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Product
Wireless Measurement System for ETSI & FCC Devices for ISM Bands
TS8997
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The R&S®OSP-B157W8 PLUS 7.5 GHz module with up to eight channels is the core of the system and uses a printed RF switch board in solid-state relay (SSR) architecture. It allows flexible operation of the connected DUT (up to eight ports) for power measurements, signal conditioning via the integrated attenuators, couplers and combiners, RF switching to the measuring instruments in combination with the R&S®OSP-B157WX up to 40 GHz and is controlled by R&S®WMS32 software.
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Product
IOL & Power Cycling Test Systems
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Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
32Ch Isolated Input Card
SET-1310
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This card provides 32 optically isolated digital inputs. SET-1310 combines high-density IO with high isolation voltages and a wide input voltage range. It allows to break ground loops and protect your system from high-voltage spikes, but also to connect high voltage signals to standard logic level acquisition devices. The channel-to-channel isolation allows to connect signals from different DUTs to a single acquisition system without compromises.
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Product
LED Burn-In Test
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Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 channels with a sampling rate of <1s. Additionally, the software and system also support digital I/O channels, e. g. for controlling the climatic chamber. Inputs for connecting temperature sensors are also provided.
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Product
Spring Probes
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An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Product
AC Ground Bond Testers
440 Series
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The 440 Series provides advanced 4-in-1 test capability in a convenient one-box solution. This new series performs AC Hipot (448 - 500 VA), DC Hipot, Insulation Resistance and 40A AC Ground Bond tests while taking up minimal production line space. The 440 Series is simple and easy-to-use; reducing setup time and increasing production line throughput for your application. With multiple memories and an optional USB port for remote BUS communication so you can quickly perform tests on a variety of DUTs from the front panel or with a PC. Learn about our 5 Year Warranty.
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Product
Dial Strain Gauge
DRK8093
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Shandong Drick Instruments Co., Ltd.
This stress (birefringence) sources are due to uneven cooling or external causes such as mechanical action, which directly affect the optical glass, glass products, quality transparent plastic products. Therefore, stress control is optical glass, glass products, plastic products, such as transparency in the production process extremely important part. The strain gauge can be qualitatively or quantitatively by observing stress to identify products (DUT) quality, are widely used in optical glass, glass, transparent plastics industry for fast, a lot of testing. In fact, it can not be solved by math the complex problems.
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Product
Functional Test
xUTS
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Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Qualification Hardware & Sockets
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Reltech Limited holds over 35 years’ experience in the design and manufacture of all types of qualification test hardware. Our advanced technology products include: HTOL Boards (Mother and Daughter cards) Burn-In Boards HAST Boards THB (humidity) Boards Burn-In Modules and frames Dynamic Driver cards (Digital, Analogue and Mixed signal) Back Planes Voltage regulator cards Custom electro-mechanical assemblies DUT Cassettes and test Fixtures
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Product
Cryogenic Applications
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Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
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The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
Network Analyzer Test Setup Assistant (NTSA)
S94605B
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Spreadsheet-based measurement configuration assistant aides users in setting up and calibrating complex measurements for a multiport DUT with a VNA based system
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Product
PXI Programmable Power Supply
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PXI Programmable Power Supply modules feature multiplechannels that you can combine for higher voltage or current capabilities. Some modules include isolatedchannels and an output disconnect functionality that allows isolation from the device under test(DUT) when not in use and remote sense to correct for losses in system wiring. You can use these models to simplify the task of designing automated test systems for a wide range of applicationsfrom aerospace and defense to automotive and component testby eliminating the need to mix multiple instrumentation form factors in a given test system.
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Product
Virtual tester
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Emulate tester patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test programs. Reads the actual ATE program and creates a Verilog /VHDL simulation test bench.
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Product
RF Test Enclosure Ideal For High-volume Repeatable Testing, ≥90 DB Isolation, 300 MHz - 18 GHz
dbGUARD
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The dbGUARD provides up to 90 dB isolation from 300 MHz to 18 GHz. The IASG (Inverted Asymmetric Squarewave Gasket) design eliminates any leakage along the perimeter of the RF enclosure. This makes the dbGUARD conducive to testing all wireless technologies including 5G/LTE, Wi-Fi, Bluetooth, ZigBee, WiMAX, etc. The interior cavity is finished with a next-generation RF absorptive coating similar to what is found in stealth technology. This allows for positioning the DUT in the shielded box without affecting attenuation caused by reflections.
