP storage system manufacturers have LoadDynamix products in their test lab.
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Touch Screen Controller
EZT-430i/570S
The EZT-430i/570S Touch Screen Controller provides users a choice to operate the controller like a smartphone or using window-based navigation. The controller comes standard with data logging, data file access via memory stick or PC, Ethernet control and monitoring, alarm notification via email or phone text message, data file backup, full system security, and may be configured in 28 different languages.
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Highly Sensitive Silica Monitor
SLIA-300
Highly sensitive silica monitor for ultrapure water management in semiconductor/FPD processes
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Burn-in and Stress Screening Chambers
KDR
Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a walk-in chamber.
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Highly Shielded Phase Stable Assemblies
PhaseMaster® Enhanced
Does your application require cable assemblies offering some combination of phase stability and low loss, significant shielding effectiveness and increased durability?Consider Phase Master® 190E as your design-in option.Compared to similar phase stable cables, the Phase Master® 190E’s enhanced, multilayer shield construction yields:- A high level of phase stability vs. temperature- Reduced insertion loss & increased amplitude stability - Increased shielding effectiveness (120 dB @ 1 GHz, min)- Increased mechanical durability, especially torsion resistanceGreater connector retention (>40 lbs straight pull with SMA connectors)
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Structural & Stress Analysis
Structural analysis is critical because it can determine cause and predict failure – evaluating whether or not a specific structural design will be able to withstand the external and internal stresses and forces expected for the design.
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SKYvec: Accelerates Software Development
The SKYvec software development tools simplify code development for large multiprocessor systems by automating many of the processes which otherwise would have to be designed or managed by the programmer.
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UV Accelerated Weathering Tester
TF424
TESTEX Testing Equipment Systems Ltd.
UV Accelerated Weathering Tester, age tester, to simulate the testing environment of sunlight, rain, and dew to reproduce the effect of sunlight with fluorescent ultraviolet lamps, providing rain and dew with condensing humidity. The aging of the specimens is accelerated by exposing the samples to alternating cycles of light and moisture at a certain temperature.
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Accelerated Product Life Cycle
Delserro Engineering Solutions
Under normal conditions it may take years to gather failure data on the life cycle of new products. Through accelerated life testing the overall time to failure can be reduced to weeks by increasing the frequency of the field loads and by removing insignificant stress components. In addition, life cycle testing on a product can be reduced or accelerated dramatically by increasing the stress levels to higher than normal. Putting a product through Accelerated Life Testing can reduce test time from weeks to days while still achieving satisfactory results saving both time and money.
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Parts Screening And Testing
DPA Components International performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability Commercial, Industrial, Space, and U.S. Military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications.
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Heat Stress
Our lineup of heat stress meters include the WBGT (Wet Bulb Globe Temperature) meters, which provides the most accurate determination of the heat stress index based on the cumulative effect of air temperature, air movement, relative humidity, and radiant heat.
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GS1 Acceleration Sensor
AGS11151
Panasonic Industrial Devices Sales Company of America
GS1 Acceleration Sensor





























