Test Fixtures
UUT interconnect interchangeable with tester.
See Also: Fixtures, Mechanical Fixtures, Vacuum Fixtures, ATE Fixtures, PCB Test Fixtures, Board Test Fixtures, Bed of Nails, Spring Probes, Test Jigs, Test Probes
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Product
C68-C68-D4 Unshielded Cable, 2X68-Position VHDCI Offset, 1 m
195949-01
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68-Pin, Male VHDCI to 68-Pin, Male VHDCI, 50 Ω, Unshielded Digital Cable - The C68-C68-D4 Digital Cable connects NI 6535/6/7, 654x, 655x, and 657x digital instruments with other NI accessories like the CB-2162 Connector Block or SMB-2163 Terminal Block. You can also use it with certain Digital I/O Adapter Modules for FlexRIO, Digitizer Adapter Modules for FlexRIO, Signal Generator Adapter Modules for FlexRIO, and high-speed serial instruments. It is flexible and easily fits around custom test fixtures and other equipment. It is an unshielded, 50 Ω cable.
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Product
Aircraft Test Set
CA-2100S-07
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The CA-2100S-07 is a bench mounted, modularized and computer based test set used to service all types of aircraft electronics. It simulates the aircraft environment and replaces a myriad of specialized test fixtures found in the industry.
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R&D Clamshell Bed of Nails Testers
Rand Press Rods Family
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Designed for Research & Development and Pre-Production environments to support often reoccurring product design changes. The primary design focus for this fixture is ease in applying engineering changes and resilience to the abuse of applying multiple engineering changes without damage. In R&D and Preproduction, design changes and updates can occur every week. This Rand fixture, unlike normal test fixtures was designed to be easily taken apart and updated. Constantly disassembling modifying and reassembling a normal bed of nails test fixture over and over again can be a major disaster with wire breakage and test pin bending issues. The modular design of the Rand fixture allows for easy disassembly without flexing the wires or risk of bending test pins. The Rand fixture provides complete easy access for multiple updates requiring machining, drilling and wiring changes.
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Trackside Equipment
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The Automotive assembly track lineside environment requires numerous amounts of tooling & equipment to ensure build phases are completed productively. Jackmark Engineering provides a wide variety of custom designed trackside jigs & fixtures, test leads and assembly aids including validation tooling to various assembly departments from HVAC to end of line.
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Emergency Battery Test Fixture
TA-60
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This test fixture will allow servicing of the 60-1321-( ) series of emergency exit light power supply. These supplies are used in many aircraft to annunciate exit lighting when aircraft power failure occurs. The TA-60 test fixture is equivalent to the suggested test fixture in the OEM 60-1321 CMM. The four load lamps are conveniently placed behind an acrylic red lens for proper viewing while performing load test. The bench cable is provided as part of the test fixture.
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Product
Universal Test Fixture
CAM/GATE
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The Low Cost Solution for Accurate and Dependable Universal Functional TestThe CAM/GATE ® Universal Test Fixture System is your afforable, efficient solution for functional test. No need to have multiple fixtures in your test area...
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Product
RF Shielded Test Enclosure, Large, Yet Benchtop Enclosure
JRE 2525
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Originally designed for testing rack mounted RF Sensing equipment, the roomy JRE 2525 is ideal for large wireless devices such as; Rack Mount Mesh Network AP's, Cellular/LTE/4G Base Stations, Wireless Laptops, Test Fixtures for testing Large RF Modules, and other large RF devices.
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Product
Hi Potential & Cable Continuity Test Fixture
HIPOTCCT
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The most important features of this hipot tester fixture is its safety and ease of use intuitive control functions and durability in a production environment.
