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Product
iSocketTM - High Power DUT - HTOL System
8000 Series
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iSocketTM Technology Open Rack-Room Temperature (RTBI) non chamber design High Power DUT Capability – 0-65W Individual DUT Temperature Measurement & Control DUT Monitoring with Auto shut down 28 BIB capacity – 14 trays 2 BIB’s per tray Multi DUT type HTOL Testing Remote System & HTOL Monitoring – Customer access via VPN
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Product
P-Series Dual Channel Power Meter
N1912A
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30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
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Product
Power/Voltage Rail Probe. 4 GHz Bandwidth, 1.2x Attenuation, +/-30V Offset, +/-800mV
RP4030
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The Teledyne LeCroy RP4030 Power Rail Probe meets the specific requirements of those who need to acquire a low-voltage DC signal as part of a:-Comprehensive power integrity, digital power management IC (PMIC), voltage regulator module (VMR), point-of-load (POL) switching regulator, or low-dropout regulator testing- Complete embedded power management system that includes PMICs, VRMs, POLs, and LDOsThe RP4030 will faithfully acquire a low-impedance, low-voltage DC power/voltage rail signal without unduly loading the device under test (DUT), while providing high offset to allow DC power/voltage rail signal display on an oscilloscope with high gain.
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Product
Electrical Safety Testers- Hipots
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Safety testers (also named hi-pot tester/hipot tester/hipot test) are designed to ensure safe operation of DUTs under various operating conditions and environment.GW Instek’s GPT-9900/GPT-9800/9600 series safety testers(hipot test) provide safe and quick measurement tools for AC/DC withstanding voltage tests, insulation resistance tests, and AC ground bond tests. Those tests are required by many international safety regulations such as CE, UL, VDE, and etc. We also have leakage current tester, GLC-9000, which supports all the major leakage current test standards for medical and general electronic equipment.
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Product
End of Line Test System for Automotive Seats
AS519
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AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
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Product
BERT Measurement Solutions
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Bit error rate testers (BERTs) are usually the initial step for communications testing. These instruments generate digital test patterns, typically pseudorandom binary sequences (PRBSs), that drive devices under test (DUTs). Following the transmission of the signal through the link, the receiver in the BERT captures the signal. This setup can be used for multiple testing purposes, such as to evaluate the performance of a transmitter, a receiver, or an optical link.
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Product
Flex Test Fixtures
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FTFs are test fixtures which are dedicated for testing flex-based components and assemblies such as displays, touch panels and more. A weak spot in a typical functional test system is the method to connect DUT flexible cable to a circuit board where the simple method of attaching the flex directly with an ZIF or LIF connector fails.
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Product
Burn-in System
Sonoma
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High power burn-in system with advanced testing functionality at DUT level for substantially lower cost and high performance using State-of-the-Art technology
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Product
Power Supplies
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AC and DC power supplies are used for providing the power required for energising the trip and close coils of the breaker and for running the spring charging motor. The appropriate AC or DC configuration of the power supplies can be selected, depending on the DUT specifications of the manufacturer. Dual-mode AC/DC power supplies capable of providing AC and DC outputs from the same power supply are also available, if required by the user.
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Product
Low Noise Test Leads For N1413 With B2980 Series, 1.5m
N1425A
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The N1425A is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425A is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425A enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425A to the B2985B/87B.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
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The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Cryogenic 4K Probe Cards
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Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Product
1μΩ-4kΩ AC Milliohmmeter Low Resistance Tester
TH2521
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Shenzhen Chuangxin Instruments Co., Ltd.
TH2521 AC Milliohmmeter is a high-performance and intelligent tester widely used to test contact resistance, internal resistance and battery voltage. The application of constant current source with 1kHz frequency can greatly eliminate the potential error caused by thermoelectricity on DUT. This meter has the function to automatically detect contact failures on test cable. At the range of 30mΩ, basic R resolution can reach 1μΩ. It is applicable for transformer, inductance coil copper resistance, relay contact resistance, switch, connector contact resistance, wire resistance, PCB line and via reistance dan metal defect detection, etc. In the mean time, signals, such as HIGH, LOW, PASS, can be output through HANDLER interface, thus it is very convenient to be used in automatic production line.