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Product
Shock Testing
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Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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Product
Load Simulator
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The load system is intended for testing satellite power supply systems; due to the integration with a solar array simulator and a battery simulator, it can perform validation and commissioning of satellite power supplies. The system is equipped with regenerative electronic loads and customer-specific high-power switching matrices for routing the DUT channels to the relevant loads. The individual voltages and currents for each channel can be read back via a Keysight Technologies switch mainframe.The system is equipped with high electrical power; its loads are capable of feeding the energy back into the power grid.
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Product
200 Vdc External Voltage Bias Fixture
16065A
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Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
Low Noise Test Leads For N1413 With B2980 Series, 1.5m
N1425A
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The N1425A is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425A is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425A enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425A to the B2985B/87B.
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Product
Multi-Channel Attenuation Control Unit (5-channels), DC to 6 GHz, 0 to 121 dB, 1 dB Step
J7205A
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The J7205A is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to5 devices under test (DUT). Operating frequency from DC to 6 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205A reduces cost of ownership and provide the best measurement accuracy.
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Product
RF Shield Box
CMW-Z10
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The R&S®CMW-Z10 has excellent shielding effectiveness and superior coupling characteristics.The shield box can be used for frequencies up to 6 GHz.The antenna structure is optimized to enable excellent radio connections between the DUT and tester.The highly broadband spiral antenna allows a wide variety of applications.These outstanding features combined with modular options make the RF shield box indispensable for any radiocommunications tester.
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Product
Transformer Turns Ratio Meter
TTRM 101
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SCOPE introduces state of the art precision single phase Transformer Turns Ratio Meter (TTRM ) designed for field testing as well as factory testing of power transformers, instrument transformers and distribution transformers of all types. TTRM 101 measures only turns ratio where as TTRM 102 along with turns ratio, measures ratio deviation, phase angle deviation, magnetizing current and detects tap-position of single phase transformer in charged switchyard condition. The range of AC voltage selection offers high accuracy in measurement.Both the instrument have in-built TFT display with touch screen and thermal printer. The user friendly, simple instrument makes the testing more easy. With the touch keypad it is possible to enter required DUT information.The ratio results are displayed with % error. Internal non-volatile memory gives the provision of storing test results.Further data can be downloaded to PC or copied to memory stick through USB port provided.
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Product
Vibration Testing
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Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Product
JESD22-A115 Machine-Model (MM) Pulse Emulator
MM-10A
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High Power Pulse Instruments GmbH
- Pulse unit to generate JESD22-A115 machine-model (MM) waveforms with TLP- Extremely stable and reproducible machine-model (MM) waveforms- Compatible with HPPI TLP-3010C/4010C/8010A/8010Csystems which have installed pulse width of 25 ns and rise time of 100 ps to 300 ps- Up to ±10 A machine-model peak current with TLP-3010C, which is equivalent to ±667 V (MM)- Up to ±15 A machine-model peak current with TLP-4010C, which is equivalent to ±1000 V (MM)- Up to ±30 A machine-model peak current with TLP-8010A and TLP-8010C, which is equivalent to ±2000 V (MM)- Same measurement procedure as TLP including DC test of the DUT- Compatible with HPPI TLP software and waveform data storage and management- 50 Ω SMA input and output connectors- Compact size: 61 mm x 25 mm x 17 mm
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Product
FCB Probe Card
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The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Product
High Performance Autoranging DC Power Module, 50V, 5A, 50W
N6751A
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The Keysight N6751A is a 50 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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Product
PXI 8/16-Channel Isolated D/A Converter
M9185A
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The M9185A is a fully independent, isolated D/A converter that is capable of supplying high voltage levels in parallel of up to eight or sixteen channels. Each channel is able to output up to 16V as stimulus signals to Device Under Tests (DUTs).
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Product
1-Port 14 GHz Analyzer
R140
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R140 Vector Network Analyzer (cable and antenna analyzer) delivers lab grade performance in a handheld device. This patented (US Patent 9,291,657) analyzer can be connected directly to the antenna or other DUT without the need for a test cable, eliminating measurement uncertainties inherent to cables. Resulting in highly dependable performance and calibration stability. The 1-port VNA comes with all the features engineers have come to expect included standard in our software.
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Product
4 x 8 Two-Wire Matrix Module for 34970A/34972A
34904A
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The Keysight 34904A module for the 34970A/34972A Data Acquisition/Switch Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your DUT at the same time. Rows or columns may be connected between multiple modules to build 8 x 8, 4 x 16 or larger matrices, with up to 96 crosspoints in a single frame.
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Product
External Frontend
FE44S
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The R&S®FE44S external frontend can extend the frequency range up to 44 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE44S enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. The R&S®FE44S uses a single RF connector to further reduce the number of antennas in over the air testing.