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Product
Breakdown Voltage Tester
ZDS-50B
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Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.5-2008/IEC60851-4; Inspection standard: JB/T4279.11-2008Used to test the breakdown voltage performance under room temperature of enameled round and flat wires with nominal conductor diameter of 0.018mm and above;Three voltage rise speeds are available: 20V/s, 100V/s and 500V/s, with error being ±5%;Three test methods can be adopted: round bar method, twist pair method and ball method;Clamp a group of test samples (5 for each) once, available to complete breakdown or withstand voltage test for any of sample one by one or individually; breakdown voltage and withstand voltage time would be automatically saved for future enquiry; all operations would be automatically completed;Capable of conducting high temperature breakdown voltage test in combination with RDS-50 thermal-state voltage tester;LED would automatically display test results and automatically return;During sample breakdown, breakdown voltage indication value would be automatically locked, free from flashing, and the test result is distinct and relatively clear;Equipped with test fixture for round rod method and twist pair method as well as the test weight for round rod method;Equipped with ball method test device (steel balls are prepared by user);Test door is provided with safety interlocking device, compliant with relevant regulations on high voltage testing equipment.
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Product
Press Down Rods Bed of Nails Testers
Protector Press Rods Family
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Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Product
Actuation Methods for Functional Test Systems
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Functional test typically applies full operational power to a final product or a loaded printed circuit board in order to determine if the Product/ PCB performs functions as designed. This type of test often involves custom built test equipment and custom test fixturing. Circuit Check supports all forms of functional test strategies within its Signature Series functional test fixtures.
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Product
Universal Test Fixture
Series 48
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The Series 48 Universal Test Fixture Systems are an effective way to test high mix, low to medium volume products. The Universal Base is designed around the CAMGATE Z axis Test Fixture. The base interfaces with removable, quick change Series 49 Universal Test Insert Kits. Three versions are offered, a blank base whereas the end user can configure the Base and insert kit to their own connector configuration, The 160 point model which uses four (40) pin IDC ribbon cable connectors to interface between the base and the insert kit, and the -I model that incorporates the same 4 block GR2270 style block interface as used on our Series 34 test fixtures. This allows for increased test point count and the use of Industry Standard 2270 style signal, power, and coax blocks. Rear panels can be custom configured to customer specifications, Virginia Panel ITA frames, or GR2270 Interfaces used on Semco’s Standard Product line
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Becker Transponder Test Fixture
TA-3400
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This transponder test fixture is specific to the requirements for testing Becker Avionics Transponders and provides interface connectors for both the panel mount and remote systems. The panel also provides switches to implement Gillham code altitude as well as separate interfaces for an external parallel or serial encoder. The panel will interface with the RMU 5000 or standard control head. This fixture also comes with voltage and current meters along with an internal dimming source. This panel comes in the standard 19 inch rack width and measures 12 inches in depth.
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Test Fixtures-Assemblies
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Qmax Test Technologies Pvt. Ltd.
Test Clips are available for various types of DIP ICs like 8, 14, 16, 20, 24, 28, 40, 48 & 64. These can be supplied with or without connectors and cables for interfacing to Qmax Testers. Test Pins in the clips are gold plated and engineered for good contact with the Device Under Test. It is designed for long life and trouble free operation. For easy handling the clips are provided with metal covers.
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CamTrac Z-Axis Test Fixture Kits
CT Serie
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The CT Series Mechanical Kits, utilizing the patented CAM mechanism1, offset the same precision linear motion. The 'Z' axis motion is ideal for a larger point count mechanical test applications.The CT Series features a hinged 3/8" FR4 probe board, tooling holes for precision alignment, removable sides, precision shafts and cam slide block assemblies, and a pan latch assembly.
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Product
Functional Test Fixtures
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Test Head Engineering's Custom Functional Test Fixtures range from simple to extremely complex. Typically, our customers do their own wiring and programming, but we will complete the job right up to the customer's requirements, including offering turn-key control and test programming through our partners.
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Sample Preparation
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Careful attention to specimen preparation is critical to obtaining top quality test data. Pacific Testing Laboratories has, what it believes to be, the most extensively equipped machine shop in any commercial laboratory. Its function is dedicated to fabricating test specimens and fixturing. Principal equipment includes diamond coated tooling, surface grinders, milling machines, lathes, a 30 ton precision press, laboratory presses, and a 4-axisCNC milling machine.
