Operation Support System
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Product
Multi-site Module Testing System
TCIII-3200ST
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TurboCATS introduces a new line of redesigned TCIII-3200ST DDR4 and DDR3 multi-site module testing system - compact, high-performance, and equiped with enhanced productivity features. The TurboCATS TCIII-3200ST module test system features an optional 8, 16 or 64 module testing, in parallel, for high throughput on your production floor.
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Product
Measurement Microphone System
MK224SYS
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The MK224SYS Type 1 measurement microphone system offers a cost effective option to acoustic measurements. Perfomance: 8 Hz to 18 kHz response, 50 mV/Pa sensitivity and a "A" weighted noise floor less than 14 dBA.
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Product
Radiation And Process Monitoring Systems
ProTK
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Monitoring of the main steam line for leakages in a PWR nuclear power plant with a wide-range gamma ionization chamber.
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Product
Test System Mainframe
ITC59000
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The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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Product
Hydrogen Penetration Monitoring System
MS3112
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The Hydrogen Penetration Monitoring System™ provides a method for directly measuring the rate of hydrogen migration through a vessel or pipe wall. This method actually measures the penetration current set up by the hydrogen as it moves through the steel. By sensing and recording this data directly from the pipe wall, this system offers valuable data which can only be indirectly inferred by other methods.
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Product
Combined System Controller Software
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Designed and manufactured by Crystal Instruments, the Spider-101i controller is a key element of the Sentek Dynamics THV Series AGREE (Department of Defense Advisor Group on Reliability of Electronic Equipment) chambers.
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Product
Optical Coherence Tomography (OCT) systems
dOCTor™
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dOCTor™ Optical Coherence Tomography (OCT) systemsoffer very high quality non-invasive tissue imaging in 2D and 3D. They are ideal for: In-Vivo Imaging Small Animal Imaging Tissue Engineering and Visualization Developmental BiologydOCTor systems are available in Swept-Source(SS) OCT and Time-Domain (TD) OCT configurations to satisfy different application imaging needs.
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Product
MSF systems
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Meinberg Funkuhren GmbH & Co. KG
DCF77 / WWVB / MSF systems: DCF77, WWVB and MSF time signal receiver, DCF77 generators, DCF77 simulation
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Product
ECHO VS System with Image Enhancement
Echo VS
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The ECHO VS system adds our Image Enhancement Suite to the ECHO platform to provide industry-leading image quality and defect identification capabilities. It’s our most accurate ultrasonic NDT equipment for development labs and for production environments that require the highest precision. The Echo system can be fitted with an optional chuck for manual wafer inspection.
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Product
Medium Enterprise Environment Monitoring System
ENVIROMUX-5D
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The ENVIROMUX-5D supports 5 external configurable sensors, 5 digital inputs, 2 output relays for control of external devices. The system also includes two internal sensors: temperature and humidity. It features 4 USB ports for USB modem, USB flash drive, or USB LCD screen. Linux inside.
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Product
Automated System for DMA+ Series
Xpander
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METRAVIB Xpander is a unique cost-effective solution to address the increasing throughput requirement of testing laboratories. Xpander is an automated specimen handling system dedicated to the DMA+ series Dynamic Mechanical Analyzers.
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Product
System Management
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Renesas CPU supervisors combine popular functions such as power-on reset control, watchdog timer, supply voltage supervision, and block lock protect serial EEPROM memory in one package, lowering system cost, reducing board space requirements and increasing reliability.
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Product
Mixed Signal Test Systems
MTS1020i
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The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Product
ESD & Latch-Up Test System
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Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Product
High-Volt Storage Battery ClusterTest System
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Shenzhen Sinexcel RE Equipment CO., Ltd
1700VPACK test equipment adopts sinexcel advanced high frequency isolation solution, small size, high efficiency, low heat dissipation, flexible configuration, the detection process supports multi-gear switching; The equipment CAN be widely used in ESS system detection, ultra-high voltage EV PACK battery and other fields, and can also integrate a variety of communication protocols such as temperature box, water cooler, mainstream CAN CANFD 485, and support a variety of practical and innovative functions such as one-click automatic data export to meet all aspects of PACK battery electrical performance testing.
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Product
Vapour Permeability Measurement System
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Mass Spectrometer vapour permeability measurement system which works across every gas or group of gasses used in modern engineering. This is important as vapour permeability issues effect many performance and safety critical aspects across the engineering industries.
