Current Transformer Test Set
See Also: Transformer Test, Transformer Testers, Current Transformer Test
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Product
20 Amp Current Transformer Burden Test Set
1044A
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Due to overwhelming demand, TESCO is pleased to re-introduce the 1044A 20 Amp Current Transformer Burden Test Set. This light weight, hand held unit is a simple and inexpensive means whereby a current transformer installation may be quickly checked for many sources of trouble. The 1044A provides utilities a less expensive and more traditional option for checking larger services for potential meter circuit related issues.
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Product
Current Transformer Field Test Set
1043
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The Catalog 1043 Current Transformer Field Test Set is a simple and inexpensive means whereby a current transformer installation may be quickly checked for many sources of trouble. The tests are made without interrupting the Customer's service and while the load is on.
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Product
Transformer Testing Equipment
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Offering you a complete choice of products which include Automatic Transformer Turns Ratio Instruments (ATRI- 3), Automatic Transformer Turns Ratio Instrument (ATRI-201), VTRI-2000 ( Transformer turns ratio instrument ), Current Transformer Test Set (CTC-1), Potential Transformer Tester ( PT Tester ) and Current Transformer Tester ( CT Tester ).
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Product
Primary Current Injection Test Set
T 2000
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T 2000 is a portable current transformer test set which allows to perform many different measurements such as saturation, ratio and polarity tests and CT winding resistance test. Substation maintenance and commissioning test equipment, T 2000 is extremely appreciated by electrical engineers for its high accuracy and portability.
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Product
Current Transformer Test Set
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Vanguard Instruments Company, Inc.
The EZCT-2000C is Vanguard’s third-generation microprocessor-based current transformer test set. Designed specifically for CT testing, the EZCT-2000C has the following outstanding features that can greatly increase productivity and save time during the commissioning stage:
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Product
NI-9265, 4-Channel C Series Current Output Module
779334-02
Current Output Module
4-Channel C Series Current Output Module - The NI‑9265 is ideal for interfacing and controlling industrial current-driven actuators at high rates. The module has built-in open-loop detection, which generates an interrupt in software when an open loop is detected as well as zeroing outputs to ensure safety and avoid driving actuators at system power on. The NI‑9265 requires an external power supply and includes a channel‑to‑earth ground double isolation barrier for safety and noise immunity.
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Product
AC / DC Current Probe, 100 KHz, 100 A
1146B
High Current Probe
The Keysight 1146B AC / DC probe provides accurate display and measurement of currents up to 100 A DC or peak AC / DC to 100 kHz without breaking the circuit. The 1146B AC / DC probe has hall-effect sensor technology to measure AC and DC signals. It is compatible with any Keysight oscilloscope with 0.2 to 0.5 V / div sensitivity and 1 MΩ BNC input.
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Product
Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
NI-9265, 4-Channel C Series Current Output Module
783733-01
Current Output Module
4-Channel C Series Current Output Module - The NI‑9265 is ideal for interfacing and controlling industrial current-driven actuators at high rates. The module has built-in open-loop detection, which generates an interrupt in software when an open loop is detected as well as zeroing outputs to ensure safety and avoid driving actuators at system power on. The NI‑9265 requires an external power supply and includes a channel‑to‑earth ground double isolation barrier for safety and noise immunity.
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Product
Scienlab Combined Battery Test Solution
SL1133A
test
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
NI-9246, 50 kS/s/ch, 20 Arms, 30 Apk, 24-Bit, 3-Channel C Series Current Input Module
783920-01
Current Input Module
50 kS/s/ch, 20 Arms, 30 Apk, 24-Bit, 3-Channel C Series Current Input Module - The NI‑9246 is designed to support direct ring lug connectivity to the three-phase high-current measurements of 1 A and 5 A current transformers (CTs). It is optimized for power, energy, and industrial applications. The safety features, certifications, input ranges, overvoltage ranges, and connectivity are well suited for applications such as power quality monitoring and metering, utility pole-mounted smart switches, utility pole-mounted smart grid reclosers, substation merging units, industrial machine measurements, health monitoring, predictive maintenance and prognostics, and phasor measurement units (PMUs).
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
C Series Voltage And Current Input Module
Current Input Module
The C Series Voltage and Current Input Module features up to 16 input channels with built-in noise rejection. You can use this module to combine the two most common inputs to reduce the overall number of modules you need in your measurement system.The C Series Voltage and Current Input Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Product
Standard - 1.44 (41.00) - 4.50 (128.00) High Current Probe
HCP-13P
High Current Probe
Current Rating (Amps): 15Average Probe Resistance (mOhm): 25Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 250,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
sbRIO-9227, Non-Enclosed, 50 kS/s/ch, 5 Arms, 24-Bit, 4-Channel C Series Current Input Module
781118-01
Current Input Module
Non-Enclosed, 50 kS/s/ch, 5 Arms, 24-Bit, 4-Channel C Series Current Input Module - The sbRIO‑9227 was designed to provide high-accuracy measurements to meet the demands of data acquisition and control applications. It includes built-in anti-aliasing filters. When used with a C Series Voltage Input Module, the sbRIO‑9227 can measure power and energy consumption for applications such as appliance and electronic device test. You can not only measure and meter current and power but also look at quality factors such as noise, frequency, and harmonics. Non-enclosed modules are designed for OEM applications.
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Product
Rogowski AC Current Probe,30 MHz, 300 A
N7042A
High Current Probe
The Keysight N7042A Rogowski coil current probe measures AC currents up to 300 A, with bandwidth ranging from 9.2 Hz to 30 MHz. The probe has a thin, lightweight, flexible, and simple-to-use clip-around Rogowski coil that enables current measurement in the most difficult-to-reach parts and confined spaces of a circuit under test. It can also measure large AC current without an increase in transducer size.
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Product
ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
Test Module
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
High-Voltage Differential Probe, 25 MHz
N2791A
High Current Probe
Use the N2791A 25-MHz low-cost high-voltage differential probe to make safe and accurate floating measurements with an oscilloscope. The N2791A differential probe allows conventional earth-grounded Keysight oscilloscopes to be used for floating signal measurements of up to 700 V of differential voltage and common mode voltage.
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Product
EOL/Functional Testing
Functional Test
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Brute High Current Probe
P4301-1Z
High Current Probe
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