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RF Functional Test Fixtures
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EMC Technologies’ design team has developed a variety of test adaptors and test stations for testing RF circuit assemblies and microwave sub-assemblies.
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DDC (Dual DIMM Carrier) DIOS Adaptor
JT 2702/DDC
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The JT2702 Digital 256 channel JTAG I/O module. JT2702/DDC (Dual DIMM Carrier) is a DIMM DIOS accessory product. It is typically used in custom test adapters or fixtures where a large number of digital I/O channels are required with a minimum space overhead.
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RF Shield Box
LTL R21001
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Liveon Technolabs LTL R12001 RF Test Enclosure is the streamline solution to manage your RF Testings. LTL R12001 RF shielded test enclosure can comfortably house the intermediate and large devices on test such as Laptops, larger test Fixtures and other large RF devices.
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Product
In-Circuit Fixtures
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In-Circuit test fixtures can be configured for dual stage, dual well and opens testing applications. Even the most complex boards can be accommodated using standard methods of actuation.
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Test Fixture, Axial And Radial
16047A
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The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
USB Type-C Test Fixture | CB26U | Cable Harness Tester
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A leader in development of PC-based cable and wire harness, continuity, resistance and hipot test systems for over 20 years, CAMI offers the CableEye suite of products complete with accessories – including “connector boards”. The selection of these test fixture boards is constantly growing and is currently numbering over 60 – most of which are populated with ‘families’ of connectors. When pre-populated boards are used, the tester GUI automatically displays a graphic of the connectors under test.
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Exchangeable Test Fixture
MA 2112/D/H/S-7
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 11,30 kg
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ARINC HSI / ADI Test Fixture
TA-2000
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The TA-2000 test fixture is a combination panel that incorporates all the standard capabilities of the legacy CTS-11(ADI) and CTS-12(HSI) panels and much more. This panel is married to our model TA-1001 dual synchro transmitter/API panel thus allowing for local stimulus and alignment of the instruments synchros and resolvers. The panel provides for testing of both superflag(28v) and low level meters through a matrix of switching that will allow testing of all meters simultaneously or just individually. The low level meter drive circuit also incorporates an automatic mode that will continuously oscillate the L/R and Up/Dn pointers.
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Product
Pod with Four Test Access Ports for 5v or 3.3V TTL Thresholds
JT 2137
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The JT 2137 pod remains a popular choice for DataBlaster controller installations that require a compact signal conditioning pod embedded within a test fixture. The JT 2137 features four test access ports which together may be set for 5v or 3.3V TTL thresholds, although additional plug-in adapters are available that allow alternative thresholds to be set on a TAP by TAP basis (contact your local sales office for details). The 20-way 0.1″ IDC TAP headers comply with the standard JTAG Technologies 20-way pin-out and provide the additional flash programming controls Read/Busy and AutoWrite.
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In-Circuit Test (ICT) Fixtures
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At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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PXI 22-Channel 2A Fault Insert Switches
40-202-001
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This is the 22 Channel version of the 40-202 Fault Insertion Switch. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test.
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Adjustable Press Plate Bed of Nails Testers
Rand Adjustable Family
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esigned for Research & Development and Pre-Production environments to support often reoccurring product design changes. The primary design focus for this fixture is ease in applying engineering changes and resilience to the abuse of applying multiple engineering changes without damage. In R&D and Preproduction, design changes and updates can occur every week. This Rand fixture, unlike normal test fixtures was designed to be easily taken apart and updated. Constantly disassembling modifying and reassembling a normal bed of nails test fixture over and over again can be a major disaster with wire breakage and test pin bending issues. The modular design of the Rand fixture allows for easy disassembly without flexing the wires or risk of bending test pins. The Rand fixture provides complete easy access for multiple updates requiring machining, drilling and wiring changes.