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Product
Battery System Analyser 24V Language
BSA24L
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The Battery System Analyser 24V Language (BSA24L) is a unique version of battery analysing device that comes with a text, black/white display and has a multi-language option making battery manufactures and distributors easy to sell and distribute worldwide. It has 4 functions: Battery, Starter, Alternator & Grounding tests on 12V system and 24V system on Starters and Alternators (Normal and Smart)
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Product
PD Test Systems
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1. Number of channels: 2/4 electric signal interfaces & 1 EXT interface 2. Sampling frequency: maximum 200MGa/s 3. Sampling precision: 12bit 4. Range: 0.1mV~20V 5. Range switch: 1mV, 2mV, 5mV, 10mV, 20mV, 50mV, 100mV, 200mV, 500mV, 1V, 2V, 5V 6. Frequency band range: 1Hz-60MHz 7. Range non-linear error: 5% 8. Range of capacitance for test object: 6pF~250µF 9. Power source mode: internal lithium cell / AC 220V 10. Display: 6.5 inches TFT LCD 11. Resolution: 640×480 12. PV: 4GB 13. Hard disk: 32G stiff disk used for storing the test data
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Product
Photovoltaic System Bypass Diode Tester
FT4310
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Hioki is pleased to announce the launch of the Bypass Diode Tester FT4310 for Photovoltaic Systems. The FT4310, which is designed to test bypass diodes in strings of crystalline photovoltaic cells, can be used to detect open and short-circuit faults in bypass diodes by string either in daylight or at night. The instrument is the first portable device capable of detecting bypass diode open faults in operating panels (without requiring the panels to be shielded from sunlight).
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Product
Electrolyzer Test Systems
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Advanced Test System for Research & Development of PEM Electrolyzers
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Product
Ground-Fault Products for Solidly Grounded Systems
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Ground-fault products are used to monitor grounded systems (ungrounded and grounded) for fault currents or residual currents. The sum of all conductors except the protective earth conductor is measured by means of measuring current transformers.In general, ground-fault monitors (RCM - residual current monitors) are used to send a message to the user even before reaching the shutdown threshold of the GFCI. Ground-fault monitors detect deteriorations of the insulation level at an early stage and in a reliable way.
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Product
Intelligent Power System Recorder
iPSR
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The iPSR™ is a 48 channel recorder (16 analog and 32 digital inputs) designed to intelligently record power system data. “Intelligently” does not mean compression. “Intelligently” means providing summary data allowing a quick identification of abnormalities combined with a fast download of the relevant data.
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Product
Probe Systems
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We offer a complete line of premium performance analytical probe stations for precise device test and measurement directly on wafer.
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Product
Standard Lifetime Measurement System
Filter-Based Systems
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*Excitation by bh ps Diode Lasers (BDS-SM or BDL-SMN Series)*Optional: fs Fiber Laser*Wavelength Selection by Filters*Detection by bh HPM-100 Hybrid Detectors*Excellent Dynamic Range*Ultra-High Time Resolution*IRF Width Down to 40 ps FWHM with HPM-100-06/07*Low Cost Detector Option: PMC-150 PMT Modules
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Product
Digital Attenuator Operating Frequency of 1 to 20 GHz
LDA Series
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The LDA series of Lab Brick® RF and Microwave Programmable Digital Attenuators includes 50 Ohm and 75 Ohm bidirectional RF step attenuators with calibrated operation up to 20 GHz. These USB powered and controlled units require no additional DC supply voltage. They are easily programmable for fixed attenuation or swept attenuation ramps directly from the included GUI. Lab Brick Digital Attenuator API DLL, Linux drivers and LabVIEW-compatible drivers are also available for custom programming applications.
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Product
Semiconductor ATE Systems
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Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.
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Product
Facility & Asset Management System
Insight
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Today’s environment confronts lab managers in new, challenging ways. The current regulations demand increasingly complex test procedures that require more time and resources to execute, which counteracts the goals to improve productivity and reduce costs. Therefore, lab managers need to maximize the test cell availability by continual awareness of the current situation in their facility. They must ensure the equipment is fully functional, meets all mandatory quality standards and regulations, and is up to date with all service and maintenance requirements.
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Product
Data Acquisition System - 3U 5-Slot
DAQ-35CP0G
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is a preconfigured rugged system ideally suited to support a multitude of military/aerospace data acquisition applications that require "SBC-less" remote Gig-E command and control of high-density, multichannel programmable ARINC 429/575; Dual-Redundant, Quad Channel MIL-STD-1553B; CANBus (CAN 2.0 A&B or J1939); A/D Conversion; RTD Measurement; RS-232/422/485 Serial Communications; Thermocouple Measurement; Discrete I/O; Differential Transceiver and Dual-Port Gig-E Ethernet.
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Product
Metrology System
IMPULSE V
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With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.
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Product
Functional Test Systems
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With extensive experience in functional test equipment, a world-wide service and support organization, and a broad range of software/hardware options, we will supply cost-effective production-ready test solutions to meet your test challenges. Proposals developed by our functional test engineering team include a detailed description of system requirements, test instrumentation, estimated test cycle times (as applicable), footprint, and other key specifications.