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Product
Semiconductor Memory Tester
T5851
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Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Product
Test Probes
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A physical device used to connect electronic test equipment to a device under test (DUT).
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Product
Impedance Analyzers
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A/D converted input signals undergo discrete Fourier transform (DFT) to calculate complex impedance values and obtain parameters and characteristics specific to the DUT, such as its capacitance, inductance and quality factor. Original NF algorithms are also applied to allow equivalent circuits made up of R, L and C along with the constants for those circuits to be estimated from the complex impedance spectrum obtained by sweeping the frequencies.
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Product
DC Power Module, 8V, 12.5A, 100W
N6742B
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The Keysight N6742B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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Product
Exchangeable Cassette Kit for 6TL36 Faraday Chamber
AN134
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Exchangeable plates for RF applications. (Use with RF Kit, P/N AN133)).DUT maximum dimensions: 340 x 350mm
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Product
Four Channel Relay Board for Power Supply Isolation
FXA-113 PSU Relay 4CH
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The FXA-113 is a four-channel relay board designed as an output disconnect option for laboratory power supplies. Especially in ICT applications it’s important, that the power supply is completely isolated from the DUT during measurements. Therefor each channel features two high current relays for the power path and two reed relays for the sense path. All four channels are equipped with a status led and can be switched independently. In addition, it is delivered with an installed DIN rail carrier.
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Product
Automated Test Interface
ATI-100
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Matrix Test Equipment Incorporated
Now, with our ?New? Model ATI-100 you can turn your existing Matrix Signal Generator and Switchable Filter Bank into a full-blown DTS (Distortion Test System). Plug and play is the word, just plug in your Multiple Frequency Signal Generator, Switchable Filter Bank, Spectrum Analyzer, Oscilloscope, Power Meter, Frequency Counter, etc. to allow the following automatic testing with a single insertion of DUT (device under test
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Product
Phase Noise Tester 5MHz to 40GHz
Model 7340
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Berkeley Nucleonics Corporation
Broad Frequency Range in a single compact instrument from 5MHz to 40GHz. Measurement offsets from .01Hz to 100MHz. Absolute Phase Noise - High Drift mode (ability to measure modulations, high drifting or unstable DUTs, etc.). AM (Absolute Amplitude Noise) measurements. Pulsed Measurement Capabilities. Transient Mode: measure WB Frequency, NB Frequency, NB Phase, NB Power (WB/NB being Wide Band and Narrow Band). Dual channel low-noise integrated power supplies.
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Product
Network Analyzer Test Setup Assistant (NTSA)
S94605B
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Spreadsheet-based measurement configuration assistant aides users in setting up and calibrating complex measurements for a multiport DUT with a VNA based system
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Product
Functional Test
UTS
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The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
Load Simulator
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The load system is intended for testing satellite power supply systems; due to the integration with a solar array simulator and a battery simulator, it can perform validation and commissioning of satellite power supplies. The system is equipped with regenerative electronic loads and customer-specific high-power switching matrices for routing the DUT channels to the relevant loads. The individual voltages and currents for each channel can be read back via a Keysight Technologies switch mainframe.The system is equipped with high electrical power; its loads are capable of feeding the energy back into the power grid.
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Product
Hand Held Test Fixtures
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Manual, or semi-automated mechanical devices designed to secure a Device Under Test (DUT) and provide a stable interface for electrical testing, inspection, or programming.
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Product
Regenerative Power System 1000 V, ±90 A, 30 KW, 400/480 VAC
RP7982A
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The RP7982A regenerative power system is a single output, bi-directional, regenerative DC power supply with safety features to protect your people and your DUT.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Vibration Testing
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Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Product
Pulse Pattern Generator, 3.35 GHz, single channel
81133A
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The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Product
PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
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PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
